US Patent No: 7,619,419

Number of patents in Portfolio can not be more than 2000

Wideband active-passive differential signal probe

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Abstract

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A wideband differential signal probe includes separate paths to convert a lower frequency component and a higher frequency component of a differential signal to a lower frequency single ended signal and a higher frequency single ended signal which are combined for the probe's output which is commonly input to instrumentation.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
CASCADE MICROTECH, INC.BEAVERTON, OR137

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Campbell, Richard Portland , US 24 95

Cited Art Landscape

Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (36)
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4,383,217 Collinear four-point probe head and mount for resistivity measurements 88 1981
4,480,223 Unitary probe assembly 136 1981
4,641,659 Medical diagnostic microwave scanning apparatus 112 1982
4,563,640 Fixed probe board 42 1982
4,515,133 Fuel economizing device 77 1984
4,812,754 Circuit board interfacing apparatus 117 1987
4,711,563 Portable collapsible darkroom 90 1987
4,791,363 Ceramic microstrip probe blade 137 1987
4,988,062 Apparatus, system and method for organizing and maintaining a plurality of medical catheters and the like 93 1988
4,922,912 MAP catheter 113 1988
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5,363,050 Quantitative dielectric imaging system 112 1990
5,414,565 Tilting kinematic mount 85 1991
5,187,443 Microwave test fixtures for determining the dielectric properties of a material 80 1992
5,584,608 Anchored cable sling system 86 1994
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6,307,363 Ultrahigh-frequency high-impedance passive voltage probe 51 1998
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2001/0002,794 Split resistor probe and method 79 2001
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2004/0201,388 Support for an electronic probe and related methods 42 2003
 
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5,511,010 Method and apparatus of eliminating interference in an undersettled electrical signal 93 1994
6,292,760 Method and apparatus to measure non-coherent signals 93 1998
6,906,539 High density, area array probe card apparatus 57 2001
6,911,834 Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probing 57 2002
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7,026,833 Multiple-chip probe and universal tester contact assemblage 101 2005
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6,194,720 Preparation of transmission electron microscope samples 110 1998
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5,298,972 Method and apparatus for measuring polarization sensitivity of optical devices 111 1991
5,274,336 Capacitively-coupled test probe 139 1992
5,308,250 Pressure contact for connecting a coaxial shield to a microstrip ground plane 30 1992
5,463,324 Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like 48 1993
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5,578,932 Method and apparatus for providing and calibrating a multiport network analyzer 147 1995
5,945,836 Loaded-board, guided-probe test fixture 130 1996
5,923,180 Compliant wafer prober docking adapter 71 1997
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5,903,143 Probe apparatus with RC circuit connected between ground and a guard 94 1997
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6,251,595 Methods and devices for carrying out chemical reactions 120 1998
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6,271,673 Probe for measuring signals 105 1999
6,407,562 Probe tip terminating device providing an easily changeable feed-through termination 95 1999
2001/0024,116 Electronic probe for measuring high impedance tri-state logic circuits 79 2001
6,643,597 Calibrating a test system using unknown standards 118 2001
6,717,426 Blade-like connecting needle 79 2002
6,768,328 Single point probe structure and method 75 2002
6,864,694 Voltage probe 91 2002
2004/0140,819 Differential voltage probe 31 2003
2005/0030,047 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration 86 2003
7,025,628 Electronic probe extender 113 2003
2004/0162,689 Multiport network analyzer calibration employing reciprocity of a device 95 2004
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7,026,834 Multiple two axis floating probe block assembly using split probe block 93 2005
 
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5,852,871 Method of making raised contacts on electronic components 143 1995
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6,032,356 Wafer-level test and burn-in, and semiconductor process 163 1997
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6,043,563 Electronic components with terminals and spring contact elements extending from areas which are remote from the terminals 167 1997
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6,330,164 Interconnect assemblies and methods including ancillary electronic component connected in immediate proximity of semiconductor device 127 1998
6,029,344 Composite interconnection element for microelectronic components, and method of making same 216 1998
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6,255,126 Lithographic contact elements 222 1998
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6,499,121 Distributed interface for parallel testing of multiple devices using a single tester channel 98 1999
6,627,483 Method for mounting an electronic component 100 1999
6,644,982 Method and apparatus for the transport and tracking of an electronic component 119 1999
6,887,723 Method for processing an integrated circuit including placing dice into a carrier and testing 75 1999
6,468,098 Electrical contactor especially wafer level contactor using fluid pressure 98 1999
6,655,023 Method and apparatus for burning-in semiconductor devices in wafer form 84 1999
6,827,584 Interconnect for microelectronic structures with enhanced spring characteristics 93 1999
6,491,968 Methods for making spring interconnect structures 102 1999
6,672,875 Spring interconnect structures 111 1999
6,339,338 Apparatus for reducing power supply noise in an integrated circuit 91 2000
6,168,974 Process of mounting spring contacts to semiconductor devices 114 2000
6,459,343 Integrated circuit interconnect system forming a multi-pole filter 71 2000
6,232,149 Sockets for "springed" semiconductor devices 79 2000
6,509,751 Planarizer for a semiconductor contactor 141 2000
6,215,196 Electronic component with terminals and spring contact elements extending from areas which are remote from the terminals 72 2000
6,640,432 Method of fabricating shaped springs 105 2000
6,677,744 System for measuring signal path resistance for an integrated circuit tester interconnect structure 71 2000
6,476,630 Method for testing signal paths between an integrated circuit wafer and a wafer tester 75 2000
6,525,555 Wafer-level burn-in and test 102 2000
6,727,579 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES 102 2000
6,685,817 Method and apparatus for controlling plating over a face of a substrate 65 2000
6,622,103 System for calibrating timing of an integrated circuit wafer tester 93 2000
6,603,323 Closed-grid bus architecture for wafer interconnect structure 90 2000
6,727,580 Microelectronic spring contact elements 79 2000
6,539,531 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes 118 2000
6,835,898 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES 85 2000
6,778,406 Resilient contact structures for interconnecting electronic devices 125 2000
6,475,822 Method of making microelectronic contact structures 91 2000
6,597,187 Special contact points for accessing internal circuitry of an integrated circuit 76 2000
6,603,324 Special contact points for accessing internal circuitry of an integrated circuit 72 2000
6,606,575 Cross-correlation timing calibration for wafer-level IC tester interconnect systems 85 2000
6,621,260 Special contact points for accessing internal circuitry of an integrated circuit 80 2000
6,701,612 Method and apparatus for shaping spring elements 89 2000
6,713,374 Interconnect assemblies and methods 103 2000
6,836,962 Method and apparatus for shaping spring elements 78 2000
6,538,538 High frequency printed circuit board via 89 2001
6,791,176 Lithographic contact elements 79 2001
6,616,966 Method of making lithographic contact springs 127 2001
6,780,001 Forming tool for forming a contoured microelectronic spring mold 75 2001
6,501,343 Integrated circuit tester with high bandwidth probe assembly 93 2001
6,606,014 Filter structures for integrated circuit interfaces 63 2001
6,534,856 Sockets for "springed" semiconductor devices 90 2001
6,910,268 Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via 135 2001
6,856,150 Probe card with coplanar daughter card 86 2001
6,627,980 Stacked semiconductor device assembly with microelectronic spring contacts 82 2001
6,538,214 Method for manufacturing raised electrical contact pattern of controlled geometry 78 2001
6,882,239 Electromagnetically coupled interconnect system 87 2001
6,888,362 Test head assembly for electronic components with plurality of contoured microelectronic spring contacts 96 2001
6,729,019 Method of manufacturing a probe card 110 2001
6,678,876 Process and apparatus for finding paths through a routing space 91 2001
6,862,727 Process and apparatus for adjusting traces 67 2001
6,764,869 Method of assembling and testing an electronics module 71 2001
6,714,828 Method and system for designing a probe card 74 2001
6,882,546 Multiple die interconnect system 75 2001
6,664,628 Electronic component overlapping dice of unsingulated semiconductor wafer 70 2001
6,456,103 Apparatus for reducing power supply noise in an integrated circuit 89 2001
6,759,311 Fan out of interconnect elements attached to semiconductor wafer 71 2001
6,817,052 Apparatuses and methods for cleaning test probes 91 2001
6,816,031 Adjustable delay transmission line 73 2001
6,624,648 Probe card assembly 119 2001
6,777,319 Microelectronic spring contact repair 81 2001
6,479,308 Semiconductor fuse covering 70 2001
6,615,485 Probe card assembly and kit, and methods of making same 95 2001
6,891,385 Probe card cooling assembly with direct cooling of active electronic components 92 2001
7,002,363 Method and system for compensating thermally induced motion of probe cards 120 2001
6,741,092 Method and system for detecting an arc condition 63 2001
6,864,105 Method of manufacturing a probe card 70 2002
6,680,659 Integrated circuit interconnect system 73 2002
6,784,674 Test signal distribution system for IC tester 76 2002
6,798,225 Tester channel to multiple IC terminals 80 2002
6,825,422 Interconnection element with contact blade 82 2002
6,812,691 Compensation for test signal degradation due to DUT fault 70 2002
6,640,415 Segmented contactor 110 2002
6,657,455 Predictive, adaptive power supply for an integrated circuit under test 82 2002
6,807,734 Microelectronic contact structures, and methods of making same 79 2002
6,559,671 Efficient parallel testing of semiconductor devices using a known good device to generate expected responses 74 2002
6,646,520 Integrated circuit interconnect system 75 2002
6,839,964 Method for manufacturing a multi-layer printed circuit board 68 2002
6,686,754 Integrated circuit tester with high bandwidth probe assembly 75 2002
6,678,850 Distributed interface for parallel testing of multiple devices using a single tester channel 74 2002
6,818,840 Method for manufacturing raised electrical contact pattern of controlled geometry 68 2002
6,642,625 Sockets for "springed" semiconductor devices 66 2002
6,661,316 High frequency printed circuit board via 71 2002
6,825,052 Test assembly including a test die for testing a semiconductor product die 85 2002
6,788,094 Wafer-level burn-in and test 78 2002
6,845,491 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes 73 2003
6,784,677 Closed-grid bus architecture for wafer interconnect structure 66 2003
7,342,402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features 25 2003
6,911,835 High performance probe system 85 2003
6,838,893 Probe card assembly 74 2003
6,870,381 Insulative covering of probe tips 64 2003
6,911,814 Apparatus and method for electromechanical testing and validation of probe cards 75 2003
6,913,468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods 91 2003
6,949,942 Predictive, adaptive power supply for an integrated circuit under test 46 2003
6,822,529 Integrated circuit interconnect system 72 2003
6,917,210 Integrated circuit tester with high bandwidth probe assembly 69 2003
7,276,922 Closed-grid bus architecture for wafer interconnect structure 23 2004
 
Sony Electronics Inc. (2)
5,669,316 Turntable for rotating a wafer carrier 101 1993
2007/0024,506 Systems and methods for high frequency parallel transmissions 79 2006
 
SEMITEST, INC. (1)
4,891,584 Apparatus for making surface photovoltage measurements of a semiconductor 138 1988
 
WISCONSIN ALUMNI RESEARCH FOUNDATION (1)
2003/0088,180 Space-time microwave imaging for cancer detection 114 2002
 
NXP B.V. (1)
6,275,043 Test device for testing a module for a data carrier intended for contactless communication 41 1999
 
OLYMPUS CORPORATION (1)
4,696,544 Fiberscopic device for inspection of internal sections of construction, and method for using same 127 1985
 
SUMITOMO WIRING SYSTEMS, LTD. (1)
5,627,473 Connector inspection device 44 1995
 
DIT-MCO INTERNATIONAL CORPORATION (1)
4,357,575 Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies 116 1980
 
SEMILAB SEMICONDUCTOR PHYSICS LABORATORY, CO., LTD. (1)
6,388,455 Method and apparatus for simulating a surface photo-voltage in a substrate 42 2000
 
MCC GESELLSCHAFT FUR DIAGNOSESYSTEME IN MEDIZIN UND TECHNIK MBH & CO. KG (1)
2005/0168,722 Device and method for measuring constituents in blood 40 2003
 
OPTOMETRIX, INC. (1)
6,181,416 Schlieren method for imaging semiconductor device properties 84 1999
 
FRESH QUEST CORPORATION (1)
5,589,781 Die carrier apparatus 74 1993
 
SEMICONDUCTOR PHYSICS LABORATORY, INC. (1)
6,052,653 Spreading resistance profiling system 100 1997
 
MESO SCALE TECHNOLOGIES, LLC. (1)
2005/0142,033 Modular assay plates, reader systems and methods for test measurements 118 2004
 
TERADYNE, INC. (1)
6,784,679 Differential coaxial contact array for high-density, high-speed signals 93 2002
 
Microwave Imaging Systems Technologies, Inc. (2)
5,841,288 Two-dimensional microwave imaging apparatus and methods 123 1997
6,448,788 Fixed array microwave imaging apparatus and method 110 2000
 
SUMITOMO ELECTRIC INDUSTRIES, LTD. (1)
4,818,059 Optical connector and splicer 86 1987
 
AG COMMUNICATION SYSTEMS CORPORATION, 2500 W. UTOPIA RD., PHOENIX, AZ 85027, A DE CORP. (1)
4,684,884 Universal test circuit for integrated circuit packages 79 1985
 
OLYMPUS OPTICAL CO., LTD. (3)
5,367,165 Cantilever chip for scanning probe microscope 78 1993
6,006,002 Rigid sleeve device fitted over a flexible insertion section of an endoscope for inspecting industrial equipment 56 1995
6,811,406 Microelectronic spring with additional protruding member 193 2001
 
HYPRES, INC. (1)
4,894,612 Soft probe for providing high speed on-wafer connections to a circuit 158 1988
 
ELECTRIC POWER RESEARCH INSTITUTE, INC. (1)
4,487,996 Shielded electrical cable 106 1982
 
COMMSCOPE, INC. OF NORTH CAROLINA (1)
6,407,542 Implementation of a multi-port modal decomposition system 42 2000
 
SNAP-ON TECHNOLOGIES, INC. (1)
6,940,283 Detecting field from different ignition coils using adjustable probe 55 2003
 
MARTEK, INC. (3)
5,656,942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane 111 1995
6,096,567 Method and apparatus for direct probe sensing 145 1997
6,320,372 Apparatus and method for testing a substrate having a plurality of terminals 101 1999
 
XCERRA CORPORATION (1)
7,015,711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method 105 2004
 
L-3 COMMUNICATIONS ELECTRON TECHNOLOGIES, INC. (1)
5,148,131 Coaxial-to-waveguide transducer with improved matching 43 1991
 
TERAVIEW LIMITED (1)
7,315,175 Probe apparatus and method for examining a sample 21 2002
 
NCR CORPORATION (1)
6,816,840 System and method of sending messages to a group of electronic price labels 37 1998
 
VEGA GRIESHABER KG (1)
7,030,827 Planar antenna and antenna system 74 2004
 
INTEST CORPORATION (2)
5,900,737 Method and apparatus for automated docking of a test head to a device handler 116 1996
6,259,260 Apparatus for coupling a test head and probe card in a wafer testing system 11 1998
 
PURDUE RESEARCH FOUNDATION (1)
2004/0147,034 Method and apparatus for measuring a substance in a biological sample 135 2003
 
INTEST IP CORPORATION (2)
4,589,815 Electronic test head positioner for test systems 50 1983
4,705,447 Electronic test head positioner for test systems 135 1985
 
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,528,993 Magneto-optical microscope magnetometer 80 2000
 
LOGICVISION, INC. (1)
2005/0229,053 Circuit and method for low frequency testing of high frequency signal waveforms 31 2004
 
GILLESPIE, ROBB S. (1)
6,481,939 Tool tip conductivity contact sensor and method 91 2001
 
MARTIN MARIETTA CORPORATION (1)
5,867,073 Waveguide to transmission line transition 84 1994
 
PS4 LUXCO S.A.R.L. (1)
7,319,337 Method and apparatus for pad aligned multiprobe wafer testing 20 2007
 
SCHLUMBERGER TECHNOLOGY CORPORATION (1)
4,766,384 Well logging apparatus for determining dip, azimuth, and invaded zone conductivity 101 1986
 
The United States of America as represented by the Secretary of the Army (2)
6,201,453 H-plane hermetic sealed waveguide probe 12 1998
6,731,804 Thermal luminescence liquid monitoring system and method 81 2000
 
STORAGE TECHNOLOGY CORPORATION (1)
5,469,324 Integrated decoupling capacitive core for a printed circuit board and method of making same 122 1994
 
The United States of America as represented by the Secretary of the Air Force (4)
4,754,239 Waveguide to stripline transition assembly 91 1986
5,631,571 Infrared receiver wafer level probe testing 145 1996
6,215,295 Photonic field probe and calibration means thereof 115 1998
2003/0170,898 Method for intracellular modifications within living cells using pulsed electric fields 125 2002
 
Trio-Tech International (1)
6,605,955 Temperature controlled wafer chuck system with low thermal resistance 104 2000
 
HITACHI HIGH-TECH SCIENCE CORPORATION (1)
6,621,082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function 100 2002
 
TRUSTEES OF DARTMOUTH COLLEGE (1)
5,833,601 Methodology for determining oxygen in biological systems 85 1997
 
WINWAY TECHNOLOGY CO., LTD. (1)
6,927,586 Temperature compensated vertical pin probing device 61 2003
 
JEOL RESONANCE INC. (1)
6,914,430 NMR probe 59 2004
 
MATRA BAE DYNAMICS (UK) LIMITED (1)
5,266,963 Integrated antenna/mixer for the microwave and millimetric wavebands 54 1991
 
APPLIED MATERIALS, INC. (5)
5,916,689 Electrostatic chuck with an impregnated, porous layer that exhibits the Johnson-Rahbeck effect 122 1996
5,874,361 Method of processing a wafer within a reaction chamber 108 1996
6,257,564 Vacuum chuck having vacuum-nipples wafer support 108 1998
6,232,787 Microstructure defect detection 161 1999
7,319,335 Configurable prober for TFT LCD array testing 20 2004
 
GYRUS MEDICAL LIMITED (1)
6,409,724 Electrosurgical instrument 260 2000
 
TOKYO ELECTRON LIMITED (34)
4,998,062 Probe device having micro-strip line structure 91 1989
5,084,671 Electric probing-test machine having a cooling system 189 1990
5,091,692 Probing test device 116 1990
5,198,752 Electric probing-test machine having a cooling system 156 1991
5,315,237 Touch sensor unit of prober for testing electric circuit and electric circuit testing apparatus using the touch sensor unit 113 1991
5,321,352 Probe apparatus and method of alignment for the same 132 1992
5,321,453 Probe apparatus for probing an object held above the probe card 103 1992
5,635,846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer 179 1993
5,404,111 Probe apparatus with a swinging holder for an object of examination 113 1993
5,517,126 Probe apparatus 132 1993
5,521,522 Probe apparatus for testing multiple integrated circuit dies 144 1993
5,539,676 Method of identifying probe position and probing method in prober 94 1994
5,811,982 High density cantilevered probe for electronic devices 167 1996
5,777,485 Probe method and apparatus with improved probe contact 119 1996
5,910,727 Electrical inspecting apparatus with ventilation system 90 1996
5,821,763 Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof 214 1996
5,804,983 Probe apparatus with tilt correction mechanisms 152 1997
6,334,247 High density integrated circuit apparatus, test probe and methods of use thereof 136 1997
5,914,614 High density cantilevered probe for electronic devices 96 1997
5,999,268 Apparatus for aligning a semiconductor wafer with an inspection contactor 118 1997
6,060,892 Probe card attaching mechanism 98 1997
6,300,780 High density integrated circuit apparatus, test probe and methods of use thereof 114 1998
6,124,725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer 136 1998
6,329,827 High density cantilevered probe for electronic devices 75 1998
6,414,478 Transfer mechanism for use in exchange of probe card 80 2000
6,722,032 Method of forming a structure for electronic devices contact locations 63 2001
7,005,842 Probe cartridge assembly and multi-probe assembly 93 2001
6,927,587 Probe apparatus 65 2003
6,906,542 Probing method and prober 61 2003
6,794,888 Probe device 76 2003
7,026,832 Probe mark reading device and probe mark reading method 96 2003
7,009,415 Probing method and probing apparatus 95 2004
7,023,226 Probe pins zero-point detecting method, and prober 93 2004
7,332,918 Prober and probe testing method for temperature-controlling object to be tested 27 2005
 
NGK INSULATORS, LTD. (2)
5,280,156 Wafer heating apparatus and with ceramic substrate and dielectric layer having electrostatic chucking means 219 1991
6,001,760 Aluminum nitride sintered body, metal embedded article, electronic functional material and electrostatic chuck 116 1997
 
PHILIPS ELECTRONICS NORTH AMERICA CORPORATION (1)
4,593,243 Coplanar and stripline probe card apparatus 115 1984
 
SYNERGETICS USA, INC. (1)
6,572,608 Directional laser probe 94 2000
 
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (2)
6,909,300 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips 56 2002
6,902,941 Probing of device elements 100 2003
 
J.A. WOOLLAM CO., INC. (1)
6,937,341 System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation 86 2002
 
Sirotech Ltd. (1)
5,824,494 Method for enumerating bacterial populations 95 1995
 
GATAN, INC. (1)
6,914,244 Ion beam milling system and method for electron microscopy specimen preparation 89 2004
 
GOOGLE TECHNOLOGY HOLDINGS LLC (3)
5,751,153 Method and apparatus for characterizing a multiport circuit 40 1996
5,793,213 Method and apparatus for calibrating a network analyzer 94 1996
5,751,252 Method and antenna for providing an omnidirectional pattern 96 1997
 
APPLE INC. (1)
5,617,035 Method for testing integrated devices 110 1995
 
FRAMATOME TECHNOLOGIES, INC. (1)
5,756,908 Probe positioner 42 1996
 
ENERGY, UNITED STATES DEPARTMENT OF (2)
5,523,694 Integrated circuit failure analysis by low-energy charge-induced voltage alteration 122 1994
6,307,672 Microscope collision protection apparatus 82 1996
 
BOARD OF REGENTS OF THE UNIVERSITY OF WISCONSIN SYSTEM, THE, AN INSTITUTE OF WI (1)
5,233,306 Method and apparatus for measuring the permittivity of materials 129 1991
 
SMITHS GROUP PLC (1)
4,706,050 Microstrip devices 94 1985
 
KABUSHIKI KAISHA TOSHIBA (4)
5,166,893 Portable apparatus having a voltage converter unit removable from a base unit having a removable display unit 46 1992
5,491,425 Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same 10 1994
6,605,941 Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes 50 2001
7,032,307 Method for fabricating a probe pin for testing electrical characteristics of an apparatus 93 2004
 
WesternGeco L.L.C. (1)
6,912,468 Method and apparatus for contemporaneous utilization of a higher order probe in pre-stack and post-stack seismic domains 62 2003
 
RAYTHEON COMPANY (5)
4,346,355 Radio frequency energy launcher 95 1980
5,069,628 Flexible electrical cable connector with double sided dots 72 1990
5,395,253 Membrane connector with stretch induced micro scrub 116 1993
5,600,256 Cast elastomer/membrane test probe assembly 78 1995
6,211,837 Dual-window high-power conical horn antenna 79 1999
 
TENCOR INSTRUMENTS (2)
4,755,746 Apparatus and methods for semiconductor wafer testing 156 1985
5,852,232 Acoustic sensor as proximity detector 137 1997
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (28)
4,520,314 Probe head arrangement for conductor line testing with at least one probe head comprising a plurality of resilient contacts 39 1982
4,744,041 Method for testing DC motors 118 1985
4,851,767 Detachable high-speed opto-electronic sampling probe 31 1988
4,831,494 Multilayer capacitor 156 1988
4,922,128 Boost clock circuit for driving redundant wordlines and sample wordlines 80 1989
4,987,100 Flexible carrier for an electronic device 82 1989
5,001,423 Dry interface thermal chuck temperature control system for semiconductor wafer testing 135 1990
5,007,163 Non-destructure method of performing electrical burn-in testing of semiconductor chips 67 1990
5,207,585 Thin interface pellicle for dense arrays of electrical interconnects 178 1990
5,061,192 High density connector 150 1990
5,334,931 Molded test probe assembly 92 1991
5,371,654 Three dimensional high performance interconnection package 293 1992
5,537,372 High density data storage system with topographic contact sensor 115 1993
5,531,022 Method of forming a three dimensional high performance interconnection package 198 1994
5,532,608 Ceramic probe card and method for reducing leakage current 64 1995
5,804,982 Miniature probe positioning actuator 106 1995
5,726,211 Process for making a foamed elastometric polymer 103 1996
5,756,021 Electronic devices comprising dielectric foamed polymers 89 1996
5,700,844 Process for making a foamed polymer 144 1996
5,723,347 Semi-conductor chip test probe and process for manufacturing the probe 108 1996
5,838,160 Integral rigid chip test probe 83 1996
5,926,029 Ultra fine probe contacts 107 1997
6,059,982 Micro probe assembly and method of fabrication 151 1997
5,804,607 Process for making a foamed elastomeric polymer 120 1997
6,104,201 Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage 72 1998
6,206,273 Structures and processes to create a desired probetip contact geometry on a wafer test probe 110 1999
6,943,571 Reduction of positional errors in a four point probe resistance measurement 62 2003
7,007,380 TFI probe I/O wrap test method 93 2004
 
OSRAM OPTO SEMICONDUCTORS GMBH (1)
6,946,864 Method for measuring product parameters of components formed on a wafer and device for performing the method 20 2002
 
ADVANCED MICRO DEVICES, INC. (1)
6,396,296 Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station 102 2000
 
U.S. BANK NATIONAL ASSOCIATION (1)
4,926,172 Joystick controller 55 1988
 
ELM TECHNOLOGY CORPORATION (2)
5,020,219 Method of making a flexible tester surface for testing integrated circuits 180 1989
5,453,404 Method for making an interconnection structure for integrated circuits 134 1994
 
DRNC HOLDINGS, INC. (1)
6,987,483 Effectively balanced dipole microstrip antenna 80 2003
 
ROBERT BOSCH GMBH (2)
6,066,911 Ultrasonic driving element 125 1998
6,948,981 Compact coupler plug, particularly for a planar broadband lambda probe, in which single-conductor seals are prevented from being lost 55 2002
 
EVERETT CHARLES TECHNOLOGIES, INC. (1)
5,214,374 Dual level test fixture 105 1991
 
HARRIS CORPORATION (3)
5,854,608 Helical antenna having a solid dielectric core 137 1994
6,181,297 Antenna 103 1998
6,424,316 Helical antenna 90 2000
 
ADE CORPORATION (1)
5,642,298 Wafer testing and self-calibration system 116 1996
 
Integral Technologies, Inc. (1)
7,006,046 Low cost electronic probe devices manufactured from conductive loaded resin-based materials 95 2004
 
TOTAL FINA ELF (1)
2002/0197,174 Electrical pump, and method for using plurality of submersible electrical pumps for well completion 0 2002
 
PROMOS TECHNOLOGIES INC. (1)
2003/0234,659 Electrical isolation between pins sharing the same tester channel 17 2002
 
FELTEN & GUILLEAUME ENERGIETECHNIK AG (1)
4,972,073 Light wave conductor-bending sensor with sliding rails for monitoring bridge structures or the like 46 1990
 
Semiconductor Diagnostics, Inc. (1)
6,114,865 Device for electrically contacting a floating semiconductor wafer having an insulating film 112 1999
 
HOUSTON ADVANCED RESEARCH CENTER, A CORP. OF TX (1)
5,846,708 Optical and electrical methods and apparatus for molecule detection 401 1992
 
LAM RESEARCH CORPORATION (1)
7,015,703 Radio frequency Langmuir probe 102 2004
 
BERTHOLD TECHNOLOGIES GMBH & CO. KG (1)
5,369,368 Device for determining material parameters by means of microwave measurements 81 1993
 
ADVANTEST (SINGAPORE) PTE. LTD. (2)
6,812,718 Massively parallel interface for electronic circuits 110 2001
6,917,525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs 114 2002
 
EDO CORPORATION, BARNES DIVISION (1)
4,755,874 Emission microscopy system 162 1987
 
TRIQUINT SEMICONDUCTOR, INC. (1)
4,853,627 Wafer probes 104 1988
 
STOVOKOR TECHNOLOGY LLC (2)
4,991,290 Flexible electrical interconnect and method of making 119 1989
5,170,930 Liquid metal paste for thermal and electrical connections 88 1991
 
SEMCO MACHINE CORPORATION (1)
5,550,481 Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making 41 1995
 
D-LINK CORPORATION (1)
6,778,140 Atch horn antenna of dual frequency 73 2003
 
RCA Corporation (1)
4,651,115 Waveguide-to-microstrip transition 82 1985
 
Shoshotech Co., Ltd. (1)
6,351,885 Method of making conductive bump on wiring board 64 1998
 
GENERAL ELECTRIC COMPANY (3)
6,927,598 Test probe for electrical devices having low or no wedge depression 58 2003
6,911,826 Pulsed eddy current sensor probes and inspection methods 64 2003
7,015,690 Omnidirectional eddy current probe and inspection system 100 2004
 
COMPAQ COMPUTER CORPORATION (1)
5,500,606 Completely wireless dual-access test fixture 114 1993
 
Sematech, Inc. (2)
5,159,264 Pneumatic energy fluxmeter 80 1991
5,159,267 Pneumatic energy fluxmeter 82 1992
 
INTERSTITIAL, LLC (3)
5,704,355 Non-invasive system for breast cancer detection 137 1995
5,829,437 Microwave method and system to detect and locate cancers in heterogenous tissues 140 1996
6,061,589 Microwave antenna for cancer detection system 133 1997
 
RUDOLPH TECHNOLOGIES, INC. (1)
6,710,798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card 111 1999
 
MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH (1)
4,551,747 Leadless chip carrier apparatus providing for a transmission line environment and improved heat dissipation 124 1982
 
BROOKS AUTOMATION, INC. (1)
5,539,323 Sensor for articles such as wafers on end effector 124 1993
 
Yulim Hitech, Inc. (2)
6,922,069 Needle assembly of probe card 62 2003
7,014,499 Probe card for testing semiconductor device 95 2005
 
PICO TECHNOLOGY HOLDINGS, INC. (1)
6,335,625 Programmable active microwave ultrafine resonance spectrometer (PAMURS) method and systems 86 2000
 
HERSTEIN, DOV (1)
4,810,981 Assembly of microwave components 91 1987
 
GILBOE, DEREK (1)
7,034,553 Direct resistance measurement corrosion probe 96 2003
 
Temptronic Corporation (1)
6,415,858 Temperature control system for a workpiece chuck 98 1997
 
Carl-Zeiss-Stiftung (1)
4,515,439 Attachment of microscope objectives 82 1982
 
John H. Blanz Company, Inc. (3)
5,097,207 Temperature stable cryogenic probe station 107 1989
5,160,883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support 96 1990
5,166,606 High efficiency cryogenic test station 95 1990
 
FUJI PHOTO FILM CO., LTD. (1)
4,727,391 Sheet film package and device for loading sheet films 82 1987
 
SCIENCE & TECHNOLOGY CORPORATION @ UNM (1)
6,549,022 Apparatus and method for analyzing functional failures in integrated circuits 130 2000
 
BRUKER BIOSPIN CORPORATION (1)
6,933,725 NMR probe circuit for generating close frequency resonances 62 2004
 
XILINX, INC. (1)
6,512,482 Method and apparatus using a semiconductor die integrated antenna structure 93 2001
 
Sandia Corporation (1)
6,078,183 Thermally-induced voltage alteration for integrated circuit analysis 132 1998
 
BARKER REVOCABLE TRUST U/A/D (1)
5,202,558 Flexible fiber optic probe for high-pressure shock experiments 103 1992
 
OKI SEMICONDUCTOR CO., LTD. (1)
6,927,078 Method of measuring contact resistance of probe and method of testing semiconductor device 61 2003
 
EMImaging Ltd (2)
5,715,819 Microwave tomographic spectroscopy system and method 150 1994
6,490,471 Electromagnetical imaging and therapeutic (EMIT) systems 93 2001
 
U.S. PHILIPS CORPORATION (2)
4,568,890 Microwave oscillator injection locked at its fundamental frequency for producing a harmonic frequency output 23 1983
4,663,840 Method of interconnecting conductors of different layers of a multilayer printed circuit board 74 1985
 
SILICONIX INCORPORATED (1)
6,476,442 Pseudo-Schottky diode 101 1998
 
SUN MICROSYSTEMS, INC. (1)
* 5,629,838 Apparatus for non-conductively interconnecting integrated circuits using half capacitors 190 1994
 
UNIVERSITY OF KANSAS (1)
6,937,020 Solid-state nuclear magnetic resonance probe 64 2004
 
TSK AMERICA, INC. (1)
2001/0043,073 PROBER INTERFACE PLATE 74 1999
 
INTERSIL CORPORATION (1)
4,528,504 Pulsed linear integrated circuit tester 97 1982
 
The United States of America as represented by the Secretary of the Navy (4)
5,361,049 Transition from double-ridge waveguide to suspended substrate 50 1986
5,091,732 Lightweight deployable antenna system 89 1990
5,430,813 Mode-matched, combination taper fiber optic probe 60 1993
6,940,264 Near field probe 60 2004
 
TEKTRONIX, INC. (12)
4,739,259 Telescoping pin probe 100 1986
4,673,839 Piezoelectric pressure sensing apparatus for integrated circuit testing stations 124 1986
4,734,641 Method for the thermal characterization of semiconductor packaging systems 60 1987
4,749,942 Wafer probe head 84 1987
4,912,399 Multiple lead probe for integrated circuits in wafer form 120 1987
4,783,625 Wideband high impedance card mountable probe 95 1988
4,965,514 Apparatus for probing a microwave circuit 18 1989
5,059,898 Wafer probe with transparent loading member 78 1990
5,136,237 Double insulated floating high voltage test probe 106 1991
5,412,330 Optical module for an optically based measurement system 95 1993
6,447,339 Adapter for a multi-channel signal probe 87 2001
6,701,265 Calibration for vector network analyzer 94 2002
 
Ampex Corporation (1)
4,375,631 Joystick control 63 1981
 
XEROX CORPORATION (2)
4,780,670 Active probe card for high resolution/low noise wafer level testing 135 1985
6,352,454 Wear-resistant spring contacts 84 1999
 
SEIKO INSTRUMENTS INC. (1)
7,015,455 Near-field optical probe 93 2005
 
SILICON VALLEY BANK (4)
4,893,914 Test station 112 1988
5,892,539 Portable emission microscope workstation for failure analysis 126 1995
6,744,268 High resolution analytical probe station 123 2002
6,917,195 Wafer probe station 56 2004
 
YOKOWO CO., LTD. (7)
7,019,701 Antenna device mounted on vehicle 85 2004
6,900,647 Contact probe and probe device 105 2004
6,903,563 Contact probe and probe device 100 2004
6,917,211 Contact probe and probe device 57 2004
6,919,732 Contact probe and probe device 58 2004
6,937,042 Contact probe and probe device 58 2004
7,015,710 Contact probe and probe device 97 2004
 
DELAWARE CAPITAL FORMATION, INC. (5)
5,408,189 Test fixture alignment system for printed circuit boards 148 1992
5,289,117 Testing of integrated circuit devices on loaded printed circuit 54 1992
5,389,885 Expandable diaphragm test modules and connectors 97 1993
6,181,149 Grid array package test contactor 104 1996
6,064,218 Peripherally leaded package test contactor 105 1997
 
TRW INC. (2)
4,468,629 NPN Operational amplifier 79 1982
5,126,696 W-Band waveguide variable controlled oscillator 42 1991
 
AMP INCORPORATED, A CORPORATION OF PENNSYLVANIA (1)
4,652,082 Angled electro optic connector 56 1984
 
Olaer Industries (1)
4,788,851 Pressure vessel incorporating a sensor for detecting liquid in a gas chamber 43 1987
 
Riken Denshi Co., Ltd. (1)
4,636,772 Multiple function type D/A converter 50 1985
 
THE REGENTS OF THE UNIVERSITY OF MICHIGAN (1)
6,906,506 Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe 56 2002
 
VERIGY (SINGAPORE) PTE. LTD. (1)
2005/0068,054 Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies 29 2004
 
3M INNOVATIVE PROPERTIES COMPANY (1)
6,902,416 High density probe device 75 2002
 
IBIDEN CO., LTD. (3)
2004/0021,475 Wafer prober 82 2003
2004/0134,899 Ceramic substrate for a semiconductor-production/inspection device 80 2003
2004/0207,072 Ceramic substrate for a semiconductor producing/examining device 85 2004
 
TELEFONAKTIEBOLAGET L M ERICSSON (PUBL) (1)
5,996,102 Assembly and method for testing integrated circuit devices 90 1997
 
ALERI INC. (1)
6,924,655 Probe card for use with microelectronic components, and methods for making same 57 2003
 
GLUCOSET AS (1)
7,003,184 Fiber optic probes 109 2001
 
AT&T Technologies, Inc. (1)
4,837,507 High frequency in-circuit test fixture 75 1987
 
University of Massachusetts (1)
5,233,197 High speed digital imaging microscope 112 1991
 
RPX CLEARINGHOUSE LLC (1)
6,753,679 Test point monitor using embedded passive resistance 84 2002
 
CNH AMERICA LLC (2)
5,316,435 Three function control system 50 1992
5,360,312 Three function control mechanism 48 1992
 
The Boeing Company (3)
4,727,637 Computer aided connector assembly method and apparatus 114 1987
5,202,648 Hermetic waveguide-to-microstrip transition module 62 1991
6,914,427 Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method 63 2003
 
UNIVERSITY OF MARYLAND, BALTIMORE (1)
6,809,533 Quantitative imaging of dielectric permittivity and tunability 79 2002
 
Fujikura Rubber Works, Ltd. (1)
4,425,395 Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production 105 1982
 
FUJIKURA LTD. (1)
4,626,618 DC electric power cable 99 1985
 
FILOTEX (1)
5,397,855 Low noise cable 95 1993
 
The Aerospace Corporation (2)
6,211,663 Baseband time-domain waveform measurement method 117 1999
6,396,298 Active feedback pulsed measurement method 91 2000
 
ROSEMOUNT TANK RADAR AB (1)
6,278,411 Horn antenna 80 1999
 
Acome, Societies Anonyme (1)
4,621,169 Electric cable construction and uses therefor 94 1985
 
DESIGNTECH INTERNATIONAL, INC. (1)
5,041,782 Microstrip probe 96 1989
 
Gebr. Marzhauser Wetzlar oHG (1)
4,552,033 Drive system for a microscope stage or the like 110 1984
 
L&P PROPERTY MANAGEMENT COMPANY (1)
5,505,150 Method and apparatus for facilitating loop take time adjustment in multi-needle quilting machine 87 1994
 
GEC FERRANTI DEFENCE SYSTEMS LIMITED (1)
4,714,873 Microwave noise measuring apparatus 49 1986
 
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. (1)
6,653,903 Supply voltage decoupling device for HF amplifier circuits 73 2001
 
ECLIPSE SURGICAL TECHNOLOGIES, INC. (1)
5,728,091 Optical fiber for myocardial channel formation 57 1995
 
ELECTRO SCIENTIFIC INDUSTRIES, INC. (1)
6,100,815 Compound switching matrix for probing and interconnecting devices under test to measurement equipment 114 1997
 
TRANSAT CORPORATION (1)
5,451,884 Electronic component temperature test system with flat ring revolving carriage 102 1993
 
FUJITA, TAKAFUMI (1)
6,933,736 Prober 58 2003
 
KOCH, LINDA (1)
4,567,436 Magnetic thickness gauge with adjustable probe 33 1982
 
Nebraska Electronics, Inc. (1)
5,481,196 Process and apparatus for microwave diagnostics and therapy 85 1994
 
ALPS ELECTRIC CO., LTD. (1)
4,725,793 Waveguide-microstrip line converter 87 1986
 
Yugen Kaisha Sozoan (1)
5,481,936 Rotary drive positioning system for an indexing table 114 1994
 
H+W Test Products, Inc. (1)
6,054,869 Bi-level test fixture for testing printed circuit boards 97 1998
 
DYNEX SEMICONDUCTOR LIMITED (1)
6,265,950 Transition from a waveguide to a strip transmission line 92 1999
 
INTEL CORPORATION (5)
5,944,093 Pickup chuck with an integral heat pipe 103 1997
7,020,363 Optical probe for wafer testing 99 2001
6,856,129 Current probe device having an integrated amplifier 92 2002
2006/0052,075 Testing integrated circuits using high bandwidth wireless technology 77 2004
2007/0145,989 Probe card with improved transient power delivery 26 2005
 
Probe-Rite, Inc. (1)
4,636,722 High density probe-head with isolated and shielded transmission lines 157 1984
 
QINETIQ LIMITED (1)
5,803,607 Method and apparatus for measurement of unsteady gas temperatures 44 1997
 
Nihon Denshizairyo Kabushiki Kaisha (1)
5,134,365 Probe card in which contact pressure and relative position of each probe end are correctly maintained 88 1991
 
GGB INDUSTRIES, INC. (4)
4,871,964 Integrated circuit probing apparatus 102 1988
5,373,231 Integrated circuit probing apparatus including a capacitor bypass structure 126 1993
6,603,322 Probe card for high speed testing 102 1996
6,118,287 Probe tip structure 103 1997
 
ARRAY BIOSCIENCE CORPORATION (1)
6,707,548 Systems and methods for filter based spectrographic analysis 109 2001
 
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. (4)
6,927,079 Method for probing a semiconductor wafer 105 2000
6,605,951 Interconnector and method of connecting probes to a die for functional analysis 108 2000
6,617,866 Apparatus and method of protecting a probe card during a sort sequence 36 2001
7,023,225 Wafer-mounted micro-probing platform 94 2003
 
AVAGO TECHNOLOGIES ECBU IP (SINGAPORE) PTE. LTD. (1)
5,066,357 Method for making flexible circuit card with laser-contoured vias and machined capacitors 108 1990
 
Xandex, Inc. (3)
5,528,158 Probe card changer system and method 105 1994
5,506,498 Probe card system and method 98 1995
6,166,553 Prober-tester electrical interface for semiconductor test 99 1998
 
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (2)
6,049,216 Contact type prober automatic alignment 93 1997
7,012,441 High conducting thin-film nanoprobe card and its fabrication method 106 2003
 
MASSACHUSETTS INSTITUTE OF TECHNOLOGY (2)
5,653,939 Optical and electrical methods and apparatus for molecule detection 473 1995
5,998,768 Active thermal control of surfaces by steering heating beam in response to sensed thermal radiation 107 1998
 
NEC CORPORATION (5)
4,669,805 High frequency connector 58 1985
6,114,864 Probe card with plural probe tips on a unitary flexible tongue 109 1997
6,310,483 Longitudinal type high frequency probe for narrow pitched electrodes 103 1998
6,281,691 Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable 103 1999
6,400,168 Method for fabricating probe tip portion composed by coaxial cable 104 2001
 
CSI TECHNOLOGY, INC. (1)
6,091,236 System and method for measuring and analyzing electrical signals on the shaft of a machine 97 1997
 
SPAR AEROSPACE LIMITED (1)
5,116,180 Human-in-the-loop machine control loop 261 1990
 
NEC ELECTRONICS CORPORATION (1)
6,320,396 Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device 99 1997
 
PINNACLE PRODUCTS, INC. (1)
5,807,107 Dental infection control system 94 1996
 
NOVELLUS DEVELOPMENT COMPANY, LLC (1)
6,946,859 Probe structures using clamped substrates with compliant interconnectors 48 2003
 
THERMOCARBON, INC. (1)
5,676,360 Machine tool rotary table locking apparatus 116 1995
 
ANRITSU COMPANY (4)
5,905,421 Apparatus for measuring and/or injecting high frequency signals in integrated systems 80 1997
6,169,410 Wafer probe with built in RF frequency conversion module 85 1998
6,529,844 Vector network measurement system 116 1999
6,943,563 Probe tone S-parameter measurements 58 2002
 
MicroCraft (1)
7,188,037 Method and apparatus for testing circuit boards 84 2004
 
BECHTEL BWXT IDAHO, LLC (1)
6,147,502 Method and apparatus for measuring butterfat and protein content using microwave absorption techniques 80 1998
 
FINCH INTERNATIONAL LIMITED (1)
5,281,364 Liquid metal electrical contact compositions 14 1992
 
Research Organization for Circuit Knowledge (1)
5,584,120 Method of manufacturing printed circuits 79 1994
 
Junkosha Co., Ltd. (1)
4,567,321 Flexible flat cable 102 1984
 
FLUKE CORPORATION (1)
6,384,614 Single tip Kelvin probe 103 2000
 
Trigon (1)
4,340,860 Integrated circuit carrier package test probe 67 1980
 
ATMEL CORPORATION (1)
4,649,339 Integrated circuit interface 115 1984
 
INTEGRATED TECHNOLOGY CORPORATION (1)
6,118,894 Integrated circuit probe card inspection system 118 1997
 
SOLID STATE MEASUREMENTS, INC. (2)
6,900,652 Flexible membrane probe and method of use thereof 106 2003
7,023,231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof 94 2004
 
Solid State Farms, Inc. (1)
5,792,668 Radio frequency spectral analysis for in-vitro or in-vivo environments 209 1996
 
New Wave Research (3)
5,811,751 Multi-wavelength laser system, probe station and laser cutter system using the same 141 1997
6,573,702 Method and apparatus for cleaning electronic test contacts 103 1997
5,963,364 Multi-wavelength variable attenuator and half wave plate 120 1997
 
WENTWORTH LABORATORIES, INC. (4)
4,975,638 Test probe assembly for testing integrated circuit devices 153 1989
5,355,079 Probe assembly for testing integrated circuit devices 107 1993
5,959,461 Probe station adapter for backside emission inspection 122 1997
6,031,383 Probe station for low current, low voltage parametric measurements using multiple probes 107 1998
 
SAMSUNG ELECTRONICS CO., LTD. (3)
6,970,001 Variable impedance test probe 74 2003
6,900,653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof 106 2003
6,909,297 Probe card 56 2004
 
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM (1)
2003/0119,057 Forming and modifying dielectrically-engineered microparticles 131 2001
 
SLOAN TECHNOLOGY CORPORATION, A CORP. OF CA (1)
4,707,657 Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine 150 1985
 
Albany Instruments, Inc. (1)
6,933,717 Sensors and probes for mapping electromagnetic fields 61 2004
 
Formfactor, et al. (1)
6,937,037 Probe card assembly for contacting a device with raised contact elements 65 2002
 
RENESAS ELECTRONICS CORPORATION (4)
6,028,435 Semiconductor device evaluation system using optical fiber 108 1997
6,160,407 Inspection method and wiring current observation method for semiconductor device and apparatus of the same 98 1998
6,900,646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof 97 2002
6,551,884 Semiconductor device including gate insulation films having different thicknesses 71 2002
 
KABUSHIKI KAISHA NIHON MICRONICS (2)
5,888,075 Auxiliary apparatus for testing device 78 1997
6,019,612 Electrical connecting apparatus for electrically connecting a device to be tested 87 1998
 
GLOBALFOUNDRIES INC. (21)
5,441,690 Process of making pinless connector 75 1993
5,810,607 Interconnector with contact pads having enhanced durability 179 1995
5,785,538 High density test probe with rigid surface structure 107 1996
6,268,016 Manufacturing computer systems with fine line circuitized substrates 68 1996
6,286,208 Interconnector with contact pads having enhanced durability 86 1996
6,054,651 Foamed elastomers for wafer probing applications and interposer connectors 82 1996
6,091,255 System and method for tasking processing modules based upon temperature 134 1998
6,062,879 High density test probe with rigid surface structure 110 1998
6,332,270 Method of making high density integral test probe 127 1998
6,608,494 Single point high resolution time resolved photoemission microscopy system and method 111 1998
6,452,406 Probe structure having a plurality of discrete insulated probe tips 82 1999
6,528,984 Integrated compliant probe for wafer level test and burn-in 115 1999
6,483,327 Quadrant avalanche photodiode time-resolved detection 109 1999
6,724,928 Real-time photoemission detection system 97 2000
6,488,405 Flip chip defect analysis using liquid crystal 101 2000
6,526,655 Angled flying lead wire bonding process 103 2001
6,617,862 Laser intrusive technique for locating specific integrated circuit current paths 98 2002
6,788,093 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies 107 2002
7,022,976 Dynamically adjustable probe tips 98 2003
7,011,531 Membrane probe with anchored elements 93 2005
7,005,879 Device for probe card power bus noise reduction 93 2005
 
NISSAN CHEMICAL INDUSTRIES, LTD. (1)
5,021,186 Chloroisocyanuric acid composition having storage stability 77 1989
 
CASCADE MICROTECH, INC. (38)
4,697,143 Wafer probe 200 1984
4,764,723 Wafer probe 91 1986
4,827,211 Wafer probe 127 1987
4,858,160 System for setting reference reactance for vector corrected measurements 99 1988
4,849,689 Microwave wafer probe having replaceable probe tip 128 1988
5,012,186 Electrical probe with contact force protection 41 1990
5,045,781 High-frequency active probe having replaceable contact needles 110 1991
5,101,453 Fiber optic wafer probe 102 1991
5,266,889 Wafer probe station with integrated environment control enclosure 135 1992
5,457,398 Wafer probe station having full guarding 123 1993
5,506,515 High-frequency probe tip assembly 160 1994
5,610,529 Probe station having conductive coating added to thermal chuck insulator 138 1995
5,565,788 Coaxial wafer probe with tip shielding 148 1995
5,729,150 Low-current probe card with reduced triboelectric current generating cables 137 1995
5,914,613 Membrane probing system with local contact scrub 119 1996
6,232,788 Wafer probe station for low-current measurements 88 1997
6,232,789 Probe holder for low current measurements 87 1997
6,034,533 Low-current pogo probe card 111 1997
6,137,302 Low-current probe card with reduced triboelectric current generating cables 112 1997
6,256,882 Membrane probing system 78 1998
6,578,264 Method for constructing a membrane probe using a depression 79 2000
6,384,615 Probe holder for low current measurements 41 2001
6,549,106 Waveguide with adjustable backshort 114 2001
7,233,160 Wafer probe 22 2001
6,496,024 Probe holder for testing of a test device 38 2002
6,850,082 Probe holder for testing of a test device 37 2002
6,724,205 Probe for combined signals 98 2002
6,815,963 Probe for testing a device under test 65 2003
6,806,724 Probe for combined signals 95 2003
7,161,363 Probe for testing a device under test 34 2004
6,930,498 Membrane probing system 57 2004
7,009,383 Wafer probe station having environment control enclosure 93 2004
7,187,188 Chuck with integrated wafer support 78 2004
2006/0184,041 System for testing semiconductors 34 2006
7,332,923 Test probe for high-frequency measurement 23 2006
7,271,603 Shielded probe for testing a device under test 34 2006
7,403,028 Test structure and probe for differential signals 22 2007
2008/0111,571 Membrane probing system 11 2008
 
National Semiconductor Corporation (4)
4,757,255 Environmental box for automated wafer probing 193 1986
5,814,847 General purpose assembly programmable multi-chip package substrate 96 1996
5,883,522 Apparatus and method for retaining a semiconductor wafer during testing 107 1996
7,096,133 Method of establishing benchmark for figure of merit indicative of amplifier flicker noise 73 2005
 
MERCK & CO., INC. (1)
7,013,221 Iterative probe design and detailed expression profiling with flexible in-situ synthesis arrays 95 2000
 
DELPHI TECHNOLOGIES, INC. (1)
7,015,709 Ultra-broadband differential voltage probes 102 2004
 
SARANTEL LIMITED (3)
6,184,845 Dielectric-loaded antenna 138 1997
6,369,776 Antenna 92 1999
6,914,580 Dielectrically-loaded antenna 83 2003
 
NORTEL NETWORKS LIMITED (1)
4,853,624 Tunable microwave wafer probe 93 1988
 
ABBOTT DIABETES CARE INC. (1)
2005/0165,316 Method for detecting artifacts in data 77 2004
 
GCB INDUSTRIES, INC. (1)
6,229,327 Broadband impedance matching probe 111 1997
 
GTE Valeron Corporation (1)
4,401,945 Apparatus for detecting the position of a probe relative to a workpiece 97 1981
 
OL SECURITY LIMITED LIABILITY COMPANY (1)
5,688,618 Millimeter wave device and method of making 42 1995
 
INTELLECTUAL VENTURES I LLC (1)
5,633,780 Electrostatic discharge protection device 133 1996
 
ELECTRONICS RESEARCH, INC. (1)
2004/0100,276 Method and apparatus for calibration of a vector network analyzer 101 2002
 
MENTOR GRAPHICS CORPORATION (1)
5,383,787 Integrated circuit package with direct access to internal signals 61 1993
 
CIRREX SYSTEMS, LLC (1)
6,222,970 Methods and apparatus for filtering an optical fiber 148 1999
 
GE CAPITAL EQUITY INVESTMENTS, INC. (1)
6,628,980 Apparatus, systems, and methods for in vivo magnetic resonance imaging 185 2001
 
INIZIATIVE MARITTIME 1991, S.R.L. (1)
5,245,292 Method and apparatus for sensing a fluid handling 75 1992
 
DEUTSCHE THOMSON-BRANDT GMBH (1)
4,685,150 Tuning of a resonant circuit in a communications receiver 53 1984
 
Aries Electronics, Inc. (1)
6,937,045 Shielded integrated circuit probe 65 2004
 
GTE Products Corporation (1)
4,653,174 Method of making packaged IC chip 28 1986
 
Circuit Components Incorporated (1)
4,793,814 Electrical circuit board interconnect 300 1986
 
Aehr Test Systems (2)
6,340,895 Wafer-level burn-in and test cartridge 107 1999
6,580,283 Wafer level burn-in and test methods 88 1999
 
General Dielectric, Inc. (1)
2002/0050,828 Multi-feed microwave reflective resonant sensors 79 2001
 
EUROPAEISCHES LABORATORIUM FUER MOLEKULARBIOLOGIE (EMBL) (2)
6,798,226 Multiple local probe measuring device and method 93 2002
6,943,574 Multiple local probe measuring device and method 63 2004
 
ABB POWER T&D COMPANY INC. (1)
4,998,063 Fiber optic coupled magneto-optic sensor having a concave reflective focusing surface 39 1989
 
East Giant Limited (1)
5,879,289 Hand-held portable endoscopic camera 167 1996
 
Dimension Polyant Sailcloth, Inc. (1)
6,013,586 Tent material product and method of making tent material product 91 1997
 
SOHN, LYDIA L. (1)
2003/0072,549 Method and apparatus for dielectric spectroscopy of biological solutions 114 2002
 
ALSTOM (1)
5,813,847 Device and method for injecting fuels into compressed gaseous media 77 1996
 
CARDIFF AND VALE NHS TRUST (1)
2004/0175,294 Apparatus and method for analysing a biological sample in response to microwave radiation 76 2004
 
DCG SYSTEMS, INC. (2)
5,530,372 Method of probing a net of an IC at an optimal probe-point 118 1994
5,675,499 Optimal probe point placement 111 1996
 
HITACHI, LTD. (1)
2005/0186,696 Gas flowmeter and manufacturing method thereof 0 2005
 
COM DEV LTD. (1)
5,841,342 Voltage controlled superconducting microwave switch and method of operation thereof 43 1995
 
SKYWORKS SOLUTIONS, INC. (2)
6,582,979 Structure and method for fabrication of a leadless chip carrier with embedded antenna 93 2001
6,770,955 Shielded antenna in a semiconductor package 101 2001
 
Bell Telephone Laboratories, Incorporated (1)
4,684,883 Method of manufacturing high-quality semiconductor light-emitting devices 97 1985
 
THK CO., LTD. (1)
4,899,998 Rotational positioning device 107 1988
 
EATON CORPORATION (2)
4,904,935 Electrical circuit board text fixture having movable platens 114 1988
5,471,185 Electrical circuit protection devices comprising conductive liquid compositions 31 1994
 
GENETRONICS, INC. (1)
5,869,326 Electroporation employing user-configured pulsing scheme 118 1996
 
KEYSIGHT TECHNOLOGIES, INC. (4)
5,493,070 Measuring cable and measuring system 97 1994
6,300,775 Scattering parameter calibration system and method 130 1999
2004/0095,145 Method and apparatus for performing multiport through-reflect-line calibration and measurement 97 2002
2004/0199,350 System and method for determining measurement errors of a testing device 94 2003
 
SIEMENS AKTIENGESELLSCHAFT (2)
4,805,627 Method and apparatus for identifying the distribution of the dielectric constants in an object 107 1986
5,095,891 Connecting cable for use with a pulse generator and a shock wave generator 98 1987
 
TIOGA TECHNOLOGIES, INC. (1)
* 6,459,739 Method and apparatus for RF common-mode noise rejection in a DSL receiver 110 1999
 
MICROCONNECT LLC (3)
5,621,333 Contact device for making connection to an electronic circuit device 95 1995
6,046,599 Method and device for making connection 67 1997
6,091,256 Contact device for making connection to an electronic circuit device 65 1997
 
ROUND ROCK RESEARCH, LLC (1)
5,126,286 Method of manufacturing edge connected semiconductor die 160 1990
 
LEXINGTON, MA. 02173 A CORP OF DE. (1)
4,502,028 Programmable two-port microwave network 32 1982
 
Vatell Corporation (1)
6,278,051 Differential thermopile heat flux transducer 100 2000
 
HP HOLDINGS THREE, INC. (1)
5,995,914 Method and apparatus for asynchronously measuring frequency shifted signals 103 1996
 
SARNOFF CORPORATION (1)
5,993,611 Capacitive denaturation of nucleic acid 137 1997
 
ASAHI KOGAKU KOGYO KABUSHIKI KAISHA (1)
5,267,088 Code plate mounting device 84 1990
 
W. L. GORE & ASSOCIATES, INC. (8)
4,871,883 Electro-magnetic shielding 121 1987
4,859,989 Security system and signal carrying member thereof 129 1987
5,061,823 Crush-resistant coaxial transmission line 134 1990
5,107,076 Easy strip composite dielectric coaxial signal cable 124 1991
5,477,011 Low noise signal transmission cable 112 1994
5,896,038 Method of wafer level burn-in 109 1996
6,032,714 Repeatably positionable nozzle assembly 79 1999
7,015,708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts 95 2003
 
PREMTEK INTERNATIONAL INC. (1)
2005/0116,730 DOUBLE-FACED DETECTING DEVICES FOR AN ELECTRONIC SUBSTRATE 27 2003
 
Biotronic Systems Corporation (1)
5,082,627 Three dimensional binding site array for interfering with an electrical field 86 1987
 
NITTO DENKO CORPORATION (1)
5,977,783 Multilayer probe for measuring electrical characteristics 64 1997
 
Crown Products, Inc. (1)
7,019,541 Electric conductivity water probe 97 2004
 
FREESCALE SEMICONDUCTOR, INC. (5)
5,172,050 Micromachined semiconductor probe card 274 1991
5,177,438 Low resistance probe for semiconductor 174 1991
5,467,024 Integrated circuit test with programmable source for both AC and DC modes of operation 86 1993
5,666,063 Method and apparatus for testing an integrated circuit 107 1996
5,982,166 Method for measuring a characteristic of a semiconductor wafer using cylindrical control 108 1997
 
CALIFORNIA INSTITUTE OF TECHNOLOGY (1)
5,138,289 Noncontacting waveguide backshort 42 1990
 
NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,759,859 Resilient and rugged multi-layered probe 34 2001
 
FAIRCHILD SEMICONDUCTOR CORPORATION (1)
5,357,211 Pin driver amplifier 84 1993
 
JPK INSTRUMENTS AG (1)
7,022,985 Apparatus and method for a scanning probe microscope 99 2002
 
JPMORGAN CHASE BANK, N.A. (1)
5,678,210 Method and apparatus of coupling a transmitter to a waveguide in a remote ground terminal 44 1995
 
MEDICAL COLLEGE OF GEORGIA RESEARCH INSTITUTE, INC. (1)
5,488,954 Ultrasonic transducer and method for using same 144 1994
 
MAGMA DESIGN AUTOMATION, INC. (1)
5,030,907 CAD driven microprobe integrated circuit tester 113 1989
 
TESSERA, INC. (1)
5,808,874 Microelectronic connections with liquid conductive elements 88 1996
 
WINBOND ELECTRONICS CORP. (1)
6,611,417 Wafer chuck system 82 2001
 
iTerra Communications, LLC (1)
* 6,794,934 High gain wideband driver amplifier 98 2001
 
SAE Magnetics (H.K.) Ltd. (1)
7,015,689 Connection method for probe pins for measurement of characteristics of thin-film magnetic head and characteristic measurement method for thin-film magnetic head 95 2003
 
HITACHI SOFTWARE ENGINEERING CO., LTD. (1)
7,035,738 Probe designing apparatus and probe designing method 94 2002
 
SWCC SHOWA CABLE SYSTEMS CO., LTD. (1)
6,944,380 Optical fiber for transmitting ultraviolet ray, optical fiber probe, and method of manufacturing the optical fiber probe 65 2002
 
QUALCOMM INCORPORATED (1)
6,737,920 Variable gain amplifier 78 2002
 
Star Technologies Inc. (2)
6,906,543 Probe card for electrical testing a chip in a wide temperature range 64 2003
7,253,646 Probe card with tunable stage and at least one replaceable probe 10 2005
 
HITACHI ULSI SYSTEMS CO., LTD. (1)
6,734,687 Apparatus for detecting defect in device and method of detecting defect 111 2001
 
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY (6)
4,983,910 Millimeter-wave active probe 72 1988
4,916,002 Microcasting of microminiature tips 138 1989
5,003,253 Millimeter-wave active probe system 79 1989
5,847,569 Electrical contact probe for sampling high frequency electrical signals 97 1996
5,981,268 Hybrid biosensors 152 1997
6,051,422 Hybrid biosensors 130 1998
 
PREMIER MICROWAVE OF CALIFORNIA, INC. (1)
4,740,764 Pressure sealed waveguide to coaxial line connection 45 1987
 
ERICSSON INC. (1)
5,949,383 Compact antenna structures including baluns 117 1997
 
CHIPMOS TECHNOLOGIES INC. (1)
6,946,860 Modularized probe head 56 2003
 
LAURENCE J. MARHOEFER (1)
5,097,101 Method of forming a conductive contact bump on a flexible substrate and a flexible substrate 95 1991
 
RENISHAW PLC (2)
5,270,664 Probe for measuring surface roughness by sensing fringe field capacitance effects 126 1992
6,909,983 Calibration of an analogue probe 66 2002
 
EASTMAN KODAK COMPANY (1)
5,848,500 Light-tight enclosure and joint connectors for enclosure framework 110 1997
 
MEDICAL DEVICE INNOVATIONS LIMITED (1)
2006/0155,270 Tissue ablation apparatus and method of ablating tissue 149 2003
 
UNISYS CORPORATION (1)
4,553,111 Printed circuit board maximizing areas for component utilization 30 1983
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
UNIVERSITY OF VIRGINIA (1)
9,366,697 Micromachined on-wafer probes and related method 0 2011
 
TERADYNE, INC. (1)
9,435,855 Interconnect for transmitting signals between a device and a tester 0 2013
* Cited By Examiner

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