Method and apparatus for improved regression modeling
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United States of America Patent
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Oct 6, 2009
Grant Date -
Jun 26, 2008
app pub date -
Oct 17, 2006
filing date -
Oct 17, 2006
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Abstract
The present invention is a method and an apparatus for improved regression modeling to address the curse of dimensionality, for example for use in data analysis tasks. In one embodiment, a method for analyzing data includes receiving a set of exemplars, where at least two of the exemplars include an input pattern (i.e., a point in an input space) and at least one of the exemplars includes a target value associated with the input pattern. A function approximator and a distance metric are then initialized, where the distance metric computes a distance between points in the input space, and the distance metric is adjusted such that an accuracy measure of the function approximator on the set of exemplars is improved.
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