US Patent No: 7,619,419

Wideband active-passive differential signal probe

ALSO PUBLISHED AS: 20060290357

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Nov 17, 2009
Issued date
Apr 28, 2006
filing date
11/413,738
serial no
In Force

status (Latency Note)

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Importance

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Abstract

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A wideband differential signal probe includes separate paths to convert a lower frequency component and a higher frequency component of a differential signal to a lower frequency single ended signal and a higher frequency single ended signal which are combined for the probe's output which is commonly input to instrumentation.

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First Claim

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Patent Owner(s)

Patent Owner	Address	Total Patents
CASCADE MICROTECH, INC.	BEAVERTON, OR	259

International Classification(s)

G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....

[Classification Symbol]

[Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Campbell, Richard	Portland, OR	36	59

Cited Art Landscape

Patent Info	# Cites	Year
FormFactor, Inc. (156)
5,476,211 Method of manufacturing electrical contacts, using a sacrificial member	363	1993
5,917,707 Flexible contact structure with an electrically conductive shell	300	1994
6,049,976 Method of mounting free-standing resilient electrical contact structures to electronic components	123	1995
5,772,451 Sockets for electronic components and methods of connecting to electronic components	355	1995
5,974,662 Method of planarizing tips of probe elements of a probe card assembly	355	1995
5,829,128 Method of mounting resilient contact structures to semiconductor devices	222	1995
5,852,871 Method of making raised contacts on electronic components	135	1995
5,601,740 Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires	113	1995
5,820,014 Solder preforms	121	1996
5,773,780 Method of severing bond wires and forming balls at their ends	76	1996
5,900,738 Contact structure device for interconnections, interposer, semiconductor assembly and package using the same and method	147	1996
5,926,951 Method of stacking electronic components	158	1996
6,184,587 Resilient contact structures, electronic interconnection component, and method of mounting resilient contact structures to electronic components	119	1996
6,242,803 Semiconductor devices with integral contact structures	90	1996
6,274,823 Interconnection substrates with resilient contact structures on both sides	116	1996
6,476,333 Raised contact structures (solder columns)	72	1996
6,064,213 Wafer-level burn-in and test	260	1997
5,806,181 Contact carriers (tiles) for populating larger substrates with spring contacts	265	1997
5,994,152 Fabricating interconnects and tips using sacrificial substrates	189	1997
6,442,831 Method for shaping spring elements	73	1997
6,482,013 Microelectronic spring contact element and electronic component having a plurality of spring contact elements	147	1997
5,832,601 Method of making temporary connections between electronic components	191	1997
5,864,946 Method of making contact tip structures	164	1997
5,878,486 Method of burning-in semiconductor devices	108	1997
5,884,398 Mounting spring elements on semiconductor devices	104	1997
5,983,493 Method of temporarily, then permanently, connecting to a semiconductor device	118	1997
5,998,228 Method of testing semiconductor	127	1997
6,032,356 Wafer-level test and burn-in, and semiconductor process	161	1997
6,184,053 Method of making microelectronic spring contact elements	200	1997
5,912,046 Method and apparatus for applying a layer of flowable coating material to a surface of an electronic component	78	1997
5,998,864 Stacking semiconductor devices, particularly memory chips	183	1997
6,050,829 Making discrete power connections to a space transformer of a probe card assembly	155	1997
6,307,161 Partially-overcoated elongate contact structures	70	1997
6,043,563 Electronic components with terminals and spring contact elements extending from areas which are remote from the terminals	165	1997
6,741,085 Contact carriers (tiles) for populating larger substrates with spring contacts	91	1997
6,520,778 Microelectronic contact structures, and methods of making same	152	1998
6,720,501 PC board having clustered blind vias	69	1998
6,042,712 Apparatus for controlling plating over a face of a substrate	115	1998
6,090,261 Method and apparatus for controlling plating over a face of a substrate	83	1998
6,110,823 Method of modifying the thickness of a plating on a member by creating a temperature gradient on the member, applications for employing such a method, and structures resulting from such a method	179	1998
6,023,103 Chip-scale carrier for semiconductor devices including mounted spring contacts	155	1998
6,033,935 Sockets for "springed" semiconductor devices	109	1998
6,669,489 Interposer, socket and assembly for socketing an electronic component and method of making and using same	111	1998
6,330,164 Interconnect assemblies and methods including ancillary electronic component connected in immediate proximity of semiconductor device	124	1998
6,029,344 Composite interconnection element for microelectronic components, and method of making same	209	1998
6,246,247 Probe card assembly and kit, and methods of using same	117	1998
6,441,315 Contact structures with blades having a wiping motion	113	1998
6,690,185 Large contactor with multiple, aligned contactor units	126	1998
6,255,126 Lithographic contact elements	185	1998
6,268,015 Method of making and using lithographic contact springs	124	1998
6,150,186 Method of making a product with improved material properties by moderate heat-treatment of a metal incorporating a dilute additive	97	1998
6,429,029 Concurrent design and subsequent partitioning of product and test die	151	1998
6,456,099 Special contact points for accessing internal circuitry of an integrated circuit	111	1998
6,215,670 Method for manufacturing raised electrical contact pattern of controlled geometry	95	1999
6,208,225 Filter structures for integrated circuit interfaces	146	1999
6,218,910 High bandwidth passive integrated circuit tester probe card assembly	139	1999
6,448,865 Integrated circuit interconnect system	73	1999
6,452,411 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses	103	1999
6,480,978 Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons	80	1999
6,499,121 Distributed interface for parallel testing of multiple devices using a single tester channel	95	1999
6,627,483 Method for mounting an electronic component	93	1999
6,644,982 Method and apparatus for the transport and tracking of an electronic component	114	1999
6,887,723 Method for processing an integrated circuit including placing dice into a carrier and testing	74	1999
6,468,098 Electrical contactor especially wafer level contactor using fluid pressure	95	1999
6,655,023 Method and apparatus for burning-in semiconductor devices in wafer form	82	1999
6,827,584 Interconnect for microelectronic structures with enhanced spring characteristics	92	1999
6,491,968 Methods for making spring interconnect structures	100	1999
6,672,875 Spring interconnect structures	106	1999
6,339,338 Apparatus for reducing power supply noise in an integrated circuit	89	2000
6,168,974 Process of mounting spring contacts to semiconductor devices	111	2000
6,459,343 Integrated circuit interconnect system forming a multi-pole filter	70	2000
6,232,149 Sockets for "springed" semiconductor devices	78	2000
6,509,751 Planarizer for a semiconductor contactor	135	2000
6,215,196 Electronic component with terminals and spring contact elements extending from areas which are remote from the terminals	71	2000
6,640,432 Method of fabricating shaped springs	103	2000
6,677,744 System for measuring signal path resistance for an integrated circuit tester interconnect structure	70	2000
6,476,630 Method for testing signal paths between an integrated circuit wafer and a wafer tester	74	2000
6,525,555 Wafer-level burn-in and test	99	2000
6,727,579 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES	95	2000
6,685,817 Method and apparatus for controlling plating over a face of a substrate	63	2000
6,622,103 System for calibrating timing of an integrated circuit wafer tester	92	2000
6,603,323 Closed-grid bus architecture for wafer interconnect structure	89	2000
6,727,580 Microelectronic spring contact elements	77	2000
6,539,531 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes	114	2000
6,835,898 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES	80	2000
6,778,406 Resilient contact structures for interconnecting electronic devices	108	2000
6,475,822 Method of making microelectronic contact structures	89	2000
6,597,187 Special contact points for accessing internal circuitry of an integrated circuit	74	2000
6,603,324 Special contact points for accessing internal circuitry of an integrated circuit	71	2000
6,606,575 Cross-correlation timing calibration for wafer-level IC tester interconnect systems	84	2000
6,621,260 Special contact points for accessing internal circuitry of an integrated circuit	79	2000
6,701,612 Method and apparatus for shaping spring elements	88	2000
6,713,374 Interconnect assemblies and methods	100	2000
6,836,962 Method and apparatus for shaping spring elements	76	2000
6,538,538 High frequency printed circuit board via	87	2001
6,791,176 Lithographic contact elements	78	2001
6,616,966 Method of making lithographic contact springs	125	2001
6,780,001 Forming tool for forming a contoured microelectronic spring mold	71	2001
6,501,343 Integrated circuit tester with high bandwidth probe assembly	91	2001
6,606,014 Filter structures for integrated circuit interfaces	62	2001
6,534,856 Sockets for "springed" semiconductor devices	87	2001
6,910,268 Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via	121	2001
6,856,150 Probe card with coplanar daughter card	84	2001
6,627,980 Stacked semiconductor device assembly with microelectronic spring contacts	80	2001
6,538,214 Method for manufacturing raised electrical contact pattern of controlled geometry	77	2001
6,882,239 Electromagnetically coupled interconnect system	81	2001
6,888,362 Test head assembly for electronic components with plurality of contoured microelectronic spring contacts	92	2001
6,729,019 Method of manufacturing a probe card	103	2001
6,678,876 Process and apparatus for finding paths through a routing space	90	2001
6,862,727 Process and apparatus for adjusting traces	66	2001
6,764,869 Method of assembling and testing an electronics module	70	2001
6,714,828 Method and system for designing a probe card	73	2001
6,882,546 Multiple die interconnect system	73	2001
6,664,628 Electronic component overlapping dice of unsingulated semiconductor wafer	69	2001
6,456,103 Apparatus for reducing power supply noise in an integrated circuit	88	2001
6,759,311 Fan out of interconnect elements attached to semiconductor wafer	70	2001
6,817,052 Apparatuses and methods for cleaning test probes	83	2001
6,816,031 Adjustable delay transmission line	71	2001
6,624,648 Probe card assembly	111	2001
6,777,319 Microelectronic spring contact repair	79	2001
6,479,308 Semiconductor fuse covering	69	2001
6,615,485 Probe card assembly and kit, and methods of making same	88	2001
6,891,385 Probe card cooling assembly with direct cooling of active electronic components	81	2001
7,002,363 Method and system for compensating thermally induced motion of probe cards	118	2001
6,741,092 Method and system for detecting an arc condition	62	2001
6,864,105 Method of manufacturing a probe card	68	2002
6,680,659 Integrated circuit interconnect system	69	2002
6,784,674 Test signal distribution system for IC tester	75	2002
6,798,225 Tester channel to multiple IC terminals	78	2002
6,825,422 Interconnection element with contact blade	74	2002
6,812,691 Compensation for test signal degradation due to DUT fault	69	2002
6,640,415 Segmented contactor	108	2002
6,657,455 Predictive, adaptive power supply for an integrated circuit under test	81	2002
6,807,734 Microelectronic contact structures, and methods of making same	78	2002
6,559,671 Efficient parallel testing of semiconductor devices using a known good device to generate expected responses	73	2002
6,646,520 Integrated circuit interconnect system	71	2002
6,839,964 Method for manufacturing a multi-layer printed circuit board	65	2002
6,686,754 Integrated circuit tester with high bandwidth probe assembly	73	2002
6,678,850 Distributed interface for parallel testing of multiple devices using a single tester channel	73	2002
6,818,840 Method for manufacturing raised electrical contact pattern of controlled geometry	67	2002
6,642,625 Sockets for "springed" semiconductor devices	65	2002
6,661,316 High frequency printed circuit board via	70	2002
6,825,052 Test assembly including a test die for testing a semiconductor product die	81	2002
6,788,094 Wafer-level burn-in and test	76	2002
6,845,491 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes	72	2003
6,784,677 Closed-grid bus architecture for wafer interconnect structure	65	2003
7,342,402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features	25	2003
6,911,835 High performance probe system	83	2003
6,838,893 Probe card assembly	72	2003
6,870,381 Insulative covering of probe tips	63	2003
6,911,814 Apparatus and method for electromechanical testing and validation of probe cards	72	2003
6,913,468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods	88	2003
6,949,942 Predictive, adaptive power supply for an integrated circuit under test	45	2003
6,822,529 Integrated circuit interconnect system	68	2003
6,917,210 Integrated circuit tester with high bandwidth probe assembly	67	2003
7,276,922 Closed-grid bus architecture for wafer interconnect structure	23	2004
INTERNATIONAL BUSINESS MACHINES CORPORATION (42)
4,520,314 Probe head arrangement for conductor line testing with at least one probe head comprising a plurality of resilient contacts	38	1982
4,744,041 Method for testing DC motors	117	1985
4,851,767 Detachable high-speed opto-electronic sampling probe	30	1988
4,831,494 Multilayer capacitor	153	1988
4,922,128 Boost clock circuit for driving redundant wordlines and sample wordlines	79	1989
4,987,100 Flexible carrier for an electronic device	81	1989
5,001,423 Dry interface thermal chuck temperature control system for semiconductor wafer testing	133	1990
5,007,163 Non-destructure method of performing electrical burn-in testing of semiconductor chips	66	1990
5,207,585 Thin interface pellicle for dense arrays of electrical interconnects	166	1990
5,061,192 High density connector	143	1990
5,334,931 Molded test probe assembly	92	1991
5,371,654 Three dimensional high performance interconnection package	241	1992
5,441,690 Process of making pinless connector	74	1993
5,537,372 High density data storage system with topographic contact sensor	113	1993
5,531,022 Method of forming a three dimensional high performance interconnection package	158	1994
5,532,608 Ceramic probe card and method for reducing leakage current	63	1995
5,804,982 Miniature probe positioning actuator	104	1995
5,810,607 Interconnector with contact pads having enhanced durability	159	1995
5,726,211 Process for making a foamed elastometric polymer	102	1996
5,756,021 Electronic devices comprising dielectric foamed polymers	88	1996
5,700,844 Process for making a foamed polymer	137	1996
5,785,538 High density test probe with rigid surface structure	86	1996
6,268,016 Manufacturing computer systems with fine line circuitized substrates	65	1996
5,723,347 Semi-conductor chip test probe and process for manufacturing the probe	106	1996
6,286,208 Interconnector with contact pads having enhanced durability	81	1996
5,838,160 Integral rigid chip test probe	82	1996
6,054,651 Foamed elastomers for wafer probing applications and interposer connectors	80	1996
5,926,029 Ultra fine probe contacts	105	1997
6,059,982 Micro probe assembly and method of fabrication	147	1997
5,804,607 Process for making a foamed elastomeric polymer	118	1997
6,062,879 High density test probe with rigid surface structure	80	1998
6,104,201 Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage	70	1998
6,332,270 Method of making high density integral test probe	91	1998
6,206,273 Structures and processes to create a desired probetip contact geometry on a wafer test probe	80	1999
6,452,406 Probe structure having a plurality of discrete insulated probe tips	78	1999
6,528,984 Integrated compliant probe for wafer level test and burn-in	109	1999
6,526,655 Angled flying lead wire bonding process	73	2001
6,788,093 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies	103	2002
6,943,571 Reduction of positional errors in a four point probe resistance measurement	60	2003
7,007,380 TFI probe I/O wrap test method	92	2004
7,011,531 Membrane probe with anchored elements	92	2005
7,005,879 Device for probe card power bus noise reduction	92	2005
CASCADE MICROTECH, INC. (39)
4,280,112 Electrical coupler	98	1979
4,697,143 Wafer probe	197	1984
4,764,723 Wafer probe	91	1986
4,827,211 Wafer probe	125	1987
4,858,160 System for setting reference reactance for vector corrected measurements	99	1988
4,849,689 Microwave wafer probe having replaceable probe tip	125	1988
5,012,186 Electrical probe with contact force protection	40	1990
5,045,781 High-frequency active probe having replaceable contact needles	109	1991
5,101,453 Fiber optic wafer probe	97	1991
5,266,889 Wafer probe station with integrated environment control enclosure	133	1992
5,457,398 Wafer probe station having full guarding	122	1993
5,506,515 High-frequency probe tip assembly	155	1994
5,610,529 Probe station having conductive coating added to thermal chuck insulator	136	1995
5,565,788 Coaxial wafer probe with tip shielding	145	1995
5,729,150 Low-current probe card with reduced triboelectric current generating cables	135	1995
5,914,613 Membrane probing system with local contact scrub	107	1996
6,232,788 Wafer probe station for low-current measurements	87	1997
6,232,789 Probe holder for low current measurements	87	1997
6,034,533 Low-current pogo probe card	107	1997
6,137,302 Low-current probe card with reduced triboelectric current generating cables	107	1997
6,256,882 Membrane probing system	71	1998
6,578,264 Method for constructing a membrane probe using a depression	77	2000
6,384,615 Probe holder for low current measurements	41	2001
6,549,106 Waveguide with adjustable backshort	110	2001
7,233,160 Wafer probe	20	2001
6,496,024 Probe holder for testing of a test device	38	2002
6,850,082 Probe holder for testing of a test device	37	2002
6,724,205 Probe for combined signals	97	2002
6,815,963 Probe for testing a device under test	64	2003
6,806,724 Probe for combined signals	94	2003
7,161,363 Probe for testing a device under test	33	2004
6,930,498 Membrane probing system	55	2004
7,009,383 Wafer probe station having environment control enclosure	92	2004
7,187,188 Chuck with integrated wafer support	76	2004
2006/0184,041 System for testing semiconductors	32	2006
7,332,923 Test probe for high-frequency measurement	21	2006
7,271,603 Shielded probe for testing a device under test	32	2006
7,403,028 Test structure and probe for differential signals	20	2007
2008/0111,571 Membrane probing system	11	2008
AGILENT TECHNOLOGIES, INC. (36)
4,980,637 Force delivery system for improved precision membrane probe	97	1988
4,918,383 Membrane probe with automatic contact scrub action	154	1988
4,906,920 Self-leveling membrane probe	203	1988
5,172,051 Wide bandwidth passive probe	108	1991
5,298,972 Method and apparatus for measuring polarization sensitivity of optical devices	108	1991
5,274,336 Capacitively-coupled test probe	135	1992
5,308,250 Pressure contact for connecting a coaxial shield to a microstrip ground plane	29	1992
5,463,324 Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like	48	1993
5,493,070 Measuring cable and measuring system	92	1994
5,507,652 Wedge connector for integrated circuits	39	1995
5,578,932 Method and apparatus for providing and calibrating a multiport network analyzer	145	1995
5,945,836 Loaded-board, guided-probe test fixture	121	1996
5,923,180 Compliant wafer prober docking adapter	71	1997
5,940,965 Method of making multiple lead voltage probe	30	1997
5,903,143 Probe apparatus with RC circuit connected between ground and a guard	93	1997
6,060,888 Error correction method for reflection measurements of reciprocal devices in vector network analyzers	112	1998
6,251,595 Methods and devices for carrying out chemical reactions	104	1998
6,175,228 Electronic probe for measuring high impedance tri-state logic circuits	83	1998
6,300,775 Scattering parameter calibration system and method	128	1999
6,271,673 Probe for measuring signals	102	1999
6,407,562 Probe tip terminating device providing an easily changeable feed-through termination	91	1999
2001/0024,116 Electronic probe for measuring high impedance tri-state logic circuits	78	2001
6,643,597 Calibrating a test system using unknown standards	115	2001
6,717,426 Blade-like connecting needle	78	2002
6,768,328 Single point probe structure and method	74	2002
6,864,694 Voltage probe	90	2002
2004/0095,145 Method and apparatus for performing multiport through-reflect-line calibration and measurement	96	2002
2004/0140,819 Differential voltage probe	29	2003
2004/0199,350 System and method for determining measurement errors of a testing device	93	2003
2005/0030,047 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration	83	2003
7,025,628 Electronic probe extender	101	2003
2004/0162,689 Multiport network analyzer calibration employing reciprocity of a device	93	2004
6,933,713 High bandwidth oscilloscope probe with replaceable cable	56	2004
7,005,868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe	92	2004
7,030,328 Liquid metal switch employing micro-electromechanical system (MEMS) structures for actuation	12	2004
7,026,834 Multiple two axis floating probe block assembly using split probe block	92	2005
TOKYO ELECTRON LIMITED (34)
4,998,062 Probe device having micro-strip line structure	90	1989
5,084,671 Electric probing-test machine having a cooling system	177	1990
5,091,692 Probing test device	113	1990
5,198,752 Electric probing-test machine having a cooling system	152	1991
5,315,237 Touch sensor unit of prober for testing electric circuit and electric circuit testing apparatus using the touch sensor unit	107	1991
5,321,352 Probe apparatus and method of alignment for the same	131	1992
5,321,453 Probe apparatus for probing an object held above the probe card	101	1992
5,635,846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer	142	1993
5,404,111 Probe apparatus with a swinging holder for an object of examination	112	1993
5,517,126 Probe apparatus	129	1993
5,521,522 Probe apparatus for testing multiple integrated circuit dies	143	1993
5,539,676 Method of identifying probe position and probing method in prober	93	1994
5,811,982 High density cantilevered probe for electronic devices	130	1996
5,777,485 Probe method and apparatus with improved probe contact	118	1996
5,910,727 Electrical inspecting apparatus with ventilation system	89	1996
5,821,763 Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof	176	1996
5,804,983 Probe apparatus with tilt correction mechanisms	151	1997
6,334,247 High density integrated circuit apparatus, test probe and methods of use thereof	98	1997
5,914,614 High density cantilevered probe for electronic devices	95	1997
5,999,268 Apparatus for aligning a semiconductor wafer with an inspection contactor	109	1997
6,060,892 Probe card attaching mechanism	94	1997
6,300,780 High density integrated circuit apparatus, test probe and methods of use thereof	84	1998
6,124,725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer	133	1998
6,329,827 High density cantilevered probe for electronic devices	73	1998
6,414,478 Transfer mechanism for use in exchange of probe card	79	2000
6,722,032 Method of forming a structure for electronic devices contact locations	62	2001
7,005,842 Probe cartridge assembly and multi-probe assembly	92	2001
6,927,587 Probe apparatus	64	2003
6,906,542 Probing method and prober	60	2003
6,794,888 Probe device	75	2003
7,026,832 Probe mark reading device and probe mark reading method	95	2003
7,009,415 Probing method and probing apparatus	94	2004
7,023,226 Probe pins zero-point detecting method, and prober	92	2004
7,332,918 Prober and probe testing method for temperature-controlling object to be tested	23	2005
TEXAS INSTRUMENTS INCORPORATED (13)
4,888,550 Intelligent multiprobe tip	91	1983
5,128,612 Disposable high performance test head	26	1990
5,159,752 Scanning electron microscope based parametric testing method and apparatus	118	1990
5,225,037 Method for fabrication of probe card for testing of semiconductor devices	214	1991
5,317,656 Fiber optic network for multi-point emissivity-compensated semiconductor wafer pyrometry	72	1993
5,511,010 Method and apparatus of eliminating interference in an undersettled electrical signal	90	1994
6,292,760 Method and apparatus to measure non-coherent signals	92	1998
6,906,539 High density, area array probe card apparatus	55	2001
6,911,834 Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probing	55	2002
6,741,129 Differential amplifier slew rate boosting scheme	34	2002
7,026,833 Multiple-chip probe and universal tester contact assemblage	95	2005
7,327,153 Analog built-in self-test module	27	2005
7,323,899 System and method for resumed probing of a wafer	19	2006
MICRON TECHNOLOGY, INC. (12)
4,312,117 Integrated test and assembly device	155	1979
4,970,386 Vertical FET high speed optical sensor	43	1989
5,487,999 Method for fabricating a penetration limited contact having a rough textured surface	165	1994
5,686,317 Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die	238	1995
5,869,974 Micromachined probe card having compliant contact members for testing semiconductor wafers	169	1996
6,071,009 Semiconductor wirebond machine leadframe thermal map system	41	1997
6,181,144 Semiconductor probe card having resistance measuring circuitry and method fabrication	139	1998
6,194,720 Preparation of transmission electron microscope samples	108	1998
6,359,456 Probe card and test system for semiconductor wafers	114	2001
6,924,653 Selectively configurable microelectronic probes	58	2002
7,026,835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad	92	2002
7,009,188 Lift-out probe having an extension tip, methods of making and using, and analytical instruments employing same	96	2004
TEKTRONIX, INC. (12)
4,739,259 Telescoping pin probe	100	1986
4,673,839 Piezoelectric pressure sensing apparatus for integrated circuit testing stations	123	1986
4,734,641 Method for the thermal characterization of semiconductor packaging systems	59	1987
4,749,942 Wafer probe head	83	1987
4,912,399 Multiple lead probe for integrated circuits in wafer form	115	1987
4,783,625 Wideband high impedance card mountable probe	95	1988
4,965,514 Apparatus for probing a microwave circuit	17	1989
5,059,898 Wafer probe with transparent loading member	77	1990
5,136,237 Double insulated floating high voltage test probe	103	1991
5,412,330 Optical module for an optically based measurement system	94	1993
6,447,339 Adapter for a multi-channel signal probe	85	2001
6,701,265 Calibration for vector network analyzer	91	2002
SV PROBE PTE LTD. (9)
5,521,518 Probe card apparatus	132	1991
5,180,977 Membrane probe contact bump compliancy system	142	1991
5,422,574 Large scale protrusion membrane for semiconductor devices under test with very high pin counts	171	1993
5,720,098 Method for making a probe preserving a uniform stress distribution under deflection	110	1995
5,742,174 Membrane for holding a probe tip in proper location	127	1995
5,623,213 Membrane probing of circuits	94	1996
6,037,785 Probe card apparatus	107	1996
5,973,504 Programmable high-density electronic device testing	99	1997
6,908,364 Method and apparatus for probe tip cleaning and shaping pad	57	2001
ADVANTEST CORPORATION (8)
5,172,049 IC test equipment	128	1991
5,644,248 Test head cooling system	83	1995
5,767,690 Test head cooling system	88	1997
6,191,596 Method for detecting a contact position between an object to be measured and measuring pins	80	1998
6,174,744 Method of producing micro contact structure and contact probe using same	136	2000
2002/0011,863 IC chip tester with heating element for preventing condensation	87	2001
7,020,360 Wavelength dispersion probing system	93	2002
6,937,040 Probe module and a testing apparatus	59	2004
W. L. GORE & ASSOCIATES, INC. (8)
4,871,883 Electro-magnetic shielding	115	1987
4,859,989 Security system and signal carrying member thereof	128	1987
5,061,823 Crush-resistant coaxial transmission line	124	1990
5,107,076 Easy strip composite dielectric coaxial signal cable	120	1991
5,477,011 Low noise signal transmission cable	108	1994
5,896,038 Method of wafer level burn-in	108	1996
6,032,714 Repeatably positionable nozzle assembly	78	1999
7,015,708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts	94	2003
CANON KABUSHIKI KAISHA (7)
4,755,747 Wafer prober and a probe card to be used therewith	106	1985
4,864,227 Wafer prober	127	1988
4,929,893 Wafer prober	159	1988
5,145,552 Process for preparing electrical connecting member	67	1990
5,304,924 Edge detector	98	1992
5,731,920 Converting adapter for interchangeable lens assembly	94	1995
5,685,232 Positioning stage device exposure apparatus and device manufacturing method utilizing the same	113	1996
FREESCALE SEMICONDUCTOR, INC. (7)
5,172,050 Micromachined semiconductor probe card	270	1991
5,177,438 Low resistance probe for semiconductor	171	1991
5,467,024 Integrated circuit test with programmable source for both AC and DC modes of operation	85	1993
5,617,035 Method for testing integrated devices	109	1995
5,666,063 Method and apparatus for testing an integrated circuit	106	1996
5,982,166 Method for measuring a characteristic of a semiconductor wafer using cylindrical control	107	1997
6,127,831 Method of testing a semiconductor device by automatically measuring probe tip parameters	103	1997
GLOBALFOUNDRIES INC. (7)
6,091,255 System and method for tasking processing modules based upon temperature	127	1998
6,608,494 Single point high resolution time resolved photoemission microscopy system and method	108	1998
6,483,327 Quadrant avalanche photodiode time-resolved detection	107	1999
6,724,928 Real-time photoemission detection system	96	2000
6,488,405 Flip chip defect analysis using liquid crystal	99	2000
6,617,862 Laser intrusive technique for locating specific integrated circuit current paths	97	2002
7,022,976 Dynamically adjustable probe tips	94	2003
HUGHES ELECTRONICS CORPORATION (7)
4,727,319 Apparatus for on-wafer testing of electrical circuits	74	1985
4,772,846 Wafer alignment and positioning apparatus for chip testing by voltage contrast electron microscopy	132	1986
4,908,570 Method of measuring FET noise parameters	43	1987
5,313,157 Probe for jesting an electrical circuit chip	92	1992
5,583,445 Opto-electronic membrane probe	100	1994
5,611,008 Substrate system for optoelectronic/microwave circuits	82	1996
5,623,214 Multiport membrane probe for full-wafer testing	106	1996
YOKOWO CO., LTD. (7)
7,019,701 Antenna device mounted on vehicle	76	2004
6,900,647 Contact probe and probe device	103	2004
6,903,563 Contact probe and probe device	97	2004
6,917,211 Contact probe and probe device	55	2004
6,919,732 Contact probe and probe device	56	2004
6,937,042 Contact probe and probe device	56	2004
7,015,710 Contact probe and probe device	94	2004
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. (6)
4,839,587 Test fixture for tab circuits and devices	125	1988
5,198,753 Integrated circuit test fixture and method	124	1990
5,691,503 Electro-magnetically shielded door hinge	41	1994
6,233,613 High impedance probe for monitoring fast ethernet LAN links	92	1997
2004/0201,388 Support for an electronic probe and related methods	41	2003
7,002,133 Detecting one or more photons from their interactions with probe photons in a matter system	92	2003
MITSUBISHI DENKI KABUSHIKI KAISHA (6)
5,408,188 High frequency wafer probe including open end waveguide	75	1992
5,493,236 Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis	185	1994
6,144,212 Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card	105	1998
6,242,929 Probe needle for vertical needle type probe card and fabrication thereof	88	1998
6,404,213 Probe stylus	84	1999
7,173,433 Circuit property measurement method	19	2005
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY (6)
4,983,910 Millimeter-wave active probe	70	1988
4,916,002 Microcasting of microminiature tips	136	1989
5,003,253 Millimeter-wave active probe system	76	1989
5,847,569 Electrical contact probe for sampling high frequency electrical signals	95	1996
5,981,268 Hybrid biosensors	144	1997
6,051,422 Hybrid biosensors	121	1998
APPLIED MATERIALS, INC. (5)
5,916,689 Electrostatic chuck with an impregnated, porous layer that exhibits the Johnson-Rahbeck effect	110	1996
5,874,361 Method of processing a wafer within a reaction chamber	106	1996
6,257,564 Vacuum chuck having vacuum-nipples wafer support	103	1998
6,232,787 Microstructure defect detection	157	1999
7,319,335 Configurable prober for TFT LCD array testing	20	2004
DELAWARE CAPITAL FORMATION, INC. (5)
5,408,189 Test fixture alignment system for printed circuit boards	144	1992
5,289,117 Testing of integrated circuit devices on loaded printed circuit	54	1992
5,389,885 Expandable diaphragm test modules and connectors	95	1993
6,181,149 Grid array package test contactor	97	1996
6,064,218 Peripherally leaded package test contactor	104	1997
Hughes Aircraft Company (5)
4,918,373 R.F. phase noise test set using fiber optic delay line	51	1988
4,835,495 Diode device packaging arrangement	40	1988
5,326,412 Method for electrodepositing corrosion barrier on isolated circuitry	72	1992
5,512,835 Electrical probe and method for measuring gaps and other discontinuities in enclosures using electrical inductance for RF shielding assessment	73	1992
5,412,866 Method of making a cast elastomer/membrane test probe assembly	121	1993
INTEL CORPORATION (5)
5,944,093 Pickup chuck with an integral heat pipe	100	1997
7,020,363 Optical probe for wafer testing	93	2001
6,856,129 Current probe device having an integrated amplifier	90	2002
2006/0052,075 Testing integrated circuits using high bandwidth wireless technology	73	2004
2007/0145,989 Probe card with improved transient power delivery	18	2005
MDS INC. (5)
6,376,258 Resonant bio-assay device and test system for detecting molecular binding events	133	2000
6,340,568 Method for detecting and classifying nucleic acid hybridization	80	2001
6,566,079 Methods for analyzing protein binding events	95	2001
2003/0032,000 Method for analyzing cellular events	88	2001
2002/0168,659 System and method for characterizing the permittivity of molecular events	74	2002
MOTOROLA, INC. (5)
4,232,398 Radio receiver alignment indicator	47	1978
4,453,142 Microstrip to waveguide transition	107	1981
4,646,005 Signal probe	98	1984
5,561,378 Circuit probe for measuring a differential circuit	30	1994
5,748,506 Calibration technique for a network analyzer	94	1996
NEC CORPORATION (5)
4,669,805 High frequency connector	58	1985
6,114,864 Probe card with plural probe tips on a unitary flexible tongue	107	1997
6,310,483 Longitudinal type high frequency probe for narrow pitched electrodes	100	1998
6,281,691 Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable	101	1999
6,400,168 Method for fabricating probe tip portion composed by coaxial cable	101	2001
RAYTHEON COMPANY (5)
4,346,355 Radio frequency energy launcher	95	1980
5,069,628 Flexible electrical cable connector with double sided dots	71	1990
5,395,253 Membrane connector with stretch induced micro scrub	115	1993
5,600,256 Cast elastomer/membrane test probe assembly	76	1995
6,211,837 Dual-window high-power conical horn antenna	76	1999
WENTWORTH LABORATORIES, INC. (5)
4,975,638 Test probe assembly for testing integrated circuit devices	149	1989
5,355,079 Probe assembly for testing integrated circuit devices	96	1993
5,959,461 Probe station adapter for backside emission inspection	119	1997
6,031,383 Probe station for low current, low voltage parametric measurements using multiple probes	104	1998
6,927,586 Temperature compensated vertical pin probing device	59	2003
ANRITSU COMPANY (4)
5,905,421 Apparatus for measuring and/or injecting high frequency signals in integrated systems	79	1997
6,169,410 Wafer probe with built in RF frequency conversion module	84	1998
6,529,844 Vector network measurement system	109	1999
6,943,563 Probe tone S-parameter measurements	57	2002
GGB INDUSTRIES, INC. (4)
4,871,964 Integrated circuit probing apparatus	92	1988
5,373,231 Integrated circuit probing apparatus including a capacitor bypass structure	119	1993
6,603,322 Probe card for high speed testing	99	1996
6,118,287 Probe tip structure	101	1997
KABUSHIKI KAISHA TOSHIBA (4)
5,166,893 Portable apparatus having a voltage converter unit removable from a base unit having a removable display unit	46	1992
5,491,425 Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same	10	1994
6,605,941 Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes	49	2001
7,032,307 Method for fabricating a probe pin for testing electrical characteristics of an apparatus	92	2004
LSI LOGIC CORPORATION (4)
6,927,079 Method for probing a semiconductor wafer	103	2000
6,605,951 Interconnector and method of connecting probes to a die for functional analysis	104	2000
6,617,866 Apparatus and method of protecting a probe card during a sort sequence	36	2001
7,023,225 Wafer-mounted micro-probing platform	93	2003
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (4)
5,594,358 Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line	97	1994
5,794,133 Microwave mixing circuit	82	1996
6,806,836 Helical antenna apparatus provided with two helical antenna elements, and radio communication apparatus provided with same helical antenna apparatus	74	2003
7,219,416 Method of manufacturing a magnetic element	21	2004
NATIONAL SEMICONDUCTOR CORPORATION (4)
4,757,255 Environmental box for automated wafer probing	184	1986
5,814,847 General purpose assembly programmable multi-chip package substrate	91	1996
5,883,522 Apparatus and method for retaining a semiconductor wafer during testing	106	1996
7,096,133 Method of establishing benchmark for figure of merit indicative of amplifier flicker noise	72	2005
RENESAS ELECTRONICS CORPORATION (4)
6,028,435 Semiconductor device evaluation system using optical fiber	106	1997
6,160,407 Inspection method and wiring current observation method for semiconductor device and apparatus of the same	97	1998
6,900,646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof	96	2002
6,551,884 Semiconductor device including gate insulation films having different thicknesses	70	2002
SILICON VALLEY BANK (4)
4,893,914 Test station	111	1988
5,892,539 Portable emission microscope workstation for failure analysis	118	1995
6,744,268 High resolution analytical probe station	119	2002
6,917,195 Wafer probe station	55	2004
The United States of America as represented by the Secretary of the Air Force (4)
4,754,239 Waveguide to stripline transition assembly	90	1986
5,631,571 Infrared receiver wafer level probe testing	135	1996
6,215,295 Photonic field probe and calibration means thereof	113	1998
2003/0170,898 Method for intracellular modifications within living cells using pulsed electric fields	110	2002
The United States of America as represented by the Secretary of the Navy (4)
5,361,049 Transition from double-ridge waveguide to suspended substrate	47	1986
5,091,732 Lightweight deployable antenna system	88	1990
5,430,813 Mode-matched, combination taper fiber optic probe	60	1993
6,940,264 Near field probe	58	2004
ELECTROGLAS, INC. (3)
5,656,942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane	108	1995
6,096,567 Method and apparatus for direct probe sensing	142	1997
6,320,372 Apparatus and method for testing a substrate having a plurality of terminals	100	1999
ENERGY, UNITED STATES DEPARTMENT OF (3)
4,287,473 Nondestructive method for detecting defects in photodetector and solar cell devices	108	1979
5,523,694 Integrated circuit failure analysis by low-energy charge-induced voltage alteration	120	1994
6,307,672 Microscope collision protection apparatus	80	1996
GENERAL ELECTRIC COMPANY (3)
6,927,598 Test probe for electrical devices having low or no wedge depression	56	2003
6,911,826 Pulsed eddy current sensor probes and inspection methods	62	2003
7,015,690 Omnidirectional eddy current probe and inspection system	98	2004
HARRIS CORPORATION (3)
5,854,608 Helical antenna having a solid dielectric core	123	1994
6,181,297 Antenna	98	1998
6,424,316 Helical antenna	87	2000
IBIDEN CO., LTD. (3)
2004/0021,475 Wafer prober	80	2003
2004/0134,899 Ceramic substrate for a semiconductor-production/inspection device	79	2003
2004/0207,072 Ceramic substrate for a semiconductor producing/examining device	83	2004
INTERSTITIAL, LLC (3)
5,704,355 Non-invasive system for breast cancer detection	126	1995
5,829,437 Microwave method and system to detect and locate cancers in heterogenous tissues	126	1996
6,061,589 Microwave antenna for cancer detection system	119	1997
John H. Blanz Company, Inc. (3)
5,097,207 Temperature stable cryogenic probe station	106	1989
5,160,883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support	95	1990
5,166,606 High efficiency cryogenic test station	94	1990
LUCENT TECHNOLOGIES INC. (3)
5,970,429 Method and apparatus for measuring electrical noise in devices	117	1997
6,121,836 Differential amplifier	37	1998
6,245,692 Method to selectively heat semiconductor wafers	90	1999
MICROCONNECT LLC (3)
5,621,333 Contact device for making connection to an electronic circuit device	94	1995
6,046,599 Method and device for making connection	67	1997
6,091,256 Contact device for making connection to an electronic circuit device	65	1997
MOTOROLA MOBILITY LLC (3)
5,751,153 Method and apparatus for characterizing a multiport circuit	40	1996
5,793,213 Method and apparatus for calibrating a network analyzer	93	1996
5,751,252 Method and antenna for providing an omnidirectional pattern	92	1997
New Wave Research (3)
5,811,751 Multi-wavelength laser system, probe station and laser cutter system using the same	136	1997
6,573,702 Method and apparatus for cleaning electronic test contacts	102	1997
5,963,364 Multi-wavelength variable attenuator and half wave plate	118	1997
NORTHROP GRUMMAN CORPORATION (3)
4,216,467 Hand controller	194	1977
4,581,679 Multi-element circuit construction	100	1985
2005/0026,276 Remote detection and analysis of chemical and biological aerosols	79	2003
OLYMPUS OPTICAL CO., LTD. (3)
5,367,165 Cantilever chip for scanning probe microscope	75	1993
6,006,002 Rigid sleeve device fitted over a flexible insertion section of an endoscope for inspecting industrial equipment	54	1995
6,811,406 Microelectronic spring with additional protruding member	169	2001
SAMSUNG ELECTRONICS CO., LTD. (3)
6,970,001 Variable impedance test probe	73	2003
6,900,653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof	105	2003
6,909,297 Probe card	55	2004
SARANTEL LIMITED (3)
6,184,845 Dielectric-loaded antenna	125	1997
6,369,776 Antenna	90	1999
6,914,580 Dielectrically-loaded antenna	82	2003
SHARP KABUSHIKI KAISHA (3)
4,899,126 Thick film resistor type printed circuit board	80	1989
5,089,774 Apparatus and a method for checking a semiconductor	127	1990
5,374,938 Waveguide to microstrip conversion means in a satellite broadcasting adaptor	94	1993
SIEMENS AKTIENGESELLSCHAFT (3)
4,275,446 Method and apparatus for measurement of attenuation and distortion by a test object	101	1979
4,805,627 Method and apparatus for identifying the distribution of the dielectric constants in an object	100	1986
5,095,891 Connecting cable for use with a pulse generator and a shock wave generator	97	1987
SONY CORPORATION (3)
6,362,792 Antenna apparatus and portable radio set	77	2000
6,366,247 Antenna device and portable radio set	82	2000
8,035,987 Electronic device having a groove partitioning functional and mounting parts from each other	34	2007
TELEDYNE LECROY, INC. (3)
6,822,463 Active differential test probe with a transmission line input structure	75	2002
6,870,359 Self-calibrating electrical test probe	33	2002
7,019,544 Transmission line input structure test probe	94	2004
The Boeing Company (3)
4,727,637 Computer aided connector assembly method and apparatus	112	1987
5,202,648 Hermetic waveguide-to-microstrip transition module	55	1991
6,914,427 Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method	60	2003
XANDEX, INC. (3)
5,528,158 Probe card changer system and method	104	1994
5,506,498 Probe card system and method	96	1995
6,166,553 Prober-tester electrical interface for semiconductor test	98	1998
ADVANTEST (SINGAPORE) PTE LTD (2)
6,812,718 Massively parallel interface for electronic circuits	102	2001
6,917,525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs	101	2002
ADVANTEST AMERICA, INC (2)
6,295,729 Angled flying lead wire bonding process	83	1998
6,708,403 Angled flying lead wire bonding process	76	2003
Aehr Test Systems (2)
6,340,895 Wafer-level burn-in and test cartridge	103	1999
6,580,283 Wafer level burn-in and test methods	87	1999
Bell Telephone Laboratories, Incorporated (2)
4,225,819 Circuit board contact contamination probe	56	1978
4,684,883 Method of manufacturing high-quality semiconductor light-emitting devices	96	1985
BRUKER NANO, INC. (2)
5,376,790 Scanning probe microscope	113	1992
5,672,816 Large stage system for scanning probe microscopes and other instruments	115	1995
CNH AMERICA LLC (2)
5,316,435 Three function control system	50	1992
5,360,312 Three function control mechanism	48	1992
DAINIPPON SCREEN MFG. CO., LTD. (2)
4,531,474 Rotary board treating apparatus	88	1984
4,746,857 Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer	95	1986
DCG SYSTEMS, INC. (2)
5,530,372 Method of probing a net of an IC at an optimal probe-point	117	1994
5,675,499 Optimal probe point placement	110	1996
EATON CORPORATION (2)
4,904,935 Electrical circuit board text fixture having movable platens	112	1988
5,471,185 Electrical circuit protection devices comprising conductive liquid compositions	31	1994
ELK FINANCIAL, INC. (2)
6,064,217 Fine pitch contact device employing a compliant conductive polymer bump	132	1996
2002/0011,859 METHOD FOR FORMING CONDUCTIVE BUMPS FOR THE PURPOSE OF CONTRRUCTING A FINE PITCH TEST DEVICE	107	1998
ELM TECHNOLOGY CORPORATION (2)
5,020,219 Method of making a flexible tester surface for testing integrated circuits	169	1989
5,453,404 Method for making an interconnection structure for integrated circuits	128	1994
EMIMAGING LTD (2)
5,715,819 Microwave tomographic spectroscopy system and method	103	1994
6,490,471 Electromagnetical imaging and therapeutic (EMIT) systems	87	2001
EUROPAISCHES LABORATORIUM FUR MOLEKULARBIOLOGIE (EMBL) (2)
6,798,226 Multiple local probe measuring device and method	91	2002
6,943,574 Multiple local probe measuring device and method	61	2004
HEWLETT-PACKARD COMPANY (2)
4,795,962 Floating driver circuit and a device for measuring impedances of electrical components	94	1987
5,133,119 Shearing stress interconnection apparatus and method	65	1991
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (2)
6,049,216 Contact type prober automatic alignment	92	1997
7,012,441 High conducting thin-film nanoprobe card and its fabrication method	104	2003
INTEST CORPORATION (2)
5,900,737 Method and apparatus for automated docking of a test head to a device handler	115	1996
6,259,260 Apparatus for coupling a test head and probe card in a wafer testing system	11	1998
INTEST IP CORPORATION (2)
4,589,815 Electronic test head positioner for test systems	50	1983
4,705,447 Electronic test head positioner for test systems	130	1985
KABUSHIKI KAISHA NIHON MICRONICS (2)
5,888,075 Auxiliary apparatus for testing device	77	1997
6,019,612 Electrical connecting apparatus for electrically connecting a device to be tested	84	1998
KLA-TENCOR CORPORATION (2)
6,633,174 Stepper type test structures and methods for inspection of semiconductor integrated circuits	99	2000
6,771,806 Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices	128	2000
MASSACHUSETTS INSTITUTE OF TECHNOLOGY (2)
5,653,939 Optical and electrical methods and apparatus for molecule detection	432	1995
5,998,768 Active thermal control of surfaces by steering heating beam in response to sensed thermal radiation	101	1998
MICROWAVE IMAGING SYSTEMS TECHNOLOGIES, INC. (2)
5,841,288 Two-dimensional microwave imaging apparatus and methods	114	1997
6,448,788 Fixed array microwave imaging apparatus and method	100	2000
NGK INSULATORS, LTD. (2)
5,280,156 Wafer heating apparatus and with ceramic substrate and dielectric layer having electrostatic chucking means	208	1991
6,001,760 Aluminum nitride sintered body, metal embedded article, electronic functional material and electrostatic chuck	115	1997
NIKON CORPORATION (2)
6,628,503 Gas cooled electrostatic pin chuck for vacuum applications	98	2001
2002/0176,160 Microscope system	37	2002
NORTHROP GRUMMAN SYSTEMS CORPORATION (2)
5,479,109 Testing device for integrated circuits on wafer	117	1994
6,040,739 Waveguide to microstrip backshort with external spring compression	67	1998
RCA Corporation (2)
4,284,033 Means to orbit and rotate target wafers supported on planet member	113	1979
4,651,115 Waveguide-to-microstrip transition	81	1985
RENISHAW PLC (2)
5,270,664 Probe for measuring surface roughness by sensing fringe field capacitance effects	123	1992
6,909,983 Calibration of an analogue probe	64	2002
ROBERT BOSCH GMBH (2)
6,066,911 Ultrasonic driving element	123	1998
6,948,981 Compact coupler plug, particularly for a planar broadband lambda probe, in which single-conductor seals are prevented from being lost	54	2002
SEMATECH, INC. (2)
5,159,264 Pneumatic energy fluxmeter	79	1991
5,159,267 Pneumatic energy fluxmeter	81	1992
SKYWORKS SOLUTIONS, INC. (2)
6,582,979 Structure and method for fabrication of a leadless chip carrier with embedded antenna	90	2001
6,770,955 Shielded antenna in a semiconductor package	88	2001
SOLID STATE MEASUREMENTS, INC. (2)
6,900,652 Flexible membrane probe and method of use thereof	105	2003
7,023,231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof	93	2004
SONY ELECTRONICS INC. (2)
5,669,316 Turntable for rotating a wafer carrier	99	1993
2007/0024,506 Systems and methods for high frequency parallel transmissions	78	2006
STAR TECHNOLOGIES INC. (2)
6,906,543 Probe card for electrical testing a chip in a wide temperature range	62	2003
7,253,646 Probe card with tunable stage and at least one replaceable probe	10	2005
STMICROELECTRONICS S.A. (2)
6,146,908 Method of manufacturing a test circuit on a silicon wafer	31	1999
6,480,013 Method for the calibration of an RF integrated circuit probe	100	2000
STOVOKOR TECHNOLOGY LLC (2)
4,991,290 Flexible electrical interconnect and method of making	109	1989
5,170,930 Liquid metal paste for thermal and electrical connections	80	1991
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (2)
6,909,300 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips	55	2002
6,902,941 Probing of device elements	99	2003
TDK CORPORATION (2)
5,510,792 Anechoic chamber and wave absorber	93	1994
7,012,425 Eddy-current probe	94	2005
TECHSEARCH, LLC (2)
4,600,907 Coplanar microstrap waveguide interconnector and method of interconnection	53	1985
4,626,805 Surface mountable microwave IC package	57	1985
TENCOR INSTRUMENTS (2)
4,755,746 Apparatus and methods for semiconductor wafer testing	155	1985
5,852,232 Acoustic sensor as proximity detector	120	1997
The Aerospace Corporation (2)
6,211,663 Baseband time-domain waveform measurement method	113	1999
6,396,298 Active feedback pulsed measurement method	89	2000
The United States of America as represented by the Secretary of the Army (2)
6,201,453 H-plane hermetic sealed waveguide probe	12	1998
6,731,804 Thermal luminescence liquid monitoring system and method	74	2000
TRW INC. (2)
4,468,629 NPN Operational amplifier	78	1982
5,126,696 W-Band waveguide variable controlled oscillator	41	1991
U.S. Philips Corporation (2)
4,568,890 Microwave oscillator injection locked at its fundamental frequency for producing a harmonic frequency output	22	1983
4,663,840 Method of interconnecting conductors of different layers of a multilayer printed circuit board	73	1985
WI-LAN INC. (2)
5,565,881 Balun apparatus including impedance transformer having transformation length	82	1994
5,628,057 Multi-port radio frequency signal transformation network	98	1996
XEROX CORPORATION (2)
4,780,670 Active probe card for high resolution/low noise wafer level testing	133	1985
6,352,454 Wear-resistant spring contacts	83	1999
YULIM HITECH, INC. (2)
6,922,069 Needle assembly of probe card	61	2003
7,014,499 Probe card for testing semiconductor device	92	2005
3M INNOVATIVE PROPERTIES COMPANY (1)
6,902,416 High density probe device	74	2002
ABB POWER T&D COMPANY, INC., A DE CORP. (1)
4,998,063 Fiber optic coupled magneto-optic sensor having a concave reflective focusing surface	39	1989
ABBOTT LABORATORIES (1)
2005/0165,316 Method for detecting artifacts in data	76	2004
Acome, Societies Anonyme (1)
4,621,169 Electric cable construction and uses therefor	93	1985
ADE CORPORATION (1)
5,642,298 Wafer testing and self-calibration system	110	1996
ADVANCED MICRO DEVICES, INC. (1)
6,396,296 Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station	97	2000
AG COMMUNICATION SYSTEMS CORPORATION, 2500 W. UTOPIA RD., PHOENIX, AZ 85027, A DE CORP. (1)
4,684,884 Universal test circuit for integrated circuit packages	76	1985
Albany Instruments, Inc. (1)
6,933,717 Sensors and probes for mapping electromagnetic fields	58	2004
ALERI INC. (1)
6,924,655 Probe card for use with microelectronic components, and methods for making same	56	2003
ALPS ELECTRIC CO., LTD. (1)
4,725,793 Waveguide-microstrip line converter	85	1986
ALSTOM (1)
5,813,847 Device and method for injecting fuels into compressed gaseous media	76	1996
AMP Incorporated (1)
4,652,082 Angled electro optic connector	56	1984
AMPEX CORPORATION (1)
4,375,631 Joystick control	62	1981
ANDO ELECTRIC CO., LTD. (1)
2001/0054,906 Probe card and a method of manufacturing the same	77	2001
Aries Electronics, Inc. (1)
6,937,045 Shielded integrated circuit probe	62	2004
ARRAY BIOSCIENCE CORPORATION (1)
6,707,548 Systems and methods for filter based spectrographic analysis	96	2001
ASAHI KOGAKU KOGYO KABUSHIKI KAISHA (1)
5,267,088 Code plate mounting device	83	1990
AT & T TECHNOLOGIES, INC., (1)
4,837,507 High frequency in-circuit test fixture	74	1987
ATMEL CORPORATION (1)
4,649,339 Integrated circuit interface	114	1984
AUTOCYTE NORTH CAROLINA, L.L.C. (1)
5,659,421 Slide positioning and holding device	105	1995
AVAGO TECHNOLOGIES ECBU IP (SINGAPORE) PTE. LTD. (1)
5,066,357 Method for making flexible circuit card with laser-contoured vias and machined capacitors	107	1990
BARKER REVOCABLE TRUST U/A/D (1)
5,202,558 Flexible fiber optic probe for high-pressure shock experiments	102	1992
BECHTEL BWXT IDAHO, LLC (1)
6,147,502 Method and apparatus for measuring butterfat and protein content using microwave absorption techniques	78	1998
BERTHOLD TECHNOLOGIES GMBH & CO. KG (1)
5,369,368 Device for determining material parameters by means of microwave measurements	79	1993
BILL, ELVIN STUART, 3 MARK ST., DUNDAS VALLEY, 2117 (1)
4,223,658 Elastic band projecting toy gun	50	1978
Biotronic Systems Corporation (1)
5,082,627 Three dimensional binding site array for interfering with an electrical field	85	1987
BLACKBERRY LIMITED (1)
6,794,950 Waveguide to microstrip transition	85	2001
BOARD OF REGENTS OF THE UNIVERSITY OF WISCONSIN SYSTEM, THE, AN INSTITUTE OF WI (1)
5,233,306 Method and apparatus for measuring the permittivity of materials	119	1991
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM (1)
2003/0119,057 Forming and modifying dielectrically-engineered microparticles	105	2001
BROADCOM CORPORATION (1)
7,088,981 Apparatus for reducing flicker noise in a mixer circuit	97	2001
BROOKS AUTOMATION, INC. (1)
5,539,323 Sensor for articles such as wafers on end effector	119	1993
BRUKER BIOSPIN CORPORATION (1)
6,933,725 NMR probe circuit for generating close frequency resonances	60	2004
CALIFORNIA INSTITUTE OF TECHNOLOGY (1)
5,138,289 Noncontacting waveguide backshort	40	1990
CARDIFF AND VALE NHS TRUST (1)
2004/0175,294 Apparatus and method for analysing a biological sample in response to microwave radiation	74	2004
Carl-Zeiss-Stiftung (1)
4,515,439 Attachment of microscope objectives	78	1982
CBC Corporation (1)
4,306,235 Multiple frequency microwave antenna	40	1978
CERPROBE CORPORATION (1)
6,002,426 Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits	109	1997
CHENG, DAVID (1)
5,479,108 Method and apparatus for handling wafers	157	1992
CHIPMOS TECHNOLOGIES INC. (1)
6,946,860 Modularized probe head	55	2003
CHUNG-SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,759,859 Resilient and rugged multi-layered probe	32	2001
CIRCUIT COMPONENTS, INCORPORATED (1)
4,793,814 Electrical circuit board interconnect	267	1986
CIRREX SYSTEMS LLC (1)
6,222,970 Methods and apparatus for filtering an optical fiber	135	1999
COM DEV LTD. (1)
5,841,342 Voltage controlled superconducting microwave switch and method of operation thereof	43	1995
COMMSCOPE, INC. OF NORTH CAROLINA (1)
6,407,542 Implementation of a multi-port modal decomposition system	42	2000
COMPAQ COMPUTER CORPORATION (1)
5,500,606 Completely wireless dual-access test fixture	113	1993
CONIFER CORPORATION (1)
5,293,175 Stacked dual dipole MMDS feed	134	1993
CONTEL FEDERAL SYSTEMS, INC., A DE CORP. (1)
4,184,729 Flexible connector cable	107	1977
CREDENCE SYSTEMS CORPORATION (1)
5,883,523 Coherent switching power for an analog circuit tester	103	1997
CROWN CORK & SEAL TECHNOLOGIES CORPORATION (1)
6,130,536 Preform test fixture and method of measuring a wall thickness	37	1998
CROWN PRODUCTS, INC. (1)
7,019,541 Electric conductivity water probe	95	2004
CSI TECHNOLOGY, INC. (1)
6,091,236 System and method for measuring and analyzing electrical signals on the shaft of a machine	94	1997
D-LINK CORPORATION (1)
6,778,140 Atch horn antenna of dual frequency	72	2003
Data Probe Corporation (1)
4,588,950 Test system for VLSI digital circuit and method of testing	94	1983
DEBIOTECH S.A. (1)
7,005,078 Micromachined fluidic device and method for making same	139	2001
DELPHI TECHNOLOGIES, INC. (1)
7,015,709 Ultra-broadband differential voltage probes	100	2004
DERMON, JOHN A. (1)
4,980,638 Microcircuit probe and method for manufacturing same	25	1989
DESIGNTECH INTERNATIONAL, INC. (1)
5,041,782 Microstrip probe	95	1989
DEUTSCHE THOMSON-BRANDT GMBH (1)
4,685,150 Tuning of a resonant circuit in a communications receiver	53	1984
DH TECHNOLOGIES DEVELOPMENT PTE. LTD. (1)
6,627,461 Method and apparatus for detection of molecular events using temperature control of detection environment	90	2001
Dimension Polyant Sailcloth, Inc. (1)
6,013,586 Tent material product and method of making tent material product	90	1997
DIT-MCO INTERNATIONAL CORPORATION (1)
4,357,575 Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies	115	1980
DYNEX SEMICONDUCTOR LIMITED (1)
6,265,950 Transition from a waveguide to a strip transmission line	88	1999
EADS DEUTSCHLAND GMBH (1)
6,636,182 Structural antenna for flight aggregates or aircraft	73	2001
EAST GIANT LIMITED (1)
5,879,289 Hand-held portable endoscopic camera	149	1996
EASTMAN KODAK COMPANY (1)
5,848,500 Light-tight enclosure and joint connectors for enclosure framework	105	1997
ECLIPSE SURGICAL TECHNOLOGIES, INC. (1)
5,728,091 Optical fiber for myocardial channel formation	55	1995
EDO CORPORATION, BARNES DIVISION (1)
4,755,874 Emission microscopy system	158	1987
Electric Power Research Institute, Inc. (1)
4,487,996 Shielded electrical cable	104	1982
ELECTRO SCIENTIFIC INDUSTRIES, INC. (1)
6,100,815 Compound switching matrix for probing and interconnecting devices under test to measurement equipment	98	1997
ELECTRONICS RESEARCH, INC. (1)
2004/0100,276 Method and apparatus for calibration of a vector network analyzer	99	2002
ENDEVCO CORPORATION (1)
5,214,243 High-temperature, low-noise coaxial cable assembly with high strength reinforcement braid	124	1991
EVERETT CHARLES TECHNOLOGIES, INC. (1)
5,214,374 Dual level test fixture	101	1991
FAIRCHILD SEMICONDUCTOR CORPORATION (1)
5,357,211 Pin driver amplifier	82	1993
FELTEN & GUILLEAUME ENERGIETECHNIK AG (1)
4,972,073 Light wave conductor-bending sensor with sliding rails for monitoring bridge structures or the like	46	1990
FILOTEX (1)
5,397,855 Low noise cable	93	1993
FINCH INTERNATIONAL LIMITED (1)
5,281,364 Liquid metal electrical contact compositions	13	1992
FLUKE CORPORATION (1)
6,384,614 Single tip Kelvin probe	101	2000
Formfactor, et al. (1)
6,937,037 Probe card assembly for contacting a device with raised contact elements	61	2002
FRAMATOME TECHNOLOGIES, INC. (1)
5,756,908 Probe positioner	41	1996
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. (1)
6,653,903 Supply voltage decoupling device for HF amplifier circuits	72	2001
FRESH QUEST CORPORATION (1)
5,589,781 Die carrier apparatus	73	1993
FUJI PHOTO FILM CO., LTD. (1)
4,727,391 Sheet film package and device for loading sheet films	81	1987
FUJIKURA LTD. (1)
4,626,618 DC electric power cable	98	1985
Fujikura Rubber Works, Ltd. (1)
4,425,395 Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production	103	1982
FUJITA, TAKAFUMI (1)
6,933,736 Prober	57	2003
GARMIN CORPORATION (1)
5,966,645 Transmitter with low-level modulation and minimal harmonic emissions	40	1997
GATAN, INC. (1)
6,914,244 Ion beam milling system and method for electron microscopy specimen preparation	85	2004
GCB INDUSTRIES, INC. (1)
6,229,327 Broadband impedance matching probe	103	1997
GE CAPITAL EQUITY INVESTMENTS, INC. (1)
6,628,980 Apparatus, systems, and methods for in vivo magnetic resonance imaging	142	2001
Gebr. Marzhauser Wetzlar oHG (1)
4,552,033 Drive system for a microscope stage or the like	109	1984
GEC FERRANTI DEFENCE SYSTEMS LIMITED (1)
4,714,873 Microwave noise measuring apparatus	48	1986
General Dielectric, Inc. (1)
2002/0050,828 Multi-feed microwave reflective resonant sensors	78	2001
GENERAL ELECTRIC MEDICAL SYSTEMS ISRAEL LTD., AN ISRAEL CORPORATION AFFILIATED WITH GENERAL ELECTRIC COMPANY (1)
4,691,163 Dual frequency surface probes	114	1985
GENERAL MOTORS CORPORATION (1)
4,277,741 Microwave acoustic spectrometer	82	1979
GENETRONICS, INC. (1)
5,869,326 Electroporation employing user-configured pulsing scheme	117	1996
GILBOE, DEREK (1)
7,034,553 Direct resistance measurement corrosion probe	95	2003
GILLESPIE, ROBB S. (1)
6,481,939 Tool tip conductivity contact sensor and method	87	2001
GOOGLE INC. (1)
6,078,500 Pluggable chip scale package	104	1998
GTE Products Corporation (1)
4,653,174 Method of making packaged IC chip	28	1986
GTE Valeron Corporation (1)
4,401,945 Apparatus for detecting the position of a probe relative to a workpiece	96	1981
GYRUS MEDICAL LIMITED (1)
6,409,724 Electrosurgical instrument	144	2000
H+W Test Products, Inc. (1)
6,054,869 Bi-level test fixture for testing printed circuit boards	95	1998
HAMAMATSU PHOTONICS K.K. (1)
4,922,186 Voltage detector	81	1988
HERSTEIN, DOV (1)
4,810,981 Assembly of microwave components	89	1987
HITACHI CONSUMER ELECTRONICS CO., LTD. (1)
7,012,871 Information recording method and apparatus with suppressed mark edge jitters	76	2004
HITACHI SOFTWARE ENGINEERING CO., LTD. (1)
7,035,738 Probe designing apparatus and probe designing method	93	2002
HITACHI ULSI SYSTEMS CO., LTD. (1)
6,734,687 Apparatus for detecting defect in device and method of detecting defect	108	2001
HITACHI, LTD. (1)
2005/0186,696 Gas flowmeter and manufacturing method thereof		2005
Honeywell Inc. (1)
5,347,204 Position dependent rate dampening in any active hand controller	55	1992
HOUSTON ADVANCED RESEARCH CENTER, A CORP. OF TX (1)
5,846,708 Optical and electrical methods and apparatus for molecule detection	335	1992
HP HOLDINGS THREE, INC. (1)
5,995,914 Method and apparatus for asynchronously measuring frequency shifted signals	101	1996
HYNIX SEMICONDUCTOR INC. (1)
7,002,364 Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same	95	2003
Hypervision, Inc. (1)
5,475,316 Transportable image emission microscope	132	1993
HYPRES, INC. (1)
4,894,612 Soft probe for providing high speed on-wafer connections to a circuit	155	1988
INIZIATIVE MARITTIME 1991 S.R.L. (1)
5,245,292 Method and apparatus for sensing a fluid handling	74	1992
INTEGRAL TECHNOLOGIES, INC. (1)
7,006,046 Low cost electronic probe devices manufactured from conductive loaded resin-based materials	94	2004
INTEGRATED TECHNOLOGY CORPORATION (1)
6,118,894 Integrated circuit probe card inspection system	116	1997
INTELLECTUAL VENTURES I LLC (1)
5,633,780 Electrostatic discharge protection device	124	1996
INTERMEC IP CORP. (1)
6,236,223 Method and apparatus for wireless radio frequency testing of RFID integrated circuits	160	1999
INTERSIL CORPORATION (1)
4,528,504 Pulsed linear integrated circuit tester	96	1982
ISC CO., LTD. (1)
7,071,722 Anisotropic, conductive sheet and impedance measuring probe	35	2003
iTerra Communications, LLC (1)
6,794,934 High gain wideband driver amplifier	86	2001
IWASAKI CORRESPOND INDUSTRY CO., LTD. (1)
6,933,737 Probe card	55	2003
J.A. WOOLLAM CO., INC. (1)
6,937,341 System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation	82	2002
JEOL RESONANCE INC. (1)
6,914,430 NMR probe	57	2004
JPK INSTRUMENTS AG (1)
7,022,985 Apparatus and method for a scanning probe microscope	98	2002
JPMORGAN CHASE BANK, N.A. (1)
5,678,210 Method and apparatus of coupling a transmitter to a waveguide in a remote ground terminal	42	1995
Junkosha Co., Ltd. (1)
4,567,321 Flexible flat cable	101	1984
KAI TECHNOLOGIES, INC. (1)
6,275,738 Microwave devices for medical hyperthermia, thermotherapy and diagnosis	125	1999
Kaiser Optical Systems (1)
6,907,149 Compact optical measurement probe	63	2003
KDC TECHNOLOGY CORP. (1)
5,227,730 Microwave needle dielectric sensors	97	1992
KEITHLEY INSTRUMENTS, INC. (1)
6,104,206 Product wafer junction leakage measurement using corona and a kelvin probe	113	1997
KOCH, LINDA (1)
4,567,436 Magnetic thickness gauge with adjustable probe	33	1982
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,528,993 Magneto-optical microscope magnetometer	79	2000
Kraftwerk Union Aktiengesellschaft (1)
4,642,417 Concentric three-conductor cable	113	1985
KYOCERA CORPORATION (1)
6,987,483 Effectively balanced dipole microstrip antenna	79	2003
L&P PROPERTY MANAGEMENT COMPANY (1)
5,505,150 Method and apparatus for facilitating loop take time adjustment in multi-needle quilting machine	86	1994
L-3 COMMUNICATIONS ELECTRON TECHNOLOGIES, INC. (1)
5,148,131 Coaxial-to-waveguide transducer with improved matching	43	1991
LAM RESEARCH CORPORATION (1)
7,015,703 Radio frequency Langmuir probe	96	2004
LAURENCE J. MARHOEFER (1)
5,097,101 Method of forming a conductive contact bump on a flexible substrate and a flexible substrate	93	1991
LEXINGTON, MA. 02173 A CORP OF DE. (1)
4,502,028 Programmable two-port microwave network	31	1982
LEXMARK INTERNATIONAL, INC. (1)
6,154,238 Scanning print head	42	1997
LION APPAREL, INC. (1)
5,157,790 Firefighter garment with lumbar support	47	1991
LOGICVISION, INC. (1)
2005/0229,053 Circuit and method for low frequency testing of high frequency signal waveforms	30	2004
M/A-COM TECHNOLOGY SOLUTIONS HOLDINGS, INC. (1)
5,142,224 Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals	102	1991
M/A-COM, INC. (1)
4,376,920 Shielded radio frequency transmission cable	140	1981
MAGMA DESIGN AUTOMATION, INC. (1)
5,030,907 CAD driven microprobe integrated circuit tester	112	1989
MARTIN MARIETTA CORPORATION (1)
5,867,073 Waveguide to transmission line transition	83	1994
MATRA BAE DYNAMICS (UK) LIMITED (1)
5,266,963 Integrated antenna/mixer for the microwave and millimetric wavebands	52	1991
MATTSON TECHNOLOGY, INC. (1)
6,172,337 System and method for thermal processing of a semiconductor substrate	102	1999
MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH (1)
4,551,747 Leadless chip carrier apparatus providing for a transmission line environment and improved heat dissipation	113	1982
MCC GESELLSCHAFT FUR DIAGNOSESYSTEME IN MEDIZIN UND TECHNIK MBH & CO. KG (1)
2005/0168,722 Device and method for measuring constituents in blood	20	2003
MEDICAL COLLEGE OF GEORGIA RESEARCH INSTITUTE, INC. (1)
5,488,954 Ultrasonic transducer and method for using same	134	1994
MEDICAL DEVICE INNOVATIONS LIMITED (1)
2006/0155,270 Tissue ablation apparatus and method of ablating tissue	108	2003
MEDISPECTRA, INC. (1)
2004/0186,382 Spectral volume microprobe arrays	75	2003
MEDXENSE AS (1)
7,003,184 Fiber optic probes	103	2001
MENTOR GRAPHICS CORPORATION (1)
5,383,787 Integrated circuit package with direct access to internal signals	59	1993
MERCK & CO., INC. (1)
7,013,221 Iterative probe design and detailed expression profiling with flexible in-situ synthesis arrays	94	2000
MESO SCALE TECHNOLOGIES, LLC (1)
2005/0142,033 Modular assay plates, reader systems and methods for test measurements	84	2004
MICROCRAFT (1)
7,188,037 Method and apparatus for testing circuit boards	78	2004
MITEL SEMICONDUCTOR LIMITED (1)
5,764,070 Structure for testing bare integrated circuit devices	59	1996
MITSUBISHI GAS CHEMICAL COMPANY, INC. (1)
6,222,031 Process for preparing water-soluble tricarboxypolysaccharide	82	1998
MOLECULAR DEVICES, INC. (1)
5,164,319 Multiple chemically modulated capacitance determination	293	1989
MTU MOTOREN- UND TURBINEN-UNION MUENCHEN GMBH (1)
5,232,789 Structural component with a protective coating having a nickel or cobalt basis and method for making such a coating	90	1992
MURATA MANUFACTURING CO., LTD. (1)
6,838,885 Method of correcting measurement error and electronic component characteristic measurement apparatus	99	2003
NCR CORPORATION (1)
6,816,840 System and method of sending messages to a group of electronic price labels	37	1998
Nebraska Electronics, Inc. (1)
5,481,196 Process and apparatus for microwave diagnostics and therapy	84	1994
NEC ELECTRONICS CORPORATION (1)
6,320,396 Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device	98	1997
NEWPORT FAB, LLC (1)
6,727,716 Probe card and probe needle for high frequency testing	95	2002
NIHON DENSHIZAIRYO KABUSHIKI KAISHA (1)
5,134,365 Probe card in which contact pressure and relative position of each probe end are correctly maintained	86	1991
NISSAN CHEMICAL INDUSTRIES, LTD. (1)
5,021,186 Chloroisocyanuric acid composition having storage stability	76	1989
NITTO DENKO CORPORATION (1)
5,977,783 Multilayer probe for measuring electrical characteristics	61	1997
NORTEL NETWORKS LIMITED (1)
4,853,624 Tunable microwave wafer probe	92	1988
NOVELLUS DEVELOPMENT COMPANY, LLC (1)
6,946,859 Probe structures using clamped substrates with compliant interconnectors	47	2003
NUCLEAR FILTER TECHNOLOGY, INC. (1)
6,948,391 Probe with integral vent, sampling port and filter element	61	2003
NXP B.V. (1)
6,275,043 Test device for testing a module for a data carrier intended for contactless communication	41	1999
OKI SEMICONDUCTOR CO., LTD. (1)
6,927,078 Method of measuring contact resistance of probe and method of testing semiconductor device	59	2003
OL SECURITY LIMITED LIABILITY COMPANY (1)
5,688,618 Millimeter wave device and method of making	41	1995
OLAER INDUSTRIES (1)
4,788,851 Pressure vessel incorporating a sensor for detecting liquid in a gas chamber	42	1987
OLYMPUS CORPORATION (1)
4,696,544 Fiberscopic device for inspection of internal sections of construction, and method for using same	102	1985
OMNIPROBE, INC. (1)
6,420,722 Method for sample separation and lift-out with one cut	116	2001
OPTOMETRIX, INC. (1)
6,181,416 Schlieren method for imaging semiconductor device properties	82	1999
OSRAM OPTO SEMICONDUCTORS GMBH (1)
6,946,864 Method for measuring product parameters of components formed on a wafer and device for performing the method	20	2002
Pacific Western Systems, Inc. (1)
4,251,772 Probe head for an automatic semiconductive wafer prober	45	1978
PHILIPS ELECTRONICS NORTH AMERICA CORPORATION (1)
4,593,243 Coplanar and stripline probe card apparatus	114	1984
PICO TECHNOLOGY HOLDINGS, INC. (1)
6,335,625 Programmable active microwave ultrafine resonance spectrometer (PAMURS) method and systems	85	2000
PINNACLE PRODUCTS, INC. (1)
5,807,107 Dental infection control system	91	1996
POPKIN FAMILY ASSETS, L.L.C. (1)
6,418,009 Broadband multi-layer capacitor	86	2000
PREMIER MICROWAVE OF CALIFORNIA, INC. (1)
4,740,764 Pressure sealed waveguide to coaxial line connection	45	1987
PREMTEK INTERNATIONAL INC. (1)
2005/0116,730 DOUBLE-FACED DETECTING DEVICES FOR AN ELECTRONIC SUBSTRATE	27	2003
Probe-Rite, Inc. (1)
4,636,722 High density probe-head with isolated and shielded transmission lines	155	1984
PROFILE TECHNOLOGIES, INC. (1)
2001/0044,152 Dual beam, pulse propagation analyzer, medical profiler interferometer	72	2001
PROMOS TECHNOLOGIES INC. (1)
2003/0234,659 Electrical isolation between pins sharing the same tester channel	17	2002
PS4 LUXCO S.A.R.L. (1)
7,319,337 Method and apparatus for pad aligned multiprobe wafer testing	19	2007
PURDUE RESEARCH FOUNDATION (1)
2004/0147,034 Method and apparatus for measuring a substance in a biological sample	126	2003
QINETIQ LIMITED (1)
5,803,607 Method and apparatus for measurement of unsteady gas temperatures	42	1997
QUALCOMM INCORPORATED (1)
6,737,920 Variable gain amplifier	76	2002
RELIABILITY INCORPORATED (1)
2002/0070,745 Cooling system for burn-in unit	83	2000
REMOLEAUX TECHNOLOGIES AG, LLC (1)
5,686,960 Image input device having optical deflection elements for capturing multiple sub-images	134	1994
RESEARCH IN MOTION LIMITED (1)
5,949,383 Compact antenna structures including baluns	112	1997
Research Organization for Circuit Knowledge (1)
5,584,120 Method of manufacturing printed circuits	76	1994
Riken Denshi Co., Ltd. (1)
4,636,772 Multiple function type D/A converter	48	1985
ROCKSTAR CONSORTIUM US LP (1)
6,753,679 Test point monitor using embedded passive resistance	83	2002
ROCKWELL INTERNATIONAL CORPORATION (1)
4,184,133 Assembly of microwave integrated circuits having a structurally continuous ground plane	51	1977
ROSEMOUNT TANK RADAR AB (1)
6,278,411 Horn antenna	78	1999
ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG (1)
2004/0066,181 High-frequency probe tip	80	2003
ROUND ROCK RESEARCH, LLC (1)
5,126,286 Method of manufacturing edge connected semiconductor die	151	1990
RUDOLPH TECHNOLOGIES, INC. (1)
6,710,798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card	108	1999
SAE MAGNETICS (H.K.) LTD. (1)
7,015,689 Connection method for probe pins for measurement of characteristics of thin-film magnetic head and characteristic measurement method for thin-film magnetic head	94	2003
SANDIA CORPORATION (1)
6,078,183 Thermally-induced voltage alteration for integrated circuit analysis	128	1998
SANTEC CORPORATION (1)
7,323,680 Optical deflection probe and optical deflection probe device	20	2006
SANTRONICS, INC. (1)
7,030,599 Hand held voltage detection probe	100	2004
SARNOFF CORPORATION (1)
5,993,611 Capacitive denaturation of nucleic acid	114	1997
SCHLUMBERGER TECHNOLOGY CORPORATION (1)
4,766,384 Well logging apparatus for determining dip, azimuth, and invaded zone conductivity	100	1986
SCIENCE & TECHNOLOGY CORPORATION @ UNM (1)
6,549,022 Apparatus and method for analyzing functional failures in integrated circuits	125	2000
SEIKO INSTRUMENTS INC. (1)
7,015,455 Near-field optical probe	92	2005
SEMCO MACHINE CORPORATION (1)
5,550,481 Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making	41	1995
SEMICONDUCTOR DIAGNOSTICS, INC. (1)
6,114,865 Device for electrically contacting a floating semiconductor wafer having an insulating film	111	1999
SEMICONDUCTOR PHYSICS LABORATORY, INC. (1)
6,052,653 Spreading resistance profiling system	99	1997
SEMILAB SEMICONDUCTOR PHYSICS LABORATORY, CO., LTD. (1)
6,388,455 Method and apparatus for simulating a surface photo-voltage in a substrate	42	2000
Semitest, Inc. (1)
4,891,584 Apparatus for making surface photovoltage measurements of a semiconductor	136	1988
SENSOR DIAGNOSTICS, INC. (1)
4,713,347 Measurement of ligand/anti-ligand interactions using bulk conductance	197	1985
SHARP LABORATORIES OF AMERICA, INC. (1)
7,057,404 Shielded probe for testing a device under test	20	2003
SHOSHOTECH CO., LTD. (1)
6,351,885 Method of making conductive bump on wiring board	62	1998
SIERRA MONOLITHICS, INC. (1)
6,639,461 Ultra-wideband power amplifier module apparatus and method for optical and electronic communications	80	2001
SIGNATURE BIOSCIENCESM INC. (1)
6,395,480 Computer program and database structure for detecting molecular binding events	98	1999
SII NANOTECHNOLOGY INC. (1)
6,621,082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function	98	2002
Siliconix incorporated (1)
6,476,442 Pseudo-Schottky diode	92	1998
SINGULUS TECHNOLOGIES GMBH (1)
5,876,082 Device for gripping and holding substrates	69	1997
Sirotech Ltd. (1)
5,824,494 Method for enumerating bacterial populations	91	1995
SLOAN TECHNOLOGY CORPORATION, A CORP. OF CA (1)
4,707,657 Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine	148	1985
SMITHS GROUP PLC (1)
4,706,050 Microstrip devices	84	1985
SMSC ANALOG TECHNOLOGY, INC. (1)
6,753,699 Integrated circuit and method of controlling output impedance	78	2002
SNAP-ON TECHNOLOGIES, INC. (1)
6,940,283 Detecting field from different ignition coils using adjustable probe	54	2003
SOHN, LYDIA L. (1)
2003/0072,549 Method and apparatus for dielectric spectroscopy of biological solutions	105	2002
Solid State Farms, Inc. (1)
5,792,668 Radio frequency spectral analysis for in-vitro or in-vivo environments	177	1996
SPAR AEROSPACE LIMITED (1)
5,116,180 Human-in-the-loop machine control loop	249	1990
Spectroscopy Imaging Systems Corporation (1)
4,916,398 Efficient remote transmission line probe tuning for NMR apparatus	94	1988
ST. CLAIR INTELLECTUAL PROPERTY CONSULTANTS, INC. (1)
4,904,933 Integrated circuit probe station	113	1986
Stiftelsen Institutet for Mikrovagsteknik vid Tekniska Hogskolan i Stockholm (1)
4,476,363 Method and device for heating by microwave energy	33	1983
Storage Technology Corporation (1)
5,469,324 Integrated decoupling capacitive core for a printed circuit board and method of making same	120	1994
SUMITOMO ELECTRIC INDUSTRIES, LTD. (1)
4,818,059 Optical connector and splicer	84	1987
SUMITOMO WIRING SYSTEMS, LTD. (1)
5,627,473 Connector inspection device	41	1995
SUN MICROSYSTEMS, INC. (1)
5,629,838 Apparatus for non-conductively interconnecting integrated circuits using half capacitors	180	1994
SWCC SHOWA CABLE SYSTEMS CO., LTD. (1)
6,944,380 Optical fiber for transmitting ultraviolet ray, optical fiber probe, and method of manufacturing the optical fiber probe	57	2002
SYNERGETICS USA, INC. (1)
6,572,608 Directional laser probe	52	2000
TDK RF SOLUTIONS, INC. (1)
6,657,601 Metrology antenna system utilizing two-port, sleeve dipole and non-radiating balancing network	76	2001
TECHNOPROBE S.R.L. (1)
2002/0070,743 Testing head having vertical probes	88	2001
TELEFONAKTIEBOLAGET LM ERICSSON (PUBL) (1)
5,996,102 Assembly and method for testing integrated circuit devices	88	1997
TEMPTRONIC CORPORATION (1)
6,415,858 Temperature control system for a workpiece chuck	92	1997
TERADYNE, INC. (1)
6,784,679 Differential coaxial contact array for high-density, high-speed signals	92	2002
TERAVIEW LIMITED (1)
7,315,175 Probe apparatus and method for examining a sample	20	2002
TESSERA, INC. (1)
5,808,874 Microelectronic connections with liquid conductive elements	77	1996
THE REGENTS OF THE UNIVERSITY OF MICHIGAN (1)
6,906,506 Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe	55	2002
THERMOCARBON, INC. (1)
5,676,360 Machine tool rotary table locking apparatus	113	1995
THK CO., LTD. (1)
4,899,998 Rotational positioning device	106	1988
THOMAS JEFFERSON UNIVERSITY (1)
5,478,748 Protein assay using microwave energy	88	1994
Thomson Hybrides et Microondes (1)
4,901,012 Circuit for measuring the dynamic characteristics of a package for high-speed integrated circuits and a method for measuring said dynamic characteristics	39	1987
Thomson-CSF (1)
4,742,571 Coupling device between a metal wave guide, a dielectric wave guide and a semiconductor component and a mixer using this coupling device	86	1986
TIOGA TECHNOLOGIES, INC. (1)
6,459,739 Method and apparatus for RF common-mode noise rejection in a DSL receiver	106	1999
TOKYO OHKA KOGYO CO., LTD. (1)
5,571,324 Rotary-cup coating apparatus	103	1994
Tokyo Shibaura Denki Kabushiki Kaisha (1)
4,491,783 Apparatus for measuring noise factor and available gain	28	1982
TOTAL FINA ELF (1)
2002/0197,174 Electrical pump, and method for using plurality of submersible electrical pumps for well completion		2002
TRANSAT CORPORATION (1)
5,451,884 Electronic component temperature test system with flat ring revolving carriage	100	1993
Trigon (1)
4,340,860 Integrated circuit carrier package test probe	67	1980
TRIO-TECH INTERNATIONAL (1)
6,605,955 Temperature controlled wafer chuck system with low thermal resistance	98	2000
TRIQUINT SEMICONDUCTOR, INC. (1)
4,853,627 Wafer probes	102	1988
TRUSTEES OF DARTMOUTH COLLEGE (1)
5,833,601 Methodology for determining oxygen in biological systems	82	1997
TSK AMERICA, INC. (1)
2001/0043,073 PROBER INTERFACE PLATE	73	1999
U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL TRUSTEE (1)
4,926,172 Joystick controller	54	1988
UNISYS CORPORATION (1)
4,553,111 Printed circuit board maximizing areas for component utilization	30	1983
UNIVERSITY COLLEGE OF WALES, ABERYSTWYTH, THE (1)
5,569,591 Analytical or monitoring apparatus and method	133	1994
UNIVERSITY OF KANSAS (1)
6,937,020 Solid-state nuclear magnetic resonance probe	61	2004
UNIVERSITY OF MARYLAND, BALTIMORE (1)
6,809,533 Quantitative imaging of dielectric permittivity and tunability	74	2002
UNIVERSITY OF MASSACHUSETTS (1)
5,233,197 High speed digital imaging microscope	111	1991
VATELL CORPORATION (1)
6,278,051 Differential thermopile heat flux transducer	92	2000
VEECO METROLOGY INC. (1)
7,001,785 Capacitance probe for thin dielectric film characterization	99	2004
VEGA GRIESHABER KG (1)
7,030,827 Planar antenna and antenna system	73	2004
VERIGY (SINGAPORE) PTE. LTD. (1)
2005/0068,054 Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies	29	2004
WAYNE STATE UNIVERSITY (1)
4,327,180 Method and apparatus for electromagnetic radiation of biological material	78	1979
WESTERNGECO L.L.C. (1)
6,912,468 Method and apparatus for contemporaneous utilization of a higher order probe in pre-stack and post-stack seismic domains	57	2003
Westinghouse Electric Corp. (1)
4,302,146 Probe positioner	46	1978
WICO DISTRIBUTION CORP., A DE CORP. (1)
4,558,609 Joystick controller with interchangeable handles	28	1983
WINBOND ELECTRONICS CORP. (1)
6,611,417 Wafer chuck system	80	2001
WISCONSIN ALUMNI RESEARCH FOUNDATION (1)
2003/0088,180 Space-time microwave imaging for cancer detection	98	2002
XCERRA CORPORATION (1)
7,015,711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method	104	2004
XILINX, INC. (1)
6,512,482 Method and apparatus using a semiconductor die integrated antenna structure	90	2001
Yugen Kaisha Sozoan (1)
5,481,936 Rotary drive positioning system for an indexing table	111	1994
Other [Check patent profile for assignment information] (37)
4,330,783 Coaxially fed dipole antenna	77	1979
4,284,682 Heat sealable, flame and abrasion resistant coated fabric	123	1980
4,383,217 Collinear four-point probe head and mount for resistivity measurements	85	1981
4,480,223 Unitary probe assembly	133	1981
4,641,659 Medical diagnostic microwave scanning apparatus	107	1982
4,563,640 Fixed probe board	42	1982
4,515,133 Fuel economizing device	76	1984
4,812,754 Circuit board interfacing apparatus	116	1987
4,711,563 Portable collapsible darkroom	89	1987
4,791,363 Ceramic microstrip probe blade	136	1987
4,988,062 Apparatus, system and method for organizing and maintaining a plurality of medical catheters and the like	92	1988
4,922,912 MAP catheter	111	1988
5,129,006 Electronic audio signal amplifier and loudspeaker system	20	1989
5,363,050 Quantitative dielectric imaging system	105	1990
5,414,565 Tilting kinematic mount	84	1991
5,187,443 Microwave test fixtures for determining the dielectric properties of a material	79	1992
5,584,608 Anchored cable sling system	85	1994
5,670,322 Multi site molecule detection method	169	1995
5,670,888 Method for transporting and testing wafers	126	1995
5,621,400 Ice detection method and apparatus for an aircraft	42	1995
5,744,971 Device and apparatus for measuring dielectric properties of materials	89	1995
5,831,442 Handling device	95	1996
5,675,932 Plant growing system	90	1996
5,949,579 Flexible darkness adapting viewer	88	1997
6,307,363 Ultrahigh-frequency high-impedance passive voltage probe	50	1998
RE37130 Signal conditioning apparatus	30	1998
6,147,851 Method for guarding electrical regions having potential gradients	91	1999
6,327,034 Apparatus for aligning two objects	92	1999
6,548,311 Device and method for detecting analytes	110	2000
2001/0002,794 Split resistor probe and method	78	2001
2002/0030,480 Apparatus for the automated testing, calibration and characterization of test adapters	12	2001
6,587,327 Integrated broadband ceramic capacitor array	107	2002
2003/0076,585 Optical system for enhancing the image from a microscope's high power objective lens	30	2002
2003/0139,662 Method and apparatus for detecting, identifying and performing operations on microstructures including, anthrax spores, brain cells, cancer cells, living tissue cells, and macro-objects including stereotactic neurosurgery instruments, weapons and explosives	82	2002
7,015,707 Micro probe	110	2003
2004/0193,382 Method and apparatus for calibrating a multiport test system for measurement of a DUT	96	2004
2006/0030,060 Apparatus and method for testing defects	37	2005

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US Patent No: 7,619,419

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Wideband active-passive differential signal probe

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