US Patent No: 7,619,419

Wideband active-passive differential signal probe

Stats

Nov 17, 2009
Issued date
Apr 28, 2006
filing date
11/413,738
serial no
In Force
status

ALSO PUBLISHED AS: 20060290357

Importance

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Abstract

A wideband differential signal probe includes separate paths to convert a lower frequency component and a higher frequency component of a differential signal to a lower frequency single ended signal and a higher frequency single ended signal which are combined for the probe's output which is commonly input to instrumentation.

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First Claim

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Related Publications

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Patent Owner(s)

Patent Owner	Address	Total Patents
CASCADE MICROTECH, INC.	BEAVERTON, OR	254

International Classification(s)

G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....

[Classification Symbol]

[Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Campbell, Richard	Portland, OR	33	48

Cited Art

Patent Info	# Cites	Year
FORMFACTOR, INC. (156)
5,476,211 Method of manufacturing electrical contacts, using a sacrificial member	353	1993
5,917,707 Flexible contact structure with an electrically conductive shell	288	1994
6,049,976 Method of mounting free-standing resilient electrical contact structures to electronic components	119	1995
5,772,451 Sockets for electronic components and methods of connecting to electronic components	342	1995
5,974,662 Method of planarizing tips of probe elements of a probe card assembly	340	1995
5,829,128 Method of mounting resilient contact structures to semiconductor devices	213	1995
5,852,871 Method of making raised contacts on electronic components	127	1995
5,601,740 Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires	111	1995
5,820,014 Solder preforms	113	1996
5,773,780 Method of severing bond wires and forming balls at their ends	75	1996
5,900,738 Contact structure device for interconnections, interposer, semiconductor assembly and package using the same and method	145	1996
5,926,951 Method of stacking electronic components	154	1996
6,184,587 Resilient contact structures, electronic interconnection component, and method of mounting resilient contact structures to electronic components	111	1996
6,242,803 Semiconductor devices with integral contact structures	87	1996
6,274,823 Interconnection substrates with resilient contact structures on both sides	110	1996
6,476,333 Raised contact structures (solder columns)	70	1996
6,064,213 Wafer-level burn-in and test	251	1997
5,806,181 Contact carriers (tiles) for populating larger substrates with spring contacts	253	1997
5,994,152 Fabricating interconnects and tips using sacrificial substrates	172	1997
6,442,831 Method for shaping spring elements	72	1997
6,482,013 Microelectronic spring contact element and electronic component having a plurality of spring contact elements	137	1997
5,832,601 Method of making temporary connections between electronic components	187	1997
5,864,946 Method of making contact tip structures	157	1997
5,878,486 Method of burning-in semiconductor devices	107	1997
5,884,398 Mounting spring elements on semiconductor devices	103	1997
5,983,493 Method of temporarily, then permanently, connecting to a semiconductor device	117	1997
5,998,228 Method of testing semiconductor	126	1997
6,032,356 Wafer-level test and burn-in, and semiconductor process	158	1997
6,184,053 Method of making microelectronic spring contact elements	192	1997
5,912,046 Method and apparatus for applying a layer of flowable coating material to a surface of an electronic component	76	1997
5,998,864 Stacking semiconductor devices, particularly memory chips	176	1997
6,050,829 Making discrete power connections to a space transformer of a probe card assembly	154	1997
6,307,161 Partially-overcoated elongate contact structures	69	1997
6,043,563 Electronic components with terminals and spring contact elements extending from areas which are remote from the terminals	157	1997
6,741,085 Contact carriers (tiles) for populating larger substrates with spring contacts	88	1997
6,520,778 Microelectronic contact structures, and methods of making same	144	1998
6,720,501 PC board having clustered blind vias	68	1998
6,042,712 Apparatus for controlling plating over a face of a substrate	110	1998
6,090,261 Method and apparatus for controlling plating over a face of a substrate	81	1998
6,110,823 Method of modifying the thickness of a plating on a member by creating a temperature gradient on the member, applications for employing such a method, and structures resulting from such a method	172	1998
6,023,103 Chip-scale carrier for semiconductor devices including mounted spring contacts	148	1998
6,033,935 Sockets for "springed" semiconductor devices	108	1998
6,669,489 Interposer, socket and assembly for socketing an electronic component and method of making and using same	106	1998
6,330,164 Interconnect assemblies and methods including ancillary electronic component connected in immediate proximity of semiconductor device	120	1998
6,029,344 Composite interconnection element for microelectronic components, and method of making same	202	1998
6,246,247 Probe card assembly and kit, and methods of using same	112	1998
6,441,315 Contact structures with blades having a wiping motion	104	1998
6,690,185 Large contactor with multiple, aligned contactor units	113	1998
6,255,126 Lithographic contact elements	173	1998
6,268,015 Method of making and using lithographic contact springs	115	1998
6,150,186 Method of making a product with improved material properties by moderate heat-treatment of a metal incorporating a dilute additive	94	1998
6,429,029 Concurrent design and subsequent partitioning of product and test die	126	1998
6,456,099 Special contact points for accessing internal circuitry of an integrated circuit	102	1998
6,215,670 Method for manufacturing raised electrical contact pattern of controlled geometry	85	1999
6,208,225 Filter structures for integrated circuit interfaces	135	1999
6,218,910 High bandwidth passive integrated circuit tester probe card assembly	131	1999
6,448,865 Integrated circuit interconnect system	72	1999
6,452,411 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses	101	1999
6,480,978 Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons	79	1999
6,499,121 Distributed interface for parallel testing of multiple devices using a single tester channel	92	1999
6,627,483 Method for mounting an electronic component	80	1999
6,644,982 Method and apparatus for the transport and tracking of an electronic component	100	1999
6,887,723 Method for processing an integrated circuit including placing dice into a carrier and testing	72	1999
6,468,098 Electrical contactor especially wafer level contactor using fluid pressure	90	1999
6,655,023 Method and apparatus for burning-in semiconductor devices in wafer form	81	1999
6,827,584 Interconnect for microelectronic structures with enhanced spring characteristics	90	1999
6,491,968 Methods for making spring interconnect structures	95	1999
6,672,875 Spring interconnect structures	96	1999
6,339,338 Apparatus for reducing power supply noise in an integrated circuit	88	2000
6,168,974 Process of mounting spring contacts to semiconductor devices	104	2000
6,459,343 Integrated circuit interconnect system forming a multi-pole filter	68	2000
6,232,149 Sockets for "springed" semiconductor devices	77	2000
6,509,751 Planarizer for a semiconductor contactor	122	2000
6,215,196 Electronic component with terminals and spring contact elements extending from areas which are remote from the terminals	70	2000
6,640,432 Method of fabricating shaped springs	100	2000
6,677,744 System for measuring signal path resistance for an integrated circuit tester interconnect structure	69	2000
6,476,630 Method for testing signal paths between an integrated circuit wafer and a wafer tester	73	2000
6,525,555 Wafer-level burn-in and test	96	2000
6,727,579 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES	90	2000
6,685,817 Method and apparatus for controlling plating over a face of a substrate	62	2000
6,622,103 System for calibrating timing of an integrated circuit wafer tester	90	2000
6,603,323 Closed-grid bus architecture for wafer interconnect structure	86	2000
6,727,580 Microelectronic spring contact elements	75	2000
6,539,531 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes	106	2000
6,835,898 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES	75	2000
6,778,406 Resilient contact structures for interconnecting electronic devices	96	2000
6,475,822 Method of making microelectronic contact structures	87	2000
6,597,187 Special contact points for accessing internal circuitry of an integrated circuit	73	2000
6,603,324 Special contact points for accessing internal circuitry of an integrated circuit	70	2000
6,606,575 Cross-correlation timing calibration for wafer-level IC tester interconnect systems	81	2000
6,621,260 Special contact points for accessing internal circuitry of an integrated circuit	75	2000
6,701,612 Method and apparatus for shaping spring elements	83	2000
6,713,374 Interconnect assemblies and methods	94	2000
6,836,962 Method and apparatus for shaping spring elements	70	2000
6,538,538 High frequency printed circuit board via	79	2001
6,791,176 Lithographic contact elements	77	2001
6,616,966 Method of making lithographic contact springs	121	2001
6,780,001 Forming tool for forming a contoured microelectronic spring mold	70	2001
6,501,343 Integrated circuit tester with high bandwidth probe assembly	88	2001
6,606,014 Filter structures for integrated circuit interfaces	61	2001
6,534,856 Sockets for "springed" semiconductor devices	86	2001
6,910,268 Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via	104	2001
6,856,150 Probe card with coplanar daughter card	82	2001
6,627,980 Stacked semiconductor device assembly with microelectronic spring contacts	76	2001
6,538,214 Method for manufacturing raised electrical contact pattern of controlled geometry	74	2001
6,882,239 Electromagnetically coupled interconnect system	78	2001
6,888,362 Test head assembly for electronic components with plurality of contoured microelectronic spring contacts	86	2001
6,729,019 Method of manufacturing a probe card	94	2001
6,678,876 Process and apparatus for finding paths through a routing space	89	2001
6,862,727 Process and apparatus for adjusting traces	64	2001
6,764,869 Method of assembling and testing an electronics module	69	2001
6,714,828 Method and system for designing a probe card	72	2001
6,882,546 Multiple die interconnect system	71	2001
6,664,628 Electronic component overlapping dice of unsingulated semiconductor wafer	68	2001
6,456,103 Apparatus for reducing power supply noise in an integrated circuit	83	2001
6,759,311 Fan out of interconnect elements attached to semiconductor wafer	68	2001
6,817,052 Apparatuses and methods for cleaning test probes	76	2001
6,816,031 Adjustable delay transmission line	68	2001
6,624,648 Probe card assembly	100	2001
6,777,319 Microelectronic spring contact repair	73	2001
6,479,308 Semiconductor fuse covering	68	2001
6,615,485 Probe card assembly and kit, and methods of making same	83	2001
6,891,385 Probe card cooling assembly with direct cooling of active electronic components	77	2001
7,002,363 Method and system for compensating thermally induced motion of probe cards	115	2001
6,741,092 Method and system for detecting an arc condition	61	2001
6,864,105 Method of manufacturing a probe card	66	2002
6,680,659 Integrated circuit interconnect system	67	2002
6,784,674 Test signal distribution system for IC tester	74	2002
6,798,225 Tester channel to multiple IC terminals	76	2002
6,825,422 Interconnection element with contact blade	71	2002
6,812,691 Compensation for test signal degradation due to DUT fault	68	2002
6,640,415 Segmented contactor	100	2002
6,657,455 Predictive, adaptive power supply for an integrated circuit under test	78	2002
6,807,734 Microelectronic contact structures, and methods of making same	76	2002
6,559,671 Efficient parallel testing of semiconductor devices using a known good device to generate expected responses	72	2002
6,646,520 Integrated circuit interconnect system	69	2002
6,839,964 Method for manufacturing a multi-layer printed circuit board	64	2002
6,686,754 Integrated circuit tester with high bandwidth probe assembly	70	2002
6,678,850 Distributed interface for parallel testing of multiple devices using a single tester channel	72	2002
6,818,840 Method for manufacturing raised electrical contact pattern of controlled geometry	65	2002
6,642,625 Sockets for "springed" semiconductor devices	64	2002
6,661,316 High frequency printed circuit board via	67	2002
6,825,052 Test assembly including a test die for testing a semiconductor product die	79	2002
6,788,094 Wafer-level burn-in and test	74	2002
6,845,491 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes	68	2003
6,784,677 Closed-grid bus architecture for wafer interconnect structure	64	2003
7,342,402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features	25	2003
6,911,835 High performance probe system	79	2003
6,838,893 Probe card assembly	66	2003
6,870,381 Insulative covering of probe tips	62	2003
6,911,814 Apparatus and method for electromechanical testing and validation of probe cards	69	2003
6,913,468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods	81	2003
6,949,942 Predictive, adaptive power supply for an integrated circuit under test	44	2003
6,822,529 Integrated circuit interconnect system	66	2003
6,917,210 Integrated circuit tester with high bandwidth probe assembly	65	2003
7,276,922 Closed-grid bus architecture for wafer interconnect structure	23	2004
INTERNATIONAL BUSINESS MACHINES CORPORATION (42)
4,520,314 Probe head arrangement for conductor line testing with at least one probe head comprising a plurality of resilient contacts	38	1982
4,744,041 Method for testing DC motors	115	1985
4,851,767 Detachable high-speed opto-electronic sampling probe	30	1988
4,831,494 Multilayer capacitor	151	1988
4,922,128 Boost clock circuit for driving redundant wordlines and sample wordlines	78	1989
4,987,100 Flexible carrier for an electronic device	80	1989
5,001,423 Dry interface thermal chuck temperature control system for semiconductor wafer testing	130	1990
5,007,163 Non-destructure method of performing electrical burn-in testing of semiconductor chips	65	1990
5,207,585 Thin interface pellicle for dense arrays of electrical interconnects	159	1990
5,061,192 High density connector	139	1990
5,334,931 Molded test probe assembly	92	1991
5,371,654 Three dimensional high performance interconnection package	214	1992
5,441,690 Process of making pinless connector	72	1993
5,537,372 High density data storage system with topographic contact sensor	110	1993
5,531,022 Method of forming a three dimensional high performance interconnection package	146	1994
5,532,608 Ceramic probe card and method for reducing leakage current	60	1995
5,804,982 Miniature probe positioning actuator	103	1995
5,810,607 Interconnector with contact pads having enhanced durability	157	1995
5,726,211 Process for making a foamed elastometric polymer	101	1996
5,756,021 Electronic devices comprising dielectric foamed polymers	87	1996
5,700,844 Process for making a foamed polymer	128	1996
5,785,538 High density test probe with rigid surface structure	85	1996
6,268,016 Manufacturing computer systems with fine line circuitized substrates	63	1996
5,723,347 Semi-conductor chip test probe and process for manufacturing the probe	105	1996
6,286,208 Interconnector with contact pads having enhanced durability	78	1996
5,838,160 Integral rigid chip test probe	81	1996
6,054,651 Foamed elastomers for wafer probing applications and interposer connectors	78	1996
5,926,029 Ultra fine probe contacts	104	1997
6,059,982 Micro probe assembly and method of fabrication	146	1997
5,804,607 Process for making a foamed elastomeric polymer	116	1997
6,062,879 High density test probe with rigid surface structure	78	1998
6,104,201 Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage	69	1998
6,332,270 Method of making high density integral test probe	78	1998
6,206,273 Structures and processes to create a desired probetip contact geometry on a wafer test probe	70	1999
6,452,406 Probe structure having a plurality of discrete insulated probe tips	76	1999
6,528,984 Integrated compliant probe for wafer level test and burn-in	102	1999
6,526,655 Angled flying lead wire bonding process	63	2001
6,788,093 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies	101	2002
6,943,571 Reduction of positional errors in a four point probe resistance measurement	59	2003
7,007,380 TFI probe I/O wrap test method	91	2004
7,011,531 Membrane probe with anchored elements	91	2005
7,005,879 Device for probe card power bus noise reduction	91	2005
CASCADE MICROTECH, INC. (39)
4,280,112 Electrical coupler	97	1979
4,697,143 Wafer probe	195	1984
4,764,723 Wafer probe	90	1986
4,827,211 Wafer probe	124	1987
4,858,160 System for setting reference reactance for vector corrected measurements	99	1988
4,849,689 Microwave wafer probe having replaceable probe tip	124	1988
5,012,186 Electrical probe with contact force protection	40	1990
5,045,781 High-frequency active probe having replaceable contact needles	108	1991
5,101,453 Fiber optic wafer probe	97	1991
5,266,889 Wafer probe station with integrated environment control enclosure	132	1992
5,457,398 Wafer probe station having full guarding	121	1993
5,506,515 High-frequency probe tip assembly	148	1994
5,610,529 Probe station having conductive coating added to thermal chuck insulator	134	1995
5,565,788 Coaxial wafer probe with tip shielding	143	1995
5,729,150 Low-current probe card with reduced triboelectric current generating cables	135	1995
5,914,613 Membrane probing system with local contact scrub	104	1996
6,232,788 Wafer probe station for low-current measurements	86	1997
6,232,789 Probe holder for low current measurements	87	1997
6,034,533 Low-current pogo probe card	105	1997
6,137,302 Low-current probe card with reduced triboelectric current generating cables	106	1997
6,256,882 Membrane probing system	66	1998
6,578,264 Method for constructing a membrane probe using a depression	76	2000
6,384,615 Probe holder for low current measurements	41	2001
6,549,106 Waveguide with adjustable backshort	108	2001
7,233,160 Wafer probe	20	2001
6,496,024 Probe holder for testing of a test device	38	2002
6,850,082 Probe holder for testing of a test device	37	2002
6,724,205 Probe for combined signals	96	2002
6,815,963 Probe for testing a device under test	63	2003
6,806,724 Probe for combined signals	93	2003
7,161,363 Probe for testing a device under test	33	2004
6,930,498 Membrane probing system	54	2004
7,009,383 Wafer probe station having environment control enclosure	91	2004
7,187,188 Chuck with integrated wafer support	74	2004
2006/0184,041 System for testing semiconductors	32	2006
7,332,923 Test probe for high-frequency measurement	21	2006
7,271,603 Shielded probe for testing a device under test	32	2006
7,403,028 Test structure and probe for differential signals	19	2007
2008/0111,571 Membrane probing system	10	2008
AGILENT TECHNOLOGIES, INC. (36)
4,980,637 Force delivery system for improved precision membrane probe	94	1988
4,918,383 Membrane probe with automatic contact scrub action	151	1988
4,906,920 Self-leveling membrane probe	201	1988
5,172,051 Wide bandwidth passive probe	103	1991
5,298,972 Method and apparatus for measuring polarization sensitivity of optical devices	106	1991
5,274,336 Capacitively-coupled test probe	129	1992
5,308,250 Pressure contact for connecting a coaxial shield to a microstrip ground plane	27	1992
5,463,324 Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like	48	1993
5,493,070 Measuring cable and measuring system	90	1994
5,507,652 Wedge connector for integrated circuits	39	1995
5,578,932 Method and apparatus for providing and calibrating a multiport network analyzer	141	1995
5,945,836 Loaded-board, guided-probe test fixture	118	1996
5,923,180 Compliant wafer prober docking adapter	70	1997
5,940,965 Method of making multiple lead voltage probe	30	1997
5,903,143 Probe apparatus with RC circuit connected between ground and a guard	92	1997
6,060,888 Error correction method for reflection measurements of reciprocal devices in vector network analyzers	111	1998
6,251,595 Methods and devices for carrying out chemical reactions	90	1998
6,175,228 Electronic probe for measuring high impedance tri-state logic circuits	82	1998
6,300,775 Scattering parameter calibration system and method	126	1999
6,271,673 Probe for measuring signals	101	1999
6,407,562 Probe tip terminating device providing an easily changeable feed-through termination	85	1999
2001/0024,116 Electronic probe for measuring high impedance tri-state logic circuits	77	2001
6,643,597 Calibrating a test system using unknown standards	114	2001
6,717,426 Blade-like connecting needle	77	2002
6,768,328 Single point probe structure and method	73	2002
6,864,694 Voltage probe	89	2002
2004/0095,145 Method and apparatus for performing multiport through-reflect-line calibration and measurement	94	2002
2004/0140,819 Differential voltage probe	28	2003
2004/0199,350 System and method for determining measurement errors of a testing device	92	2003
2005/0030,047 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration	81	2003
7,025,628 Electronic probe extender	95	2003
2004/0162,689 Multiport network analyzer calibration employing reciprocity of a device	91	2004
6,933,713 High bandwidth oscilloscope probe with replaceable cable	54	2004
7,005,868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe	91	2004
7,030,328 Liquid metal switch employing micro-electromechanical system (MEMS) structures for actuation	12	2004
7,026,834 Multiple two axis floating probe block assembly using split probe block	91	2005
TOKYO ELECTRON LIMITED (34)
4,998,062 Probe device having micro-strip line structure	88	1989
5,084,671 Electric probing-test machine having a cooling system	172	1990
5,091,692 Probing test device	112	1990
5,198,752 Electric probing-test machine having a cooling system	151	1991
5,315,237 Touch sensor unit of prober for testing electric circuit and electric circuit testing apparatus using the touch sensor unit	106	1991
5,321,352 Probe apparatus and method of alignment for the same	130	1992
5,321,453 Probe apparatus for probing an object held above the probe card	100	1992
5,635,846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer	129	1993
5,404,111 Probe apparatus with a swinging holder for an object of examination	111	1993
5,517,126 Probe apparatus	127	1993
5,521,522 Probe apparatus for testing multiple integrated circuit dies	141	1993
5,539,676 Method of identifying probe position and probing method in prober	92	1994
5,811,982 High density cantilevered probe for electronic devices	112	1996
5,777,485 Probe method and apparatus with improved probe contact	117	1996
5,910,727 Electrical inspecting apparatus with ventilation system	88	1996
5,821,763 Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof	162	1996
5,804,983 Probe apparatus with tilt correction mechanisms	147	1997
6,334,247 High density integrated circuit apparatus, test probe and methods of use thereof	83	1997
5,914,614 High density cantilevered probe for electronic devices	94	1997
5,999,268 Apparatus for aligning a semiconductor wafer with an inspection contactor	105	1997
6,060,892 Probe card attaching mechanism	92	1997
6,300,780 High density integrated circuit apparatus, test probe and methods of use thereof	74	1998
6,124,725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer	127	1998
6,329,827 High density cantilevered probe for electronic devices	72	1998
6,414,478 Transfer mechanism for use in exchange of probe card	78	2000
6,722,032 Method of forming a structure for electronic devices contact locations	61	2001
7,005,842 Probe cartridge assembly and multi-probe assembly	91	2001
6,927,587 Probe apparatus	62	2003
6,906,542 Probing method and prober	59	2003
6,794,888 Probe device	74	2003
7,026,832 Probe mark reading device and probe mark reading method	92	2003
7,009,415 Probing method and probing apparatus	93	2004
7,023,226 Probe pins zero-point detecting method, and prober	91	2004
7,332,918 Prober and probe testing method for temperature-controlling object to be tested	22	2005
TEXAS INSTRUMENTS INCORPORATED (13)
4,888,550 Intelligent multiprobe tip	91	1983
5,128,612 Disposable high performance test head	26	1990
5,159,752 Scanning electron microscope based parametric testing method and apparatus	117	1990
5,225,037 Method for fabrication of probe card for testing of semiconductor devices	212	1991
5,317,656 Fiber optic network for multi-point emissivity-compensated semiconductor wafer pyrometry	70	1993
5,511,010 Method and apparatus of eliminating interference in an undersettled electrical signal	88	1994
6,292,760 Method and apparatus to measure non-coherent signals	91	1998
6,906,539 High density, area array probe card apparatus	54	2001
6,911,834 Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probing	54	2002
6,741,129 Differential amplifier slew rate boosting scheme	34	2002
7,026,833 Multiple-chip probe and universal tester contact assemblage	93	2005
7,327,153 Analog built-in self-test module	25	2005
7,323,899 System and method for resumed probing of a wafer	19	2006
MICRON TECHNOLOGY, INC. (12)
4,312,117 Integrated test and assembly device	151	1979
4,970,386 Vertical FET high speed optical sensor	43	1989
5,487,999 Method for fabricating a penetration limited contact having a rough textured surface	159	1994
5,686,317 Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die	235	1995
5,869,974 Micromachined probe card having compliant contact members for testing semiconductor wafers	168	1996
6,071,009 Semiconductor wirebond machine leadframe thermal map system	41	1997
6,181,144 Semiconductor probe card having resistance measuring circuitry and method fabrication	130	1998
6,194,720 Preparation of transmission electron microscope samples	106	1998
6,359,456 Probe card and test system for semiconductor wafers	112	2001
6,924,653 Selectively configurable microelectronic probes	57	2002
7,026,835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad	91	2002
7,009,188 Lift-out probe having an extension tip, methods of making and using, and analytical instruments employing same	95	2004
TEKTRONIX, INC. (12)
4,739,259 Telescoping pin probe	99	1986
4,673,839 Piezoelectric pressure sensing apparatus for integrated circuit testing stations	121	1986
4,734,641 Method for the thermal characterization of semiconductor packaging systems	59	1987
4,749,942 Wafer probe head	81	1987
4,912,399 Multiple lead probe for integrated circuits in wafer form	112	1987
4,783,625 Wideband high impedance card mountable probe	95	1988
4,965,514 Apparatus for probing a microwave circuit	17	1989
5,059,898 Wafer probe with transparent loading member	76	1990
5,136,237 Double insulated floating high voltage test probe	102	1991
5,412,330 Optical module for an optically based measurement system	92	1993
6,447,339 Adapter for a multi-channel signal probe	83	2001
6,701,265 Calibration for vector network analyzer	90	2002
SV PROBE PTE LTD. (9)
5,521,518 Probe card apparatus	130	1991
5,180,977 Membrane probe contact bump compliancy system	139	1991
5,422,574 Large scale protrusion membrane for semiconductor devices under test with very high pin counts	164	1993
5,720,098 Method for making a probe preserving a uniform stress distribution under deflection	107	1995
5,742,174 Membrane for holding a probe tip in proper location	124	1995
5,623,213 Membrane probing of circuits	92	1996
6,037,785 Probe card apparatus	106	1996
5,973,504 Programmable high-density electronic device testing	97	1997
6,908,364 Method and apparatus for probe tip cleaning and shaping pad	55	2001
ADVANTEST CORPORATION (8)
5,172,049 IC test equipment	126	1991
5,644,248 Test head cooling system	82	1995
5,767,690 Test head cooling system	86	1997
6,191,596 Method for detecting a contact position between an object to be measured and measuring pins	79	1998
6,174,744 Method of producing micro contact structure and contact probe using same	135	2000
2002/0011,863 IC chip tester with heating element for preventing condensation	85	2001
7,020,360 Wavelength dispersion probing system	91	2002
6,937,040 Probe module and a testing apparatus	57	2004
W. L. GORE & ASSOCIATES, INC. (8)
4,871,883 Electro-magnetic shielding	114	1987
4,859,989 Security system and signal carrying member thereof	127	1987
5,061,823 Crush-resistant coaxial transmission line	119	1990
5,107,076 Easy strip composite dielectric coaxial signal cable	117	1991
5,477,011 Low noise signal transmission cable	102	1994
5,896,038 Method of wafer level burn-in	104	1996
6,032,714 Repeatably positionable nozzle assembly	77	1999
7,015,708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts	93	2003
CANON KABUSHIKI KAISHA (7)
4,755,747 Wafer prober and a probe card to be used therewith	105	1985
4,864,227 Wafer prober	125	1988
4,929,893 Wafer prober	158	1988
5,145,552 Process for preparing electrical connecting member	66	1990
5,304,924 Edge detector	97	1992
5,731,920 Converting adapter for interchangeable lens assembly	91	1995
5,685,232 Positioning stage device exposure apparatus and device manufacturing method utilizing the same	112	1996
FREESCALE SEMICONDUCTOR, INC. (7)
5,172,050 Micromachined semiconductor probe card	269	1991
5,177,438 Low resistance probe for semiconductor	164	1991
5,467,024 Integrated circuit test with programmable source for both AC and DC modes of operation	84	1993
5,617,035 Method for testing integrated devices	108	1995
5,666,063 Method and apparatus for testing an integrated circuit	105	1996
5,982,166 Method for measuring a characteristic of a semiconductor wafer using cylindrical control	106	1997
6,127,831 Method of testing a semiconductor device by automatically measuring probe tip parameters	100	1997
GLOBALFOUNDRIES INC. (7)
6,091,255 System and method for tasking processing modules based upon temperature	124	1998
6,608,494 Single point high resolution time resolved photoemission microscopy system and method	107	1998
6,483,327 Quadrant avalanche photodiode time-resolved detection	103	1999
6,724,928 Real-time photoemission detection system	95	2000
6,488,405 Flip chip defect analysis using liquid crystal	97	2000
6,617,862 Laser intrusive technique for locating specific integrated circuit current paths	96	2002
7,022,976 Dynamically adjustable probe tips	93	2003
HUGHES ELECTRONICS CORPORATION (7)
4,727,319 Apparatus for on-wafer testing of electrical circuits	74	1985
4,772,846 Wafer alignment and positioning apparatus for chip testing by voltage contrast electron microscopy	129	1986
4,908,570 Method of measuring FET noise parameters	43	1987
5,313,157 Probe for jesting an electrical circuit chip	91	1992
5,583,445 Opto-electronic membrane probe	99	1994
5,611,008 Substrate system for optoelectronic/microwave circuits	80	1996
5,623,214 Multiport membrane probe for full-wafer testing	105	1996
YOKOWO CO., LTD. (7)
7,019,701 Antenna device mounted on vehicle	74	2004
6,900,647 Contact probe and probe device	102	2004
6,903,563 Contact probe and probe device	96	2004
6,917,211 Contact probe and probe device	54	2004
6,919,732 Contact probe and probe device	55	2004
6,937,042 Contact probe and probe device	55	2004
7,015,710 Contact probe and probe device	93	2004
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. (6)
4,839,587 Test fixture for tab circuits and devices	124	1988
5,198,753 Integrated circuit test fixture and method	123	1990
5,691,503 Electro-magnetically shielded door hinge	41	1994
6,233,613 High impedance probe for monitoring fast ethernet LAN links	91	1997
2004/0201,388 Support for an electronic probe and related methods	39	2003
7,002,133 Detecting one or more photons from their interactions with probe photons in a matter system	91	2003
MITSUBISHI DENKI KABUSHIKI KAISHA (6)
5,408,188 High frequency wafer probe including open end waveguide	74	1992
5,493,236 Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis	182	1994
6,144,212 Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card	104	1998
6,242,929 Probe needle for vertical needle type probe card and fabrication thereof	86	1998
6,404,213 Probe stylus	82	1999
7,173,433 Circuit property measurement method	19	2005
SARANTEL LIMITED (6)
5,854,608 Helical antenna having a solid dielectric core	112	1994
6,184,845 Dielectric-loaded antenna	121	1997
6,181,297 Antenna	88	1998
6,369,776 Antenna	86	1999
6,424,316 Helical antenna	84	2000
6,914,580 Dielectrically-loaded antenna	80	2003
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY (6)
4,983,910 Millimeter-wave active probe	68	1988
4,916,002 Microcasting of microminiature tips	133	1989
5,003,253 Millimeter-wave active probe system	75	1989
5,847,569 Electrical contact probe for sampling high frequency electrical signals	94	1996
5,981,268 Hybrid biosensors	140	1997
6,051,422 Hybrid biosensors	119	1998
APPLIED MATERIALS, INC. (5)
5,916,689 Electrostatic chuck with an impregnated, porous layer that exhibits the Johnson-Rahbeck effect	105	1996
5,874,361 Method of processing a wafer within a reaction chamber	104	1996
6,257,564 Vacuum chuck having vacuum-nipples wafer support	98	1998
6,232,787 Microstructure defect detection	151	1999
7,319,335 Configurable prober for TFT LCD array testing	20	2004
DELAWARE CAPITAL FORMATION, INC. (5)
5,408,189 Test fixture alignment system for printed circuit boards	141	1992
5,289,117 Testing of integrated circuit devices on loaded printed circuit	54	1992
5,389,885 Expandable diaphragm test modules and connectors	94	1993
6,181,149 Grid array package test contactor	95	1996
6,064,218 Peripherally leaded package test contactor	102	1997
HUGHES AIRCRAFT COMPANY (5)
4,918,373 R.F. phase noise test set using fiber optic delay line	50	1988
4,835,495 Diode device packaging arrangement	40	1988
5,326,412 Method for electrodepositing corrosion barrier on isolated circuitry	71	1992
5,512,835 Electrical probe and method for measuring gaps and other discontinuities in enclosures using electrical inductance for RF shielding assessment	72	1992
5,412,866 Method of making a cast elastomer/membrane test probe assembly	119	1993
INTEL CORPORATION (5)
5,944,093 Pickup chuck with an integral heat pipe	99	1997
7,020,363 Optical probe for wafer testing	92	2001
6,856,129 Current probe device having an integrated amplifier	89	2002
2006/0052,075 Testing integrated circuits using high bandwidth wireless technology	71	2004
2007/0145,989 Probe card with improved transient power delivery	16	2005
MDS INC. (5)
6,376,258 Resonant bio-assay device and test system for detecting molecular binding events	132	2000
6,340,568 Method for detecting and classifying nucleic acid hybridization	79	2001
6,566,079 Methods for analyzing protein binding events	93	2001
2003/0032,000 Method for analyzing cellular events	87	2001
2002/0168,659 System and method for characterizing the permittivity of molecular events	73	2002
MOTOROLA, INC. (5)
4,232,398 Radio receiver alignment indicator	47	1978
4,453,142 Microstrip to waveguide transition	104	1981
4,646,005 Signal probe	97	1984
5,561,378 Circuit probe for measuring a differential circuit	30	1994
5,748,506 Calibration technique for a network analyzer	93	1996
NEC CORPORATION (5)
4,669,805 High frequency connector	57	1985
6,114,864 Probe card with plural probe tips on a unitary flexible tongue	106	1997
6,310,483 Longitudinal type high frequency probe for narrow pitched electrodes	99	1998
6,281,691 Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable	100	1999
6,400,168 Method for fabricating probe tip portion composed by coaxial cable	100	2001
RAYTHEON COMPANY (5)
4,346,355 Radio frequency energy launcher	95	1980
5,069,628 Flexible electrical cable connector with double sided dots	70	1990
5,395,253 Membrane connector with stretch induced micro scrub	114	1993
5,600,256 Cast elastomer/membrane test probe assembly	75	1995
6,211,837 Dual-window high-power conical horn antenna	75	1999
WENTWORTH LABORATORIES, INC. (5)
4,975,638 Test probe assembly for testing integrated circuit devices	143	1989
5,355,079 Probe assembly for testing integrated circuit devices	93	1993
5,959,461 Probe station adapter for backside emission inspection	117	1997
6,031,383 Probe station for low current, low voltage parametric measurements using multiple probes	103	1998
6,927,586 Temperature compensated vertical pin probing device	57	2003
ANRITSU COMPANY (4)
5,905,421 Apparatus for measuring and/or injecting high frequency signals in integrated systems	77	1997
6,169,410 Wafer probe with built in RF frequency conversion module	83	1998
6,529,844 Vector network measurement system	103	1999
6,943,563 Probe tone S-parameter measurements	56	2002
GGB INDUSTRIES, INC. (4)
4,871,964 Integrated circuit probing apparatus	90	1988
5,373,231 Integrated circuit probing apparatus including a capacitor bypass structure	118	1993
6,603,322 Probe card for high speed testing	98	1996
6,118,287 Probe tip structure	95	1997
KABUSHIKI KAISHA TOSHIBA (4)
5,166,893 Portable apparatus having a voltage converter unit removable from a base unit having a removable display unit	46	1992
5,491,425 Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same	10	1994
6,605,941 Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes	49	2001
7,032,307 Method for fabricating a probe pin for testing electrical characteristics of an apparatus	91	2004
LSI LOGIC CORPORATION (4)
6,927,079 Method for probing a semiconductor wafer	101	2000
6,605,951 Interconnector and method of connecting probes to a die for functional analysis	101	2000
6,617,866 Apparatus and method of protecting a probe card during a sort sequence	36	2001
7,023,225 Wafer-mounted micro-probing platform	92	2003
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (4)
5,594,358 Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line	96	1994
5,794,133 Microwave mixing circuit	81	1996
6,806,836 Helical antenna apparatus provided with two helical antenna elements, and radio communication apparatus provided with same helical antenna apparatus	73	2003
7,219,416 Method of manufacturing a magnetic element	20	2004
NATIONAL SEMICONDUCTOR CORPORATION (4)
4,757,255 Environmental box for automated wafer probing	180	1986
5,814,847 General purpose assembly programmable multi-chip package substrate	88	1996
5,883,522 Apparatus and method for retaining a semiconductor wafer during testing	105	1996
7,096,133 Method of establishing benchmark for figure of merit indicative of amplifier flicker noise	71	2005
RENESAS ELECTRONICS CORPORATION (4)
6,028,435 Semiconductor device evaluation system using optical fiber	105	1997
6,160,407 Inspection method and wiring current observation method for semiconductor device and apparatus of the same	96	1998
6,900,646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof	95	2002
6,551,884 Semiconductor device including gate insulation films having different thicknesses	69	2002
SILICON VALLEY BANK (4)
4,893,914 Test station	110	1988
5,892,539 Portable emission microscope workstation for failure analysis	115	1995
6,744,268 High resolution analytical probe station	117	2002
6,917,195 Wafer probe station	54	2004
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE (4)
4,754,239 Waveguide to stripline transition assembly	89	1986
5,631,571 Infrared receiver wafer level probe testing	132	1996
6,215,295 Photonic field probe and calibration means thereof	111	1998
2003/0170,898 Method for intracellular modifications within living cells using pulsed electric fields	102	2002
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY (4)
5,361,049 Transition from double-ridge waveguide to suspended substrate	46	1986
5,091,732 Lightweight deployable antenna system	86	1990
5,430,813 Mode-matched, combination taper fiber optic probe	60	1993
6,940,264 Near field probe	57	2004
ELECTROGLAS, INC. (3)
5,656,942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane	106	1995
6,096,567 Method and apparatus for direct probe sensing	138	1997
6,320,372 Apparatus and method for testing a substrate having a plurality of terminals	99	1999
ENERGY, UNITED STATES DEPARTMENT OF (3)
4,287,473 Nondestructive method for detecting defects in photodetector and solar cell devices	107	1979
5,523,694 Integrated circuit failure analysis by low-energy charge-induced voltage alteration	118	1994
6,307,672 Microscope collision protection apparatus	79	1996
GENERAL ELECTRIC COMPANY (3)
6,927,598 Test probe for electrical devices having low or no wedge depression	55	2003
6,911,826 Pulsed eddy current sensor probes and inspection methods	61	2003
7,015,690 Omnidirectional eddy current probe and inspection system	96	2004
IBIDEN CO., LTD. (3)
2004/0021,475 Wafer prober	79	2003
2004/0134,899 Ceramic substrate for a semiconductor-production/inspection device	78	2003
2004/0207,072 Ceramic substrate for a semiconductor producing/examining device	82	2004
INTERSTITIAL, LLC (3)
5,704,355 Non-invasive system for breast cancer detection	113	1995
5,829,437 Microwave method and system to detect and locate cancers in heterogenous tissues	117	1996
6,061,589 Microwave antenna for cancer detection system	113	1997
JOHN H. BLANZ COMPANY, INC. (3)
5,097,207 Temperature stable cryogenic probe station	105	1989
5,160,883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support	94	1990
5,166,606 High efficiency cryogenic test station	93	1990
LUCENT TECHNOLOGIES INC. (3)
5,970,429 Method and apparatus for measuring electrical noise in devices	115	1997
6,121,836 Differential amplifier	37	1998
6,245,692 Method to selectively heat semiconductor wafers	89	1999
MICROCONNECT LLC (3)
5,621,333 Contact device for making connection to an electronic circuit device	90	1995
6,046,599 Method and device for making connection	65	1997
6,091,256 Contact device for making connection to an electronic circuit device	62	1997
MOTOROLA MOBILITY LLC (3)
5,751,153 Method and apparatus for characterizing a multiport circuit	39	1996
5,793,213 Method and apparatus for calibrating a network analyzer	92	1996
5,751,252 Method and antenna for providing an omnidirectional pattern	84	1997
NEW WAVE RESEARCH (3)
5,811,751 Multi-wavelength laser system, probe station and laser cutter system using the same	134	1997
6,573,702 Method and apparatus for cleaning electronic test contacts	99	1997
5,963,364 Multi-wavelength variable attenuator and half wave plate	115	1997
NORTHROP GRUMMAN CORPORATION (3)
4,216,467 Hand controller	186	1977
4,581,679 Multi-element circuit construction	99	1985
2005/0026,276 Remote detection and analysis of chemical and biological aerosols	77	2003
OLYMPUS OPTICAL CO., LTD. (3)
5,367,165 Cantilever chip for scanning probe microscope	73	1993
6,006,002 Rigid sleeve device fitted over a flexible insertion section of an endoscope for inspecting industrial equipment	49	1995
6,811,406 Microelectronic spring with additional protruding member	145	2001
SAMSUNG ELECTRONICS CO., LTD. (3)
6,970,001 Variable impedance test probe	72	2003
6,900,653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof	104	2003
6,909,297 Probe card	54	2004
SHARP KABUSHIKI KAISHA (3)
4,899,126 Thick film resistor type printed circuit board	70	1989
5,089,774 Apparatus and a method for checking a semiconductor	126	1990
5,374,938 Waveguide to microstrip conversion means in a satellite broadcasting adaptor	93	1993
SIEMENS AKTIENGESELLSCHAFT (3)
4,275,446 Method and apparatus for measurement of attenuation and distortion by a test object	100	1979
4,805,627 Method and apparatus for identifying the distribution of the dielectric constants in an object	97	1986
5,095,891 Connecting cable for use with a pulse generator and a shock wave generator	96	1987
SONY CORPORATION (3)
6,362,792 Antenna apparatus and portable radio set	76	2000
6,366,247 Antenna device and portable radio set	81	2000
8,035,987 Electronic device having a groove partitioning functional and mounting parts from each other	34	2007
TELEDYNE LECROY, INC. (3)
6,822,463 Active differential test probe with a transmission line input structure	74	2002
6,870,359 Self-calibrating electrical test probe	27	2002
7,019,544 Transmission line input structure test probe	93	2004
THE BOEING COMPANY (3)
4,727,637 Computer aided connector assembly method and apparatus	109	1987
5,202,648 Hermetic waveguide-to-microstrip transition module	53	1991
6,914,427 Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method	58	2003
XANDEX, INC. (3)
5,528,158 Probe card changer system and method	103	1994
5,506,498 Probe card system and method	95	1995
6,166,553 Prober-tester electrical interface for semiconductor test	95	1998
ADVANTEST (SINGAPORE) PTE LTD (2)
6,812,718 Massively parallel interface for electronic circuits	101	2001
6,917,525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs	94	2002
ADVANTEST AMERICA, INC (2)
6,295,729 Angled flying lead wire bonding process	73	1998
6,708,403 Angled flying lead wire bonding process	65	2003
AEHR TEST SYSTEMS (2)
6,340,895 Wafer-level burn-in and test cartridge	99	1999
6,580,283 Wafer level burn-in and test methods	85	1999
AEROSPACE CORPORATION, THE (2)
6,211,663 Baseband time-domain waveform measurement method	112	1999
6,396,298 Active feedback pulsed measurement method	86	2000
BELL TELEPHONE LABORATORIES, INCORPORATED (2)
4,225,819 Circuit board contact contamination probe	56	1978
4,684,883 Method of manufacturing high-quality semiconductor light-emitting devices	93	1985
BRUKER NANO, INC. (2)
5,376,790 Scanning probe microscope	111	1992
5,672,816 Large stage system for scanning probe microscopes and other instruments	114	1995
CNH AMERICA LLC (2)
5,316,435 Three function control system	49	1992
5,360,312 Three function control mechanism	48	1992
DAINIPPON SCREEN MFG. CO., LTD. (2)
4,531,474 Rotary board treating apparatus	87	1984
4,746,857 Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer	94	1986
DCG SYSTEMS, INC. (2)
5,530,372 Method of probing a net of an IC at an optimal probe-point	115	1994
5,675,499 Optimal probe point placement	106	1996
EATON CORPORATION (2)
4,904,935 Electrical circuit board text fixture having movable platens	111	1988
5,471,185 Electrical circuit protection devices comprising conductive liquid compositions	31	1994
ELK FINANCIAL, INC. (2)
6,064,217 Fine pitch contact device employing a compliant conductive polymer bump	129	1996
2002/0011,859 METHOD FOR FORMING CONDUCTIVE BUMPS FOR THE PURPOSE OF CONTRRUCTING A FINE PITCH TEST DEVICE	104	1998
ELM TECHNOLOGY CORPORATION (2)
5,020,219 Method of making a flexible tester surface for testing integrated circuits	160	1989
5,453,404 Method for making an interconnection structure for integrated circuits	124	1994
EMIMAGING LTD (2)
5,715,819 Microwave tomographic spectroscopy system and method	101	1994
6,490,471 Electromagnetical imaging and therapeutic (EMIT) systems	85	2001
EUROPAISCHES LABORATORIUM FUR MOLEKULARBIOLOGIE (EMBL) (2)
6,798,226 Multiple local probe measuring device and method	88	2002
6,943,574 Multiple local probe measuring device and method	59	2004
HEWLETT-PACKARD COMPANY (2)
4,795,962 Floating driver circuit and a device for measuring impedances of electrical components	93	1987
5,133,119 Shearing stress interconnection apparatus and method	64	1991
HITACHI, LTD. (2)
7,012,871 Information recording method and apparatus with suppressed mark edge jitters	76	2004
2005/0186,696 Gas flowmeter and manufacturing method thereof		2005
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (2)
6,049,216 Contact type prober automatic alignment	91	1997
7,012,441 High conducting thin-film nanoprobe card and its fabrication method	102	2003
INTEST CORPORATION (2)
5,900,737 Method and apparatus for automated docking of a test head to a device handler	112	1996
6,259,260 Apparatus for coupling a test head and probe card in a wafer testing system	11	1998
INTEST IP CORPORATION (2)
4,589,815 Electronic test head positioner for test systems	48	1983
4,705,447 Electronic test head positioner for test systems	127	1985
KABUSHIKI KAISHA NIHON MICRONICS (2)
5,888,075 Auxiliary apparatus for testing device	76	1997
6,019,612 Electrical connecting apparatus for electrically connecting a device to be tested	83	1998
KLA-TENCOR CORPORATION (2)
6,633,174 Stepper type test structures and methods for inspection of semiconductor integrated circuits	98	2000
6,771,806 Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices	125	2000
MASSACHUSETTS INSTITUTE OF TECHNOLOGY (2)
5,653,939 Optical and electrical methods and apparatus for molecule detection	402	1995
5,998,768 Active thermal control of surfaces by steering heating beam in response to sensed thermal radiation	98	1998
MICROWAVE IMAGING SYSTEMS TECHNOLOGIES, INC. (2)
5,841,288 Two-dimensional microwave imaging apparatus and methods	112	1997
6,448,788 Fixed array microwave imaging apparatus and method	98	2000
NGK INSULATORS, LTD. (2)
5,280,156 Wafer heating apparatus and with ceramic substrate and dielectric layer having electrostatic chucking means	201	1991
6,001,760 Aluminum nitride sintered body, metal embedded article, electronic functional material and electrostatic chuck	113	1997
NIKON CORPORATION (2)
6,628,503 Gas cooled electrostatic pin chuck for vacuum applications	94	2001
2002/0176,160 Microscope system	36	2002
NORTHROP GRUMMAN SYSTEMS CORPORATION (2)
5,479,109 Testing device for integrated circuits on wafer	116	1994
6,040,739 Waveguide to microstrip backshort with external spring compression	67	1998
RCA CORPORATION (2)
4,284,033 Means to orbit and rotate target wafers supported on planet member	112	1979
4,651,115 Waveguide-to-microstrip transition	79	1985
RENISHAW PLC (2)
5,270,664 Probe for measuring surface roughness by sensing fringe field capacitance effects	121	1992
6,909,983 Calibration of an analogue probe	63	2002
ROBERT BOSCH GMBH (2)
6,066,911 Ultrasonic driving element	117	1998
6,948,981 Compact coupler plug, particularly for a planar broadband lambda probe, in which single-conductor seals are prevented from being lost	53	2002
SEMATECH, INC. (2)
5,159,264 Pneumatic energy fluxmeter	78	1991
5,159,267 Pneumatic energy fluxmeter	80	1992
SKYWORKS SOLUTIONS, INC. (2)
6,582,979 Structure and method for fabrication of a leadless chip carrier with embedded antenna	86	2001
6,770,955 Shielded antenna in a semiconductor package	83	2001
SOLID STATE MEASUREMENTS, INC. (2)
6,900,652 Flexible membrane probe and method of use thereof	104	2003
7,023,231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof	92	2004
SONY ELECTRONICS INC. (2)
5,669,316 Turntable for rotating a wafer carrier	98	1993
2007/0024,506 Systems and methods for high frequency parallel transmissions	77	2006
STAR TECHNOLOGIES INC. (2)
6,906,543 Probe card for electrical testing a chip in a wide temperature range	60	2003
7,253,646 Probe card with tunable stage and at least one replaceable probe	10	2005
STMICROELECTRONICS S.A. (2)
6,146,908 Method of manufacturing a test circuit on a silicon wafer	31	1999
6,480,013 Method for the calibration of an RF integrated circuit probe	99	2000
STOVOKOR TECHNOLOGY LLC (2)
4,991,290 Flexible electrical interconnect and method of making	100	1989
5,170,930 Liquid metal paste for thermal and electrical connections	77	1991
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (2)
6,909,300 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips	54	2002
6,902,941 Probing of device elements	98	2003
TDK CORPORATION (2)
5,510,792 Anechoic chamber and wave absorber	92	1994
7,012,425 Eddy-current probe	93	2005
TECHSEARCH, LLC (2)
4,600,907 Coplanar microstrap waveguide interconnector and method of interconnection	52	1985
4,626,805 Surface mountable microwave IC package	55	1985
TENCOR INSTRUMENTS (2)
4,755,746 Apparatus and methods for semiconductor wafer testing	154	1985
5,852,232 Acoustic sensor as proximity detector	116	1997
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY (2)
6,201,453 H-plane hermetic sealed waveguide probe	12	1998
6,731,804 Thermal luminescence liquid monitoring system and method	73	2000
TRW INC. (2)
4,468,629 NPN Operational amplifier	76	1982
5,126,696 W-Band waveguide variable controlled oscillator	41	1991
U.S. PHILIPS CORPORATION (2)
4,568,890 Microwave oscillator injection locked at its fundamental frequency for producing a harmonic frequency output	22	1983
4,663,840 Method of interconnecting conductors of different layers of a multilayer printed circuit board	72	1985
WI-LAN INC. (2)
5,565,881 Balun apparatus including impedance transformer having transformation length	77	1994
5,628,057 Multi-port radio frequency signal transformation network	96	1996
XEROX CORPORATION (2)
4,780,670 Active probe card for high resolution/low noise wafer level testing	132	1985
6,352,454 Wear-resistant spring contacts	81	1999
YULIM HITECH, INC. (2)
6,922,069 Needle assembly of probe card	60	2003
7,014,499 Probe card for testing semiconductor device	91	2005
3M INNOVATIVE PROPERTIES COMPANY (1)
6,902,416 High density probe device	73	2002
ABB POWER T&D COMPANY, INC., A DE CORP. (1)
4,998,063 Fiber optic coupled magneto-optic sensor having a concave reflective focusing surface	39	1989
ABBOTT LABORATORIES (1)
2005/0165,316 Method for detecting artifacts in data	74	2004
ACOME, SOCIETIES ANONYME (1)
4,621,169 Electric cable construction and uses therefor	92	1985
ADE CORPORATION (1)
5,642,298 Wafer testing and self-calibration system	105	1996
ADVANCED MICRO DEVICES, INC. (1)
6,396,296 Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station	95	2000
AG COMMUNICATION SYSTEMS CORPORATION, 2500 W. UTOPIA RD., PHOENIX, AZ 85027, A DE CORP. (1)
4,684,884 Universal test circuit for integrated circuit packages	74	1985
ALBANY INSTRUMENTS, INC. (1)
6,933,717 Sensors and probes for mapping electromagnetic fields	57	2004
ALERI INC. (1)
6,924,655 Probe card for use with microelectronic components, and methods for making same	55	2003
ALPS ELECTRIC CO., LTD. (1)
4,725,793 Waveguide-microstrip line converter	84	1986
ALSTOM (1)
5,813,847 Device and method for injecting fuels into compressed gaseous media	75	1996
AMP INCORPORATED (1)
4,652,082 Angled electro optic connector	56	1984
AMPEX CORPORATION (1)
4,375,631 Joystick control	61	1981
ANDO ELECTRIC CO., LTD. (1)
2001/0054,906 Probe card and a method of manufacturing the same	76	2001
ARIES ELECTRONICS, INC. (1)
6,937,045 Shielded integrated circuit probe	61	2004
ARRAY BIOSCIENCE CORPORATION (1)
6,707,548 Systems and methods for filter based spectrographic analysis	95	2001
ASAHI KOGAKU KOGYO KABUSHIKI KAISHA (1)
5,267,088 Code plate mounting device	82	1990
AT & T TECHNOLOGIES, INC., (1)
4,837,507 High frequency in-circuit test fixture	73	1987
ATG TEST SYSTEMS GMBH & CO. KG (1)
7,015,711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method	103	2004
ATMEL CORPORATION (1)
4,649,339 Integrated circuit interface	113	1984
AUTOCYTE NORTH CAROLINA, L.L.C. (1)
5,659,421 Slide positioning and holding device	102	1995
AVAGO TECHNOLOGIES ECBU IP (SINGAPORE) PTE. LTD. (1)
5,066,357 Method for making flexible circuit card with laser-contoured vias and machined capacitors	106	1990
BARKER REVOCABLE TRUST U/A/D (1)
5,202,558 Flexible fiber optic probe for high-pressure shock experiments	101	1992
BECHTEL BWXT IDAHO, LLC (1)
6,147,502 Method and apparatus for measuring butterfat and protein content using microwave absorption techniques	77	1998
BERTHOLD TECHNOLOGIES GMBH & CO. KG (1)
5,369,368 Device for determining material parameters by means of microwave measurements	78	1993
BILL, ELVIN STUART, 3 MARK ST., DUNDAS VALLEY, 2117 (1)
4,223,658 Elastic band projecting toy gun	50	1978
BIOTRONIC SYSTEMS CORPORATION (1)
5,082,627 Three dimensional binding site array for interfering with an electrical field	83	1987
BOARD OF REGENTS OF THE UNIVERSITY OF WISCONSIN SYSTEM, THE, AN INSTITUTE OF WI (1)
5,233,306 Method and apparatus for measuring the permittivity of materials	99	1991
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM (1)
2003/0119,057 Forming and modifying dielectrically-engineered microparticles	95	2001
BROADCOM CORPORATION (1)
7,088,981 Apparatus for reducing flicker noise in a mixer circuit	93	2001
BROOKS AUTOMATION, INC. (1)
5,539,323 Sensor for articles such as wafers on end effector	115	1993
BRUKER BIOSPIN CORPORATION (1)
6,933,725 NMR probe circuit for generating close frequency resonances	59	2004
CALIFORNIA INSTITUTE OF TECHNOLOGY (1)
5,138,289 Noncontacting waveguide backshort	40	1990
CARDIFF AND VALE NHS TRUST (1)
2004/0175,294 Apparatus and method for analysing a biological sample in response to microwave radiation	73	2004
CARL-ZEISS-STIFTUNG (1)
4,515,439 Attachment of microscope objectives	77	1982
CBC CORPORATION (1)
4,306,235 Multiple frequency microwave antenna	40	1978
CERPROBE CORPORATION (1)
6,002,426 Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits	108	1997
CHENG, DAVID (1)
5,479,108 Method and apparatus for handling wafers	155	1992
CHIPMOS TECHNOLOGIES INC. (1)
6,946,860 Modularized probe head	54	2003
CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,759,859 Resilient and rugged multi-layered probe	32	2001
CIRCUIT COMPONENTS, INCORPORATED (1)
4,793,814 Electrical circuit board interconnect	254	1986
CIRREX SYSTEMS LLC (1)
6,222,970 Methods and apparatus for filtering an optical fiber	129	1999
COM DEV LTD. (1)
5,841,342 Voltage controlled superconducting microwave switch and method of operation thereof	40	1995
COMMSCOPE, INC. OF NORTH CAROLINA (1)
6,407,542 Implementation of a multi-port modal decomposition system	42	2000
COMPAQ COMPUTER CORPORATION (1)
5,500,606 Completely wireless dual-access test fixture	112	1993
CONIFER CORPORATION (1)
5,293,175 Stacked dual dipole MMDS feed	133	1993
CONTEL FEDERAL SYSTEMS, INC., A DE CORP. (1)
4,184,729 Flexible connector cable	104	1977
CREDENCE SYSTEMS CORPORATION (1)
5,883,523 Coherent switching power for an analog circuit tester	102	1997
CROWN CORK & SEAL TECHNOLOGIES CORPORATION (1)
6,130,536 Preform test fixture and method of measuring a wall thickness	37	1998
CROWN PRODUCTS, INC. (1)
7,019,541 Electric conductivity water probe	94	2004
CSI TECHNOLOGY, INC. (1)
6,091,236 System and method for measuring and analyzing electrical signals on the shaft of a machine	93	1997
D-LINK CORPORATION (1)
6,778,140 Atch horn antenna of dual frequency	71	2003
DATA PROBE CORPORATION (1)
4,588,950 Test system for VLSI digital circuit and method of testing	91	1983
DEBIOTECH S.A. (1)
7,005,078 Micromachined fluidic device and method for making same	116	2001
DELPHI TECHNOLOGIES, INC. (1)
7,015,709 Ultra-broadband differential voltage probes	97	2004
DERMON, JOHN A. (1)
4,980,638 Microcircuit probe and method for manufacturing same	25	1989
DESIGNTECH INTERNATIONAL, INC. (1)
5,041,782 Microstrip probe	94	1989
DEUTSCHE THOMSON-BRANDT GMBH (1)
4,685,150 Tuning of a resonant circuit in a communications receiver	53	1984
DH TECHNOLOGIES DEVELOPMENT PTE. LTD. (1)
6,627,461 Method and apparatus for detection of molecular events using temperature control of detection environment	89	2001
DIMENSION POLYANT SAILCLOTH, INC. (1)
6,013,586 Tent material product and method of making tent material product	88	1997
DIT-MCO INTERNATIONAL CORPORATION (1)
4,357,575 Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies	114	1980
DYNEX SEMICONDUCTOR LIMITED (1)
6,265,950 Transition from a waveguide to a strip transmission line	84	1999
EADS DEUTSCHLAND GMBH (1)
6,636,182 Structural antenna for flight aggregates or aircraft	72	2001
EAST GIANT LIMITED (1)
5,879,289 Hand-held portable endoscopic camera	141	1996
EASTMAN KODAK COMPANY (1)
5,848,500 Light-tight enclosure and joint connectors for enclosure framework	101	1997
ECLIPSE SURGICAL TECHNOLOGIES, INC. (1)
5,728,091 Optical fiber for myocardial channel formation	55	1995
EDO CORPORATION, BARNES DIVISION (1)
4,755,874 Emission microscopy system	154	1987
ELECTRIC POWER RESEARCH INSTITUTE, INC. (1)
4,487,996 Shielded electrical cable	103	1982
ELECTRO SCIENTIFIC INDUSTRIES, INC. (1)
6,100,815 Compound switching matrix for probing and interconnecting devices under test to measurement equipment	90	1997
ELECTRONICS RESEARCH, INC. (1)
2004/0100,276 Method and apparatus for calibration of a vector network analyzer	98	2002
ELPIDA MEMORY, INC. (1)
7,319,337 Method and apparatus for pad aligned multiprobe wafer testing	19	2007
ENDEVCO CORPORATION (1)
5,214,243 High-temperature, low-noise coaxial cable assembly with high strength reinforcement braid	123	1991
EVERETT CHARLES TECHNOLOGIES, INC. (1)
5,214,374 Dual level test fixture	99	1991
FAIRCHILD SEMICONDUCTOR CORPORATION (1)
5,357,211 Pin driver amplifier	81	1993
FELTEN & GUILLEAUME ENERGIETECHNIK AG (1)
4,972,073 Light wave conductor-bending sensor with sliding rails for monitoring bridge structures or the like	46	1990
FILOTEX (1)
5,397,855 Low noise cable	92	1993
FINCH INTERNATIONAL LIMITED (1)
5,281,364 Liquid metal electrical contact compositions	13	1992
FLUKE CORPORATION (1)
6,384,614 Single tip Kelvin probe	100	2000
FORMFACTOR, ET AL. (1)
6,937,037 Probe card assembly for contacting a device with raised contact elements	59	2002
FRAMATOME TECHNOLOGIES, INC. (1)
5,756,908 Probe positioner	41	1996
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. (1)
6,653,903 Supply voltage decoupling device for HF amplifier circuits	71	2001
FRESH QUEST CORPORATION (1)
5,589,781 Die carrier apparatus	72	1993
FUJI PHOTO FILM CO., LTD. (1)
4,727,391 Sheet film package and device for loading sheet films	80	1987
FUJIKURA LTD. (1)
4,626,618 DC electric power cable	97	1985
FUJIKURA RUBBER WORKS, LTD. (1)
4,425,395 Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production	95	1982
FUJITA, TAKAFUMI (1)
6,933,736 Prober	56	2003
GARMIN CORPORATION (1)
5,966,645 Transmitter with low-level modulation and minimal harmonic emissions	39	1997
GATAN, INC. (1)
6,914,244 Ion beam milling system and method for electron microscopy specimen preparation	78	2004
GCB INDUSTRIES, INC. (1)
6,229,327 Broadband impedance matching probe	101	1997
GE CAPITAL EQUITY INVESTMENTS, INC. (1)
6,628,980 Apparatus, systems, and methods for in vivo magnetic resonance imaging	123	2001
GEBR. MARZHAUSER WETZLAR OHG (1)
4,552,033 Drive system for a microscope stage or the like	105	1984
GEC FERRANTI DEFENCE SYSTEMS LIMITED (1)
4,714,873 Microwave noise measuring apparatus	48	1986
GENERAL DIELECTRIC, INC. (1)
2002/0050,828 Multi-feed microwave reflective resonant sensors	76	2001
GENERAL ELECTRIC MEDICAL SYSTEMS ISRAEL LTD., AN ISRAEL CORPORATION AFFILIATED WITH GENERAL ELECTRIC COMPANY (1)
4,691,163 Dual frequency surface probes	111	1985
GENERAL MOTORS CORPORATION (1)
4,277,741 Microwave acoustic spectrometer	81	1979
GENETRONICS, INC. (1)
5,869,326 Electroporation employing user-configured pulsing scheme	113	1996
GILLESPIE, ROBB S. (1)
6,481,939 Tool tip conductivity contact sensor and method	86	2001
GOOGLE INC. (1)
6,078,500 Pluggable chip scale package	103	1998
GTE PRODUCTS CORPORATION (1)
4,653,174 Method of making packaged IC chip	28	1986
GTE VALERON CORPORATION (1)
4,401,945 Apparatus for detecting the position of a probe relative to a workpiece	95	1981
GYRUS MEDICAL LIMITED (1)
6,409,724 Electrosurgical instrument	99	2000
H+W TEST PRODUCTS, INC. (1)
6,054,869 Bi-level test fixture for testing printed circuit boards	93	1998
HAMAMATSU PHOTONICS K.K. (1)
4,922,186 Voltage detector	80	1988
HERSTEIN, DOV (1)
4,810,981 Assembly of microwave components	88	1987
HITACHI SOFTWARE ENGINEERING CO., LTD. (1)
7,035,738 Probe designing apparatus and probe designing method	92	2002
HITACHI ULSI SYSTEMS CO., LTD. (1)
6,734,687 Apparatus for detecting defect in device and method of detecting defect	107	2001
HONEYWELL INC. (1)
5,347,204 Position dependent rate dampening in any active hand controller	55	1992
HOUSTON ADVANCED RESEARCH CENTER, A CORP. OF TX (1)
5,846,708 Optical and electrical methods and apparatus for molecule detection	271	1992
HP HOLDINGS THREE, INC. (1)
5,995,914 Method and apparatus for asynchronously measuring frequency shifted signals	99	1996
HYNIX SEMICONDUCTOR INC. (1)
7,002,364 Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same	94	2003
HYPERVISION, INC. (1)
5,475,316 Transportable image emission microscope	129	1993
HYPRES, INC. (1)
4,894,612 Soft probe for providing high speed on-wafer connections to a circuit	153	1988
INIZIATIVE MARITTIME 1991 S.R.L. (1)
5,245,292 Method and apparatus for sensing a fluid handling	73	1992
INTEGRAL TECHNOLOGIES, INC. (1)
7,006,046 Low cost electronic probe devices manufactured from conductive loaded resin-based materials	93	2004
INTEGRATED TECHNOLOGY CORPORATION (1)
6,118,894 Integrated circuit probe card inspection system	113	1997
INTERMEC IP CORP. (1)
6,236,223 Method and apparatus for wireless radio frequency testing of RFID integrated circuits	148	1999
INTERSIL CORPORATION (1)
4,528,504 Pulsed linear integrated circuit tester	95	1982
ITERRA COMMUNICATIONS, LLC (1)
6,794,934 High gain wideband driver amplifier	75	2001
IWASAKI CORRESPOND INDUSTRY CO., LTD. (1)
6,933,737 Probe card	54	2003
J.A. WOOLLAM CO., INC. (1)
6,937,341 System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation	79	2002
JEOL RESONANCE INC. (1)
6,914,430 NMR probe	56	2004
JPK INSTRUMENTS AG (1)
7,022,985 Apparatus and method for a scanning probe microscope	97	2002
JPMORGAN CHASE BANK, N.A. (1)
5,678,210 Method and apparatus of coupling a transmitter to a waveguide in a remote ground terminal	41	1995
JSR CORPORATION (1)
7,071,722 Anisotropic, conductive sheet and impedance measuring probe	34	2003
JUNKOSHA CO., LTD. (1)
4,567,321 Flexible flat cable	99	1984
KAI TECHNOLOGIES, INC. (1)
6,275,738 Microwave devices for medical hyperthermia, thermotherapy and diagnosis	114	1999
KAISER OPTICAL SYSTEMS (1)
6,907,149 Compact optical measurement probe	61	2003
KDC TECHNOLOGY CORP. (1)
5,227,730 Microwave needle dielectric sensors	93	1992
KEITHLEY INSTRUMENTS, INC. (1)
6,104,206 Product wafer junction leakage measurement using corona and a kelvin probe	110	1997
KOCH, LINDA (1)
4,567,436 Magnetic thickness gauge with adjustable probe	33	1982
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,528,993 Magneto-optical microscope magnetometer	78	2000
KRAFTWERK UNION AKTIENGESELLSCHAFT (1)
4,642,417 Concentric three-conductor cable	112	1985
KYOCERA CORPORATION (1)
6,987,483 Effectively balanced dipole microstrip antenna	77	2003
L&P PROPERTY MANAGEMENT COMPANY (1)
5,505,150 Method and apparatus for facilitating loop take time adjustment in multi-needle quilting machine	84	1994
L-3 COMMUNICATIONS ELECTRON TECHNOLOGIES, INC. (1)
5,148,131 Coaxial-to-waveguide transducer with improved matching	43	1991
LAM RESEARCH CORPORATION (1)
7,015,703 Radio frequency Langmuir probe	93	2004
LAURENCE J. MARHOEFER (1)
5,097,101 Method of forming a conductive contact bump on a flexible substrate and a flexible substrate	92	1991
LEXINGTON, MA. 02173 A CORP OF DE. (1)
4,502,028 Programmable two-port microwave network	31	1982
LEXMARK INTERNATIONAL, INC. (1)
6,154,238 Scanning print head	42	1997
LION APPAREL, INC. (1)
5,157,790 Firefighter garment with lumbar support	46	1991
LOGICVISION, INC. (1)
2005/0229,053 Circuit and method for low frequency testing of high frequency signal waveforms	30	2004
M/A-COM TECHNOLOGY SOLUTIONS HOLDINGS, INC. (1)
5,142,224 Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals	101	1991
M/A-COM, INC. (1)
4,376,920 Shielded radio frequency transmission cable	139	1981
MAGMA DESIGN AUTOMATION, INC. (1)
5,030,907 CAD driven microprobe integrated circuit tester	110	1989
MARTIN MARIETTA CORPORATION (1)
5,867,073 Waveguide to transmission line transition	82	1994
MATRA BAE DYNAMICS (UK) LIMITED (1)
5,266,963 Integrated antenna/mixer for the microwave and millimetric wavebands	51	1991
MATTSON TECHNOLOGY, INC. (1)
6,172,337 System and method for thermal processing of a semiconductor substrate	99	1999
MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH (1)
4,551,747 Leadless chip carrier apparatus providing for a transmission line environment and improved heat dissipation	108	1982
MCC GESELLSCHAFT FUR DIAGNOSESYSTEME IN MEDIZIN UND TECHNIK MBH & CO. KG (1)
2005/0168,722 Device and method for measuring constituents in blood	1	2003
MEDICAL COLLEGE OF GEORGIA RESEARCH INSTITUTE, INC. (1)
5,488,954 Ultrasonic transducer and method for using same	125	1994
MEDICAL DEVICE INNOVATIONS LIMITED (1)
2006/0155,270 Tissue ablation apparatus and method of ablating tissue	94	2003
MEDISPECTRA, INC. (1)
2004/0186,382 Spectral volume microprobe arrays	74	2003
MEDXENSE AS (1)
7,003,184 Fiber optic probes	101	2001
MENTOR GRAPHICS CORPORATION (1)
5,383,787 Integrated circuit package with direct access to internal signals	58	1993
MERCK & CO., INC. (1)
7,013,221 Iterative probe design and detailed expression profiling with flexible in-situ synthesis arrays	92	2000
MESO SCALE TECHNOLOGIES, LLC (1)
2005/0142,033 Modular assay plates, reader systems and methods for test measurements	52	2004
MICROCRAFT (1)
7,188,037 Method and apparatus for testing circuit boards	76	2004
MITEL SEMICONDUCTOR LIMITED (1)
5,764,070 Structure for testing bare integrated circuit devices	57	1996
MITSUBISHI GAS CHEMICAL COMPANY, INC. (1)
6,222,031 Process for preparing water-soluble tricarboxypolysaccharide	80	1998
MOLECULAR DEVICES, INC. (1)
5,164,319 Multiple chemically modulated capacitance determination	245	1989
MTU MOTOREN- UND TURBINEN-UNION MUENCHEN GMBH (1)
5,232,789 Structural component with a protective coating having a nickel or cobalt basis and method for making such a coating	89	1992
MURATA MANUFACTURING CO., LTD. (1)
6,838,885 Method of correcting measurement error and electronic component characteristic measurement apparatus	97	2003
NCR CORPORATION (1)
6,816,840 System and method of sending messages to a group of electronic price labels	37	1998
NEBRASKA ELECTRONICS, INC. (1)
5,481,196 Process and apparatus for microwave diagnostics and therapy	82	1994
NEC ELECTRONICS CORPORATION (1)
6,320,396 Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device	97	1997
NEWPORT FAB, LLC (1)
6,727,716 Probe card and probe needle for high frequency testing	93	2002
NIHON DENSHIZAIRYO KABUSHIKI KAISHA (1)
5,134,365 Probe card in which contact pressure and relative position of each probe end are correctly maintained	85	1991
NISSAN CHEMICAL INDUSTRIES, LTD. (1)
5,021,186 Chloroisocyanuric acid composition having storage stability	74	1989
NITTO DENKO CORPORATION (1)
5,977,783 Multilayer probe for measuring electrical characteristics	61	1997
NORTEL NETWORKS LIMITED (1)
4,853,624 Tunable microwave wafer probe	91	1988
NOVELLUS DEVELOPMENT COMPANY, LLC (1)
6,946,859 Probe structures using clamped substrates with compliant interconnectors	45	2003
NUCLEAR FILTER TECHNOLOGY, INC. (1)
6,948,391 Probe with integral vent, sampling port and filter element	57	2003
NXP B.V. (1)
6,275,043 Test device for testing a module for a data carrier intended for contactless communication	41	1999
OKI SEMICONDUCTOR CO., LTD. (1)
6,927,078 Method of measuring contact resistance of probe and method of testing semiconductor device	58	2003
OL SECURITY LIMITED LIABILITY COMPANY (1)
5,688,618 Millimeter wave device and method of making	41	1995
OLAER INDUSTRIES (1)
4,788,851 Pressure vessel incorporating a sensor for detecting liquid in a gas chamber	42	1987
OLYMPUS CORPORATION (1)
4,696,544 Fiberscopic device for inspection of internal sections of construction, and method for using same	89	1985
OMNIPROBE, INC. (1)
6,420,722 Method for sample separation and lift-out with one cut	107	2001
OPTOMETRIX, INC. (1)
6,181,416 Schlieren method for imaging semiconductor device properties	80	1999
OSRAM OPTO SEMICONDUCTORS GMBH & CO. OHG (1)
6,946,864 Method for measuring product parameters of components formed on a wafer and device for performing the method	20	2002
PACIFIC WESTERN SYSTEMS, INC. (1)
4,251,772 Probe head for an automatic semiconductive wafer prober	45	1978
PHILIPS ELECTRONICS NORTH AMERICA CORPORATION (1)
4,593,243 Coplanar and stripline probe card apparatus	112	1984
PICO TECHNOLOGY HOLDINGS, INC. (1)
6,335,625 Programmable active microwave ultrafine resonance spectrometer (PAMURS) method and systems	84	2000
PINNACLE PRODUCTS, INC. (1)
5,807,107 Dental infection control system	90	1996
POPKIN FAMILY ASSETS, L.L.C. (1)
6,418,009 Broadband multi-layer capacitor	85	2000
PREMIER MICROWAVE OF CALIFORNIA, INC. (1)
4,740,764 Pressure sealed waveguide to coaxial line connection	45	1987
PREMTEK INTERNATIONAL INC. (1)
2005/0116,730 DOUBLE-FACED DETECTING DEVICES FOR AN ELECTRONIC SUBSTRATE	27	2003
PROBE-RITE, INC. (1)
4,636,722 High density probe-head with isolated and shielded transmission lines	152	1984
PRODONT, INC. (1)
7,034,553 Direct resistance measurement corrosion probe	94	2003
PROFILE TECHNOLOGIES, INC. (1)
2001/0044,152 Dual beam, pulse propagation analyzer, medical profiler interferometer	71	2001
PROMOS TECHNOLOGIES INC. (1)
2003/0234,659 Electrical isolation between pins sharing the same tester channel	16	2002
PURDUE RESEARCH FOUNDATION (1)
2004/0147,034 Method and apparatus for measuring a substance in a biological sample	112	2003
QINETIQ LIMITED (1)
5,803,607 Method and apparatus for measurement of unsteady gas temperatures	41	1997
QUALCOMM INCORPORATED (1)
6,737,920 Variable gain amplifier	75	2002
RELIABILITY INCORPORATED (1)
2002/0070,745 Cooling system for burn-in unit	82	2000
REMOLEAUX TECHNOLOGIES AG, LLC (1)
5,686,960 Image input device having optical deflection elements for capturing multiple sub-images	124	1994
RESEARCH IN MOTION LIMITED (1)
5,949,383 Compact antenna structures including baluns	109	1997
RESEARCH IN MOTION RF, INC. (1)
6,794,950 Waveguide to microstrip transition	81	2001
RESEARCH ORGANIZATION FOR CIRCUIT KNOWLEDGE (1)
5,584,120 Method of manufacturing printed circuits	75	1994
RIKEN DENSHI CO., LTD. (1)
4,636,772 Multiple function type D/A converter	46	1985
ROCKSTAR BIDCO, LP (1)
6,753,679 Test point monitor using embedded passive resistance	81	2002
ROCKWELL INTERNATIONAL CORPORATION (1)
4,184,133 Assembly of microwave integrated circuits having a structurally continuous ground plane	51	1977
ROSEMOUNT TANK RADAR AB (1)
6,278,411 Horn antenna	76	1999
ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG (1)
2004/0066,181 High-frequency probe tip	79	2003
ROUND ROCK RESEARCH, LLC (1)
5,126,286 Method of manufacturing edge connected semiconductor die	143	1990
RUDOLPH TECHNOLOGIES, INC. (1)
6,710,798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card	105	1999
SAE MAGNETICS (H.K.) LTD. (1)
7,015,689 Connection method for probe pins for measurement of characteristics of thin-film magnetic head and characteristic measurement method for thin-film magnetic head	93	2003
SANDIA CORPORATION (1)
6,078,183 Thermally-induced voltage alteration for integrated circuit analysis	127	1998
SANTEC CORPORATION (1)
7,323,680 Optical deflection probe and optical deflection probe device	19	2006
SANTRONICS, INC. (1)
7,030,599 Hand held voltage detection probe	95	2004
SARNOFF CORPORATION (1)
5,993,611 Capacitive denaturation of nucleic acid	100	1997
SCHLUMBERGER TECHNOLOGY CORPORATION (1)
4,766,384 Well logging apparatus for determining dip, azimuth, and invaded zone conductivity	98	1986
SCIENCE & TECHNOLOGY CORPORATION @ UNM (1)
6,549,022 Apparatus and method for analyzing functional failures in integrated circuits	121	2000
SEIKO INSTRUMENTS INC. (1)
7,015,455 Near-field optical probe	91	2005
SEMCO MACHINE CORPORATION (1)
5,550,481 Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making	40	1995
SEMICONDUCTOR DIAGNOSTICS, INC. (1)
6,114,865 Device for electrically contacting a floating semiconductor wafer having an insulating film	109	1999
SEMICONDUCTOR PHYSICS LABORATORY, INC. (1)
6,052,653 Spreading resistance profiling system	98	1997
SEMILAB SEMICONDUCTOR PHYSICS LABORATORY, CO., LTD. (1)
6,388,455 Method and apparatus for simulating a surface photo-voltage in a substrate	42	2000
SEMITEST, INC. (1)
4,891,584 Apparatus for making surface photovoltage measurements of a semiconductor	134	1988
SENSHIN CAPITAL, LLC (1)
5,633,780 Electrostatic discharge protection device	112	1996
SENSOR DIAGNOSTICS, INC. (1)
4,713,347 Measurement of ligand/anti-ligand interactions using bulk conductance	190	1985
SHARP LABORATORIES OF AMERICA, INC. (1)
7,057,404 Shielded probe for testing a device under test	20	2003
SHOSHOTECH CO., LTD. (1)
6,351,885 Method of making conductive bump on wiring board	60	1998
SIERRA MONOLITHICS, INC. (1)
6,639,461 Ultra-wideband power amplifier module apparatus and method for optical and electronic communications	79	2001
SIGNATURE BIOSCIENCESM INC. (1)
6,395,480 Computer program and database structure for detecting molecular binding events	95	1999
SII NANOTECHNOLOGY INC. (1)
6,621,082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function	97	2002
SILICONIX INCORPORATED (1)
6,476,442 Pseudo-Schottky diode	86	1998
SINGULUS TECHNOLOGIES GMBH (1)
5,876,082 Device for gripping and holding substrates	68	1997
SIROTECH LTD. (1)
5,824,494 Method for enumerating bacterial populations	89	1995
SLOAN TECHNOLOGY CORPORATION, A CORP. OF CA (1)
4,707,657 Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine	147	1985
SMITHS GROUP PLC (1)
4,706,050 Microstrip devices	77	1985
SMSC ANALOG TECHNOLOGY, INC. (1)
6,753,699 Integrated circuit and method of controlling output impedance	75	2002
SNAP-ON TECHNOLOGIES, INC. (1)
6,940,283 Detecting field from different ignition coils using adjustable probe	52	2003
SOHN, LYDIA L. (1)
2003/0072,549 Method and apparatus for dielectric spectroscopy of biological solutions	97	2002
SOLID STATE FARMS, INC. (1)
5,792,668 Radio frequency spectral analysis for in-vitro or in-vivo environments	146	1996
SPAR AEROSPACE LIMITED (1)
5,116,180 Human-in-the-loop machine control loop	238	1990
SPECTROSCOPY IMAGING SYSTEMS CORPORATION (1)
4,916,398 Efficient remote transmission line probe tuning for NMR apparatus	93	1988
ST. CLAIR INTELLECTUAL PROPERTY CONSULTANTS, INC. (1)
4,904,933 Integrated circuit probe station	111	1986
STIFTELSEN INSTITUTET FOR MIKROVAGSTEKNIK VID TEKNISKA HOGSKOLAN I STOCKHOLM (1)
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OTHER [CHECK PATENT PROFILE FOR ASSIGNMENT INFORMATION] (37)
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4,515,133 Fuel economizing device	75	1984
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4,791,363 Ceramic microstrip probe blade	135	1987
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5,584,608 Anchored cable sling system	82	1994
5,670,322 Multi site molecule detection method	163	1995
5,670,888 Method for transporting and testing wafers	124	1995
5,621,400 Ice detection method and apparatus for an aircraft	41	1995
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5,831,442 Handling device	94	1996
5,675,932 Plant growing system	89	1996
5,949,579 Flexible darkness adapting viewer	87	1997
6,307,363 Ultrahigh-frequency high-impedance passive voltage probe	46	1998
RE37130 Signal conditioning apparatus	30	1998
6,147,851 Method for guarding electrical regions having potential gradients	89	1999
6,327,034 Apparatus for aligning two objects	88	1999
6,548,311 Device and method for detecting analytes	98	2000
2001/0002,794 Split resistor probe and method	77	2001
2002/0030,480 Apparatus for the automated testing, calibration and characterization of test adapters	12	2001
6,587,327 Integrated broadband ceramic capacitor array	103	2002
2003/0076,585 Optical system for enhancing the image from a microscope's high power objective lens	30	2002
2003/0139,662 Method and apparatus for detecting, identifying and performing operations on microstructures including, anthrax spores, brain cells, cancer cells, living tissue cells, and macro-objects including stereotactic neurosurgery instruments, weapons and explosives	80	2002
7,015,707 Micro probe	107	2003
2004/0193,382 Method and apparatus for calibrating a multiport test system for measurement of a DUT	94	2004
2006/0030,060 Apparatus and method for testing defects	36	2005

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