Wideband active-passive differential signal probe
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 17, 2009
Grant Date -
Dec 28, 2006
app pub date -
Apr 28, 2006
filing date -
Jun 13, 2005
priority date (Note) -
In Force
status (Latency Note)
![]() |
A preliminary load of PAIR data current through [] has been loaded. Any more recent PAIR data will be loaded within twenty-four hours. |
PAIR data current through []
A preliminary load of cached data will be loaded soon.
Any more recent PAIR data will be loaded within twenty-four hours.
![]() |
Next PAIR Update Scheduled on [ ] |

Importance

US Family Size
|
Non-US Coverage
|
Patent Longevity
|
Forward Citations
|
Abstract
A wideband differential signal probe includes separate paths to convert a lower frequency component and a higher frequency component of a differential signal to a lower frequency single ended signal and a higher frequency single ended signal which are combined for the probe's output which is commonly input to instrumentation.

First Claim
Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | Total Patents |
---|---|---|
CASCADE MICROTECH, INC. | BEAVERTON, OR | 142 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Campbell, Richard | Portland , US | 26 | 137 |
Cited Art Landscape
Patent Info | (Count) | # Cites | Year |
---|---|---|---|
|
|||
4284682 Heat sealable, flame and abrasion resistant coated fabric | 128 | 1980 | |
4383217 Collinear four-point probe head and mount for resistivity measurements | 88 | 1981 | |
4480223 Unitary probe assembly | 138 | 1981 | |
4641659 Medical diagnostic microwave scanning apparatus | 114 | 1982 | |
4563640 Fixed probe board | 42 | 1982 | |
4515133 Fuel economizing device | 77 | 1984 | |
4812754 Circuit board interfacing apparatus | 118 | 1987 | |
4711563 Portable collapsible darkroom | 90 | 1987 | |
4791363 Ceramic microstrip probe blade | 137 | 1987 | |
4988062 Apparatus, system and method for organizing and maintaining a plurality of medical catheters and the like | 99 | 1988 | |
4922912 MAP catheter | 122 | 1988 | |
* 5129006 Electronic audio signal amplifier and loudspeaker system | 24 | 1989 | |
5363050 Quantitative dielectric imaging system | 121 | 1990 | |
5414565 Tilting kinematic mount | 85 | 1991 | |
5187443 Microwave test fixtures for determining the dielectric properties of a material | 80 | 1992 | |
5584608 Anchored cable sling system | 87 | 1994 | |
5670322 Multi site molecule detection method | 183 | 1995 | |
5670888 Method for transporting and testing wafers | 128 | 1995 | |
5621400 Ice detection method and apparatus for an aircraft | 42 | 1995 | |
5744971 Device and apparatus for measuring dielectric properties of materials | 99 | 1995 | |
5831442 Handling device | 96 | 1996 | |
5675932 Plant growing system | 94 | 1996 | |
5949579 Flexible darkness adapting viewer | 89 | 1997 | |
6307363 Ultrahigh-frequency high-impedance passive voltage probe | 52 | 1998 | |
* RE37130 Signal conditioning apparatus | 30 | 1998 | |
6147851 Method for guarding electrical regions having potential gradients | 92 | 1999 | |
6327034 Apparatus for aligning two objects | 94 | 1999 | |
6548311 Device and method for detecting analytes | 154 | 2000 | |
2001/0002,794 Split resistor probe and method | 79 | 2001 | |
2002/0030,480 Apparatus for the automated testing, calibration and characterization of test adapters | 12 | 2001 | |
6587327 Integrated broadband ceramic capacitor array | 118 | 2002 | |
2003/0076,585 Optical system for enhancing the image from a microscope's high power objective lens | 31 | 2002 | |
2003/0139,662 Method and apparatus for detecting, identifying and performing operations on microstructures including, anthrax spores, brain cells, cancer cells, living tissue cells, and macro-objects including stereotactic neurosurgery instruments, weapons and explosives | 85 | 2002 | |
7015707 Micro probe | 121 | 2003 | |
2004/0193,382 Method and apparatus for calibrating a multiport test system for measurement of a DUT | 101 | 2004 | |
2006/0030,060 Apparatus and method for testing defects | 42 | 2005 | |
|
|||
5659421 Slide positioning and holding device | 111 | 1995 | |
|
|||
4691163 Dual frequency surface probes | 116 | 1985 | |
|
|||
4476363 Method and device for heating by microwave energy | 37 | 1983 | |
|
|||
4531474 Rotary board treating apparatus | 89 | 1984 | |
4746857 Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer | 96 | 1986 | |
|
|||
5293175 Stacked dual dipole MMDS feed | 148 | 1993 | |
|
|||
5227730 Microwave needle dielectric sensors | 115 | 1992 | |
|
|||
4642417 Concentric three-conductor cable | 115 | 1985 | |
|
|||
5316435 Three function control system | 50 | 1992 | |
5360312 Three function control mechanism | 48 | 1992 | |
|
|||
6639461 Ultra-wideband power amplifier module apparatus and method for optical and electronic communications | 84 | 2001 | |
|
|||
4727319 Apparatus for on-wafer testing of electrical circuits | 75 | 1985 | |
4772846 Wafer alignment and positioning apparatus for chip testing by voltage contrast electron microscopy | 141 | 1986 | |
4908570 Method of measuring FET noise parameters | 43 | 1987 | |
5313157 Probe for jesting an electrical circuit chip | 93 | 1992 | |
5583445 Opto-electronic membrane probe | 105 | 1994 | |
5611008 Substrate system for optoelectronic/microwave circuits | 88 | 1996 | |
5623214 Multiport membrane probe for full-wafer testing | 109 | 1996 | |
|
|||
6130536 Preform test fixture and method of measuring a wall thickness | 38 | 1998 | |
|
|||
2004/0066,181 High-frequency probe tip | 82 | 2003 | |
|
|||
4581679 Multi-element circuit construction | 102 | 1985 | |
2005/0026,276 Remote detection and analysis of chemical and biological aerosols | 80 | 2003 | |
|
|||
7088981 Apparatus for reducing flicker noise in a mixer circuit | 114 | 2001 | |
|
|||
5376790 Scanning probe microscope | 118 | 1992 | |
5672816 Large stage system for scanning probe microscopes and other instruments | 119 | 1995 | |
|
|||
2001/0044,152 Dual beam, pulse propagation analyzer, medical profiler interferometer | 73 | 2001 | |
|
|||
5479109 Testing device for integrated circuits on wafer | 118 | 1994 | |
6040739 Waveguide to microstrip backshort with external spring compression | 77 | 1998 | |
|
|||
5966645 Transmitter with low-level modulation and minimal harmonic emissions | 45 | 1997 | |
|
|||
6628503 Gas cooled electrostatic pin chuck for vacuum applications | 111 | 2001 | |
2002/0176,160 Microscope system | 45 | 2002 | |
|
|||
4795962 Floating driver circuit and a device for measuring impedances of electrical components | 95 | 1987 | |
5133119 Shearing stress interconnection apparatus and method | 66 | 1991 | |
|
|||
7012871 Information recording method and apparatus with suppressed mark edge jitters | 76 | 2004 | |
|
|||
4839587 Test fixture for tab circuits and devices | 156 | 1988 | |
5198753 Integrated circuit test fixture and method | 131 | 1990 | |
5691503 Electro-magnetically shielded door hinge | 41 | 1994 | |
2004/0201,388 Support for an electronic probe and related methods | 42 | 2003 | |
|
|||
6794950 Waveguide to microstrip transition | 89 | 2001 | |
|
|||
4918373 R.F. phase noise test set using fiber optic delay line | 52 | 1988 | |
4835495 Diode device packaging arrangement | 41 | 1988 | |
5326412 Method for electrodepositing corrosion barrier on isolated circuitry | 75 | 1992 | |
5512835 Electrical probe and method for measuring gaps and other discontinuities in enclosures using electrical inductance for RF shielding assessment | 75 | 1992 | |
5412866 Method of making a cast elastomer/membrane test probe assembly | 123 | 1993 | |
|
|||
7030599 Hand held voltage detection probe | 102 | 2004 | |
|
|||
7071722 Anisotropic, conductive sheet and impedance measuring probe | 35 | 2003 | |
|
|||
4888550 Intelligent multiprobe tip | 92 | 1983 | |
5128612 Disposable high performance test head | 26 | 1990 | |
5159752 Scanning electron microscope based parametric testing method and apparatus | 119 | 1990 | |
5225037 Method for fabrication of probe card for testing of semiconductor devices | 216 | 1991 | |
5317656 Fiber optic network for multi-point emissivity-compensated semiconductor wafer pyrometry | 74 | 1993 | |
5511010 Method and apparatus of eliminating interference in an undersettled electrical signal | 93 | 1994 | |
6292760 Method and apparatus to measure non-coherent signals | 93 | 1998 | |
6906539 High density, area array probe card apparatus | 58 | 2001 | |
6911834 Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probing | 57 | 2002 | |
* 6741129 Differential amplifier slew rate boosting scheme | 34 | 2002 | |
7026833 Multiple-chip probe and universal tester contact assemblage | 102 | 2005 | |
7327153 Analog built-in self-test module | 35 | 2005 | |
7323899 System and method for resumed probing of a wafer | 19 | 2006 | |
|
|||
6236223 Method and apparatus for wireless radio frequency testing of RFID integrated circuits | 222 | 1999 | |
|
|||
4713347 Measurement of ligand/anti-ligand interactions using bulk conductance | 221 | 1985 | |
|
|||
6420722 Method for sample separation and lift-out with one cut | 127 | 2001 | |
|
|||
4970386 Vertical FET high speed optical sensor | 43 | 1989 | |
5487999 Method for fabricating a penetration limited contact having a rough textured surface | 173 | 1994 | |
5686317 Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die | 239 | 1995 | |
5869974 Micromachined probe card having compliant contact members for testing semiconductor wafers | 173 | 1996 | |
6071009 Semiconductor wirebond machine leadframe thermal map system | 46 | 1997 | |
6181144 Semiconductor probe card having resistance measuring circuitry and method fabrication | 182 | 1998 | |
6194720 Preparation of transmission electron microscope samples | 111 | 1998 | |
6359456 Probe card and test system for semiconductor wafers | 115 | 2001 | |
6924653 Selectively configurable microelectronic probes | 60 | 2002 | |
7026835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad | 93 | 2002 | |
7009188 Lift-out probe having an extension tip, methods of making and using, and analytical instruments employing same | 97 | 2004 | |
|
|||
4922186 Voltage detector | 82 | 1988 | |
|
|||
7323680 Optical deflection probe and optical deflection probe device | 21 | 2006 | |
|
|||
2001/0054,906 Probe card and a method of manufacturing the same | 78 | 2001 | |
|
|||
4600907 Coplanar microstrap waveguide interconnector and method of interconnection | 55 | 1985 | |
4626805 Surface mountable microwave IC package | 62 | 1985 | |
|
|||
5478748 Protein assay using microwave energy | 89 | 1994 | |
|
|||
5751153 Method and apparatus for characterizing a multiport circuit | 40 | 1996 | |
5793213 Method and apparatus for calibrating a network analyzer | 94 | 1996 | |
5751252 Method and antenna for providing an omnidirectional pattern | 97 | 1997 | |
|
|||
6376258 Resonant bio-assay device and test system for detecting molecular binding events | 140 | 2000 | |
6340568 Method for detecting and classifying nucleic acid hybridization | 87 | 2001 | |
6566079 Methods for analyzing protein binding events | 107 | 2001 | |
2003/0032,000 Method for analyzing cellular events | 95 | 2001 | |
2002/0168,659 System and method for characterizing the permittivity of molecular events | 75 | 2002 | |
|
|||
5883523 Coherent switching power for an analog circuit tester | 105 | 1997 | |
|
|||
6222031 Process for preparing water-soluble tricarboxypolysaccharide | 83 | 1998 | |
|
|||
4899126 Thick film resistor type printed circuit board | 100 | 1989 | |
5089774 Apparatus and a method for checking a semiconductor | 129 | 1990 | |
5374938 Waveguide to microstrip conversion means in a satellite broadcasting adaptor | 95 | 1993 | |
|
|||
7057404 Shielded probe for testing a device under test | 22 | 2003 | |
|
|||
2004/0186,382 Spectral volume microprobe arrays | 84 | 2003 | |
|
|||
6002426 Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits | 114 | 1997 | |
|
|||
6636182 Structural antenna for flight aggregates or aircraft | 74 | 2001 | |
|
|||
5157790 Firefighter garment with lumbar support | 50 | 1991 | |
|
|||
2002/0070,745 Cooling system for burn-in unit | 85 | 2000 | |
|
|||
5066357 Method for making flexible circuit card with laser-contoured vias and machined capacitors | 108 | 1990 | |
|
|||
4980637 Force delivery system for improved precision membrane probe | 100 | 1988 | |
4918383 Membrane probe with automatic contact scrub action | 159 | 1988 | |
4906920 Self-leveling membrane probe | 207 | 1988 | |
5172051 Wide bandwidth passive probe | 111 | 1991 | |
5298972 Method and apparatus for measuring polarization sensitivity of optical devices | 111 | 1991 | |
5274336 Capacitively-coupled test probe | 141 | 1992 | |
5308250 Pressure contact for connecting a coaxial shield to a microstrip ground plane | 30 | 1992 | |
5463324 Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like | 48 | 1993 | |
5507652 Wedge connector for integrated circuits | 40 | 1995 | |
5578932 Method and apparatus for providing and calibrating a multiport network analyzer | 148 | 1995 | |
5945836 Loaded-board, guided-probe test fixture | 133 | 1996 | |
5923180 Compliant wafer prober docking adapter | 72 | 1997 | |
5940965 Method of making multiple lead voltage probe | 30 | 1997 | |
5903143 Probe apparatus with RC circuit connected between ground and a guard | 95 | 1997 | |
6060888 Error correction method for reflection measurements of reciprocal devices in vector network analyzers | 113 | 1998 | |
6251595 Methods and devices for carrying out chemical reactions | 129 | 1998 | |
6175228 Electronic probe for measuring high impedance tri-state logic circuits | 84 | 1998 | |
6271673 Probe for measuring signals | 105 | 1999 | |
6407562 Probe tip terminating device providing an easily changeable feed-through termination | 95 | 1999 | |
2001/0024,116 Electronic probe for measuring high impedance tri-state logic circuits | 80 | 2001 | |
6643597 Calibrating a test system using unknown standards | 119 | 2001 | |
6717426 Blade-like connecting needle | 79 | 2002 | |
6768328 Single point probe structure and method | 77 | 2002 | |
6864694 Voltage probe | 91 | 2002 | |
2004/0140,819 Differential voltage probe | 33 | 2003 | |
2005/0030,047 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration | 87 | 2003 | |
7025628 Electronic probe extender | 117 | 2003 | |
2004/0162,689 Multiport network analyzer calibration employing reciprocity of a device | 95 | 2004 | |
6933713 High bandwidth oscilloscope probe with replaceable cable | 58 | 2004 | |
7005868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe | 94 | 2004 | |
7030328 Liquid metal switch employing micro-electromechanical system (MEMS) structures for actuation | 13 | 2004 | |
7026834 Multiple two axis floating probe block assembly using split probe block | 93 | 2005 | |
|
|||
4980638 Microcircuit probe and method for manufacturing same | 26 | 1989 | |
|
|||
6127831 Method of testing a semiconductor device by automatically measuring probe tip parameters | 107 | 1997 | |
|
|||
6154238 Scanning print head | 42 | 1997 | |
|
|||
6633174 Stepper type test structures and methods for inspection of semiconductor integrated circuits | 156 | 2000 | |
6771806 Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices | 200 | 2000 | |
|
|||
5521518 Probe card apparatus | 136 | 1991 | |
5180977 Membrane probe contact bump compliancy system | 146 | 1991 | |
5422574 Large scale protrusion membrane for semiconductor devices under test with very high pin counts | 183 | 1993 | |
5720098 Method for making a probe preserving a uniform stress distribution under deflection | 118 | 1995 | |
5742174 Membrane for holding a probe tip in proper location | 135 | 1995 | |
5623213 Membrane probing of circuits | 97 | 1996 | |
6037785 Probe card apparatus | 109 | 1996 | |
5973504 Programmable high-density electronic device testing | 101 | 1997 | |
6908364 Method and apparatus for probe tip cleaning and shaping pad | 58 | 2001 | |
|
|||
7005078 Micromachined fluidic device and method for making same | 187 | 2001 | |
|
|||
6172337 System and method for thermal processing of a semiconductor substrate | 105 | 1999 | |
|
|||
6295729 Angled flying lead wire bonding process | 148 | 1998 | |
6708403 Angled flying lead wire bonding process | 139 | 2003 | |
|
|||
4558609 Joystick controller with interchangeable handles | 29 | 1983 | |
|
|||
7002364 Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same | 97 | 2003 | |
|
|||
4755747 Wafer prober and a probe card to be used therewith | 109 | 1985 | |
4864227 Wafer prober | 132 | 1988 | |
4929893 Wafer prober | 161 | 1988 | |
5145552 Process for preparing electrical connecting member | 68 | 1990 | |
5304924 Edge detector | 99 | 1992 | |
5731920 Converting adapter for interchangeable lens assembly | 95 | 1995 | |
5685232 Positioning stage device exposure apparatus and device manufacturing method utilizing the same | 116 | 1996 | |
|
|||
4707657 Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine | 150 | 1985 | |
|
|||
5479108 Method and apparatus for handling wafers | 158 | 1992 | |
|
|||
5214243 High-temperature, low-noise coaxial cable assembly with high strength reinforcement braid | 130 | 1991 | |
|
|||
5970429 Method and apparatus for measuring electrical noise in devices | 134 | 1997 | |
6121836 Differential amplifier | 37 | 1998 | |
6245692 Method to selectively heat semiconductor wafers | 91 | 1999 | |
|
|||
7001785 Capacitance probe for thin dielectric film characterization | 100 | 2004 | |
|
|||
6078500 Pluggable chip scale package | 107 | 1998 | |
|
|||
6822463 Active differential test probe with a transmission line input structure | 77 | 2002 | |
6870359 Self-calibrating electrical test probe | 40 | 2002 | |
7019544 Transmission line input structure test probe | 97 | 2004 | |
|
|||
6948391 Probe with integral vent, sampling port and filter element | 66 | 2003 | |
|
|||
6838885 Method of correcting measurement error and electronic component characteristic measurement apparatus | 101 | 2003 | |
|
|||
4453142 Microstrip to waveguide transition | 113 | 1981 | |
4646005 Signal probe | 100 | 1984 | |
5561378 Circuit probe for measuring a differential circuit | 33 | 1994 | |
5748506 Calibration technique for a network analyzer | 96 | 1996 | |
|
|||
5142224 Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals | 106 | 1991 | |
|
|||
4376920 Shielded radio frequency transmission cable | 143 | 1981 | |
|
|||
5715819 Microwave tomographic spectroscopy system and method | 175 | 1994 | |
|
|||
5408188 High frequency wafer probe including open end waveguide | 77 | 1992 | |
5493236 Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis | 193 | 1994 | |
6144212 Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card | 112 | 1998 | |
6242929 Probe needle for vertical needle type probe card and fabrication thereof | 90 | 1998 | |
6404213 Probe stylus | 85 | 1999 | |
7173433 Circuit property measurement method | 19 | 2005 | |
|
|||
6146908 Method of manufacturing a test circuit on a silicon wafer | 32 | 1999 | |
6480013 Method for the calibration of an RF integrated circuit probe | 101 | 2000 | |
|
|||
4901012 Circuit for measuring the dynamic characteristics of a package for high-speed integrated circuits and a method for measuring said dynamic characteristics | 39 | 1987 | |
|
|||
4904933 Integrated circuit probe station | 114 | 1986 | |
|
|||
6395480 Computer program and database structure for detecting molecular binding events | 114 | 1999 | |
|
|||
5565881 Balun apparatus including impedance transformer having transformation length | 84 | 1994 | |
5628057 Multi-port radio frequency signal transformation network | 100 | 1996 | |
|
|||
6657601 Metrology antenna system utilizing two-port, sleeve dipole and non-radiating balancing network | 78 | 2001 | |
|
|||
6233613 High impedance probe for monitoring fast ethernet LAN links | 98 | 1997 | |
7002133 Detecting one or more photons from their interactions with probe photons in a matter system | 93 | 2003 | |
|
|||
6418009 Broadband multi-layer capacitor | 88 | 2000 | |
|
|||
5510792 Anechoic chamber and wave absorber | 95 | 1994 | |
7012425 Eddy-current probe | 95 | 2005 | |
|
|||
4742571 Coupling device between a metal wave guide, a dielectric wave guide and a semiconductor component and a mixer using this coupling device | 88 | 1986 | |
|
|||
6933737 Probe card | 56 | 2003 | |
|
|||
6907149 Compact optical measurement probe | 65 | 2003 | |
|
|||
5686960 Image input device having optical deflection elements for capturing multiple sub-images | 170 | 1994 | |
|
|||
6104206 Product wafer junction leakage measurement using corona and a kelvin probe | 129 | 1997 | |
|
|||
6064217 Fine pitch contact device employing a compliant conductive polymer bump | 134 | 1996 | |
2002/0011,859 METHOD FOR FORMING CONDUCTIVE BUMPS FOR THE PURPOSE OF CONTRRUCTING A FINE PITCH TEST DEVICE | 114 | 1998 | |
|
|||
5571324 Rotary-cup coating apparatus | 104 | 1994 | |
|
|||
5475316 Transportable image emission microscope | 141 | 1993 | |
|
|||
5232789 Structural component with a protective coating having a nickel or cobalt basis and method for making such a coating | 92 | 1992 | |
|
|||
6753699 Integrated circuit and method of controlling output impedance | 81 | 2002 | |
|
|||
5876082 Device for gripping and holding substrates | 70 | 1997 | |
|
|||
5172049 IC test equipment | 135 | 1991 | |
5644248 Test head cooling system | 85 | 1995 | |
5767690 Test head cooling system | 93 | 1997 | |
6191596 Method for detecting a contact position between an object to be measured and measuring pins | 81 | 1998 | |
6174744 Method of producing micro contact structure and contact probe using same | 138 | 2000 | |
2002/0011,863 IC chip tester with heating element for preventing condensation | 89 | 2001 | |
7020360 Wavelength dispersion probing system | 94 | 2002 | |
6937040 Probe module and a testing apparatus | 61 | 2004 | |
|
|||
5764070 Structure for testing bare integrated circuit devices | 66 | 1996 | |
|
|||
4491783 Apparatus for measuring noise factor and available gain | 30 | 1982 | |
|
|||
2002/0070,743 Testing head having vertical probes | 96 | 2001 | |
|
|||
5164319 Multiple chemically modulated capacitance determination | 333 | 1989 | |
|
|||
4588950 Test system for VLSI digital circuit and method of testing | 98 | 1983 | |
|
|||
5347204 Position dependent rate dampening in any active hand controller | 58 | 1992 | |
|
|||
6275738 Microwave devices for medical hyperthermia, thermotherapy and diagnosis | 153 | 1999 | |
|
|||
5594358 Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line | 98 | 1994 | |
5794133 Microwave mixing circuit | 84 | 1996 | |
6806836 Helical antenna apparatus provided with two helical antenna elements, and radio communication apparatus provided with same helical antenna apparatus | 76 | 2003 | |
7219416 Method of manufacturing a magnetic element | 22 | 2004 | |
|
|||
5569591 Analytical or monitoring apparatus and method | 162 | 1994 | |
|
|||
5669316 Turntable for rotating a wafer carrier | 101 | 1993 | |
6362792 Antenna apparatus and portable radio set | 81 | 2000 | |
6366247 Antenna device and portable radio set | 85 | 2000 | |
8035987 Electronic device having a groove partitioning functional and mounting parts from each other | 35 | 2007 | |
|
|||
4916398 Efficient remote transmission line probe tuning for NMR apparatus | 95 | 1988 | |
|
|||
5476211 Method of manufacturing electrical contacts, using a sacrificial member | 378 | 1993 | |
5917707 Flexible contact structure with an electrically conductive shell | 315 | 1994 | |
6049976 Method of mounting free-standing resilient electrical contact structures to electronic components | 125 | 1995 | |
5772451 Sockets for electronic components and methods of connecting to electronic components | 424 | 1995 | |
5974662 Method of planarizing tips of probe elements of a probe card assembly | 379 | 1995 | |
5829128 Method of mounting resilient contact structures to semiconductor devices | 237 | 1995 | |
5852871 Method of making raised contacts on electronic components | 144 | 1995 | |
5601740 Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires | 118 | 1995 | |
5820014 Solder preforms | 127 | 1996 | |
5773780 Method of severing bond wires and forming balls at their ends | 77 | 1996 | |
5900738 Contact structure device for interconnections, interposer, semiconductor assembly and package using the same and method | 149 | 1996 | |
5926951 Method of stacking electronic components | 178 | 1996 | |
6184587 Resilient contact structures, electronic interconnection component, and method of mounting resilient contact structures to electronic components | 124 | 1996 | |
6242803 Semiconductor devices with integral contact structures | 94 | 1996 | |
6274823 Interconnection substrates with resilient contact structures on both sides | 129 | 1996 | |
6476333 Raised contact structures (solder columns) | 73 | 1996 | |
6064213 Wafer-level burn-in and test | 267 | 1997 | |
5806181 Contact carriers (tiles) for populating larger substrates with spring contacts | 279 | 1997 | |
5994152 Fabricating interconnects and tips using sacrificial substrates | 262 | 1997 | |
6442831 Method for shaping spring elements | 75 | 1997 | |
6482013 Microelectronic spring contact element and electronic component having a plurality of spring contact elements | 159 | 1997 | |
5832601 Method of making temporary connections between electronic components | 201 | 1997 | |
5864946 Method of making contact tip structures | 173 | 1997 | |
5878486 Method of burning-in semiconductor devices | 110 | 1997 | |
5884398 Mounting spring elements on semiconductor devices | 106 | 1997 | |
5983493 Method of temporarily, then permanently, connecting to a semiconductor device | 120 | 1997 | |
5998228 Method of testing semiconductor | 130 | 1997 | |
6032356 Wafer-level test and burn-in, and semiconductor process | 165 | 1997 | |
6184053 Method of making microelectronic spring contact elements | 206 | 1997 | |
5912046 Method and apparatus for applying a layer of flowable coating material to a surface of an electronic component | 81 | 1997 | |
5998864 Stacking semiconductor devices, particularly memory chips | 212 | 1997 | |
6050829 Making discrete power connections to a space transformer of a probe card assembly | 161 | 1997 | |
6307161 Partially-overcoated elongate contact structures | 79 | 1997 | |
6043563 Electronic components with terminals and spring contact elements extending from areas which are remote from the terminals | 168 | 1997 | |
6741085 Contact carriers (tiles) for populating larger substrates with spring contacts | 96 | 1997 | |
6520778 Microelectronic contact structures, and methods of making same | 157 | 1998 | |
6720501 PC board having clustered blind vias | 71 | 1998 | |
6042712 Apparatus for controlling plating over a face of a substrate | 117 | 1998 | |
6090261 Method and apparatus for controlling plating over a face of a substrate | 84 | 1998 | |
6110823 Method of modifying the thickness of a plating on a member by creating a temperature gradient on the member, applications for employing such a method, and structures resulting from such a method | 190 | 1998 | |
6023103 Chip-scale carrier for semiconductor devices including mounted spring contacts | 160 | 1998 | |
6033935 Sockets for "springed" semiconductor devices | 111 | 1998 | |
6669489 Interposer, socket and assembly for socketing an electronic component and method of making and using same | 117 | 1998 | |
6330164 Interconnect assemblies and methods including ancillary electronic component connected in immediate proximity of semiconductor device | 129 | 1998 | |
6029344 Composite interconnection element for microelectronic components, and method of making same | 219 | 1998 | |
6246247 Probe card assembly and kit, and methods of using same | 128 | 1998 | |
6441315 Contact structures with blades having a wiping motion | 128 | 1998 | |
6690185 Large contactor with multiple, aligned contactor units | 140 | 1998 | |
6255126 Lithographic contact elements | 237 | 1998 | |
6268015 Method of making and using lithographic contact springs | 127 | 1998 | |
6150186 Method of making a product with improved material properties by moderate heat-treatment of a metal incorporating a dilute additive | 103 | 1998 | |
6429029 Concurrent design and subsequent partitioning of product and test die | 169 | 1998 | |
6456099 Special contact points for accessing internal circuitry of an integrated circuit | 121 | 1998 | |
6215670 Method for manufacturing raised electrical contact pattern of controlled geometry | 154 | 1999 | |
6208225 Filter structures for integrated circuit interfaces | 158 | 1999 | |
6218910 High bandwidth passive integrated circuit tester probe card assembly | 144 | 1999 | |
6448865 Integrated circuit interconnect system | 75 | 1999 | |
6452411 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses | 110 | 1999 | |
6480978 Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons | 88 | 1999 | |
6499121 Distributed interface for parallel testing of multiple devices using a single tester channel | 101 | 1999 | |
6627483 Method for mounting an electronic component | 102 | 1999 | |
6644982 Method and apparatus for the transport and tracking of an electronic component | 123 | 1999 | |
6887723 Method for processing an integrated circuit including placing dice into a carrier and testing | 76 | 1999 | |
6468098 Electrical contactor especially wafer level contactor using fluid pressure | 99 | 1999 | |
6655023 Method and apparatus for burning-in semiconductor devices in wafer form | 84 | 1999 | |
6827584 Interconnect for microelectronic structures with enhanced spring characteristics | 94 | 1999 | |
6491968 Methods for making spring interconnect structures | 103 | 1999 | |
6672875 Spring interconnect structures | 113 | 1999 | |
6339338 Apparatus for reducing power supply noise in an integrated circuit | 91 | 2000 | |
6168974 Process of mounting spring contacts to semiconductor devices | 115 | 2000 | |
6459343 Integrated circuit interconnect system forming a multi-pole filter | 72 | 2000 | |
6232149 Sockets for "springed" semiconductor devices | 79 | 2000 | |
6509751 Planarizer for a semiconductor contactor | 144 | 2000 | |
6215196 Electronic component with terminals and spring contact elements extending from areas which are remote from the terminals | 72 | 2000 | |
6640432 Method of fabricating shaped springs | 107 | 2000 | |
6677744 System for measuring signal path resistance for an integrated circuit tester interconnect structure | 73 | 2000 | |
6476630 Method for testing signal paths between an integrated circuit wafer and a wafer tester | 75 | 2000 | |
6525555 Wafer-level burn-in and test | 103 | 2000 | |
6727579 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES | 104 | 2000 | |
6685817 Method and apparatus for controlling plating over a face of a substrate | 65 | 2000 | |
6622103 System for calibrating timing of an integrated circuit wafer tester | 94 | 2000 | |
6603323 Closed-grid bus architecture for wafer interconnect structure | 92 | 2000 | |
6727580 Microelectronic spring contact elements | 79 | 2000 | |
6539531 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes | 119 | 2000 | |
6835898 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES | 91 | 2000 | |
6778406 Resilient contact structures for interconnecting electronic devices | 152 | 2000 | |
6475822 Method of making microelectronic contact structures | 92 | 2000 | |
6597187 Special contact points for accessing internal circuitry of an integrated circuit | 78 | 2000 | |
6603324 Special contact points for accessing internal circuitry of an integrated circuit | 72 | 2000 | |
6606575 Cross-correlation timing calibration for wafer-level IC tester interconnect systems | 85 | 2000 | |
6621260 Special contact points for accessing internal circuitry of an integrated circuit | 80 | 2000 | |
6701612 Method and apparatus for shaping spring elements | 90 | 2000 | |
6713374 Interconnect assemblies and methods | 104 | 2000 | |
6836962 Method and apparatus for shaping spring elements | 79 | 2000 | |
6538538 High frequency printed circuit board via | 93 | 2001 | |
6791176 Lithographic contact elements | 80 | 2001 | |
6616966 Method of making lithographic contact springs | 128 | 2001 | |
6780001 Forming tool for forming a contoured microelectronic spring mold | 75 | 2001 | |
6501343 Integrated circuit tester with high bandwidth probe assembly | 94 | 2001 | |
6606014 Filter structures for integrated circuit interfaces | 63 | 2001 | |
6534856 Sockets for "springed" semiconductor devices | 90 | 2001 | |
6910268 Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via | 149 | 2001 | |
6856150 Probe card with coplanar daughter card | 88 | 2001 | |
6627980 Stacked semiconductor device assembly with microelectronic spring contacts | 83 | 2001 | |
6538214 Method for manufacturing raised electrical contact pattern of controlled geometry | 78 | 2001 | |
6882239 Electromagnetically coupled interconnect system | 92 | 2001 | |
6888362 Test head assembly for electronic components with plurality of contoured microelectronic spring contacts | 97 | 2001 | |
6729019 Method of manufacturing a probe card | 112 | 2001 | |
6678876 Process and apparatus for finding paths through a routing space | 92 | 2001 | |
6862727 Process and apparatus for adjusting traces | 72 | 2001 | |
6764869 Method of assembling and testing an electronics module | 71 | 2001 | |
6714828 Method and system for designing a probe card | 74 | 2001 | |
6882546 Multiple die interconnect system | 75 | 2001 | |
6664628 Electronic component overlapping dice of unsingulated semiconductor wafer | 70 | 2001 | |
6456103 Apparatus for reducing power supply noise in an integrated circuit | 90 | 2001 | |
6759311 Fan out of interconnect elements attached to semiconductor wafer | 71 | 2001 | |
6817052 Apparatuses and methods for cleaning test probes | 94 | 2001 | |
6816031 Adjustable delay transmission line | 73 | 2001 | |
6624648 Probe card assembly | 121 | 2001 | |
6777319 Microelectronic spring contact repair | 81 | 2001 | |
6479308 Semiconductor fuse covering | 70 | 2001 | |
6615485 Probe card assembly and kit, and methods of making same | 98 | 2001 | |
6891385 Probe card cooling assembly with direct cooling of active electronic components | 94 | 2001 | |
7002363 Method and system for compensating thermally induced motion of probe cards | 123 | 2001 | |
6741092 Method and system for detecting an arc condition | 63 | 2001 | |
6864105 Method of manufacturing a probe card | 72 | 2002 | |
6680659 Integrated circuit interconnect system | 74 | 2002 | |
6784674 Test signal distribution system for IC tester | 76 | 2002 | |
6798225 Tester channel to multiple IC terminals | 81 | 2002 | |
6825422 Interconnection element with contact blade | 83 | 2002 | |
6812691 Compensation for test signal degradation due to DUT fault | 70 | 2002 | |
6640415 Segmented contactor | 111 | 2002 | |
6657455 Predictive, adaptive power supply for an integrated circuit under test | 83 | 2002 | |
6807734 Microelectronic contact structures, and methods of making same | 79 | 2002 | |
6559671 Efficient parallel testing of semiconductor devices using a known good device to generate expected responses | 75 | 2002 | |
6646520 Integrated circuit interconnect system | 77 | 2002 | |
6839964 Method for manufacturing a multi-layer printed circuit board | 68 | 2002 | |
6686754 Integrated circuit tester with high bandwidth probe assembly | 75 | 2002 | |
6678850 Distributed interface for parallel testing of multiple devices using a single tester channel | 74 | 2002 | |
6818840 Method for manufacturing raised electrical contact pattern of controlled geometry | 68 | 2002 | |
6642625 Sockets for "springed" semiconductor devices | 66 | 2002 | |
6661316 High frequency printed circuit board via | 71 | 2002 | |
6825052 Test assembly including a test die for testing a semiconductor product die | 87 | 2002 | |
6788094 Wafer-level burn-in and test | 78 | 2002 | |
6845491 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes | 73 | 2003 | |
6784677 Closed-grid bus architecture for wafer interconnect structure | 66 | 2003 | |
7342402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features | 25 | 2003 | |
6911835 High performance probe system | 87 | 2003 | |
6838893 Probe card assembly | 75 | 2003 | |
6870381 Insulative covering of probe tips | 64 | 2003 | |
6911814 Apparatus and method for electromechanical testing and validation of probe cards | 79 | 2003 | |
6913468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods | 95 | 2003 | |
6949942 Predictive, adaptive power supply for an integrated circuit under test | 46 | 2003 | |
6822529 Integrated circuit interconnect system | 73 | 2003 | |
6917210 Integrated circuit tester with high bandwidth probe assembly | 69 | 2003 | |
7276922 Closed-grid bus architecture for wafer interconnect structure | 23 | 2004 | |
|
|||
2007/0024,506 Systems and methods for high frequency parallel transmissions | 79 | 2006 | |
|
|||
4891584 Apparatus for making surface photovoltage measurements of a semiconductor | 138 | 1988 | |
|
|||
2003/0088,180 Space-time microwave imaging for cancer detection | 120 | 2002 | |
|
|||
6275043 Test device for testing a module for a data carrier intended for contactless communication | 41 | 1999 | |
|
|||
4696544 Fiberscopic device for inspection of internal sections of construction, and method for using same | 145 | 1985 | |
|
|||
5627473 Connector inspection device | 44 | 1995 | |
|
|||
4357575 Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies | 116 | 1980 | |
|
|||
6388455 Method and apparatus for simulating a surface photo-voltage in a substrate | 42 | 2000 | |
|
|||
2005/0168,722 Device and method for measuring constituents in blood | 47 | 2003 | |
|
|||
6181416 Schlieren method for imaging semiconductor device properties | 84 | 1999 | |
|
|||
5589781 Die carrier apparatus | 74 | 1993 | |
|
|||
6052653 Spreading resistance profiling system | 100 | 1997 | |
|
|||
2005/0142,033 Modular assay plates, reader systems and methods for test measurements | 136 | 2004 | |
|
|||
6784679 Differential coaxial contact array for high-density, high-speed signals | 93 | 2002 | |
|
|||
5841288 Two-dimensional microwave imaging apparatus and methods | 127 | 1997 | |
6448788 Fixed array microwave imaging apparatus and method | 115 | 2000 | |
|
|||
4818059 Optical connector and splicer | 87 | 1987 | |
|
|||
4684884 Universal test circuit for integrated circuit packages | 80 | 1985 | |
|
|||
5367165 Cantilever chip for scanning probe microscope | 78 | 1993 | |
6006002 Rigid sleeve device fitted over a flexible insertion section of an endoscope for inspecting industrial equipment | 56 | 1995 | |
6811406 Microelectronic spring with additional protruding member | 206 | 2001 | |
|
|||
4894612 Soft probe for providing high speed on-wafer connections to a circuit | 159 | 1988 | |
|
|||
4487996 Shielded electrical cable | 108 | 1982 | |
|
|||
6407542 Implementation of a multi-port modal decomposition system | 42 | 2000 | |
|
|||
6940283 Detecting field from different ignition coils using adjustable probe | 55 | 2003 | |
|
|||
5656942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane | 111 | 1995 | |
6096567 Method and apparatus for direct probe sensing | 146 | 1997 | |
6320372 Apparatus and method for testing a substrate having a plurality of terminals | 102 | 1999 | |
|
|||
7015711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method | 107 | 2004 | |
|
|||
5148131 Coaxial-to-waveguide transducer with improved matching | 43 | 1991 | |
|
|||
7315175 Probe apparatus and method for examining a sample | 21 | 2002 | |
|
|||
5266963 Integrated antenna/mixer for the microwave and millimetric wavebands | 54 | 1991 | |
|
|||
6816840 System and method of sending messages to a group of electronic price labels | 37 | 1998 | |
|
|||
6078183 Thermally-induced voltage alteration for integrated circuit analysis | 132 | 1998 | |
|
|||
7030827 Planar antenna and antenna system | 75 | 2004 | |
|
|||
5900737 Method and apparatus for automated docking of a test head to a device handler | 116 | 1996 | |
6259260 Apparatus for coupling a test head and probe card in a wafer testing system | 11 | 1998 | |
|
|||
2004/0147,034 Method and apparatus for measuring a substance in a biological sample | 144 | 2003 | |
|
|||
4589815 Electronic test head positioner for test systems | 50 | 1983 | |
4705447 Electronic test head positioner for test systems | 139 | 1985 | |
|
|||
6528993 Magneto-optical microscope magnetometer | 81 | 2000 | |
|
|||
6481939 Tool tip conductivity contact sensor and method | 92 | 2001 | |
|
|||
2005/0229,053 Circuit and method for low frequency testing of high frequency signal waveforms | 31 | 2004 | |
|
|||
5867073 Waveguide to transmission line transition | 87 | 1994 | |
|
|||
7319337 Method and apparatus for pad aligned multiprobe wafer testing | 20 | 2007 | |
|
|||
4766384 Well logging apparatus for determining dip, azimuth, and invaded zone conductivity | 101 | 1986 | |
|
|||
6201453 H-plane hermetic sealed waveguide probe | 20 | 1998 | |
6731804 Thermal luminescence liquid monitoring system and method | 82 | 2000 | |
|
|||
5469324 Integrated decoupling capacitive core for a printed circuit board and method of making same | 122 | 1994 | |
|
|||
4754239 Waveguide to stripline transition assembly | 92 | 1986 | |
5631571 Infrared receiver wafer level probe testing | 149 | 1996 | |
6215295 Photonic field probe and calibration means thereof | 115 | 1998 | |
2003/0170,898 Method for intracellular modifications within living cells using pulsed electric fields | 133 | 2002 | |
|
|||
6605955 Temperature controlled wafer chuck system with low thermal resistance | 116 | 2000 | |
|
|||
6621082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function | 101 | 2002 | |
|
|||
5833601 Methodology for determining oxygen in biological systems | 85 | 1997 | |
|
|||
6927586 Temperature compensated vertical pin probing device | 63 | 2003 | |
|
|||
6914430 NMR probe | 59 | 2004 | |
|
|||
5916689 Electrostatic chuck with an impregnated, porous layer that exhibits the Johnson-Rahbeck effect | 134 | 1996 | |
5874361 Method of processing a wafer within a reaction chamber | 108 | 1996 | |
6257564 Vacuum chuck having vacuum-nipples wafer support | 109 | 1998 | |
6232787 Microstructure defect detection | 165 | 1999 | |
7319335 Configurable prober for TFT LCD array testing | 20 | 2004 | |
|
|||
6409724 Electrosurgical instrument | 407 | 2000 | |
|
|||
4998062 Probe device having micro-strip line structure | 92 | 1989 | |
5084671 Electric probing-test machine having a cooling system | 198 | 1990 | |
5091692 Probing test device | 117 | 1990 | |
5198752 Electric probing-test machine having a cooling system | 156 | 1991 | |
5315237 Touch sensor unit of prober for testing electric circuit and electric circuit testing apparatus using the touch sensor unit | 114 | 1991 | |
5321352 Probe apparatus and method of alignment for the same | 133 | 1992 | |
5321453 Probe apparatus for probing an object held above the probe card | 103 | 1992 | |
5635846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer | 214 | 1993 | |
5404111 Probe apparatus with a swinging holder for an object of examination | 114 | 1993 | |
5517126 Probe apparatus | 135 | 1993 | |
5521522 Probe apparatus for testing multiple integrated circuit dies | 144 | 1993 | |
5539676 Method of identifying probe position and probing method in prober | 94 | 1994 | |
5811982 High density cantilevered probe for electronic devices | 200 | 1996 | |
5777485 Probe method and apparatus with improved probe contact | 119 | 1996 | |
5910727 Electrical inspecting apparatus with ventilation system | 90 | 1996 | |
5821763 Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof | 245 | 1996 | |
5804983 Probe apparatus with tilt correction mechanisms | 153 | 1997 | |
6334247 High density integrated circuit apparatus, test probe and methods of use thereof | 167 | 1997 | |
5914614 High density cantilevered probe for electronic devices | 98 | 1997 | |
5999268 Apparatus for aligning a semiconductor wafer with an inspection contactor | 123 | 1997 | |
6060892 Probe card attaching mechanism | 100 | 1997 | |
6300780 High density integrated circuit apparatus, test probe and methods of use thereof | 144 | 1998 | |
6124725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer | 138 | 1998 | |
6329827 High density cantilevered probe for electronic devices | 76 | 1998 | |
6414478 Transfer mechanism for use in exchange of probe card | 80 | 2000 | |
6722032 Method of forming a structure for electronic devices contact locations | 64 | 2001 | |
7005842 Probe cartridge assembly and multi-probe assembly | 93 | 2001 | |
6933736 Prober | 58 | 2003 | |
6927587 Probe apparatus | 66 | 2003 | |
6906542 Probing method and prober | 61 | 2003 | |
6794888 Probe device | 76 | 2003 | |
7026832 Probe mark reading device and probe mark reading method | 96 | 2003 | |
7009415 Probing method and probing apparatus | 95 | 2004 | |
7023226 Probe pins zero-point detecting method, and prober | 93 | 2004 | |
7332918 Prober and probe testing method for temperature-controlling object to be tested | 30 | 2005 | |
|
|||
5280156 Wafer heating apparatus and with ceramic substrate and dielectric layer having electrostatic chucking means | 224 | 1991 | |
6001760 Aluminum nitride sintered body, metal embedded article, electronic functional material and electrostatic chuck | 118 | 1997 | |
|
|||
4593243 Coplanar and stripline probe card apparatus | 115 | 1984 | |
|
|||
6572608 Directional laser probe | 132 | 2000 | |
|
|||
6909300 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips | 56 | 2002 | |
6902941 Probing of device elements | 100 | 2003 | |
|
|||
6937341 System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation | 86 | 2002 | |
|
|||
5824494 Method for enumerating bacterial populations | 101 | 1995 | |
|
|||
6914244 Ion beam milling system and method for electron microscopy specimen preparation | 90 | 2004 | |
|
|||
5617035 Method for testing integrated devices | 110 | 1995 | |
|
|||
5756908 Probe positioner | 42 | 1996 | |
|
|||
5523694 Integrated circuit failure analysis by low-energy charge-induced voltage alteration | 122 | 1994 | |
6307672 Microscope collision protection apparatus | 82 | 1996 | |
|
|||
5233306 Method and apparatus for measuring the permittivity of materials | 133 | 1991 | |
|
|||
4706050 Microstrip devices | 108 | 1985 | |
|
|||
5166893 Portable apparatus having a voltage converter unit removable from a base unit having a removable display unit | 46 | 1992 | |
5491425 Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same | 10 | 1994 | |
6605941 Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes | 51 | 2001 | |
7032307 Method for fabricating a probe pin for testing electrical characteristics of an apparatus | 93 | 2004 | |
|
|||
6912468 Method and apparatus for contemporaneous utilization of a higher order probe in pre-stack and post-stack seismic domains | 66 | 2003 | |
|
|||
4346355 Radio frequency energy launcher | 96 | 1980 | |
4502028 Programmable two-port microwave network | 35 | 1982 | |
5069628 Flexible electrical cable connector with double sided dots | 72 | 1990 | |
5395253 Membrane connector with stretch induced micro scrub | 116 | 1993 | |
5600256 Cast elastomer/membrane test probe assembly | 78 | 1995 | |
6211837 Dual-window high-power conical horn antenna | 184 | 1999 | |
|
|||
4755746 Apparatus and methods for semiconductor wafer testing | 156 | 1985 | |
5852232 Acoustic sensor as proximity detector | 145 | 1997 | |
|
|||
4520314 Probe head arrangement for conductor line testing with at least one probe head comprising a plurality of resilient contacts | 39 | 1982 | |
4744041 Method for testing DC motors | 119 | 1985 | |
4851767 Detachable high-speed opto-electronic sampling probe | 31 | 1988 | |
4831494 Multilayer capacitor | 160 | 1988 | |
4922128 Boost clock circuit for driving redundant wordlines and sample wordlines | 80 | 1989 | |
4987100 Flexible carrier for an electronic device | 82 | 1989 | |
5001423 Dry interface thermal chuck temperature control system for semiconductor wafer testing | 136 | 1990 | |
5007163 Non-destructure method of performing electrical burn-in testing of semiconductor chips | 68 | 1990 | |
5207585 Thin interface pellicle for dense arrays of electrical interconnects | 180 | 1990 | |
5061192 High density connector | 154 | 1990 | |
5334931 Molded test probe assembly | 93 | 1991 | |
5371654 Three dimensional high performance interconnection package | 342 | 1992 | |
5537372 High density data storage system with topographic contact sensor | 115 | 1993 | |
5531022 Method of forming a three dimensional high performance interconnection package | 230 | 1994 | |
5532608 Ceramic probe card and method for reducing leakage current | 66 | 1995 | |
5804982 Miniature probe positioning actuator | 106 | 1995 | |
5726211 Process for making a foamed elastometric polymer | 103 | 1996 | |
5756021 Electronic devices comprising dielectric foamed polymers | 89 | 1996 | |
5700844 Process for making a foamed polymer | 149 | 1996 | |
5723347 Semi-conductor chip test probe and process for manufacturing the probe | 108 | 1996 | |
5838160 Integral rigid chip test probe | 83 | 1996 | |
5926029 Ultra fine probe contacts | 108 | 1997 | |
6059982 Micro probe assembly and method of fabrication | 152 | 1997 | |
5804607 Process for making a foamed elastomeric polymer | 121 | 1997 | |
6104201 Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage | 72 | 1998 | |
6206273 Structures and processes to create a desired probetip contact geometry on a wafer test probe | 141 | 1999 | |
6943571 Reduction of positional errors in a four point probe resistance measurement | 62 | 2003 | |
7007380 TFI probe I/O wrap test method | 93 | 2004 | |
|
|||
6946864 Method for measuring product parameters of components formed on a wafer and device for performing the method | 20 | 2002 | |
|
|||
6396296 Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station | 103 | 2000 | |
|
|||
4926172 Joystick controller | 57 | 1988 | |
|
|||
5020219 Method of making a flexible tester surface for testing integrated circuits | 212 | 1989 | |
5453404 Method for making an interconnection structure for integrated circuits | 135 | 1994 | |
|
|||
6987483 Effectively balanced dipole microstrip antenna | 81 | 2003 | |
|
|||
6066911 Ultrasonic driving element | 125 | 1998 | |
6948981 Compact coupler plug, particularly for a planar broadband lambda probe, in which single-conductor seals are prevented from being lost | 55 | 2002 | |
|
|||
5214374 Dual level test fixture | 106 | 1991 | |
|
|||
5854608 Helical antenna having a solid dielectric core | 253 | 1994 | |
6181297 Antenna | 109 | 1998 | |
6424316 Helical antenna | 91 | 2000 | |
|
|||
5642298 Wafer testing and self-calibration system | 117 | 1996 | |
|
|||
7006046 Low cost electronic probe devices manufactured from conductive loaded resin-based materials | 95 | 2004 | |
|
|||
2002/0197,174 Electrical pump, and method for using plurality of submersible electrical pumps for well completion | 0 | 2002 | |
|
|||
2003/0234,659 Electrical isolation between pins sharing the same tester channel | 17 | 2002 | |
|
|||
4972073 Light wave conductor-bending sensor with sliding rails for monitoring bridge structures or the like | 47 | 1990 | |
|
|||
6114865 Device for electrically contacting a floating semiconductor wafer having an insulating film | 112 | 1999 | |
|
|||
5846708 Optical and electrical methods and apparatus for molecule detection | 439 | 1992 | |
|
|||
7015703 Radio frequency Langmuir probe | 103 | 2004 | |
|
|||
5369368 Device for determining material parameters by means of microwave measurements | 81 | 1993 | |
|
|||
4755874 Emission microscopy system | 167 | 1987 | |
|
|||
4853627 Wafer probes | 105 | 1988 | |
|
|||
4991290 Flexible electrical interconnect and method of making | 123 | 1989 | |
5170930 Liquid metal paste for thermal and electrical connections | 92 | 1991 | |
|
|||
5550481 Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making | 42 | 1995 | |
|
|||
6778140 Atch horn antenna of dual frequency | 73 | 2003 | |
|
|||
4651115 Waveguide-to-microstrip transition | 82 | 1985 | |
|
|||
6351885 Method of making conductive bump on wiring board | 64 | 1998 | |
|
|||
6927598 Test probe for electrical devices having low or no wedge depression | 58 | 2003 | |
6911826 Pulsed eddy current sensor probes and inspection methods | 65 | 2003 | |
7015690 Omnidirectional eddy current probe and inspection system | 100 | 2004 | |
|
|||
5500606 Completely wireless dual-access test fixture | 116 | 1993 | |
|
|||
5159264 Pneumatic energy fluxmeter | 80 | 1991 | |
5159267 Pneumatic energy fluxmeter | 82 | 1992 | |
|
|||
5704355 Non-invasive system for breast cancer detection | 153 | 1995 | |
5829437 Microwave method and system to detect and locate cancers in heterogenous tissues | 147 | 1996 | |
6061589 Microwave antenna for cancer detection system | 141 | 1997 | |
|
|||
6710798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card | 118 | 1999 | |
|
|||
4551747 Leadless chip carrier apparatus providing for a transmission line environment and improved heat dissipation | 129 | 1982 | |
|
|||
5539323 Sensor for articles such as wafers on end effector | 126 | 1993 | |
|
|||
6922069 Needle assembly of probe card | 65 | 2003 | |
7014499 Probe card for testing semiconductor device | 97 | 2005 | |
|
|||
6335625 Programmable active microwave ultrafine resonance spectrometer (PAMURS) method and systems | 88 | 2000 | |
|
|||
4810981 Assembly of microwave components | 91 | 1987 | |
|
|||
7034553 Direct resistance measurement corrosion probe | 96 | 2003 | |
|
|||
6415858 Temperature control system for a workpiece chuck | 99 | 1997 | |
|
|||
4515439 Attachment of microscope objectives | 82 | 1982 | |
|
|||
5097207 Temperature stable cryogenic probe station | 107 | 1989 | |
5160883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support | 96 | 1990 | |
5166606 High efficiency cryogenic test station | 95 | 1990 | |
|
|||
4727391 Sheet film package and device for loading sheet films | 82 | 1987 | |
|
|||
6549022 Apparatus and method for analyzing functional failures in integrated circuits | 132 | 2000 | |
|
|||
6933725 NMR probe circuit for generating close frequency resonances | 62 | 2004 | |
|
|||
6512482 Method and apparatus using a semiconductor die integrated antenna structure | 94 | 2001 | |
|
|||
5202558 Flexible fiber optic probe for high-pressure shock experiments | 103 | 1992 | |
|
|||
6927078 Method of measuring contact resistance of probe and method of testing semiconductor device | 62 | 2003 | |
|
|||
6812718 Massively parallel interface for electronic circuits | 113 | 2001 | |
6917525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs | 116 | 2002 | |
|
|||
4568890 Microwave oscillator injection locked at its fundamental frequency for producing a harmonic frequency output | 23 | 1983 | |
4663840 Method of interconnecting conductors of different layers of a multilayer printed circuit board | 74 | 1985 | |
|
|||
6476442 Pseudo-Schottky diode | 103 | 1998 | |
|
|||
* 5629838 Apparatus for non-conductively interconnecting integrated circuits using half capacitors | 201 | 1994 | |
|
|||
6937020 Solid-state nuclear magnetic resonance probe | 65 | 2004 | |
|
|||
2001/0043,073 PROBER INTERFACE PLATE | 74 | 1999 | |
|
|||
4528504 Pulsed linear integrated circuit tester | 98 | 1982 | |
|
|||
5361049 Transition from double-ridge waveguide to suspended substrate | 52 | 1986 | |
5091732 Lightweight deployable antenna system | 89 | 1990 | |
5430813 Mode-matched, combination taper fiber optic probe | 60 | 1993 | |
6940264 Near field probe | 60 | 2004 | |
|
|||
4739259 Telescoping pin probe | 100 | 1986 | |
4673839 Piezoelectric pressure sensing apparatus for integrated circuit testing stations | 125 | 1986 | |
4734641 Method for the thermal characterization of semiconductor packaging systems | 60 | 1987 | |
4749942 Wafer probe head | 84 | 1987 | |
4912399 Multiple lead probe for integrated circuits in wafer form | 122 | 1987 | |
4783625 Wideband high impedance card mountable probe | 95 | 1988 | |
4965514 Apparatus for probing a microwave circuit | 18 | 1989 | |
5059898 Wafer probe with transparent loading member | 78 | 1990 | |
5136237 Double insulated floating high voltage test probe | 108 | 1991 | |
5412330 Optical module for an optically based measurement system | 95 | 1993 | |
6447339 Adapter for a multi-channel signal probe | 87 | 2001 | |
6701265 Calibration for vector network analyzer | 94 | 2002 | |
|
|||
4375631 Joystick control | 63 | 1981 | |
|
|||
4780670 Active probe card for high resolution/low noise wafer level testing | 135 | 1985 | |
6352454 Wear-resistant spring contacts | 85 | 1999 | |
|
|||
7015455 Near-field optical probe | 93 | 2005 | |
|
|||
4893914 Test station | 113 | 1988 | |
5892539 Portable emission microscope workstation for failure analysis | 127 | 1995 | |
6744268 High resolution analytical probe station | 126 | 2002 | |
6917195 Wafer probe station | 57 | 2004 | |
|
|||
7019701 Antenna device mounted on vehicle | 89 | 2004 | |
6900647 Contact probe and probe device | 105 | 2004 | |
6903563 Contact probe and probe device | 100 | 2004 | |
6917211 Contact probe and probe device | 57 | 2004 | |
6919732 Contact probe and probe device | 58 | 2004 | |
6937042 Contact probe and probe device | 58 | 2004 | |
7015710 Contact probe and probe device | 97 | 2004 | |
|
|||
5408189 Test fixture alignment system for printed circuit boards | 149 | 1992 | |
5289117 Testing of integrated circuit devices on loaded printed circuit | 54 | 1992 | |
5389885 Expandable diaphragm test modules and connectors | 97 | 1993 | |
6181149 Grid array package test contactor | 107 | 1996 | |
6064218 Peripherally leaded package test contactor | 106 | 1997 | |
|
|||
4468629 NPN Operational amplifier | 80 | 1982 | |
5126696 W-Band waveguide variable controlled oscillator | 42 | 1991 | |
|
|||
4652082 Angled electro optic connector | 56 | 1984 | |
|
|||
4788851 Pressure vessel incorporating a sensor for detecting liquid in a gas chamber | 44 | 1987 | |
|
|||
4636772 Multiple function type D/A converter | 50 | 1985 | |
|
|||
6906506 Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe | 57 | 2002 | |
|
|||
6902416 High density probe device | 75 | 2002 | |
|
|||
2004/0021,475 Wafer prober | 82 | 2003 | |
2004/0134,899 Ceramic substrate for a semiconductor-production/inspection device | 80 | 2003 | |
2004/0207,072 Ceramic substrate for a semiconductor producing/examining device | 85 | 2004 | |
|
|||
5996102 Assembly and method for testing integrated circuit devices | 92 | 1997 | |
|
|||
6924655 Probe card for use with microelectronic components, and methods for making same | 57 | 2003 | |
|
|||
6727716 Probe card and probe needle for high frequency testing | 97 | 2002 | |
|
|||
7003184 Fiber optic probes | 110 | 2001 | |
|
|||
4837507 High frequency in-circuit test fixture | 76 | 1987 | |
|
|||
5233197 High speed digital imaging microscope | 114 | 1991 | |
|
|||
6753679 Test point monitor using embedded passive resistance | 84 | 2002 | |
|
|||
4727637 Computer aided connector assembly method and apparatus | 114 | 1987 | |
5202648 Hermetic waveguide-to-microstrip transition module | 63 | 1991 | |
6914427 Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method | 65 | 2003 | |
|
|||
6809533 Quantitative imaging of dielectric permittivity and tunability | 79 | 2002 | |
|
|||
4425395 Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production | 105 | 1982 | |
|
|||
4626618 DC electric power cable | 99 | 1985 | |
|
|||
5397855 Low noise cable | 95 | 1993 | |
|
|||
6211663 Baseband time-domain waveform measurement method | 119 | 1999 | |
6396298 Active feedback pulsed measurement method | 97 | 2000 | |
|
|||
6278411 Horn antenna | 80 | 1999 | |
|
|||
4621169 Electric cable construction and uses therefor | 100 | 1985 | |
|
|||
5041782 Microstrip probe | 96 | 1989 | |
|
|||
4552033 Drive system for a microscope stage or the like | 110 | 1984 | |
|
|||
5505150 Method and apparatus for facilitating loop take time adjustment in multi-needle quilting machine | 87 | 1994 | |
|
|||
4714873 Microwave noise measuring apparatus | 49 | 1986 | |
|
|||
6653903 Supply voltage decoupling device for HF amplifier circuits | 73 | 2001 | |
|
|||
5728091 Optical fiber for myocardial channel formation | 59 | 1995 | |
|
|||
6100815 Compound switching matrix for probing and interconnecting devices under test to measurement equipment | 122 | 1997 | |
|
|||
5451884 Electronic component temperature test system with flat ring revolving carriage | 103 | 1993 | |
|
|||
4567436 Magnetic thickness gauge with adjustable probe | 34 | 1982 | |
|
|||
5481196 Process and apparatus for microwave diagnostics and therapy | 85 | 1994 | |
|
|||
4725793 Waveguide-microstrip line converter | 89 | 1986 | |
|
|||
5481936 Rotary drive positioning system for an indexing table | 115 | 1994 | |
|
|||
6054869 Bi-level test fixture for testing printed circuit boards | 97 | 1998 | |
|
|||
6265950 Transition from a waveguide to a strip transmission line | 95 | 1999 | |
|
|||
5944093 Pickup chuck with an integral heat pipe | 104 | 1997 | |
7020363 Optical probe for wafer testing | 101 | 2001 | |
6856129 Current probe device having an integrated amplifier | 92 | 2002 | |
2006/0052,075 Testing integrated circuits using high bandwidth wireless technology | 78 | 2004 | |
2007/0145,989 Probe card with improved transient power delivery | 28 | 2005 | |
|
|||
5803607 Method and apparatus for measurement of unsteady gas temperatures | 44 | 1997 | |
|
|||
4636722 High density probe-head with isolated and shielded transmission lines | 159 | 1984 | |
|
|||
5134365 Probe card in which contact pressure and relative position of each probe end are correctly maintained | 88 | 1991 | |
|
|||
4871964 Integrated circuit probing apparatus | 104 | 1988 | |
5373231 Integrated circuit probing apparatus including a capacitor bypass structure | 131 | 1993 | |
6603322 Probe card for high speed testing | 106 | 1996 | |
6118287 Probe tip structure | 104 | 1997 | |
|
|||
6707548 Systems and methods for filter based spectrographic analysis | 113 | 2001 | |
|
|||
5528158 Probe card changer system and method | 105 | 1994 | |
5506498 Probe card system and method | 98 | 1995 | |
6166553 Prober-tester electrical interface for semiconductor test | 100 | 1998 | |
|
|||
2005/0068,054 Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies | 30 | 2004 | |
|
|||
6049216 Contact type prober automatic alignment | 94 | 1997 | |
7012441 High conducting thin-film nanoprobe card and its fabrication method | 106 | 2003 | |
|
|||
5653939 Optical and electrical methods and apparatus for molecule detection | 488 | 1995 | |
5998768 Active thermal control of surfaces by steering heating beam in response to sensed thermal radiation | 110 | 1998 | |
|
|||
4669805 High frequency connector | 59 | 1985 | |
6114864 Probe card with plural probe tips on a unitary flexible tongue | 111 | 1997 | |
6310483 Longitudinal type high frequency probe for narrow pitched electrodes | 103 | 1998 | |
6281691 Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable | 103 | 1999 | |
6400168 Method for fabricating probe tip portion composed by coaxial cable | 104 | 2001 | |
|
|||
6091236 System and method for measuring and analyzing electrical signals on the shaft of a machine | 97 | 1997 | |
|
|||
2003/0072,549 Method and apparatus for dielectric spectroscopy of biological solutions | 121 | 2002 | |
|
|||
5116180 Human-in-the-loop machine control loop | 272 | 1990 | |
|
|||
5021186 Chloroisocyanuric acid composition having storage stability | 77 | 1989 | |
|
|||
6320396 Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device | 100 | 1997 | |
|
|||
5807107 Dental infection control system | 94 | 1996 | |
|
|||
6946859 Probe structures using clamped substrates with compliant interconnectors | 50 | 2003 | |
|
|||
5676360 Machine tool rotary table locking apparatus | 118 | 1995 | |
|
|||
5905421 Apparatus for measuring and/or injecting high frequency signals in integrated systems | 80 | 1997 | |
6169410 Wafer probe with built in RF frequency conversion module | 85 | 1998 | |
6529844 Vector network measurement system | 118 | 1999 | |
6943563 Probe tone S-parameter measurements | 59 | 2002 | |
|
|||
7188037 Method and apparatus for testing circuit boards | 92 | 2004 | |
|
|||
6147502 Method and apparatus for measuring butterfat and protein content using microwave absorption techniques | 81 | 1998 | |
|
|||
5281364 Liquid metal electrical contact compositions | 14 | 1992 | |
|
|||
5584120 Method of manufacturing printed circuits | 80 | 1994 | |
|
|||
4567321 Flexible flat cable | 104 | 1984 | |
|
|||
6384614 Single tip Kelvin probe | 103 | 2000 | |
|
|||
4340860 Integrated circuit carrier package test probe | 67 | 1980 | |
|
|||
4649339 Integrated circuit interface | 116 | 1984 | |
|
|||
6118894 Integrated circuit probe card inspection system | 120 | 1997 | |
|
|||
6900652 Flexible membrane probe and method of use thereof | 106 | 2003 | |
7023231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof | 94 | 2004 | |
|
|||
5792668 Radio frequency spectral analysis for in-vitro or in-vivo environments | 221 | 1996 | |
|
|||
5811751 Multi-wavelength laser system, probe station and laser cutter system using the same | 141 | 1997 | |
6573702 Method and apparatus for cleaning electronic test contacts | 104 | 1997 | |
5963364 Multi-wavelength variable attenuator and half wave plate | 120 | 1997 | |
|
|||
4975638 Test probe assembly for testing integrated circuit devices | 155 | 1989 | |
5355079 Probe assembly for testing integrated circuit devices | 109 | 1993 | |
5959461 Probe station adapter for backside emission inspection | 123 | 1997 | |
6031383 Probe station for low current, low voltage parametric measurements using multiple probes | 110 | 1998 | |
|
|||
6970001 Variable impedance test probe | 74 | 2003 | |
6900653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof | 106 | 2003 | |
6909297 Probe card | 56 | 2004 | |
|
|||
2003/0119,057 Forming and modifying dielectrically-engineered microparticles | 137 | 2001 | |
|
|||
6933717 Sensors and probes for mapping electromagnetic fields | 62 | 2004 | |
|
|||
6937037 Probe card assembly for contacting a device with raised contact elements | 65 | 2002 | |
|
|||
6028435 Semiconductor device evaluation system using optical fiber | 108 | 1997 | |
6160407 Inspection method and wiring current observation method for semiconductor device and apparatus of the same | 98 | 1998 | |
6900646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof | 97 | 2002 | |
6551884 Semiconductor device including gate insulation films having different thicknesses | 71 | 2002 | |
|
|||
6490471 Electromagnetical imaging and therapeutic (EMIT) systems | 98 | 2001 | |
|
|||
5888075 Auxiliary apparatus for testing device | 78 | 1997 | |
6019612 Electrical connecting apparatus for electrically connecting a device to be tested | 87 | 1998 | |
|
|||
5441690 Process of making pinless connector | 76 | 1993 | |
5810607 Interconnector with contact pads having enhanced durability | 190 | 1995 | |
5785538 High density test probe with rigid surface structure | 117 | 1996 | |
6268016 Manufacturing computer systems with fine line circuitized substrates | 68 | 1996 | |
6286208 Interconnector with contact pads having enhanced durability | 88 | 1996 | |
6054651 Foamed elastomers for wafer probing applications and interposer connectors | 82 | 1996 | |
6091255 System and method for tasking processing modules based upon temperature | 143 | 1998 | |
6062879 High density test probe with rigid surface structure | 119 | 1998 | |
6332270 Method of making high density integral test probe | 159 | 1998 | |
6608494 Single point high resolution time resolved photoemission microscopy system and method | 111 | 1998 | |
6452406 Probe structure having a plurality of discrete insulated probe tips | 82 | 1999 | |
6528984 Integrated compliant probe for wafer level test and burn-in | 115 | 1999 | |
6483327 Quadrant avalanche photodiode time-resolved detection | 110 | 1999 | |
6724928 Real-time photoemission detection system | 97 | 2000 | |
6488405 Flip chip defect analysis using liquid crystal | 103 | 2000 | |
6526655 Angled flying lead wire bonding process | 134 | 2001 | |
6617862 Laser intrusive technique for locating specific integrated circuit current paths | 98 | 2002 | |
6788093 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies | 110 | 2002 | |
7022976 Dynamically adjustable probe tips | 98 | 2003 | |
7011531 Membrane probe with anchored elements | 93 | 2005 | |
7005879 Device for probe card power bus noise reduction | 94 | 2005 | |
|
|||
6627461 Method and apparatus for detection of molecular events using temperature control of detection environment | 101 | 2001 | |
|
|||
6927079 Method for probing a semiconductor wafer | 105 | 2000 | |
6605951 Interconnector and method of connecting probes to a die for functional analysis | 109 | 2000 | |
6617866 Apparatus and method of protecting a probe card during a sort sequence | 36 | 2001 | |
7023225 Wafer-mounted micro-probing platform | 95 | 2003 | |
|
|||
5982166 Method for measuring a characteristic of a semiconductor wafer using cylindrical control | 108 | 1997 | |
|
|||
4697143 Wafer probe | 204 | 1984 | |
4764723 Wafer probe | 91 | 1986 | |
4827211 Wafer probe | 127 | 1987 | |
4858160 System for setting reference reactance for vector corrected measurements | 99 | 1988 | |
4849689 Microwave wafer probe having replaceable probe tip | 128 | 1988 | |
5012186 Electrical probe with contact force protection | 42 | 1990 | |
5045781 High-frequency active probe having replaceable contact needles | 110 | 1991 | |
5101453 Fiber optic wafer probe | 103 | 1991 | |
5266889 Wafer probe station with integrated environment control enclosure | 136 | 1992 | |
5457398 Wafer probe station having full guarding | 123 | 1993 | |
5506515 High-frequency probe tip assembly | 160 | 1994 | |
5610529 Probe station having conductive coating added to thermal chuck insulator | 139 | 1995 | |
5565788 Coaxial wafer probe with tip shielding | 149 | 1995 | |
5729150 Low-current probe card with reduced triboelectric current generating cables | 139 | 1995 | |
5914613 Membrane probing system with local contact scrub | 122 | 1996 | |
6232788 Wafer probe station for low-current measurements | 88 | 1997 | |
6232789 Probe holder for low current measurements | 87 | 1997 | |
6034533 Low-current pogo probe card | 113 | 1997 | |
6137302 Low-current probe card with reduced triboelectric current generating cables | 114 | 1997 | |
6256882 Membrane probing system | 81 | 1998 | |
6578264 Method for constructing a membrane probe using a depression | 80 | 2000 | |
6384615 Probe holder for low current measurements | 42 | 2001 | |
6549106 Waveguide with adjustable backshort | 219 | 2001 | |
7233160 Wafer probe | 23 | 2001 | |
6496024 Probe holder for testing of a test device | 38 | 2002 | |
6850082 Probe holder for testing of a test device | 37 | 2002 | |
6724205 Probe for combined signals | 98 | 2002 | |
6815963 Probe for testing a device under test | 65 | 2003 | |
6806724 Probe for combined signals | 95 | 2003 | |
7161363 Probe for testing a device under test | 35 | 2004 | |
6930498 Membrane probing system | 59 | 2004 | |
7009383 Wafer probe station having environment control enclosure | 94 | 2004 | |
7187188 Chuck with integrated wafer support | 80 | 2004 | |
2006/0184,041 System for testing semiconductors | 34 | 2006 | |
7332923 Test probe for high-frequency measurement | 23 | 2006 | |
7271603 Shielded probe for testing a device under test | 35 | 2006 | |
7403028 Test structure and probe for differential signals | 25 | 2007 | |
2008/0111,571 Membrane probing system | 11 | 2008 | |
|
|||
4757255 Environmental box for automated wafer probing | 194 | 1986 | |
5814847 General purpose assembly programmable multi-chip package substrate | 98 | 1996 | |
5883522 Apparatus and method for retaining a semiconductor wafer during testing | 107 | 1996 | |
7096133 Method of establishing benchmark for figure of merit indicative of amplifier flicker noise | 73 | 2005 | |
|
|||
7013221 Iterative probe design and detailed expression profiling with flexible in-situ synthesis arrays | 96 | 2000 | |
|
|||
7015709 Ultra-broadband differential voltage probes | 103 | 2004 | |
|
|||
6184845 Dielectric-loaded antenna | 142 | 1997 | |
6369776 Antenna | 92 | 1999 | |
6914580 Dielectrically-loaded antenna | 83 | 2003 | |
|
|||
4853624 Tunable microwave wafer probe | 93 | 1988 | |
|
|||
2005/0165,316 Method for detecting artifacts in data | 78 | 2004 | |
|
|||
6229327 Broadband impedance matching probe | 218 | 1997 | |
|
|||
4401945 Apparatus for detecting the position of a probe relative to a workpiece | 97 | 1981 | |
|
|||
5688618 Millimeter wave device and method of making | 42 | 1995 | |
|
|||
5633780 Electrostatic discharge protection device | 134 | 1996 | |
|
|||
2004/0100,276 Method and apparatus for calibration of a vector network analyzer | 101 | 2002 | |
|
|||
5383787 Integrated circuit package with direct access to internal signals | 67 | 1993 | |
|
|||
6222970 Methods and apparatus for filtering an optical fiber | 158 | 1999 | |
|
|||
6628980 Apparatus, systems, and methods for in vivo magnetic resonance imaging | 201 | 2001 | |
|
|||
5245292 Method and apparatus for sensing a fluid handling | 75 | 1992 | |
|
|||
4685150 Tuning of a resonant circuit in a communications receiver | 53 | 1984 | |
|
|||
6937045 Shielded integrated circuit probe | 66 | 2004 | |
|
|||
4653174 Method of making packaged IC chip | 28 | 1986 | |
|
|||
4793814 Electrical circuit board interconnect | 330 | 1986 | |
|
|||
6340895 Wafer-level burn-in and test cartridge | 107 | 1999 | |
6580283 Wafer level burn-in and test methods | 89 | 1999 | |
|
|||
2002/0050,828 Multi-feed microwave reflective resonant sensors | 81 | 2001 | |
|
|||
6798226 Multiple local probe measuring device and method | 94 | 2002 | |
6943574 Multiple local probe measuring device and method | 64 | 2004 | |
|
|||
4998063 Fiber optic coupled magneto-optic sensor having a concave reflective focusing surface | 39 | 1989 | |
|
|||
5879289 Hand-held portable endoscopic camera | 183 | 1996 | |
|
|||
6013586 Tent material product and method of making tent material product | 91 | 1997 | |
|
|||
5813847 Device and method for injecting fuels into compressed gaseous media | 80 | 1996 | |
|
|||
2004/0175,294 Apparatus and method for analysing a biological sample in response to microwave radiation | 77 | 2004 | |
|
|||
5530372 Method of probing a net of an IC at an optimal probe-point | 119 | 1994 | |
5675499 Optimal probe point placement | 111 | 1996 | |
|
|||
2005/0186,696 Gas flowmeter and manufacturing method thereof | 0 | 2005 | |
|
|||
5841342 Voltage controlled superconducting microwave switch and method of operation thereof | 43 | 1995 | |
|
|||
6582979 Structure and method for fabrication of a leadless chip carrier with embedded antenna | 93 | 2001 | |
6770955 Shielded antenna in a semiconductor package | 107 | 2001 | |
|
|||
4684883 Method of manufacturing high-quality semiconductor light-emitting devices | 97 | 1985 | |
|
|||
4899998 Rotational positioning device | 107 | 1988 | |
|
|||
4904935 Electrical circuit board text fixture having movable platens | 115 | 1988 | |
5471185 Electrical circuit protection devices comprising conductive liquid compositions | 32 | 1994 | |
|
|||
5869326 Electroporation employing user-configured pulsing scheme | 122 | 1996 | |
|
|||
5493070 Measuring cable and measuring system | 99 | 1994 | |
6300775 Scattering parameter calibration system and method | 130 | 1999 | |
2004/0095,145 Method and apparatus for performing multiport through-reflect-line calibration and measurement | 97 | 2002 | |
2004/0199,350 System and method for determining measurement errors of a testing device | 94 | 2003 | |
|
|||
4805627 Method and apparatus for identifying the distribution of the dielectric constants in an object | 111 | 1986 | |
5095891 Connecting cable for use with a pulse generator and a shock wave generator | 98 | 1987 | |
|
|||
* 6459739 Method and apparatus for RF common-mode noise rejection in a DSL receiver | 113 | 1999 | |
|
|||
5621333 Contact device for making connection to an electronic circuit device | 95 | 1995 | |
6046599 Method and device for making connection | 67 | 1997 | |
6091256 Contact device for making connection to an electronic circuit device | 65 | 1997 | |
|
|||
5126286 Method of manufacturing edge connected semiconductor die | 166 | 1990 | |
|
|||
6278051 Differential thermopile heat flux transducer | 100 | 2000 | |
|
|||
5995914 Method and apparatus for asynchronously measuring frequency shifted signals | 103 | 1996 | |
|
|||
5993611 Capacitive denaturation of nucleic acid | 150 | 1997 | |
|
|||
5267088 Code plate mounting device | 84 | 1990 | |
|
|||
4871883 Electro-magnetic shielding | 121 | 1987 | |
4859989 Security system and signal carrying member thereof | 131 | 1987 | |
5061823 Crush-resistant coaxial transmission line | 137 | 1990 | |
5107076 Easy strip composite dielectric coaxial signal cable | 126 | 1991 | |
5477011 Low noise signal transmission cable | 114 | 1994 | |
5896038 Method of wafer level burn-in | 110 | 1996 | |
6032714 Repeatably positionable nozzle assembly | 79 | 1999 | |
7015708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts | 95 | 2003 | |
|
|||
2005/0116,730 DOUBLE-FACED DETECTING DEVICES FOR AN ELECTRONIC SUBSTRATE | 27 | 2003 | |
|
|||
5082627 Three dimensional binding site array for interfering with an electrical field | 87 | 1987 | |
|
|||
5977783 Multilayer probe for measuring electrical characteristics | 65 | 1997 | |
|
|||
7019541 Electric conductivity water probe | 97 | 2004 | |
|
|||
5172050 Micromachined semiconductor probe card | 277 | 1991 | |
5177438 Low resistance probe for semiconductor | 176 | 1991 | |
5467024 Integrated circuit test with programmable source for both AC and DC modes of operation | 87 | 1993 | |
5666063 Method and apparatus for testing an integrated circuit | 108 | 1996 | |
|
|||
5138289 Noncontacting waveguide backshort | 42 | 1990 | |
|
|||
6759859 Resilient and rugged multi-layered probe | 34 | 2001 | |
|
|||
5357211 Pin driver amplifier | 84 | 1993 | |
|
|||
7022985 Apparatus and method for a scanning probe microscope | 99 | 2002 | |
|
|||
5678210 Method and apparatus of coupling a transmitter to a waveguide in a remote ground terminal | 44 | 1995 | |
|
|||
5488954 Ultrasonic transducer and method for using same | 146 | 1994 | |
|
|||
5030907 CAD driven microprobe integrated circuit tester | 113 | 1989 | |
|
|||
5808874 Microelectronic connections with liquid conductive elements | 93 | 1996 | |
|
|||
6611417 Wafer chuck system | 83 | 2001 | |
|
|||
* 6794934 High gain wideband driver amplifier | 103 | 2001 | |
|
|||
7035738 Probe designing apparatus and probe designing method | 94 | 2002 | |
|
|||
6944380 Optical fiber for transmitting ultraviolet ray, optical fiber probe, and method of manufacturing the optical fiber probe | 67 | 2002 | |
|
|||
6737920 Variable gain amplifier | 78 | 2002 | |
|
|||
6906543 Probe card for electrical testing a chip in a wide temperature range | 64 | 2003 | |
7253646 Probe card with tunable stage and at least one replaceable probe | 11 | 2005 | |
|
|||
6734687 Apparatus for detecting defect in device and method of detecting defect | 112 | 2001 | |
|
|||
4983910 Millimeter-wave active probe | 73 | 1988 | |
4916002 Microcasting of microminiature tips | 138 | 1989 | |
5003253 Millimeter-wave active probe system | 80 | 1989 | |
5847569 Electrical contact probe for sampling high frequency electrical signals | 99 | 1996 | |
5981268 Hybrid biosensors | 160 | 1997 | |
6051422 Hybrid biosensors | 135 | 1998 | |
|
|||
4740764 Pressure sealed waveguide to coaxial line connection | 45 | 1987 | |
|
|||
7015689 Connection method for probe pins for measurement of characteristics of thin-film magnetic head and characteristic measurement method for thin-film magnetic head | 95 | 2003 | |
|
|||
5949383 Compact antenna structures including baluns | 119 | 1997 | |
|
|||
6946860 Modularized probe head | 56 | 2003 | |
|
|||
5097101 Method of forming a conductive contact bump on a flexible substrate and a flexible substrate | 96 | 1991 | |
|
|||
5270664 Probe for measuring surface roughness by sensing fringe field capacitance effects | 128 | 1992 | |
6909983 Calibration of an analogue probe | 66 | 2002 | |
|
|||
5848500 Light-tight enclosure and joint connectors for enclosure framework | 116 | 1997 | |
|
|||
2006/0155,270 Tissue ablation apparatus and method of ablating tissue | 173 | 2003 | |
|
|||
4553111 Printed circuit board maximizing areas for component utilization | 32 | 1983 |
Patent Citation Ranking
Forward Cite Landscape
Patent Info | (Count) | # Cites | Year |
---|---|---|---|
|
|||
9366697 Micromachined on-wafer probes and related method | 0 | 2011 | |
|
|||
9435855 Interconnect for transmitting signals between a device and a tester | 0 | 2013 | |
9594114 Structure for transmitting signals in an application space between a device under test and test electronics | 0 | 2014 |
Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
---|---|---|---|---|
11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | May 17, 2021 |
Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge - 11.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
Full Text

Legal Events

Matter Detail

Renewals Detail

Note
The template below is formatted to ensure compatibility with our system.
Provide tags with | separated like (tags1|tags2).
Maximum length is 128 characters for Customer Application No
Mandatory Fields * - 'MatterType','AppType','Country','Title','SerialNo'.
Acceptable Date Format - 'MM/DD/YYYY'.
Acceptable Filing/App Types -
- Continuation/Divisional
- Original
- Paris Convention
- PCT National
- With Priority
- EP Validation
- Provisional Conversion
- Reissue
- Provisional
- Foreign Extension
Acceptable Status -
- Pending
- Abandoned
- Unfiled
- Expired
- Granted
Acceptable Matter Types -
- Patent
- Utility Model
- Supplemental Protection Certificate
- Design
- Inventor Certificate
- Plant
- Statutory Invention Reg
Advertisement
Advertisement
Advertisement

Advertisement

Advertisement

Recipient Email Address

Recipient Email Address

Comment
Recipient Email Address

Success
E-mail has been sent successfully.
Failure
Some error occured while sending email. Please check e-mail and try again!
PAIR load has been initiated
A preliminary load of cached data will be loaded soon. Current PAIR data will be loaded within twenty four hours.
File History PDF
Thank you for your purchase! The File Wrapper for Patent Number 7619419 will be available within the next 24 hours.
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:

Last Refreshed On:
Changes done successfully
Important Notes on Latency of Status data
Please note there is up to 60 days of latency in this Status indicator for certain status conditions. You can obtain up-to-date Status indicator readings by ordering PAIR for the file.
An application with the status "Published" (which means it is pending) may be recently abandoned, but not yet updated to reflect its abandoned status. However, an application filed less than one year ago is unlikely to be abandoned.
A patent with the status "Granted" may be recently expired, but not yet updated to reflect its expired status. However, it is highly unlikely a patent less than 3.5 years old would be expired.
An application with the status "Abandoned" is almost always current, but there is a small chance it was recently revived and the status not yet updated.
Important Note on Priority Date data
This priority date is an estimated earliest priority date and is purely an estimation. This date should not be taken as legal conclusion. No representations are made as to the accuracy of the date listed. Please consult a legal professional before relying on this date.
We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.