Tunnel-based object identification and dimensioning system

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United States of America Patent

PATENT NO 7600689
APP PUB NO 20080156882A1
SERIAL NO

11821940

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Abstract

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Methods of and systems for illuminating objects using planar laser illumination beams having substantially-planar spatial distribution characteristics that extend through the field of view (FOV) of image formation and detection modules employed in such systems. Each planar laser illumination beam is produced from a planar laser illumination beam array (PLIA) comprising an plurality of planar laser illumination modules (PLIMs). Each PLIM comprises a visible laser diode (VLD, a focusing lens, and a cylindrical optical element arranged therewith. The individual planar laser illumination beam components produced from each PLIM are optically combined to produce a composite substantially planar laser illumination beam having substantially uniform power density characteristics over the entire spatial extend thereof and thus the working range of the system. Preferably, each planar laser illumination beam component is focused so that the minimum beam width thereof occurs at a point or plane which is the farthest or maximum object distance at which the system is designed to acquire images, thereby compensating for decreases in the power density of the incident planar laser illumination beam due to the fact that the width of the planar laser illumination beam increases in length for increasing object distances away from the imaging optics. Advanced high-resolution wavefront control methods and devices are disclosed for use with the PLIIM-based systems in order to reduce the power of speckle-noise patterns observed at the image detections thereof. By virtue of the present invention, it is now possible to use both VLDs and high-speed CCD-type image detectors in conveyor, hand-held and hold-under type imaging applications alike, enjoying the advantages and benefits that each such technology has to offer, while avoiding the shortcomings and drawbacks hitherto associated therewith.

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Patent Owner(s)

Patent OwnerAddress
METROLOGIC INSTRUMENTS INCNEW JERSEY NEW JERSEY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Amundsen, Thomas Turnersville , US 148 9830
Au, Ka Man Philadelphia , US 169 9851
Colavito, Stephen J Brookhaven , US 79 2799
Dobbs, Russell Joseph Cherry Hill , US 36 927
Ghosh, Sankar Glenolden , US 90 3959
Giordano, Patrick A Blackwood , US 30 771
Good, Timothy A Clementon , US 75 3310
Jankevics, Andrew Westford , US 34 1486
Kim, Steve Y Cambridge , US 8 206
Knowles, C Harry Moorestown , US 239 11674
Naylor, Charles A Sewell , US 63 2691
Schmidt, Mark S Williamstown , US 41 1192
Schnee, Michael D Aston , US 58 2165
Svedas, William Deptford , US 19 508
Tsikos, Constantine J Voorhees , US 73 3268
Wilz,, Sr David M Sewell , US 38 5415
Wirth, Allan Bedford , US 52 2560
Yorsz, Jeffery Winchester , US 17 439
Zhu, Xiaoxun Marlton , US 309 26903

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