US Patent No: 7,619,419

Number of patents in Portfolio can not be more than 2000

Wideband active-passive differential signal probe

ALSO PUBLISHED AS: 20060290357

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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A wideband differential signal probe includes separate paths to convert a lower frequency component and a higher frequency component of a differential signal to a lower frequency single ended signal and a higher frequency single ended signal which are combined for the probe's output which is commonly input to instrumentation.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
CASCADE MICROTECH, INC.BEAVERTON, OR261

International Classification(s)

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  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Campbell, Richard Portland, OR 36 62

Cited Art Landscape

Patent Info (Count) # Cites Year
 
FormFactor, Inc. (156)
5,476,211 Method of manufacturing electrical contacts, using a sacrificial member 365 1993
5,917,707 Flexible contact structure with an electrically conductive shell 302 1994
6,049,976 Method of mounting free-standing resilient electrical contact structures to electronic components 123 1995
5,772,451 Sockets for electronic components and methods of connecting to electronic components 356 1995
5,974,662 Method of planarizing tips of probe elements of a probe card assembly 356 1995
5,829,128 Method of mounting resilient contact structures to semiconductor devices 224 1995
5,852,871 Method of making raised contacts on electronic components 135 1995
5,601,740 Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires 113 1995
5,820,014 Solder preforms 121 1996
5,773,780 Method of severing bond wires and forming balls at their ends 76 1996
5,900,738 Contact structure device for interconnections, interposer, semiconductor assembly and package using the same and method 148 1996
5,926,951 Method of stacking electronic components 158 1996
6,184,587 Resilient contact structures, electronic interconnection component, and method of mounting resilient contact structures to electronic components 119 1996
6,242,803 Semiconductor devices with integral contact structures 91 1996
6,274,823 Interconnection substrates with resilient contact structures on both sides 118 1996
6,476,333 Raised contact structures (solder columns) 72 1996
6,064,213 Wafer-level burn-in and test 261 1997
5,806,181 Contact carriers (tiles) for populating larger substrates with spring contacts 266 1997
5,994,152 Fabricating interconnects and tips using sacrificial substrates 191 1997
6,442,831 Method for shaping spring elements 73 1997
6,482,013 Microelectronic spring contact element and electronic component having a plurality of spring contact elements 147 1997
5,832,601 Method of making temporary connections between electronic components 192 1997
5,864,946 Method of making contact tip structures 165 1997
5,878,486 Method of burning-in semiconductor devices 109 1997
5,884,398 Mounting spring elements on semiconductor devices 105 1997
5,983,493 Method of temporarily, then permanently, connecting to a semiconductor device 119 1997
5,998,228 Method of testing semiconductor 128 1997
6,032,356 Wafer-level test and burn-in, and semiconductor process 162 1997
6,184,053 Method of making microelectronic spring contact elements 202 1997
5,912,046 Method and apparatus for applying a layer of flowable coating material to a surface of an electronic component 78 1997
5,998,864 Stacking semiconductor devices, particularly memory chips 185 1997
6,050,829 Making discrete power connections to a space transformer of a probe card assembly 155 1997
6,307,161 Partially-overcoated elongate contact structures 70 1997
6,043,563 Electronic components with terminals and spring contact elements extending from areas which are remote from the terminals 165 1997
6,741,085 Contact carriers (tiles) for populating larger substrates with spring contacts 91 1997
6,520,778 Microelectronic contact structures, and methods of making same 152 1998
6,720,501 PC board having clustered blind vias 69 1998
6,042,712 Apparatus for controlling plating over a face of a substrate 115 1998
6,090,261 Method and apparatus for controlling plating over a face of a substrate 83 1998
6,110,823 Method of modifying the thickness of a plating on a member by creating a temperature gradient on the member, applications for employing such a method, and structures resulting from such a method 182 1998
6,023,103 Chip-scale carrier for semiconductor devices including mounted spring contacts 155 1998
6,033,935 Sockets for "springed" semiconductor devices 109 1998
6,669,489 Interposer, socket and assembly for socketing an electronic component and method of making and using same 112 1998
6,330,164 Interconnect assemblies and methods including ancillary electronic component connected in immediate proximity of semiconductor device 125 1998
6,029,344 Composite interconnection element for microelectronic components, and method of making same 209 1998
6,246,247 Probe card assembly and kit, and methods of using same 117 1998
6,441,315 Contact structures with blades having a wiping motion 113 1998
6,690,185 Large contactor with multiple, aligned contactor units 126 1998
6,255,126 Lithographic contact elements 186 1998
6,268,015 Method of making and using lithographic contact springs 124 1998
6,150,186 Method of making a product with improved material properties by moderate heat-treatment of a metal incorporating a dilute additive 97 1998
6,429,029 Concurrent design and subsequent partitioning of product and test die 156 1998
6,456,099 Special contact points for accessing internal circuitry of an integrated circuit 111 1998
6,215,670 Method for manufacturing raised electrical contact pattern of controlled geometry 97 1999
6,208,225 Filter structures for integrated circuit interfaces 147 1999
6,218,910 High bandwidth passive integrated circuit tester probe card assembly 139 1999
6,448,865 Integrated circuit interconnect system 73 1999
6,452,411 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses 103 1999
6,480,978 Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons 81 1999
6,499,121 Distributed interface for parallel testing of multiple devices using a single tester channel 95 1999
6,627,483 Method for mounting an electronic component 94 1999
6,644,982 Method and apparatus for the transport and tracking of an electronic component 114 1999
6,887,723 Method for processing an integrated circuit including placing dice into a carrier and testing 74 1999
6,468,098 Electrical contactor especially wafer level contactor using fluid pressure 96 1999
6,655,023 Method and apparatus for burning-in semiconductor devices in wafer form 83 1999
6,827,584 Interconnect for microelectronic structures with enhanced spring characteristics 92 1999
6,491,968 Methods for making spring interconnect structures 100 1999
6,672,875 Spring interconnect structures 106 1999
6,339,338 Apparatus for reducing power supply noise in an integrated circuit 89 2000
6,168,974 Process of mounting spring contacts to semiconductor devices 111 2000
6,459,343 Integrated circuit interconnect system forming a multi-pole filter 70 2000
6,232,149 Sockets for "springed" semiconductor devices 78 2000
6,509,751 Planarizer for a semiconductor contactor 135 2000
6,215,196 Electronic component with terminals and spring contact elements extending from areas which are remote from the terminals 71 2000
6,640,432 Method of fabricating shaped springs 103 2000
6,677,744 System for measuring signal path resistance for an integrated circuit tester interconnect structure 70 2000
6,476,630 Method for testing signal paths between an integrated circuit wafer and a wafer tester 74 2000
6,525,555 Wafer-level burn-in and test 100 2000
6,727,579 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES 95 2000
6,685,817 Method and apparatus for controlling plating over a face of a substrate 63 2000
6,622,103 System for calibrating timing of an integrated circuit wafer tester 92 2000
6,603,323 Closed-grid bus architecture for wafer interconnect structure 89 2000
6,727,580 Microelectronic spring contact elements 78 2000
6,539,531 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes 114 2000
6,835,898 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES 81 2000
6,778,406 Resilient contact structures for interconnecting electronic devices 109 2000
6,475,822 Method of making microelectronic contact structures 89 2000
6,597,187 Special contact points for accessing internal circuitry of an integrated circuit 74 2000
6,603,324 Special contact points for accessing internal circuitry of an integrated circuit 71 2000
6,606,575 Cross-correlation timing calibration for wafer-level IC tester interconnect systems 84 2000
6,621,260 Special contact points for accessing internal circuitry of an integrated circuit 79 2000
6,701,612 Method and apparatus for shaping spring elements 88 2000
6,713,374 Interconnect assemblies and methods 101 2000
6,836,962 Method and apparatus for shaping spring elements 76 2000
6,538,538 High frequency printed circuit board via 87 2001
6,791,176 Lithographic contact elements 78 2001
6,616,966 Method of making lithographic contact springs 126 2001
6,780,001 Forming tool for forming a contoured microelectronic spring mold 71 2001
6,501,343 Integrated circuit tester with high bandwidth probe assembly 91 2001
6,606,014 Filter structures for integrated circuit interfaces 62 2001
6,534,856 Sockets for "springed" semiconductor devices 87 2001
6,910,268 Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via 123 2001
6,856,150 Probe card with coplanar daughter card 85 2001
6,627,980 Stacked semiconductor device assembly with microelectronic spring contacts 80 2001
6,538,214 Method for manufacturing raised electrical contact pattern of controlled geometry 77 2001
6,882,239 Electromagnetically coupled interconnect system 81 2001
6,888,362 Test head assembly for electronic components with plurality of contoured microelectronic spring contacts 92 2001
6,729,019 Method of manufacturing a probe card 105 2001
6,678,876 Process and apparatus for finding paths through a routing space 90 2001
6,862,727 Process and apparatus for adjusting traces 66 2001
6,764,869 Method of assembling and testing an electronics module 70 2001
6,714,828 Method and system for designing a probe card 73 2001
6,882,546 Multiple die interconnect system 74 2001
6,664,628 Electronic component overlapping dice of unsingulated semiconductor wafer 69 2001
6,456,103 Apparatus for reducing power supply noise in an integrated circuit 88 2001
6,759,311 Fan out of interconnect elements attached to semiconductor wafer 70 2001
6,817,052 Apparatuses and methods for cleaning test probes 83 2001
6,816,031 Adjustable delay transmission line 71 2001
6,624,648 Probe card assembly 112 2001
6,777,319 Microelectronic spring contact repair 79 2001
6,479,308 Semiconductor fuse covering 69 2001
6,615,485 Probe card assembly and kit, and methods of making same 88 2001
6,891,385 Probe card cooling assembly with direct cooling of active electronic components 81 2001
7,002,363 Method and system for compensating thermally induced motion of probe cards 118 2001
6,741,092 Method and system for detecting an arc condition 62 2001
6,864,105 Method of manufacturing a probe card 68 2002
6,680,659 Integrated circuit interconnect system 70 2002
6,784,674 Test signal distribution system for IC tester 75 2002
6,798,225 Tester channel to multiple IC terminals 78 2002
6,825,422 Interconnection element with contact blade 74 2002
6,812,691 Compensation for test signal degradation due to DUT fault 69 2002
6,640,415 Segmented contactor 108 2002
6,657,455 Predictive, adaptive power supply for an integrated circuit under test 81 2002
6,807,734 Microelectronic contact structures, and methods of making same 78 2002
6,559,671 Efficient parallel testing of semiconductor devices using a known good device to generate expected responses 73 2002
6,646,520 Integrated circuit interconnect system 72 2002
6,839,964 Method for manufacturing a multi-layer printed circuit board 65 2002
6,686,754 Integrated circuit tester with high bandwidth probe assembly 73 2002
6,678,850 Distributed interface for parallel testing of multiple devices using a single tester channel 73 2002
6,818,840 Method for manufacturing raised electrical contact pattern of controlled geometry 67 2002
6,642,625 Sockets for "springed" semiconductor devices 65 2002
6,661,316 High frequency printed circuit board via 70 2002
6,825,052 Test assembly including a test die for testing a semiconductor product die 81 2002
6,788,094 Wafer-level burn-in and test 77 2002
6,845,491 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes 72 2003
6,784,677 Closed-grid bus architecture for wafer interconnect structure 65 2003
7,342,402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features 25 2003
6,911,835 High performance probe system 83 2003
6,838,893 Probe card assembly 72 2003
6,870,381 Insulative covering of probe tips 63 2003
6,911,814 Apparatus and method for electromechanical testing and validation of probe cards 72 2003
6,913,468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods 88 2003
6,949,942 Predictive, adaptive power supply for an integrated circuit under test 45 2003
6,822,529 Integrated circuit interconnect system 69 2003
6,917,210 Integrated circuit tester with high bandwidth probe assembly 67 2003
7,276,922 Closed-grid bus architecture for wafer interconnect structure 23 2004
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (42)
4,520,314 Probe head arrangement for conductor line testing with at least one probe head comprising a plurality of resilient contacts 38 1982
4,744,041 Method for testing DC motors 117 1985
4,851,767 Detachable high-speed opto-electronic sampling probe 30 1988
4,831,494 Multilayer capacitor 154 1988
4,922,128 Boost clock circuit for driving redundant wordlines and sample wordlines 79 1989
4,987,100 Flexible carrier for an electronic device 81 1989
5,001,423 Dry interface thermal chuck temperature control system for semiconductor wafer testing 133 1990
5,007,163 Non-destructure method of performing electrical burn-in testing of semiconductor chips 66 1990
5,207,585 Thin interface pellicle for dense arrays of electrical interconnects 168 1990
5,061,192 High density connector 143 1990
5,334,931 Molded test probe assembly 92 1991
5,371,654 Three dimensional high performance interconnection package 247 1992
5,441,690 Process of making pinless connector 74 1993
5,537,372 High density data storage system with topographic contact sensor 113 1993
5,531,022 Method of forming a three dimensional high performance interconnection package 161 1994
5,532,608 Ceramic probe card and method for reducing leakage current 63 1995
5,804,982 Miniature probe positioning actuator 104 1995
5,810,607 Interconnector with contact pads having enhanced durability 159 1995
5,726,211 Process for making a foamed elastometric polymer 102 1996
5,756,021 Electronic devices comprising dielectric foamed polymers 88 1996
5,700,844 Process for making a foamed polymer 138 1996
5,785,538 High density test probe with rigid surface structure 86 1996
6,268,016 Manufacturing computer systems with fine line circuitized substrates 66 1996
5,723,347 Semi-conductor chip test probe and process for manufacturing the probe 106 1996
6,286,208 Interconnector with contact pads having enhanced durability 84 1996
5,838,160 Integral rigid chip test probe 82 1996
6,054,651 Foamed elastomers for wafer probing applications and interposer connectors 81 1996
5,926,029 Ultra fine probe contacts 105 1997
6,059,982 Micro probe assembly and method of fabrication 148 1997
5,804,607 Process for making a foamed elastomeric polymer 118 1997
6,062,879 High density test probe with rigid surface structure 82 1998
6,104,201 Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage 71 1998
6,332,270 Method of making high density integral test probe 95 1998
6,206,273 Structures and processes to create a desired probetip contact geometry on a wafer test probe 82 1999
6,452,406 Probe structure having a plurality of discrete insulated probe tips 80 1999
6,528,984 Integrated compliant probe for wafer level test and burn-in 110 1999
6,526,655 Angled flying lead wire bonding process 75 2001
6,788,093 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies 104 2002
6,943,571 Reduction of positional errors in a four point probe resistance measurement 60 2003
7,007,380 TFI probe I/O wrap test method 92 2004
7,011,531 Membrane probe with anchored elements 92 2005
7,005,879 Device for probe card power bus noise reduction 92 2005
 
CASCADE MICROTECH, INC. (39)
4,280,112 Electrical coupler 98 1979
4,697,143 Wafer probe 197 1984
4,764,723 Wafer probe 91 1986
4,827,211 Wafer probe 125 1987
4,858,160 System for setting reference reactance for vector corrected measurements 99 1988
4,849,689 Microwave wafer probe having replaceable probe tip 125 1988
5,012,186 Electrical probe with contact force protection 40 1990
5,045,781 High-frequency active probe having replaceable contact needles 109 1991
5,101,453 Fiber optic wafer probe 98 1991
5,266,889 Wafer probe station with integrated environment control enclosure 133 1992
5,457,398 Wafer probe station having full guarding 122 1993
5,506,515 High-frequency probe tip assembly 156 1994
5,610,529 Probe station having conductive coating added to thermal chuck insulator 136 1995
5,565,788 Coaxial wafer probe with tip shielding 146 1995
5,729,150 Low-current probe card with reduced triboelectric current generating cables 136 1995
5,914,613 Membrane probing system with local contact scrub 108 1996
6,232,788 Wafer probe station for low-current measurements 87 1997
6,232,789 Probe holder for low current measurements 87 1997
6,034,533 Low-current pogo probe card 107 1997
6,137,302 Low-current probe card with reduced triboelectric current generating cables 108 1997
6,256,882 Membrane probing system 72 1998
6,578,264 Method for constructing a membrane probe using a depression 77 2000
6,384,615 Probe holder for low current measurements 41 2001
6,549,106 Waveguide with adjustable backshort 110 2001
7,233,160 Wafer probe 20 2001
6,496,024 Probe holder for testing of a test device 38 2002
6,850,082 Probe holder for testing of a test device 37 2002
6,724,205 Probe for combined signals 97 2002
6,815,963 Probe for testing a device under test 64 2003
6,806,724 Probe for combined signals 94 2003
7,161,363 Probe for testing a device under test 33 2004
6,930,498 Membrane probing system 55 2004
7,009,383 Wafer probe station having environment control enclosure 92 2004
7,187,188 Chuck with integrated wafer support 76 2004
2006/0184,041 System for testing semiconductors 32 2006
7,332,923 Test probe for high-frequency measurement 21 2006
7,271,603 Shielded probe for testing a device under test 32 2006
7,403,028 Test structure and probe for differential signals 20 2007
2008/0111,571 Membrane probing system 11 2008
 
TOKYO ELECTRON LIMITED (34)
4,998,062 Probe device having micro-strip line structure 90 1989
5,084,671 Electric probing-test machine having a cooling system 179 1990
5,091,692 Probing test device 113 1990
5,198,752 Electric probing-test machine having a cooling system 152 1991
5,315,237 Touch sensor unit of prober for testing electric circuit and electric circuit testing apparatus using the touch sensor unit 107 1991
5,321,352 Probe apparatus and method of alignment for the same 131 1992
5,321,453 Probe apparatus for probing an object held above the probe card 102 1992
5,635,846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer 145 1993
5,404,111 Probe apparatus with a swinging holder for an object of examination 112 1993
5,517,126 Probe apparatus 129 1993
5,521,522 Probe apparatus for testing multiple integrated circuit dies 143 1993
5,539,676 Method of identifying probe position and probing method in prober 93 1994
5,811,982 High density cantilevered probe for electronic devices 134 1996
5,777,485 Probe method and apparatus with improved probe contact 118 1996
5,910,727 Electrical inspecting apparatus with ventilation system 89 1996
5,821,763 Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof 180 1996
5,804,983 Probe apparatus with tilt correction mechanisms 151 1997
6,334,247 High density integrated circuit apparatus, test probe and methods of use thereof 100 1997
5,914,614 High density cantilevered probe for electronic devices 95 1997
5,999,268 Apparatus for aligning a semiconductor wafer with an inspection contactor 110 1997
6,060,892 Probe card attaching mechanism 94 1997
6,300,780 High density integrated circuit apparatus, test probe and methods of use thereof 86 1998
6,124,725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer 133 1998
6,329,827 High density cantilevered probe for electronic devices 74 1998
6,414,478 Transfer mechanism for use in exchange of probe card 79 2000
6,722,032 Method of forming a structure for electronic devices contact locations 62 2001
7,005,842 Probe cartridge assembly and multi-probe assembly 92 2001
6,927,587 Probe apparatus 64 2003
6,906,542 Probing method and prober 60 2003
6,794,888 Probe device 75 2003
7,026,832 Probe mark reading device and probe mark reading method 95 2003
7,009,415 Probing method and probing apparatus 94 2004
7,023,226 Probe pins zero-point detecting method, and prober 92 2004
7,332,918 Prober and probe testing method for temperature-controlling object to be tested 24 2005
 
AGILENT TECHNOLOGIES, INC. (33)
4,980,637 Force delivery system for improved precision membrane probe 97 1988
4,918,383 Membrane probe with automatic contact scrub action 154 1988
4,906,920 Self-leveling membrane probe 203 1988
5,172,051 Wide bandwidth passive probe 109 1991
5,298,972 Method and apparatus for measuring polarization sensitivity of optical devices 109 1991
5,274,336 Capacitively-coupled test probe 136 1992
5,308,250 Pressure contact for connecting a coaxial shield to a microstrip ground plane 29 1992
5,463,324 Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like 48 1993
5,507,652 Wedge connector for integrated circuits 39 1995
5,578,932 Method and apparatus for providing and calibrating a multiport network analyzer 145 1995
5,945,836 Loaded-board, guided-probe test fixture 121 1996
5,923,180 Compliant wafer prober docking adapter 71 1997
5,940,965 Method of making multiple lead voltage probe 30 1997
5,903,143 Probe apparatus with RC circuit connected between ground and a guard 93 1997
6,060,888 Error correction method for reflection measurements of reciprocal devices in vector network analyzers 112 1998
6,251,595 Methods and devices for carrying out chemical reactions 106 1998
6,175,228 Electronic probe for measuring high impedance tri-state logic circuits 83 1998
6,300,775 Scattering parameter calibration system and method 129 1999
6,271,673 Probe for measuring signals 102 1999
6,407,562 Probe tip terminating device providing an easily changeable feed-through termination 92 1999
2001/0024,116 Electronic probe for measuring high impedance tri-state logic circuits 78 2001
6,643,597 Calibrating a test system using unknown standards 115 2001
6,717,426 Blade-like connecting needle 78 2002
6,768,328 Single point probe structure and method 74 2002
6,864,694 Voltage probe 90 2002
2004/0140,819 Differential voltage probe 30 2003
2005/0030,047 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration 83 2003
7,025,628 Electronic probe extender 103 2003
2004/0162,689 Multiport network analyzer calibration employing reciprocity of a device 93 2004
6,933,713 High bandwidth oscilloscope probe with replaceable cable 56 2004
7,005,868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe 92 2004
7,030,328 Liquid metal switch employing micro-electromechanical system (MEMS) structures for actuation 12 2004
7,026,834 Multiple two axis floating probe block assembly using split probe block 92 2005
 
TEXAS INSTRUMENTS INCORPORATED (13)
4,888,550 Intelligent multiprobe tip 91 1983
5,128,612 Disposable high performance test head 26 1990
5,159,752 Scanning electron microscope based parametric testing method and apparatus 118 1990
5,225,037 Method for fabrication of probe card for testing of semiconductor devices 215 1991
5,317,656 Fiber optic network for multi-point emissivity-compensated semiconductor wafer pyrometry 72 1993
5,511,010 Method and apparatus of eliminating interference in an undersettled electrical signal 90 1994
6,292,760 Method and apparatus to measure non-coherent signals 92 1998
6,906,539 High density, area array probe card apparatus 55 2001
6,911,834 Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probing 55 2002
6,741,129 Differential amplifier slew rate boosting scheme 34 2002
7,026,833 Multiple-chip probe and universal tester contact assemblage 96 2005
7,327,153 Analog built-in self-test module 27 2005
7,323,899 System and method for resumed probing of a wafer 19 2006
 
MICRON TECHNOLOGY, INC. (12)
4,312,117 Integrated test and assembly device 157 1979
4,970,386 Vertical FET high speed optical sensor 43 1989
5,487,999 Method for fabricating a penetration limited contact having a rough textured surface 165 1994
5,686,317 Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die 238 1995
5,869,974 Micromachined probe card having compliant contact members for testing semiconductor wafers 169 1996
6,071,009 Semiconductor wirebond machine leadframe thermal map system 42 1997
6,181,144 Semiconductor probe card having resistance measuring circuitry and method fabrication 141 1998
6,194,720 Preparation of transmission electron microscope samples 108 1998
6,359,456 Probe card and test system for semiconductor wafers 114 2001
6,924,653 Selectively configurable microelectronic probes 58 2002
7,026,835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad 92 2002
7,009,188 Lift-out probe having an extension tip, methods of making and using, and analytical instruments employing same 96 2004
 
TEKTRONIX, INC. (12)
4,739,259 Telescoping pin probe 100 1986
4,673,839 Piezoelectric pressure sensing apparatus for integrated circuit testing stations 123 1986
4,734,641 Method for the thermal characterization of semiconductor packaging systems 59 1987
4,749,942 Wafer probe head 83 1987
4,912,399 Multiple lead probe for integrated circuits in wafer form 116 1987
4,783,625 Wideband high impedance card mountable probe 95 1988
4,965,514 Apparatus for probing a microwave circuit 17 1989
5,059,898 Wafer probe with transparent loading member 77 1990
5,136,237 Double insulated floating high voltage test probe 103 1991
5,412,330 Optical module for an optically based measurement system 94 1993
6,447,339 Adapter for a multi-channel signal probe 86 2001
6,701,265 Calibration for vector network analyzer 92 2002
 
SV PROBE PTE LTD. (9)
5,521,518 Probe card apparatus 132 1991
5,180,977 Membrane probe contact bump compliancy system 142 1991
5,422,574 Large scale protrusion membrane for semiconductor devices under test with very high pin counts 172 1993
5,720,098 Method for making a probe preserving a uniform stress distribution under deflection 110 1995
5,742,174 Membrane for holding a probe tip in proper location 127 1995
5,623,213 Membrane probing of circuits 94 1996
6,037,785 Probe card apparatus 107 1996
5,973,504 Programmable high-density electronic device testing 99 1997
6,908,364 Method and apparatus for probe tip cleaning and shaping pad 57 2001
 
ADVANTEST CORPORATION (8)
5,172,049 IC test equipment 128 1991
5,644,248 Test head cooling system 83 1995
5,767,690 Test head cooling system 89 1997
6,191,596 Method for detecting a contact position between an object to be measured and measuring pins 80 1998
6,174,744 Method of producing micro contact structure and contact probe using same 137 2000
2002/0011,863 IC chip tester with heating element for preventing condensation 87 2001
7,020,360 Wavelength dispersion probing system 93 2002
6,937,040 Probe module and a testing apparatus 59 2004
 
W. L. GORE & ASSOCIATES, INC. (8)
4,871,883 Electro-magnetic shielding 115 1987
4,859,989 Security system and signal carrying member thereof 128 1987
5,061,823 Crush-resistant coaxial transmission line 125 1990
5,107,076 Easy strip composite dielectric coaxial signal cable 120 1991
5,477,011 Low noise signal transmission cable 108 1994
5,896,038 Method of wafer level burn-in 108 1996
6,032,714 Repeatably positionable nozzle assembly 78 1999
7,015,708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts 94 2003
 
CANON KABUSHIKI KAISHA (7)
4,755,747 Wafer prober and a probe card to be used therewith 107 1985
4,864,227 Wafer prober 127 1988
4,929,893 Wafer prober 159 1988
5,145,552 Process for preparing electrical connecting member 67 1990
5,304,924 Edge detector 98 1992
5,731,920 Converting adapter for interchangeable lens assembly 94 1995
5,685,232 Positioning stage device exposure apparatus and device manufacturing method utilizing the same 114 1996
 
FREESCALE SEMICONDUCTOR, INC. (7)
5,172,050 Micromachined semiconductor probe card 271 1991
5,177,438 Low resistance probe for semiconductor 171 1991
5,467,024 Integrated circuit test with programmable source for both AC and DC modes of operation 85 1993
5,617,035 Method for testing integrated devices 109 1995
5,666,063 Method and apparatus for testing an integrated circuit 106 1996
5,982,166 Method for measuring a characteristic of a semiconductor wafer using cylindrical control 107 1997
6,127,831 Method of testing a semiconductor device by automatically measuring probe tip parameters 104 1997
 
GLOBALFOUNDRIES INC. (7)
6,091,255 System and method for tasking processing modules based upon temperature 127 1998
6,608,494 Single point high resolution time resolved photoemission microscopy system and method 110 1998
6,483,327 Quadrant avalanche photodiode time-resolved detection 107 1999
6,724,928 Real-time photoemission detection system 96 2000
6,488,405 Flip chip defect analysis using liquid crystal 99 2000
6,617,862 Laser intrusive technique for locating specific integrated circuit current paths 97 2002
7,022,976 Dynamically adjustable probe tips 94 2003
 
HUGHES ELECTRONICS CORPORATION (7)
4,727,319 Apparatus for on-wafer testing of electrical circuits 74 1985
4,772,846 Wafer alignment and positioning apparatus for chip testing by voltage contrast electron microscopy 132 1986
4,908,570 Method of measuring FET noise parameters 43 1987
5,313,157 Probe for jesting an electrical circuit chip 92 1992
5,583,445 Opto-electronic membrane probe 100 1994
5,611,008 Substrate system for optoelectronic/microwave circuits 82 1996
5,623,214 Multiport membrane probe for full-wafer testing 106 1996
 
YOKOWO CO., LTD. (7)
7,019,701 Antenna device mounted on vehicle 77 2004
6,900,647 Contact probe and probe device 103 2004
6,903,563 Contact probe and probe device 97 2004
6,917,211 Contact probe and probe device 55 2004
6,919,732 Contact probe and probe device 56 2004
6,937,042 Contact probe and probe device 56 2004
7,015,710 Contact probe and probe device 94 2004
 
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. (6)
4,839,587 Test fixture for tab circuits and devices 125 1988
5,198,753 Integrated circuit test fixture and method 124 1990
5,691,503 Electro-magnetically shielded door hinge 41 1994
6,233,613 High impedance probe for monitoring fast ethernet LAN links 92 1997
2004/0201,388 Support for an electronic probe and related methods 41 2003
7,002,133 Detecting one or more photons from their interactions with probe photons in a matter system 92 2003
 
MITSUBISHI DENKI KABUSHIKI KAISHA (6)
5,408,188 High frequency wafer probe including open end waveguide 75 1992
5,493,236 Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis 185 1994
6,144,212 Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card 106 1998
6,242,929 Probe needle for vertical needle type probe card and fabrication thereof 88 1998
6,404,213 Probe stylus 84 1999
7,173,433 Circuit property measurement method 19 2005
 
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY (6)
4,983,910 Millimeter-wave active probe 70 1988
4,916,002 Microcasting of microminiature tips 136 1989
5,003,253 Millimeter-wave active probe system 76 1989
5,847,569 Electrical contact probe for sampling high frequency electrical signals 95 1996
5,981,268 Hybrid biosensors 145 1997
6,051,422 Hybrid biosensors 121 1998
 
APPLIED MATERIALS, INC. (5)
5,916,689 Electrostatic chuck with an impregnated, porous layer that exhibits the Johnson-Rahbeck effect 111 1996
5,874,361 Method of processing a wafer within a reaction chamber 106 1996
6,257,564 Vacuum chuck having vacuum-nipples wafer support 103 1998
6,232,787 Microstructure defect detection 157 1999
7,319,335 Configurable prober for TFT LCD array testing 20 2004
 
DELAWARE CAPITAL FORMATION, INC. (5)
5,408,189 Test fixture alignment system for printed circuit boards 145 1992
5,289,117 Testing of integrated circuit devices on loaded printed circuit 54 1992
5,389,885 Expandable diaphragm test modules and connectors 95 1993
6,181,149 Grid array package test contactor 97 1996
6,064,218 Peripherally leaded package test contactor 104 1997
 
Hughes Aircraft Company (5)
4,918,373 R.F. phase noise test set using fiber optic delay line 51 1988
4,835,495 Diode device packaging arrangement 40 1988
5,326,412 Method for electrodepositing corrosion barrier on isolated circuitry 72 1992
5,512,835 Electrical probe and method for measuring gaps and other discontinuities in enclosures using electrical inductance for RF shielding assessment 73 1992
5,412,866 Method of making a cast elastomer/membrane test probe assembly 121 1993
 
INTEL CORPORATION (5)
5,944,093 Pickup chuck with an integral heat pipe 100 1997
7,020,363 Optical probe for wafer testing 93 2001
6,856,129 Current probe device having an integrated amplifier 90 2002
2006/0052,075 Testing integrated circuits using high bandwidth wireless technology 73 2004
2007/0145,989 Probe card with improved transient power delivery 18 2005
 
MDS INC. (5)
6,376,258 Resonant bio-assay device and test system for detecting molecular binding events 133 2000
6,340,568 Method for detecting and classifying nucleic acid hybridization 80 2001
6,566,079 Methods for analyzing protein binding events 95 2001
2003/0032,000 Method for analyzing cellular events 88 2001
2002/0168,659 System and method for characterizing the permittivity of molecular events 74 2002
 
MOTOROLA, INC. (5)
4,232,398 Radio receiver alignment indicator 47 1978
4,453,142 Microstrip to waveguide transition 108 1981
4,646,005 Signal probe 98 1984
5,561,378 Circuit probe for measuring a differential circuit 30 1994
5,748,506 Calibration technique for a network analyzer 94 1996
 
NEC CORPORATION (5)
4,669,805 High frequency connector 58 1985
6,114,864 Probe card with plural probe tips on a unitary flexible tongue 107 1997
6,310,483 Longitudinal type high frequency probe for narrow pitched electrodes 100 1998
6,281,691 Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable 101 1999
6,400,168 Method for fabricating probe tip portion composed by coaxial cable 101 2001
 
RAYTHEON COMPANY (5)
4,346,355 Radio frequency energy launcher 95 1980
5,069,628 Flexible electrical cable connector with double sided dots 71 1990
5,395,253 Membrane connector with stretch induced micro scrub 115 1993
5,600,256 Cast elastomer/membrane test probe assembly 76 1995
6,211,837 Dual-window high-power conical horn antenna 76 1999
 
WENTWORTH LABORATORIES, INC. (5)
4,975,638 Test probe assembly for testing integrated circuit devices 149 1989
5,355,079 Probe assembly for testing integrated circuit devices 97 1993
5,959,461 Probe station adapter for backside emission inspection 119 1997
6,031,383 Probe station for low current, low voltage parametric measurements using multiple probes 104 1998
6,927,586 Temperature compensated vertical pin probing device 59 2003
 
ANRITSU COMPANY (4)
5,905,421 Apparatus for measuring and/or injecting high frequency signals in integrated systems 79 1997
6,169,410 Wafer probe with built in RF frequency conversion module 84 1998
6,529,844 Vector network measurement system 109 1999
6,943,563 Probe tone S-parameter measurements 57 2002
 
GGB INDUSTRIES, INC. (4)
4,871,964 Integrated circuit probing apparatus 92 1988
5,373,231 Integrated circuit probing apparatus including a capacitor bypass structure 119 1993
6,603,322 Probe card for high speed testing 100 1996
6,118,287 Probe tip structure 102 1997
 
KABUSHIKI KAISHA TOSHIBA (4)
5,166,893 Portable apparatus having a voltage converter unit removable from a base unit having a removable display unit 46 1992
5,491,425 Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same 10 1994
6,605,941 Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes 49 2001
7,032,307 Method for fabricating a probe pin for testing electrical characteristics of an apparatus 92 2004
 
LSI LOGIC CORPORATION (4)
6,927,079 Method for probing a semiconductor wafer 103 2000
6,605,951 Interconnector and method of connecting probes to a die for functional analysis 104 2000
6,617,866 Apparatus and method of protecting a probe card during a sort sequence 36 2001
7,023,225 Wafer-mounted micro-probing platform 93 2003
 
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (4)
5,594,358 Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line 97 1994
5,794,133 Microwave mixing circuit 82 1996
6,806,836 Helical antenna apparatus provided with two helical antenna elements, and radio communication apparatus provided with same helical antenna apparatus 74 2003
7,219,416 Method of manufacturing a magnetic element 21 2004
 
NATIONAL SEMICONDUCTOR CORPORATION (4)
4,757,255 Environmental box for automated wafer probing 184 1986
5,814,847 General purpose assembly programmable multi-chip package substrate 92 1996
5,883,522 Apparatus and method for retaining a semiconductor wafer during testing 106 1996
7,096,133 Method of establishing benchmark for figure of merit indicative of amplifier flicker noise 72 2005
 
RENESAS ELECTRONICS CORPORATION (4)
6,028,435 Semiconductor device evaluation system using optical fiber 106 1997
6,160,407 Inspection method and wiring current observation method for semiconductor device and apparatus of the same 97 1998
6,900,646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof 96 2002
6,551,884 Semiconductor device including gate insulation films having different thicknesses 70 2002
 
SILICON VALLEY BANK (4)
4,893,914 Test station 111 1988
5,892,539 Portable emission microscope workstation for failure analysis 118 1995
6,744,268 High resolution analytical probe station 120 2002
6,917,195 Wafer probe station 55 2004
 
The United States of America as represented by the Secretary of the Air Force (4)
4,754,239 Waveguide to stripline transition assembly 90 1986
5,631,571 Infrared receiver wafer level probe testing 135 1996
6,215,295 Photonic field probe and calibration means thereof 113 1998
2003/0170,898 Method for intracellular modifications within living cells using pulsed electric fields 113 2002
 
The United States of America as represented by the Secretary of the Navy (4)
5,361,049 Transition from double-ridge waveguide to suspended substrate 47 1986
5,091,732 Lightweight deployable antenna system 88 1990
5,430,813 Mode-matched, combination taper fiber optic probe 60 1993
6,940,264 Near field probe 58 2004
 
ELECTROGLAS, INC. (3)
5,656,942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane 108 1995
6,096,567 Method and apparatus for direct probe sensing 142 1997
6,320,372 Apparatus and method for testing a substrate having a plurality of terminals 100 1999
 
ENERGY, UNITED STATES DEPARTMENT OF (3)
4,287,473 Nondestructive method for detecting defects in photodetector and solar cell devices 108 1979
5,523,694 Integrated circuit failure analysis by low-energy charge-induced voltage alteration 120 1994
6,307,672 Microscope collision protection apparatus 80 1996
 
GENERAL ELECTRIC COMPANY (3)
6,927,598 Test probe for electrical devices having low or no wedge depression 56 2003
6,911,826 Pulsed eddy current sensor probes and inspection methods 62 2003
7,015,690 Omnidirectional eddy current probe and inspection system 98 2004
 
HARRIS CORPORATION (3)
5,854,608 Helical antenna having a solid dielectric core 125 1994
6,181,297 Antenna 98 1998
6,424,316 Helical antenna 88 2000
 
IBIDEN CO., LTD. (3)
2004/0021,475 Wafer prober 80 2003
2004/0134,899 Ceramic substrate for a semiconductor-production/inspection device 79 2003
2004/0207,072 Ceramic substrate for a semiconductor producing/examining device 83 2004
 
INTERSTITIAL, LLC (3)
5,704,355 Non-invasive system for breast cancer detection 127 1995
5,829,437 Microwave method and system to detect and locate cancers in heterogenous tissues 127 1996
6,061,589 Microwave antenna for cancer detection system 119 1997
 
John H. Blanz Company, Inc. (3)
5,097,207 Temperature stable cryogenic probe station 106 1989
5,160,883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support 95 1990
5,166,606 High efficiency cryogenic test station 94 1990
 
KEYSIGHT TECHNOLOGIES, INC. (3)
5,493,070 Measuring cable and measuring system 92 1994
2004/0095,145 Method and apparatus for performing multiport through-reflect-line calibration and measurement 96 2002
2004/0199,350 System and method for determining measurement errors of a testing device 93 2003
 
LUCENT TECHNOLOGIES INC. (3)
5,970,429 Method and apparatus for measuring electrical noise in devices 117 1997
6,121,836 Differential amplifier 37 1998
6,245,692 Method to selectively heat semiconductor wafers 90 1999
 
MICROCONNECT LLC (3)
5,621,333 Contact device for making connection to an electronic circuit device 95 1995
6,046,599 Method and device for making connection 67 1997
6,091,256 Contact device for making connection to an electronic circuit device 65 1997
 
MOTOROLA MOBILITY LLC (3)
5,751,153 Method and apparatus for characterizing a multiport circuit 40 1996
5,793,213 Method and apparatus for calibrating a network analyzer 93 1996
5,751,252 Method and antenna for providing an omnidirectional pattern 92 1997
 
New Wave Research (3)
5,811,751 Multi-wavelength laser system, probe station and laser cutter system using the same 138 1997
6,573,702 Method and apparatus for cleaning electronic test contacts 102 1997
5,963,364 Multi-wavelength variable attenuator and half wave plate 119 1997
 
NORTHROP GRUMMAN CORPORATION (3)
4,216,467 Hand controller 194 1977
4,581,679 Multi-element circuit construction 100 1985
2005/0026,276 Remote detection and analysis of chemical and biological aerosols 79 2003
 
OLYMPUS OPTICAL CO., LTD. (3)
5,367,165 Cantilever chip for scanning probe microscope 75 1993
6,006,002 Rigid sleeve device fitted over a flexible insertion section of an endoscope for inspecting industrial equipment 54 1995
6,811,406 Microelectronic spring with additional protruding member 173 2001
 
SAMSUNG ELECTRONICS CO., LTD. (3)
6,970,001 Variable impedance test probe 73 2003
6,900,653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof 105 2003
6,909,297 Probe card 55 2004
 
SARANTEL LIMITED (3)
6,184,845 Dielectric-loaded antenna 127 1997
6,369,776 Antenna 91 1999
6,914,580 Dielectrically-loaded antenna 82 2003
 
SHARP KABUSHIKI KAISHA (3)
4,899,126 Thick film resistor type printed circuit board 82 1989
5,089,774 Apparatus and a method for checking a semiconductor 128 1990
5,374,938 Waveguide to microstrip conversion means in a satellite broadcasting adaptor 94 1993
 
SIEMENS AKTIENGESELLSCHAFT (3)
4,275,446 Method and apparatus for measurement of attenuation and distortion by a test object 101 1979
4,805,627 Method and apparatus for identifying the distribution of the dielectric constants in an object 101 1986
5,095,891 Connecting cable for use with a pulse generator and a shock wave generator 97 1987
 
SONY CORPORATION (3)
6,362,792 Antenna apparatus and portable radio set 77 2000
6,366,247 Antenna device and portable radio set 82 2000
8,035,987 Electronic device having a groove partitioning functional and mounting parts from each other 35 2007
 
TELEDYNE LECROY, INC. (3)
6,822,463 Active differential test probe with a transmission line input structure 75 2002
6,870,359 Self-calibrating electrical test probe 34 2002
7,019,544 Transmission line input structure test probe 94 2004
 
The Boeing Company (3)
4,727,637 Computer aided connector assembly method and apparatus 112 1987
5,202,648 Hermetic waveguide-to-microstrip transition module 55 1991
6,914,427 Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method 60 2003
 
XANDEX, INC. (3)
5,528,158 Probe card changer system and method 104 1994
5,506,498 Probe card system and method 97 1995
6,166,553 Prober-tester electrical interface for semiconductor test 98 1998
 
ADVANTEST (SINGAPORE) PTE LTD (2)
6,812,718 Massively parallel interface for electronic circuits 102 2001
6,917,525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs 101 2002
 
ADVANTEST AMERICA, INC (2)
6,295,729 Angled flying lead wire bonding process 86 1998
6,708,403 Angled flying lead wire bonding process 78 2003
 
Aehr Test Systems (2)
6,340,895 Wafer-level burn-in and test cartridge 103 1999
6,580,283 Wafer level burn-in and test methods 87 1999
 
Bell Telephone Laboratories, Incorporated (2)
4,225,819 Circuit board contact contamination probe 56 1978
4,684,883 Method of manufacturing high-quality semiconductor light-emitting devices 96 1985
 
BRUKER NANO, INC. (2)
5,376,790 Scanning probe microscope 113 1992
5,672,816 Large stage system for scanning probe microscopes and other instruments 115 1995
 
CNH AMERICA LLC (2)
5,316,435 Three function control system 50 1992
5,360,312 Three function control mechanism 48 1992
 
DAINIPPON SCREEN MFG. CO., LTD. (2)
4,531,474 Rotary board treating apparatus 88 1984
4,746,857 Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer 95 1986
 
DCG SYSTEMS, INC. (2)
5,530,372 Method of probing a net of an IC at an optimal probe-point 117 1994
5,675,499 Optimal probe point placement 110 1996
 
EATON CORPORATION (2)
4,904,935 Electrical circuit board text fixture having movable platens 112 1988
5,471,185 Electrical circuit protection devices comprising conductive liquid compositions 31 1994
 
ELK FINANCIAL, INC. (2)
6,064,217 Fine pitch contact device employing a compliant conductive polymer bump 132 1996
2002/0011,859 METHOD FOR FORMING CONDUCTIVE BUMPS FOR THE PURPOSE OF CONTRRUCTING A FINE PITCH TEST DEVICE 110 1998
 
ELM TECHNOLOGY CORPORATION (2)
5,020,219 Method of making a flexible tester surface for testing integrated circuits 172 1989
5,453,404 Method for making an interconnection structure for integrated circuits 129 1994
 
EMIMAGING LTD (2)
5,715,819 Microwave tomographic spectroscopy system and method 103 1994
6,490,471 Electromagnetical imaging and therapeutic (EMIT) systems 87 2001
 
EUROPAISCHES LABORATORIUM FUR MOLEKULARBIOLOGIE (EMBL) (2)
6,798,226 Multiple local probe measuring device and method 92 2002
6,943,574 Multiple local probe measuring device and method 62 2004
 
HEWLETT-PACKARD COMPANY (2)
4,795,962 Floating driver circuit and a device for measuring impedances of electrical components 94 1987
5,133,119 Shearing stress interconnection apparatus and method 65 1991
 
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (2)
6,049,216 Contact type prober automatic alignment 92 1997
7,012,441 High conducting thin-film nanoprobe card and its fabrication method 105 2003
 
INTEST CORPORATION (2)
5,900,737 Method and apparatus for automated docking of a test head to a device handler 115 1996
6,259,260 Apparatus for coupling a test head and probe card in a wafer testing system 11 1998
 
INTEST IP CORPORATION (2)
4,589,815 Electronic test head positioner for test systems 50 1983
4,705,447 Electronic test head positioner for test systems 130 1985
 
KABUSHIKI KAISHA NIHON MICRONICS (2)
5,888,075 Auxiliary apparatus for testing device 77 1997
6,019,612 Electrical connecting apparatus for electrically connecting a device to be tested 84 1998
 
KLA-TENCOR CORPORATION (2)
6,633,174 Stepper type test structures and methods for inspection of semiconductor integrated circuits 99 2000
6,771,806 Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices 131 2000
 
MASSACHUSETTS INSTITUTE OF TECHNOLOGY (2)
5,653,939 Optical and electrical methods and apparatus for molecule detection 435 1995
5,998,768 Active thermal control of surfaces by steering heating beam in response to sensed thermal radiation 101 1998
 
MICROWAVE IMAGING SYSTEMS TECHNOLOGIES, INC. (2)
5,841,288 Two-dimensional microwave imaging apparatus and methods 114 1997
6,448,788 Fixed array microwave imaging apparatus and method 101 2000
 
NGK INSULATORS, LTD. (2)
5,280,156 Wafer heating apparatus and with ceramic substrate and dielectric layer having electrostatic chucking means 210 1991
6,001,760 Aluminum nitride sintered body, metal embedded article, electronic functional material and electrostatic chuck 115 1997
 
NIKON CORPORATION (2)
6,628,503 Gas cooled electrostatic pin chuck for vacuum applications 102 2001
2002/0176,160 Microscope system 37 2002
 
NORTHROP GRUMMAN SYSTEMS CORPORATION (2)
5,479,109 Testing device for integrated circuits on wafer 117 1994
6,040,739 Waveguide to microstrip backshort with external spring compression 67 1998
 
RCA Corporation (2)
4,284,033 Means to orbit and rotate target wafers supported on planet member 115 1979
4,651,115 Waveguide-to-microstrip transition 81 1985
 
RENISHAW PLC (2)
5,270,664 Probe for measuring surface roughness by sensing fringe field capacitance effects 123 1992
6,909,983 Calibration of an analogue probe 64 2002
 
ROBERT BOSCH GMBH (2)
6,066,911 Ultrasonic driving element 123 1998
6,948,981 Compact coupler plug, particularly for a planar broadband lambda probe, in which single-conductor seals are prevented from being lost 54 2002
 
SEMATECH, INC. (2)
5,159,264 Pneumatic energy fluxmeter 79 1991
5,159,267 Pneumatic energy fluxmeter 81 1992
 
SKYWORKS SOLUTIONS, INC. (2)
6,582,979 Structure and method for fabrication of a leadless chip carrier with embedded antenna 90 2001
6,770,955 Shielded antenna in a semiconductor package 89 2001
 
SOLID STATE MEASUREMENTS, INC. (2)
6,900,652 Flexible membrane probe and method of use thereof 105 2003
7,023,231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof 93 2004
 
SONY ELECTRONICS INC. (2)
5,669,316 Turntable for rotating a wafer carrier 99 1993
2007/0024,506 Systems and methods for high frequency parallel transmissions 78 2006
 
STAR TECHNOLOGIES INC. (2)
6,906,543 Probe card for electrical testing a chip in a wide temperature range 62 2003
7,253,646 Probe card with tunable stage and at least one replaceable probe 10 2005
 
STMICROELECTRONICS S.A. (2)
6,146,908 Method of manufacturing a test circuit on a silicon wafer 31 1999
6,480,013 Method for the calibration of an RF integrated circuit probe 100 2000
 
STOVOKOR TECHNOLOGY LLC (2)
4,991,290 Flexible electrical interconnect and method of making 111 1989
5,170,930 Liquid metal paste for thermal and electrical connections 80 1991
 
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (2)
6,909,300 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips 55 2002
6,902,941 Probing of device elements 99 2003
 
TDK CORPORATION (2)
5,510,792 Anechoic chamber and wave absorber 93 1994
7,012,425 Eddy-current probe 94 2005
 
TECHSEARCH, LLC (2)
4,600,907 Coplanar microstrap waveguide interconnector and method of interconnection 53 1985
4,626,805 Surface mountable microwave IC package 58 1985
 
TENCOR INSTRUMENTS (2)
4,755,746 Apparatus and methods for semiconductor wafer testing 155 1985
5,852,232 Acoustic sensor as proximity detector 125 1997
 
The Aerospace Corporation (2)
6,211,663 Baseband time-domain waveform measurement method 113 1999
6,396,298 Active feedback pulsed measurement method 89 2000
 
The United States of America as represented by the Secretary of the Army (2)
6,201,453 H-plane hermetic sealed waveguide probe 12 1998
6,731,804 Thermal luminescence liquid monitoring system and method 75 2000
 
TRW INC. (2)
4,468,629 NPN Operational amplifier 78 1982
5,126,696 W-Band waveguide variable controlled oscillator 41 1991
 
U.S. Philips Corporation (2)
4,568,890 Microwave oscillator injection locked at its fundamental frequency for producing a harmonic frequency output 22 1983
4,663,840 Method of interconnecting conductors of different layers of a multilayer printed circuit board 73 1985
 
WI-LAN INC. (2)
5,565,881 Balun apparatus including impedance transformer having transformation length 82 1994
5,628,057 Multi-port radio frequency signal transformation network 98 1996
 
XEROX CORPORATION (2)
4,780,670 Active probe card for high resolution/low noise wafer level testing 134 1985
6,352,454 Wear-resistant spring contacts 83 1999
 
YULIM HITECH, INC. (2)
6,922,069 Needle assembly of probe card 61 2003
7,014,499 Probe card for testing semiconductor device 92 2005
 
3M INNOVATIVE PROPERTIES COMPANY (1)
6,902,416 High density probe device 74 2002
 
ABB POWER T&D COMPANY, INC., A DE CORP. (1)
4,998,063 Fiber optic coupled magneto-optic sensor having a concave reflective focusing surface 39 1989
 
ABBOTT DIABETES CARE INC. (1)
2005/0165,316 Method for detecting artifacts in data 76 2004
 
Acome, Societies Anonyme (1)
4,621,169 Electric cable construction and uses therefor 93 1985
 
ADE CORPORATION (1)
5,642,298 Wafer testing and self-calibration system 112 1996
 
ADVANCED MICRO DEVICES, INC. (1)
6,396,296 Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station 98 2000
 
AG COMMUNICATION SYSTEMS CORPORATION, 2500 W. UTOPIA RD., PHOENIX, AZ 85027, A DE CORP. (1)
4,684,884 Universal test circuit for integrated circuit packages 76 1985
 
Albany Instruments, Inc. (1)
6,933,717 Sensors and probes for mapping electromagnetic fields 58 2004
 
ALERI INC. (1)
6,924,655 Probe card for use with microelectronic components, and methods for making same 56 2003
 
ALPS ELECTRIC CO., LTD. (1)
4,725,793 Waveguide-microstrip line converter 85 1986
 
ALSTOM (1)
5,813,847 Device and method for injecting fuels into compressed gaseous media 76 1996
 
AMP Incorporated (1)
4,652,082 Angled electro optic connector 56 1984
 
AMPEX CORPORATION (1)
4,375,631 Joystick control 62 1981
 
ANDO ELECTRIC CO., LTD. (1)
2001/0054,906 Probe card and a method of manufacturing the same 77 2001
 
Aries Electronics, Inc. (1)
6,937,045 Shielded integrated circuit probe 62 2004
 
ARRAY BIOSCIENCE CORPORATION (1)
6,707,548 Systems and methods for filter based spectrographic analysis 99 2001
 
ASAHI KOGAKU KOGYO KABUSHIKI KAISHA (1)
5,267,088 Code plate mounting device 83 1990
 
AT & T TECHNOLOGIES, INC., (1)
4,837,507 High frequency in-circuit test fixture 74 1987
 
ATMEL CORPORATION (1)
4,649,339 Integrated circuit interface 114 1984
 
AUTOCYTE NORTH CAROLINA, L.L.C. (1)
5,659,421 Slide positioning and holding device 105 1995
 
AVAGO TECHNOLOGIES ECBU IP (SINGAPORE) PTE. LTD. (1)
5,066,357 Method for making flexible circuit card with laser-contoured vias and machined capacitors 107 1990
 
BARKER REVOCABLE TRUST U/A/D (1)
5,202,558 Flexible fiber optic probe for high-pressure shock experiments 102 1992
 
BECHTEL BWXT IDAHO, LLC (1)
6,147,502 Method and apparatus for measuring butterfat and protein content using microwave absorption techniques 79 1998
 
BERTHOLD TECHNOLOGIES GMBH & CO. KG (1)
5,369,368 Device for determining material parameters by means of microwave measurements 79 1993
 
BILL, ELVIN STUART, 3 MARK ST., DUNDAS VALLEY, 2117 (1)
4,223,658 Elastic band projecting toy gun 50 1978
 
Biotronic Systems Corporation (1)
5,082,627 Three dimensional binding site array for interfering with an electrical field 85 1987
 
BLACKBERRY LIMITED (1)
6,794,950 Waveguide to microstrip transition 85 2001
 
BOARD OF REGENTS OF THE UNIVERSITY OF WISCONSIN SYSTEM, THE, AN INSTITUTE OF WI (1)
5,233,306 Method and apparatus for measuring the permittivity of materials 119 1991
 
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM (1)
2003/0119,057 Forming and modifying dielectrically-engineered microparticles 109 2001
 
BROADCOM CORPORATION (1)
7,088,981 Apparatus for reducing flicker noise in a mixer circuit 98 2001
 
BROOKS AUTOMATION, INC. (1)
5,539,323 Sensor for articles such as wafers on end effector 119 1993
 
BRUKER BIOSPIN CORPORATION (1)
6,933,725 NMR probe circuit for generating close frequency resonances 60 2004
 
CALIFORNIA INSTITUTE OF TECHNOLOGY (1)
5,138,289 Noncontacting waveguide backshort 41 1990
 
CARDIFF AND VALE NHS TRUST (1)
2004/0175,294 Apparatus and method for analysing a biological sample in response to microwave radiation 74 2004
 
Carl-Zeiss-Stiftung (1)
4,515,439 Attachment of microscope objectives 78 1982
 
CBC Corporation (1)
4,306,235 Multiple frequency microwave antenna 40 1978
 
CERPROBE CORPORATION (1)
6,002,426 Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits 109 1997
 
CHENG, DAVID (1)
5,479,108 Method and apparatus for handling wafers 157 1992
 
CHIPMOS TECHNOLOGIES INC. (1)
6,946,860 Modularized probe head 55 2003
 
CHUNG-SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,759,859 Resilient and rugged multi-layered probe 32 2001
 
CIRCUIT COMPONENTS, INCORPORATED (1)
4,793,814 Electrical circuit board interconnect 269 1986
 
CIRREX SYSTEMS LLC (1)
6,222,970 Methods and apparatus for filtering an optical fiber 136 1999
 
COM DEV LTD. (1)
5,841,342 Voltage controlled superconducting microwave switch and method of operation thereof 43 1995
 
COMMSCOPE, INC. OF NORTH CAROLINA (1)
6,407,542 Implementation of a multi-port modal decomposition system 42 2000
 
COMPAQ COMPUTER CORPORATION (1)
5,500,606 Completely wireless dual-access test fixture 113 1993
 
CONIFER CORPORATION (1)
5,293,175 Stacked dual dipole MMDS feed 134 1993
 
CONTEL FEDERAL SYSTEMS, INC., A DE CORP. (1)
4,184,729 Flexible connector cable 107 1977
 
CREDENCE SYSTEMS CORPORATION (1)
5,883,523 Coherent switching power for an analog circuit tester 103 1997
 
CROWN CORK & SEAL TECHNOLOGIES CORPORATION (1)
6,130,536 Preform test fixture and method of measuring a wall thickness 37 1998
 
CROWN PRODUCTS, INC. (1)
7,019,541 Electric conductivity water probe 96 2004
 
CSI TECHNOLOGY, INC. (1)
6,091,236 System and method for measuring and analyzing electrical signals on the shaft of a machine 94 1997
 
D-LINK CORPORATION (1)
6,778,140 Atch horn antenna of dual frequency 72 2003
 
Data Probe Corporation (1)
4,588,950 Test system for VLSI digital circuit and method of testing 94 1983
 
DEBIOTECH S.A. (1)
7,005,078 Micromachined fluidic device and method for making same 146 2001
 
DELPHI TECHNOLOGIES, INC. (1)
7,015,709 Ultra-broadband differential voltage probes 100 2004
 
DERMON, JOHN A. (1)
4,980,638 Microcircuit probe and method for manufacturing same 25 1989
 
DESIGNTECH INTERNATIONAL, INC. (1)
5,041,782 Microstrip probe 95 1989
 
DEUTSCHE THOMSON-BRANDT GMBH (1)
4,685,150 Tuning of a resonant circuit in a communications receiver 53 1984
 
DH TECHNOLOGIES DEVELOPMENT PTE. LTD. (1)
6,627,461 Method and apparatus for detection of molecular events using temperature control of detection environment 90 2001
 
Dimension Polyant Sailcloth, Inc. (1)
6,013,586 Tent material product and method of making tent material product 90 1997
 
DIT-MCO INTERNATIONAL CORPORATION (1)
4,357,575 Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies 115 1980
 
DYNEX SEMICONDUCTOR LIMITED (1)
6,265,950 Transition from a waveguide to a strip transmission line 88 1999
 
EADS DEUTSCHLAND GMBH (1)
6,636,182 Structural antenna for flight aggregates or aircraft 73 2001
 
EAST GIANT LIMITED (1)
5,879,289 Hand-held portable endoscopic camera 150 1996
 
EASTMAN KODAK COMPANY (1)
5,848,500 Light-tight enclosure and joint connectors for enclosure framework 106 1997
 
ECLIPSE SURGICAL TECHNOLOGIES, INC. (1)
5,728,091 Optical fiber for myocardial channel formation 57 1995
 
EDO CORPORATION, BARNES DIVISION (1)
4,755,874 Emission microscopy system 158 1987
 
Electric Power Research Institute, Inc. (1)
4,487,996 Shielded electrical cable 104 1982
 
ELECTRO SCIENTIFIC INDUSTRIES, INC. (1)
6,100,815 Compound switching matrix for probing and interconnecting devices under test to measurement equipment 100 1997
 
ELECTRONICS RESEARCH, INC. (1)
2004/0100,276 Method and apparatus for calibration of a vector network analyzer 99 2002
 
ENDEVCO CORPORATION (1)
5,214,243 High-temperature, low-noise coaxial cable assembly with high strength reinforcement braid 124 1991
 
EVERETT CHARLES TECHNOLOGIES, INC. (1)
5,214,374 Dual level test fixture 102 1991
 
FAIRCHILD SEMICONDUCTOR CORPORATION (1)
5,357,211 Pin driver amplifier 82 1993
 
FELTEN & GUILLEAUME ENERGIETECHNIK AG (1)
4,972,073 Light wave conductor-bending sensor with sliding rails for monitoring bridge structures or the like 46 1990
 
FILOTEX (1)
5,397,855 Low noise cable 93 1993
 
FINCH INTERNATIONAL LIMITED (1)
5,281,364 Liquid metal electrical contact compositions 13 1992
 
FLUKE CORPORATION (1)
6,384,614 Single tip Kelvin probe 101 2000
 
Formfactor, et al. (1)
6,937,037 Probe card assembly for contacting a device with raised contact elements 62 2002
 
FRAMATOME TECHNOLOGIES, INC. (1)
5,756,908 Probe positioner 41 1996
 
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. (1)
6,653,903 Supply voltage decoupling device for HF amplifier circuits 72 2001
 
FRESH QUEST CORPORATION (1)
5,589,781 Die carrier apparatus 73 1993
 
FUJI PHOTO FILM CO., LTD. (1)
4,727,391 Sheet film package and device for loading sheet films 81 1987
 
FUJIKURA LTD. (1)
4,626,618 DC electric power cable 98 1985
 
Fujikura Rubber Works, Ltd. (1)
4,425,395 Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production 104 1982
 
FUJITA, TAKAFUMI (1)
6,933,736 Prober 57 2003
 
GARMIN CORPORATION (1)
5,966,645 Transmitter with low-level modulation and minimal harmonic emissions 41 1997
 
GATAN, INC. (1)
6,914,244 Ion beam milling system and method for electron microscopy specimen preparation 85 2004
 
GCB INDUSTRIES, INC. (1)
6,229,327 Broadband impedance matching probe 103 1997
 
GE CAPITAL EQUITY INVESTMENTS, INC. (1)
6,628,980 Apparatus, systems, and methods for in vivo magnetic resonance imaging 146 2001
 
Gebr. Marzhauser Wetzlar oHG (1)
4,552,033 Drive system for a microscope stage or the like 109 1984
 
GEC FERRANTI DEFENCE SYSTEMS LIMITED (1)
4,714,873 Microwave noise measuring apparatus 48 1986
 
General Dielectric, Inc. (1)
2002/0050,828 Multi-feed microwave reflective resonant sensors 78 2001
 
GENERAL ELECTRIC MEDICAL SYSTEMS ISRAEL LTD., AN ISRAEL CORPORATION AFFILIATED WITH GENERAL ELECTRIC COMPANY (1)
4,691,163 Dual frequency surface probes 114 1985
 
GENERAL MOTORS CORPORATION (1)
4,277,741 Microwave acoustic spectrometer 82 1979
 
GENETRONICS, INC. (1)
5,869,326 Electroporation employing user-configured pulsing scheme 117 1996
 
GILBOE, DEREK (1)
7,034,553 Direct resistance measurement corrosion probe 95 2003
 
GILLESPIE, ROBB S. (1)
6,481,939 Tool tip conductivity contact sensor and method 87 2001
 
GLUCOSET AS (1)
7,003,184 Fiber optic probes 104 2001
 
GOOGLE INC. (1)
6,078,500 Pluggable chip scale package 104 1998
 
GTE Products Corporation (1)
4,653,174 Method of making packaged IC chip 28 1986
 
GTE Valeron Corporation (1)
4,401,945 Apparatus for detecting the position of a probe relative to a workpiece 96 1981
 
GYRUS MEDICAL LIMITED (1)
6,409,724 Electrosurgical instrument 150 2000
 
H+W Test Products, Inc. (1)
6,054,869 Bi-level test fixture for testing printed circuit boards 95 1998
 
HAMAMATSU PHOTONICS K.K. (1)
4,922,186 Voltage detector 81 1988
 
HERSTEIN, DOV (1)
4,810,981 Assembly of microwave components 89 1987
 
HITACHI CONSUMER ELECTRONICS CO., LTD. (1)
7,012,871 Information recording method and apparatus with suppressed mark edge jitters 76 2004
 
HITACHI HIGH-TECH SCIENCE CORPORATION (1)
6,621,082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function 98 2002
 
HITACHI SOFTWARE ENGINEERING CO., LTD. (1)
7,035,738 Probe designing apparatus and probe designing method 93 2002
 
HITACHI ULSI SYSTEMS CO., LTD. (1)
6,734,687 Apparatus for detecting defect in device and method of detecting defect 109 2001
 
HITACHI, LTD. (1)
2005/0186,696 Gas flowmeter and manufacturing method thereof 2005
 
Honeywell Inc. (1)
5,347,204 Position dependent rate dampening in any active hand controller 55 1992
 
HOUSTON ADVANCED RESEARCH CENTER, A CORP. OF TX (1)
5,846,708 Optical and electrical methods and apparatus for molecule detection 346 1992
 
HP HOLDINGS THREE, INC. (1)
5,995,914 Method and apparatus for asynchronously measuring frequency shifted signals 101 1996
 
HYNIX SEMICONDUCTOR INC. (1)
7,002,364 Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same 95 2003
 
Hypervision, Inc. (1)
5,475,316 Transportable image emission microscope 135 1993
 
HYPRES, INC. (1)
4,894,612 Soft probe for providing high speed on-wafer connections to a circuit 155 1988
 
INIZIATIVE MARITTIME 1991 S.R.L. (1)
5,245,292 Method and apparatus for sensing a fluid handling 74 1992
 
INTEGRAL TECHNOLOGIES, INC. (1)
7,006,046 Low cost electronic probe devices manufactured from conductive loaded resin-based materials 94 2004
 
INTEGRATED TECHNOLOGY CORPORATION (1)
6,118,894 Integrated circuit probe card inspection system 116 1997
 
INTELLECTUAL VENTURES I LLC (1)
5,633,780 Electrostatic discharge protection device 126 1996
 
INTERMEC IP CORP. (1)
6,236,223 Method and apparatus for wireless radio frequency testing of RFID integrated circuits 161 1999
 
INTERSIL CORPORATION (1)
4,528,504 Pulsed linear integrated circuit tester 96 1982
 
ISC CO., LTD. (1)
7,071,722 Anisotropic, conductive sheet and impedance measuring probe 35 2003
 
iTerra Communications, LLC (1)
6,794,934 High gain wideband driver amplifier 86 2001
 
IWASAKI CORRESPOND INDUSTRY CO., LTD. (1)
6,933,737 Probe card 55 2003
 
J.A. WOOLLAM CO., INC. (1)
6,937,341 System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation 82 2002
 
JEOL RESONANCE INC. (1)
6,914,430 NMR probe 58 2004
 
JPK INSTRUMENTS AG (1)
7,022,985 Apparatus and method for a scanning probe microscope 98 2002
 
JPMORGAN CHASE BANK, N.A. (1)
5,678,210 Method and apparatus of coupling a transmitter to a waveguide in a remote ground terminal 42 1995
 
Junkosha Co., Ltd. (1)
4,567,321 Flexible flat cable 101 1984
 
KAI TECHNOLOGIES, INC. (1)
6,275,738 Microwave devices for medical hyperthermia, thermotherapy and diagnosis 126 1999
 
Kaiser Optical Systems (1)
6,907,149 Compact optical measurement probe 63 2003
 
KDC TECHNOLOGY CORP. (1)
5,227,730 Microwave needle dielectric sensors 98 1992
 
KEITHLEY INSTRUMENTS, INC. (1)
6,104,206 Product wafer junction leakage measurement using corona and a kelvin probe 115 1997
 
KOCH, LINDA (1)
4,567,436 Magnetic thickness gauge with adjustable probe 33 1982
 
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,528,993 Magneto-optical microscope magnetometer 79 2000
 
Kraftwerk Union Aktiengesellschaft (1)
4,642,417 Concentric three-conductor cable 113 1985
 
KYOCERA CORPORATION (1)
6,987,483 Effectively balanced dipole microstrip antenna 79 2003
 
L&P PROPERTY MANAGEMENT COMPANY (1)
5,505,150 Method and apparatus for facilitating loop take time adjustment in multi-needle quilting machine 86 1994
 
L-3 COMMUNICATIONS ELECTRON TECHNOLOGIES, INC. (1)
5,148,131 Coaxial-to-waveguide transducer with improved matching 43 1991
 
LAM RESEARCH CORPORATION (1)
7,015,703 Radio frequency Langmuir probe 98 2004
 
LAURENCE J. MARHOEFER (1)
5,097,101 Method of forming a conductive contact bump on a flexible substrate and a flexible substrate 93 1991
 
LEXINGTON, MA. 02173 A CORP OF DE. (1)
4,502,028 Programmable two-port microwave network 32 1982
 
LEXMARK INTERNATIONAL, INC. (1)
6,154,238 Scanning print head 42 1997
 
LION APPAREL, INC. (1)
5,157,790 Firefighter garment with lumbar support 47 1991
 
LOGICVISION, INC. (1)
2005/0229,053 Circuit and method for low frequency testing of high frequency signal waveforms 31 2004
 
M/A-COM TECHNOLOGY SOLUTIONS HOLDINGS, INC. (1)
5,142,224 Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals 102 1991
 
M/A-COM, INC. (1)
4,376,920 Shielded radio frequency transmission cable 140 1981
 
MAGMA DESIGN AUTOMATION, INC. (1)
5,030,907 CAD driven microprobe integrated circuit tester 112 1989
 
MARTIN MARIETTA CORPORATION (1)
5,867,073 Waveguide to transmission line transition 83 1994
 
MATRA BAE DYNAMICS (UK) LIMITED (1)
5,266,963 Integrated antenna/mixer for the microwave and millimetric wavebands 52 1991
 
MATTSON TECHNOLOGY, INC. (1)
6,172,337 System and method for thermal processing of a semiconductor substrate 102 1999
 
MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH (1)
4,551,747 Leadless chip carrier apparatus providing for a transmission line environment and improved heat dissipation 113 1982
 
MCC GESELLSCHAFT FUR DIAGNOSESYSTEME IN MEDIZIN UND TECHNIK MBH & CO. KG (1)
2005/0168,722 Device and method for measuring constituents in blood 27 2003
 
MEDICAL COLLEGE OF GEORGIA RESEARCH INSTITUTE, INC. (1)
5,488,954 Ultrasonic transducer and method for using same 137 1994
 
MEDICAL DEVICE INNOVATIONS LIMITED (1)
2006/0155,270 Tissue ablation apparatus and method of ablating tissue 110 2003
 
MEDISPECTRA, INC. (1)
2004/0186,382 Spectral volume microprobe arrays 76 2003
 
MENTOR GRAPHICS CORPORATION (1)
5,383,787 Integrated circuit package with direct access to internal signals 59 1993
 
MERCK & CO., INC. (1)
7,013,221 Iterative probe design and detailed expression profiling with flexible in-situ synthesis arrays 94 2000
 
MESO SCALE TECHNOLOGIES, LLC (1)
2005/0142,033 Modular assay plates, reader systems and methods for test measurements 89 2004
 
MICROCRAFT (1)
7,188,037 Method and apparatus for testing circuit boards 79 2004
 
MITEL SEMICONDUCTOR LIMITED (1)
5,764,070 Structure for testing bare integrated circuit devices 59 1996
 
MITSUBISHI GAS CHEMICAL COMPANY, INC. (1)
6,222,031 Process for preparing water-soluble tricarboxypolysaccharide 82 1998
 
MOLECULAR DEVICES, INC. (1)
5,164,319 Multiple chemically modulated capacitance determination 300 1989
 
MTU MOTOREN- UND TURBINEN-UNION MUENCHEN GMBH (1)
5,232,789 Structural component with a protective coating having a nickel or cobalt basis and method for making such a coating 90 1992
 
MURATA MANUFACTURING CO., LTD. (1)
6,838,885 Method of correcting measurement error and electronic component characteristic measurement apparatus 99 2003
 
NCR CORPORATION (1)
6,816,840 System and method of sending messages to a group of electronic price labels 37 1998
 
Nebraska Electronics, Inc. (1)
5,481,196 Process and apparatus for microwave diagnostics and therapy 84 1994
 
NEC ELECTRONICS CORPORATION (1)
6,320,396 Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device 98 1997
 
NEWPORT FAB, LLC (1)
6,727,716 Probe card and probe needle for high frequency testing 95 2002
 
NIHON DENSHIZAIRYO KABUSHIKI KAISHA (1)
5,134,365 Probe card in which contact pressure and relative position of each probe end are correctly maintained 87 1991
 
NISSAN CHEMICAL INDUSTRIES, LTD. (1)
5,021,186 Chloroisocyanuric acid composition having storage stability 76 1989
 
NITTO DENKO CORPORATION (1)
5,977,783 Multilayer probe for measuring electrical characteristics 61 1997
 
NORTEL NETWORKS LIMITED (1)
4,853,624 Tunable microwave wafer probe 92 1988
 
NOVELLUS DEVELOPMENT COMPANY, LLC (1)
6,946,859 Probe structures using clamped substrates with compliant interconnectors 47 2003
 
NUCLEAR FILTER TECHNOLOGY, INC. (1)
6,948,391 Probe with integral vent, sampling port and filter element 61 2003
 
NXP B.V. (1)
6,275,043 Test device for testing a module for a data carrier intended for contactless communication 41 1999
 
OKI SEMICONDUCTOR CO., LTD. (1)
6,927,078 Method of measuring contact resistance of probe and method of testing semiconductor device 60 2003
 
OL SECURITY LIMITED LIABILITY COMPANY (1)
5,688,618 Millimeter wave device and method of making 41 1995
 
OLAER INDUSTRIES (1)
4,788,851 Pressure vessel incorporating a sensor for detecting liquid in a gas chamber 42 1987
 
OLYMPUS CORPORATION (1)
4,696,544 Fiberscopic device for inspection of internal sections of construction, and method for using same 106 1985
 
OMNIPROBE, INC. (1)
6,420,722 Method for sample separation and lift-out with one cut 117 2001
 
OPTOMETRIX, INC. (1)
6,181,416 Schlieren method for imaging semiconductor device properties 82 1999
 
OSRAM OPTO SEMICONDUCTORS GMBH (1)
6,946,864 Method for measuring product parameters of components formed on a wafer and device for performing the method 20 2002
 
Pacific Western Systems, Inc. (1)
4,251,772 Probe head for an automatic semiconductive wafer prober 45 1978
 
PHILIPS ELECTRONICS NORTH AMERICA CORPORATION (1)
4,593,243 Coplanar and stripline probe card apparatus 114 1984
 
PICO TECHNOLOGY HOLDINGS, INC. (1)
6,335,625 Programmable active microwave ultrafine resonance spectrometer (PAMURS) method and systems 85 2000
 
PINNACLE PRODUCTS, INC. (1)
5,807,107 Dental infection control system 91 1996
 
POPKIN FAMILY ASSETS, L.L.C. (1)
6,418,009 Broadband multi-layer capacitor 86 2000
 
PREMIER MICROWAVE OF CALIFORNIA, INC. (1)
4,740,764 Pressure sealed waveguide to coaxial line connection 45 1987
 
PREMTEK INTERNATIONAL INC. (1)
2005/0116,730 DOUBLE-FACED DETECTING DEVICES FOR AN ELECTRONIC SUBSTRATE 27 2003
 
Probe-Rite, Inc. (1)
4,636,722 High density probe-head with isolated and shielded transmission lines 155 1984
 
PROFILE TECHNOLOGIES, INC. (1)
2001/0044,152 Dual beam, pulse propagation analyzer, medical profiler interferometer 72 2001
 
PROMOS TECHNOLOGIES INC. (1)
2003/0234,659 Electrical isolation between pins sharing the same tester channel 17 2002
 
PS4 LUXCO S.A.R.L. (1)
7,319,337 Method and apparatus for pad aligned multiprobe wafer testing 19 2007
 
PURDUE RESEARCH FOUNDATION (1)
2004/0147,034 Method and apparatus for measuring a substance in a biological sample 126 2003
 
QINETIQ LIMITED (1)
5,803,607 Method and apparatus for measurement of unsteady gas temperatures 42 1997
 
QUALCOMM INCORPORATED (1)
6,737,920 Variable gain amplifier 76 2002
 
RELIABILITY INCORPORATED (1)
2002/0070,745 Cooling system for burn-in unit 83 2000
 
REMOLEAUX TECHNOLOGIES AG, LLC (1)
5,686,960 Image input device having optical deflection elements for capturing multiple sub-images 139 1994
 
RESEARCH IN MOTION LIMITED (1)
5,949,383 Compact antenna structures including baluns 113 1997
 
Research Organization for Circuit Knowledge (1)
5,584,120 Method of manufacturing printed circuits 76 1994
 
Riken Denshi Co., Ltd. (1)
4,636,772 Multiple function type D/A converter 48 1985
 
ROCKSTAR CONSORTIUM US LP (1)
6,753,679 Test point monitor using embedded passive resistance 83 2002
 
ROCKWELL INTERNATIONAL CORPORATION (1)
4,184,133 Assembly of microwave integrated circuits having a structurally continuous ground plane 51 1977
 
ROSEMOUNT TANK RADAR AB (1)
6,278,411 Horn antenna 78 1999
 
ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG (1)
2004/0066,181 High-frequency probe tip 80 2003
 
ROUND ROCK RESEARCH, LLC (1)
5,126,286 Method of manufacturing edge connected semiconductor die 153 1990
 
RUDOLPH TECHNOLOGIES, INC. (1)
6,710,798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card 108 1999
 
SAE MAGNETICS (H.K.) LTD. (1)
7,015,689 Connection method for probe pins for measurement of characteristics of thin-film magnetic head and characteristic measurement method for thin-film magnetic head 94 2003
 
SANDIA CORPORATION (1)
6,078,183 Thermally-induced voltage alteration for integrated circuit analysis 129 1998
 
SANTEC CORPORATION (1)
7,323,680 Optical deflection probe and optical deflection probe device 20 2006
 
SANTRONICS, INC. (1)
7,030,599 Hand held voltage detection probe 100 2004
 
SARNOFF CORPORATION (1)
5,993,611 Capacitive denaturation of nucleic acid 116 1997
 
SCHLUMBERGER TECHNOLOGY CORPORATION (1)
4,766,384 Well logging apparatus for determining dip, azimuth, and invaded zone conductivity 100 1986
 
SCIENCE & TECHNOLOGY CORPORATION @ UNM (1)
6,549,022 Apparatus and method for analyzing functional failures in integrated circuits 125 2000
 
SEIKO INSTRUMENTS INC. (1)
7,015,455 Near-field optical probe 92 2005
 
SEMCO MACHINE CORPORATION (1)
5,550,481 Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making 41 1995
 
SEMICONDUCTOR DIAGNOSTICS, INC. (1)
6,114,865 Device for electrically contacting a floating semiconductor wafer having an insulating film 111 1999
 
SEMICONDUCTOR PHYSICS LABORATORY, INC. (1)
6,052,653 Spreading resistance profiling system 99 1997
 
SEMILAB SEMICONDUCTOR PHYSICS LABORATORY, CO., LTD. (1)
6,388,455 Method and apparatus for simulating a surface photo-voltage in a substrate 42 2000
 
Semitest, Inc. (1)
4,891,584 Apparatus for making surface photovoltage measurements of a semiconductor 136 1988
 
SENSOR DIAGNOSTICS, INC. (1)
4,713,347 Measurement of ligand/anti-ligand interactions using bulk conductance 199 1985
 
SHARP LABORATORIES OF AMERICA, INC. (1)
7,057,404 Shielded probe for testing a device under test 20 2003
 
SHOSHOTECH CO., LTD. (1)
6,351,885 Method of making conductive bump on wiring board 62 1998
 
SIERRA MONOLITHICS, INC. (1)
6,639,461 Ultra-wideband power amplifier module apparatus and method for optical and electronic communications 80 2001
 
SIGNATURE BIOSCIENCESM INC. (1)
6,395,480 Computer program and database structure for detecting molecular binding events 99 1999
 
Siliconix incorporated (1)
6,476,442 Pseudo-Schottky diode 93 1998
 
SINGULUS TECHNOLOGIES GMBH (1)
5,876,082 Device for gripping and holding substrates 69 1997
 
Sirotech Ltd. (1)
5,824,494 Method for enumerating bacterial populations 92 1995
 
SLOAN TECHNOLOGY CORPORATION, A CORP. OF CA (1)
4,707,657 Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine 149 1985
 
SMITHS GROUP PLC (1)
4,706,050 Microstrip devices 86 1985
 
SMSC ANALOG TECHNOLOGY, INC. (1)
6,753,699 Integrated circuit and method of controlling output impedance 79 2002
 
SNAP-ON TECHNOLOGIES, INC. (1)
6,940,283 Detecting field from different ignition coils using adjustable probe 54 2003
 
SOHN, LYDIA L. (1)
2003/0072,549 Method and apparatus for dielectric spectroscopy of biological solutions 106 2002
 
Solid State Farms, Inc. (1)
5,792,668 Radio frequency spectral analysis for in-vitro or in-vivo environments 179 1996
 
SPAR AEROSPACE LIMITED (1)
5,116,180 Human-in-the-loop machine control loop 252 1990
 
Spectroscopy Imaging Systems Corporation (1)
4,916,398 Efficient remote transmission line probe tuning for NMR apparatus 94 1988
 
ST. CLAIR INTELLECTUAL PROPERTY CONSULTANTS, INC. (1)
4,904,933 Integrated circuit probe station 113 1986
 
Stiftelsen Institutet for Mikrovagsteknik vid Tekniska Hogskolan i Stockholm (1)
4,476,363 Method and device for heating by microwave energy 33 1983
 
Storage Technology Corporation (1)
5,469,324 Integrated decoupling capacitive core for a printed circuit board and method of making same 120 1994
 
SUMITOMO ELECTRIC INDUSTRIES, LTD. (1)
4,818,059 Optical connector and splicer 84 1987
 
SUMITOMO WIRING SYSTEMS, LTD. (1)
5,627,473 Connector inspection device 41 1995
 
SUN MICROSYSTEMS, INC. (1)
5,629,838 Apparatus for non-conductively interconnecting integrated circuits using half capacitors 181 1994
 
SWCC SHOWA CABLE SYSTEMS CO., LTD. (1)
6,944,380 Optical fiber for transmitting ultraviolet ray, optical fiber probe, and method of manufacturing the optical fiber probe 59 2002
 
SYNERGETICS USA, INC. (1)
6,572,608 Directional laser probe 58 2000
 
TDK RF SOLUTIONS, INC. (1)
6,657,601 Metrology antenna system utilizing two-port, sleeve dipole and non-radiating balancing network 76 2001
 
TECHNOPROBE S.R.L. (1)
2002/0070,743 Testing head having vertical probes 88 2001
 
TELEFONAKTIEBOLAGET LM ERICSSON (PUBL) (1)
5,996,102 Assembly and method for testing integrated circuit devices 88 1997
 
TEMPTRONIC CORPORATION (1)
6,415,858 Temperature control system for a workpiece chuck 94 1997
 
TERADYNE, INC. (1)
6,784,679 Differential coaxial contact array for high-density, high-speed signals 92 2002
 
TERAVIEW LIMITED (1)
7,315,175 Probe apparatus and method for examining a sample 20 2002
 
TESSERA, INC. (1)
5,808,874 Microelectronic connections with liquid conductive elements 81 1996
 
THE REGENTS OF THE UNIVERSITY OF MICHIGAN (1)
6,906,506 Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe 55 2002
 
THERMOCARBON, INC. (1)
5,676,360 Machine tool rotary table locking apparatus 113 1995
 
THK CO., LTD. (1)
4,899,998 Rotational positioning device 106 1988
 
THOMAS JEFFERSON UNIVERSITY (1)
5,478,748 Protein assay using microwave energy 88 1994
 
Thomson Hybrides et Microondes (1)
4,901,012 Circuit for measuring the dynamic characteristics of a package for high-speed integrated circuits and a method for measuring said dynamic characteristics 39 1987
 
Thomson-CSF (1)
4,742,571 Coupling device between a metal wave guide, a dielectric wave guide and a semiconductor component and a mixer using this coupling device 86 1986
 
TIOGA TECHNOLOGIES, INC. (1)
6,459,739 Method and apparatus for RF common-mode noise rejection in a DSL receiver 106 1999
 
TOKYO OHKA KOGYO CO., LTD. (1)
5,571,324 Rotary-cup coating apparatus 103 1994
 
Tokyo Shibaura Denki Kabushiki Kaisha (1)
4,491,783 Apparatus for measuring noise factor and available gain 28 1982
 
TOTAL FINA ELF (1)
2002/0197,174 Electrical pump, and method for using plurality of submersible electrical pumps for well completion 2002
 
TRANSAT CORPORATION (1)
5,451,884 Electronic component temperature test system with flat ring revolving carriage 101 1993
 
Trigon (1)
4,340,860 Integrated circuit carrier package test probe 67 1980
 
TRIO-TECH INTERNATIONAL (1)
6,605,955 Temperature controlled wafer chuck system with low thermal resistance 98 2000
 
TRIQUINT SEMICONDUCTOR, INC. (1)
4,853,627 Wafer probes 103 1988
 
TRUSTEES OF DARTMOUTH COLLEGE (1)
5,833,601 Methodology for determining oxygen in biological systems 82 1997
 
TSK AMERICA, INC. (1)
2001/0043,073 PROBER INTERFACE PLATE 73 1999
 
U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL TRUSTEE (1)
4,926,172 Joystick controller 54 1988
 
UNISYS CORPORATION (1)
4,553,111 Printed circuit board maximizing areas for component utilization 30 1983
 
UNIVERSITY COLLEGE OF WALES, ABERYSTWYTH, THE (1)
5,569,591 Analytical or monitoring apparatus and method 136 1994
 
UNIVERSITY OF KANSAS (1)
6,937,020 Solid-state nuclear magnetic resonance probe 61 2004
 
UNIVERSITY OF MARYLAND, BALTIMORE (1)
6,809,533 Quantitative imaging of dielectric permittivity and tunability 77 2002
 
UNIVERSITY OF MASSACHUSETTS (1)
5,233,197 High speed digital imaging microscope 111 1991
 
VATELL CORPORATION (1)
6,278,051 Differential thermopile heat flux transducer 95 2000
 
VEECO METROLOGY INC. (1)
7,001,785 Capacitance probe for thin dielectric film characterization 99 2004
 
VEGA GRIESHABER KG (1)
7,030,827 Planar antenna and antenna system 73 2004
 
VERIGY (SINGAPORE) PTE. LTD. (1)
2005/0068,054 Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies 29 2004
 
WAYNE STATE UNIVERSITY (1)
4,327,180 Method and apparatus for electromagnetic radiation of biological material 78 1979
 
WESTERNGECO L.L.C. (1)
6,912,468 Method and apparatus for contemporaneous utilization of a higher order probe in pre-stack and post-stack seismic domains 57 2003
 
Westinghouse Electric Corp. (1)
4,302,146 Probe positioner 46 1978
 
WICO DISTRIBUTION CORP., A DE CORP. (1)
4,558,609 Joystick controller with interchangeable handles 28 1983
 
WINBOND ELECTRONICS CORP. (1)
6,611,417 Wafer chuck system 81 2001
 
WISCONSIN ALUMNI RESEARCH FOUNDATION (1)
2003/0088,180 Space-time microwave imaging for cancer detection 98 2002
 
XCERRA CORPORATION (1)
7,015,711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method 104 2004
 
XILINX, INC. (1)
6,512,482 Method and apparatus using a semiconductor die integrated antenna structure 90 2001
 
Yugen Kaisha Sozoan (1)
5,481,936 Rotary drive positioning system for an indexing table 111 1994
 
Other [Check patent profile for assignment information] (37)
4,330,783 Coaxially fed dipole antenna 77 1979
4,284,682 Heat sealable, flame and abrasion resistant coated fabric 123 1980
4,383,217 Collinear four-point probe head and mount for resistivity measurements 86 1981
4,480,223 Unitary probe assembly 134 1981
4,641,659 Medical diagnostic microwave scanning apparatus 107 1982
4,563,640 Fixed probe board 42 1982
4,515,133 Fuel economizing device 76 1984
4,812,754 Circuit board interfacing apparatus 116 1987
4,711,563 Portable collapsible darkroom 89 1987
4,791,363 Ceramic microstrip probe blade 136 1987
4,988,062 Apparatus, system and method for organizing and maintaining a plurality of medical catheters and the like 92 1988
4,922,912 MAP catheter 112 1988
5,129,006 Electronic audio signal amplifier and loudspeaker system 20 1989
5,363,050 Quantitative dielectric imaging system 105 1990
5,414,565 Tilting kinematic mount 84 1991
5,187,443 Microwave test fixtures for determining the dielectric properties of a material 79 1992
5,584,608 Anchored cable sling system 85 1994
5,670,322 Multi site molecule detection method 172 1995
5,670,888 Method for transporting and testing wafers 126 1995
5,621,400 Ice detection method and apparatus for an aircraft 42 1995
5,744,971 Device and apparatus for measuring dielectric properties of materials 90 1995
5,831,442 Handling device 95 1996
5,675,932 Plant growing system 90 1996
5,949,579 Flexible darkness adapting viewer 88 1997
6,307,363 Ultrahigh-frequency high-impedance passive voltage probe 51 1998
RE37130 Signal conditioning apparatus 30 1998
6,147,851 Method for guarding electrical regions having potential gradients 91 1999
6,327,034 Apparatus for aligning two objects 92 1999
6,548,311 Device and method for detecting analytes 110 2000
2001/0002,794 Split resistor probe and method 78 2001
2002/0030,480 Apparatus for the automated testing, calibration and characterization of test adapters 12 2001
6,587,327 Integrated broadband ceramic capacitor array 107 2002
2003/0076,585 Optical system for enhancing the image from a microscope's high power objective lens 30 2002
2003/0139,662 Method and apparatus for detecting, identifying and performing operations on microstructures including, anthrax spores, brain cells, cancer cells, living tissue cells, and macro-objects including stereotactic neurosurgery instruments, weapons and explosives 82 2002
7,015,707 Micro probe 110 2003
2004/0193,382 Method and apparatus for calibrating a multiport test system for measurement of a DUT 97 2004
2006/0030,060 Apparatus and method for testing defects 37 2005

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