Circuits and associated methods for improved debug and test of an application integrated circuit
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 10, 2009
Grant Date -
Feb 28, 2008
app pub date -
Aug 23, 2006
filing date -
Aug 23, 2006
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Circuits and associated methods for testing internal operation of an application integrated circuit. Features and aspects hereof add configurable test interrupt circuits to an application circuit design to permit dynamic, configurable interrupt generation from an integrated circuit based on conditions determined from monitoring of internal signals of the application circuit. The internal signals that may be tested and used to generate test interrupts are those not exposed to the external processor interface of the integrated circuit and thus may be configured to interrupt based on any internal state of the application specific functional circuits of the integrated circuit.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully