Specimen analysis system obtaining characteristic of specimen by diffusion approximation
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United States of America Patent
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Oct 6, 2009
Grant Date -
Mar 29, 2007
app pub date -
Sep 20, 2006
filing date -
Sep 20, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
In a specimen analysis system: incident light is injected into a specimen at an injection position on the specimen; an information acquisition unit acquires first information carried by light exiting from each of positions in a first region of the specimen in response to injection of the incident light into the specimen for a first duration of measurement, and second information carried by light exiting from each of positions in a second region of the specimen in response to injection of the incident light into the specimen for a second duration of measurement longer than the first duration of measurement; and an information processing unit calculates a characteristic of the specimen on the basis of the first and second information. The first region is located within a predetermined distance from the injection position, and the second region is located farther from the injection position than the first region.
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