Deposition methods for barrier and tungsten materials

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United States of America Patent

PATENT NO 7611990
APP PUB NO 20080268636A1
SERIAL NO

12171132

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Embodiments as described herein provide a method for depositing barrier layers and tungsten materials on substrates. In one embodiment, a method for depositing materials is provided which includes forming a barrier layer on a substrate, wherein the barrier layer contains a cobalt silicide layer and a metallic cobalt layer, exposing the barrier layer to a soak gas containing a reducing gas during a soak process, and forming a tungsten material over the barrier layer. In one example, the barrier layer may be formed by depositing a cobalt-containing material on a dielectric surface of the substrate and annealing the substrate to form the cobalt silicide layer from a lower portion of the cobalt-containing material and the metallic cobalt layer from an upper portion of the cobalt-containing material.

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Patent Owner(s)

Patent OwnerAddress
APPLIED MATERIALS INC3050 BOWERS AVENUE SANTA CLARA CALIFORNIA 95054 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ahmad, Hafiz Farooq Newark , US 4 651
Cha, Yonghwa Chris San Jose , US 12 1280
Wee, Ho Sun Santa Clara , US 5 668
Yoon, Ki Hwan Sunnyvale , US 10 1007
Yu, Sang Ho Sunnyvale , US 67 4296

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