Wideband active-passive differential signal probe

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7619419
APP PUB NO 20060290357A1
SERIAL NO

11413738

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A wideband differential signal probe includes separate paths to convert a lower frequency component and a higher frequency component of a differential signal to a lower frequency single ended signal and a higher frequency single ended signal which are combined for the probe's output which is commonly input to instrumentation.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
CASCADE MICROTECH, INC.BEAVERTON, OR141

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Campbell, Richard Portland , US 24 133

Cited Art Landscape

Patent Info (Count) # Cites Year
 
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6476630 Method for testing signal paths between an integrated circuit wafer and a wafer tester 75 2000
6525555 Wafer-level burn-in and test 103 2000
6727579 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES 104 2000
6685817 Method and apparatus for controlling plating over a face of a substrate 65 2000
6622103 System for calibrating timing of an integrated circuit wafer tester 93 2000
6603323 Closed-grid bus architecture for wafer interconnect structure 92 2000
6727580 Microelectronic spring contact elements 79 2000
6539531 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes 119 2000
6835898 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES 89 2000
6778406 Resilient contact structures for interconnecting electronic devices 145 2000
6475822 Method of making microelectronic contact structures 91 2000
6597187 Special contact points for accessing internal circuitry of an integrated circuit 76 2000
6603324 Special contact points for accessing internal circuitry of an integrated circuit 72 2000
6606575 Cross-correlation timing calibration for wafer-level IC tester interconnect systems 85 2000
6621260 Special contact points for accessing internal circuitry of an integrated circuit 80 2000
6701612 Method and apparatus for shaping spring elements 90 2000
6713374 Interconnect assemblies and methods 104 2000
6836962 Method and apparatus for shaping spring elements 78 2000
6538538 High frequency printed circuit board via 93 2001
6791176 Lithographic contact elements 79 2001
6616966 Method of making lithographic contact springs 128 2001
6780001 Forming tool for forming a contoured microelectronic spring mold 75 2001
6501343 Integrated circuit tester with high bandwidth probe assembly 94 2001
6606014 Filter structures for integrated circuit interfaces 63 2001
6534856 Sockets for "springed" semiconductor devices 90 2001
6910268 Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via 147 2001
6856150 Probe card with coplanar daughter card 88 2001
6627980 Stacked semiconductor device assembly with microelectronic spring contacts 82 2001
6538214 Method for manufacturing raised electrical contact pattern of controlled geometry 78 2001
6882239 Electromagnetically coupled interconnect system 91 2001
6888362 Test head assembly for electronic components with plurality of contoured microelectronic spring contacts 97 2001
6729019 Method of manufacturing a probe card 112 2001
6678876 Process and apparatus for finding paths through a routing space 92 2001
6862727 Process and apparatus for adjusting traces 71 2001
6764869 Method of assembling and testing an electronics module 71 2001
6714828 Method and system for designing a probe card 74 2001
6882546 Multiple die interconnect system 75 2001
6664628 Electronic component overlapping dice of unsingulated semiconductor wafer 70 2001
6456103 Apparatus for reducing power supply noise in an integrated circuit 90 2001
6759311 Fan out of interconnect elements attached to semiconductor wafer 71 2001
6817052 Apparatuses and methods for cleaning test probes 94 2001
6816031 Adjustable delay transmission line 73 2001
6624648 Probe card assembly 121 2001
6777319 Microelectronic spring contact repair 81 2001
6479308 Semiconductor fuse covering 70 2001
6615485 Probe card assembly and kit, and methods of making same 96 2001
6891385 Probe card cooling assembly with direct cooling of active electronic components 94 2001
7002363 Method and system for compensating thermally induced motion of probe cards 123 2001
6741092 Method and system for detecting an arc condition 63 2001
6864105 Method of manufacturing a probe card 71 2002
6680659 Integrated circuit interconnect system 74 2002
6784674 Test signal distribution system for IC tester 76 2002
6798225 Tester channel to multiple IC terminals 81 2002
6825422 Interconnection element with contact blade 83 2002
6812691 Compensation for test signal degradation due to DUT fault 70 2002
6640415 Segmented contactor 111 2002
6657455 Predictive, adaptive power supply for an integrated circuit under test 83 2002
6807734 Microelectronic contact structures, and methods of making same 79 2002
6559671 Efficient parallel testing of semiconductor devices using a known good device to generate expected responses 75 2002
6646520 Integrated circuit interconnect system 76 2002
6839964 Method for manufacturing a multi-layer printed circuit board 68 2002
6686754 Integrated circuit tester with high bandwidth probe assembly 75 2002
6678850 Distributed interface for parallel testing of multiple devices using a single tester channel 74 2002
6818840 Method for manufacturing raised electrical contact pattern of controlled geometry 68 2002
6642625 Sockets for "springed" semiconductor devices 66 2002
6661316 High frequency printed circuit board via 71 2002
6825052 Test assembly including a test die for testing a semiconductor product die 87 2002
6788094 Wafer-level burn-in and test 78 2002
6845491 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes 73 2003
6784677 Closed-grid bus architecture for wafer interconnect structure 66 2003
7342402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features 25 2003
6911835 High performance probe system 87 2003
6838893 Probe card assembly 75 2003
6870381 Insulative covering of probe tips 64 2003
6911814 Apparatus and method for electromechanical testing and validation of probe cards 77 2003
6913468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods 92 2003
6949942 Predictive, adaptive power supply for an integrated circuit under test 46 2003
6822529 Integrated circuit interconnect system 73 2003
6917210 Integrated circuit tester with high bandwidth probe assembly 69 2003
7276922 Closed-grid bus architecture for wafer interconnect structure 23 2004
 
Sony Electronics Inc. (1)
2007/0024,506 Systems and methods for high frequency parallel transmissions 79 2006
 
Semitest, Inc. (1)
4891584 Apparatus for making surface photovoltage measurements of a semiconductor 138 1988
 
WISCONSIN ALUMNI RESEARCH FOUNDATION (1)
2003/0088,180 Space-time microwave imaging for cancer detection 119 2002
 
NXP B.V. (1)
6275043 Test device for testing a module for a data carrier intended for contactless communication 41 1999
 
OLYMPUS CORPORATION (1)
4696544 Fiberscopic device for inspection of internal sections of construction, and method for using same 144 1985
 
SUMITOMO WIRING SYSTEMS, LTD. (1)
5627473 Connector inspection device 44 1995
 
DIT-MCO INTERNATIONAL CORPORATION (1)
4357575 Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies 116 1980
 
SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD. (1)
6388455 Method and apparatus for simulating a surface photo-voltage in a substrate 42 2000
 
MCC GESELLSCHAFT FUR DIAGNOSESYSTEME IN MEDIZIN UND TECHNIK MBH & CO. KG (1)
2005/0168,722 Device and method for measuring constituents in blood 46 2003
 
OPTOMETRIX, INC. (1)
6181416 Schlieren method for imaging semiconductor device properties 84 1999
 
FRESH QUEST CORPORATION (1)
5589781 Die carrier apparatus 74 1993
 
SEMICONDUCTOR PHYSICS LABORATORY, INC. (1)
6052653 Spreading resistance profiling system 100 1997
 
MESO SCALE TECHNOLOGIES, LLC (1)
2005/0142,033 Modular assay plates, reader systems and methods for test measurements 129 2004
 
TERADYNE, INC. (1)
6784679 Differential coaxial contact array for high-density, high-speed signals 93 2002
 
Microwave Imaging Systems Technologies, Inc. (2)
5841288 Two-dimensional microwave imaging apparatus and methods 126 1997
6448788 Fixed array microwave imaging apparatus and method 113 2000
 
SUMITOMO ELECTRIC INDUSTRIES, LTD. (1)
4818059 Optical connector and splicer 87 1987
 
AG Communication Systems Corporation (1)
4684884 Universal test circuit for integrated circuit packages 80 1985
 
OLYMPUS OPTICAL CO., LTD. (3)
5367165 Cantilever chip for scanning probe microscope 78 1993
6006002 Rigid sleeve device fitted over a flexible insertion section of an endoscope for inspecting industrial equipment 56 1995
6811406 Microelectronic spring with additional protruding member 204 2001
 
HYPRES, INC. (1)
4894612 Soft probe for providing high speed on-wafer connections to a circuit 158 1988
 
ELECTRIC POWER RESEARCH INSTITUTE, INC. (1)
4487996 Shielded electrical cable 108 1982
 
COMMSCOPE, INC. OF NORTH CAROLINA (1)
6407542 Implementation of a multi-port modal decomposition system 42 2000
 
SNAP-ON TECHNOLOGIES, INC. (1)
6940283 Detecting field from different ignition coils using adjustable probe 55 2003
 
MARTEK, INC. (3)
5656942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane 111 1995
6096567 Method and apparatus for direct probe sensing 146 1997
6320372 Apparatus and method for testing a substrate having a plurality of terminals 102 1999
 
XCERRA CORPORATION (1)
7015711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method 107 2004
 
L-3 COMMUNICATIONS ELECTRON TECHNOLOGIES, INC. (1)
5148131 Coaxial-to-waveguide transducer with improved matching 43 1991
 
TERAVIEW LIMITED (1)
7315175 Probe apparatus and method for examining a sample 21 2002
 
MATRA BAE DYNAMICS (UK) (1)
5266963 Integrated antenna/mixer for the microwave and millimetric wavebands 54 1991
 
NCR CORPORATION (1)
6816840 System and method of sending messages to a group of electronic price labels 37 1998
 
NATIONAL TECHNOLOGY & ENGINEERING SOLUTIONS OF SANDIA, LLC (1)
6078183 Thermally-induced voltage alteration for integrated circuit analysis 132 1998
 
VEGA GRIESHABER KG (1)
7030827 Planar antenna and antenna system 75 2004
 
INTEST CORPORATION (2)
5900737 Method and apparatus for automated docking of a test head to a device handler 116 1996
6259260 Apparatus for coupling a test head and probe card in a wafer testing system 11 1998
 
PURDUE RESEARCH FOUNDATION (1)
2004/0147,034 Method and apparatus for measuring a substance in a biological sample 139 2003
 
INTEST IP CORPORATION (2)
4589815 Electronic test head positioner for test systems 50 1983
4705447 Electronic test head positioner for test systems 139 1985
 
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6528993 Magneto-optical microscope magnetometer 81 2000
 
GILLESPIE, ROBB S. (1)
6481939 Tool tip conductivity contact sensor and method 92 2001
 
LOGICVISION, INC. (1)
2005/0229,053 Circuit and method for low frequency testing of high frequency signal waveforms 31 2004
 
MARTIN MARIETTA CORPORATION (1)
5867073 Waveguide to transmission line transition 87 1994
 
PS4 LUXCO S.A.R.L. (1)
7319337 Method and apparatus for pad aligned multiprobe wafer testing 20 2007
 
SCHLUMBERGER TECHNOLOGY CORPORATION (1)
4766384 Well logging apparatus for determining dip, azimuth, and invaded zone conductivity 101 1986
 
The United States of America as represented by the Secretary of the Army (2)
6201453 H-plane hermetic sealed waveguide probe 20 1998
6731804 Thermal luminescence liquid monitoring system and method 81 2000
 
STORAGE TECHNOLOGY CORPORATION (1)
5469324 Integrated decoupling capacitive core for a printed circuit board and method of making same 122 1994
 
The United States of America as represented by the Secretary of the Air Force (4)
4754239 Waveguide to stripline transition assembly 91 1986
5631571 Infrared receiver wafer level probe testing 148 1996
6215295 Photonic field probe and calibration means thereof 115 1998
2003/0170,898 Method for intracellular modifications within living cells using pulsed electric fields 130 2002
 
Trio-Tech International (1)
6605955 Temperature controlled wafer chuck system with low thermal resistance 112 2000
 
HITACHI HIGH-TECH SCIENCE CORPORATION (1)
6621082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function 100 2002
 
THE TRUSTEES OF DARTMOUTH COLLEGE (1)
5833601 Methodology for determining oxygen in biological systems 85 1997
 
WINWAY TECH. CO., LTD. (1)
6927586 Temperature compensated vertical pin probing device 63 2003
 
JEOL RESONANCE INC. (1)
6914430 NMR probe 59 2004
 
APPLIED MATERIALS, INC. (5)
5916689 Electrostatic chuck with an impregnated, porous layer that exhibits the Johnson-Rahbeck effect 130 1996
5874361 Method of processing a wafer within a reaction chamber 108 1996
6257564 Vacuum chuck having vacuum-nipples wafer support 108 1998
6232787 Microstructure defect detection 165 1999
7319335 Configurable prober for TFT LCD array testing 20 2004
 
GYRUS MEDICAL LIMITED (1)
6409724 Electrosurgical instrument 368 2000
 
TOKYO ELECTRON LIMITED (35)
4998062 Probe device having micro-strip line structure 92 1989
5084671 Electric probing-test machine having a cooling system 194 1990
5091692 Probing test device 117 1990
5198752 Electric probing-test machine having a cooling system 156 1991
5315237 Touch sensor unit of prober for testing electric circuit and electric circuit testing apparatus using the touch sensor unit 114 1991
5321352 Probe apparatus and method of alignment for the same 133 1992
5321453 Probe apparatus for probing an object held above the probe card 103 1992
5635846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer 205 1993
5404111 Probe apparatus with a swinging holder for an object of examination 114 1993
5517126 Probe apparatus 134 1993
5521522 Probe apparatus for testing multiple integrated circuit dies 144 1993
5539676 Method of identifying probe position and probing method in prober 94 1994
5811982 High density cantilevered probe for electronic devices 192 1996
5777485 Probe method and apparatus with improved probe contact 119 1996
5910727 Electrical inspecting apparatus with ventilation system 90 1996
5821763 Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof 237 1996
5804983 Probe apparatus with tilt correction mechanisms 153 1997
6334247 High density integrated circuit apparatus, test probe and methods of use thereof 159 1997
5914614 High density cantilevered probe for electronic devices 98 1997
5999268 Apparatus for aligning a semiconductor wafer with an inspection contactor 122 1997
6060892 Probe card attaching mechanism 100 1997
6300780 High density integrated circuit apparatus, test probe and methods of use thereof 136 1998
6124725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer 138 1998
6329827 High density cantilevered probe for electronic devices 76 1998
6414478 Transfer mechanism for use in exchange of probe card 80 2000
6722032 Method of forming a structure for electronic devices contact locations 64 2001
7005842 Probe cartridge assembly and multi-probe assembly 93 2001
6933736 Prober 58 2003
6927587 Probe apparatus 65 2003
6906542 Probing method and prober 61 2003
6794888 Probe device 76 2003
7026832 Probe mark reading device and probe mark reading method 96 2003
7009415 Probing method and probing apparatus 95 2004
7023226 Probe pins zero-point detecting method, and prober 93 2004
7332918 Prober and probe testing method for temperature-controlling object to be tested 29 2005
 
NGK INSULATORS, LTD. (2)
5280156 Wafer heating apparatus and with ceramic substrate and dielectric layer having electrostatic chucking means 221 1991
6001760 Aluminum nitride sintered body, metal embedded article, electronic functional material and electrostatic chuck 117 1997
 
PHILIPS ELECTRONICS NORTH AMERICA CORPORATION (1)
4593243 Coplanar and stripline probe card apparatus 115 1984
 
SYNERGETICS USA, INC. (1)
6572608 Directional laser probe 122 2000
 
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (2)
6909300 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips 56 2002
6902941 Probing of device elements 100 2003
 
J.A. Woollam Co., Inc. (1)
6937341 System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation 86 2002
 
Sirotech Ltd. (1)
5824494 Method for enumerating bacterial populations 101 1995
 
GATAN, INC. (1)
6914244 Ion beam milling system and method for electron microscopy specimen preparation 90 2004
 
APPLE INC. (1)
5617035 Method for testing integrated devices 110 1995
 
Framatome Technologies, Inc. (1)
5756908 Probe positioner 42 1996
 
The United States of America as represented by the United States Department of Energy (2)
5523694 Integrated circuit failure analysis by low-energy charge-induced voltage alteration 122 1994
6307672 Microscope collision protection apparatus 82 1996
 
BOARD OF REGENTS OF THE UNIVERSITY OF WISCONSIN SYSTEM, THE, AN INSTITUTE OF WI (1)
5233306 Method and apparatus for measuring the permittivity of materials 132 1991
 
SMITHS GROUP PLC (1)
4706050 Microstrip devices 105 1985
 
KABUSHIKI KAISHA TOSHIBA (4)
5166893 Portable apparatus having a voltage converter unit removable from a base unit having a removable display unit 46 1992
5491425 Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same 10 1994
6605941 Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes 51 2001
7032307 Method for fabricating a probe pin for testing electrical characteristics of an apparatus 93 2004
 
WESTERNGECO L.L.C. (1)
6912468 Method and apparatus for contemporaneous utilization of a higher order probe in pre-stack and post-stack seismic domains 64 2003
 
RAYTHEON COMPANY (6)
4346355 Radio frequency energy launcher 96 1980
4502028 Programmable two-port microwave network 35 1982
5069628 Flexible electrical cable connector with double sided dots 72 1990
5395253 Membrane connector with stretch induced micro scrub 116 1993
5600256 Cast elastomer/membrane test probe assembly 78 1995
6211837 Dual-window high-power conical horn antenna 143 1999
 
TENCOR INSTRUMENTS (2)
4755746 Apparatus and methods for semiconductor wafer testing 156 1985
5852232 Acoustic sensor as proximity detector 144 1997
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (28)
4520314 Probe head arrangement for conductor line testing with at least one probe head comprising a plurality of resilient contacts 39 1982
4744041 Method for testing DC motors 119 1985
4851767 Detachable high-speed opto-electronic sampling probe 31 1988
4831494 Multilayer capacitor 160 1988
4922128 Boost clock circuit for driving redundant wordlines and sample wordlines 80 1989
4987100 Flexible carrier for an electronic device 82 1989
5001423 Dry interface thermal chuck temperature control system for semiconductor wafer testing 135 1990
5007163 Non-destructure method of performing electrical burn-in testing of semiconductor chips 68 1990
5207585 Thin interface pellicle for dense arrays of electrical interconnects 180 1990
5061192 High density connector 154 1990
5334931 Molded test probe assembly 93 1991
5371654 Three dimensional high performance interconnection package 331 1992
5537372 High density data storage system with topographic contact sensor 115 1993
5531022 Method of forming a three dimensional high performance interconnection package 221 1994
5532608 Ceramic probe card and method for reducing leakage current 66 1995
5804982 Miniature probe positioning actuator 106 1995
5726211 Process for making a foamed elastometric polymer 103 1996
5756021 Electronic devices comprising dielectric foamed polymers 89 1996
5700844 Process for making a foamed polymer 147 1996
5723347 Semi-conductor chip test probe and process for manufacturing the probe 108 1996
5838160 Integral rigid chip test probe 83 1996
5926029 Ultra fine probe contacts 108 1997
6059982 Micro probe assembly and method of fabrication 151 1997
5804607 Process for making a foamed elastomeric polymer 121 1997
6104201 Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage 72 1998
6206273 Structures and processes to create a desired probetip contact geometry on a wafer test probe 133 1999
6943571 Reduction of positional errors in a four point probe resistance measurement 62 2003
7007380 TFI probe I/O wrap test method 93 2004
 
OSRAM OPTO SEMICONDUCTORS GMBH (1)
6946864 Method for measuring product parameters of components formed on a wafer and device for performing the method 20 2002
 
ADVANCED MICRO DEVICES, INC. (1)
6396296 Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station 103 2000
 
U.S. BANK NATIONAL ASSOCIATION (1)
4926172 Joystick controller 57 1988
 
ELM TECHNOLOGY CORPORATION (2)
5020219 Method of making a flexible tester surface for testing integrated circuits 199 1989
5453404 Method for making an interconnection structure for integrated circuits 135 1994
 
DRNC HOLDINGS, INC. (1)
6987483 Effectively balanced dipole microstrip antenna 81 2003
 
ROBERT BOSCH GMBH (2)
6066911 Ultrasonic driving element 125 1998
6948981 Compact coupler plug, particularly for a planar broadband lambda probe, in which single-conductor seals are prevented from being lost 55 2002
 
EVERETT CHARLES TECHNOLOGIES, INC. (1)
5214374 Dual level test fixture 105 1991
 
HARRIS CORPORATION (3)
5854608 Helical antenna having a solid dielectric core 207 1994
6181297 Antenna 105 1998
6424316 Helical antenna 91 2000
 
ADE Corporation (1)
5642298 Wafer testing and self-calibration system 117 1996
 
Integral Technologies, Inc. (1)
7006046 Low cost electronic probe devices manufactured from conductive loaded resin-based materials 95 2004
 
TOTAL FINA ELF (1)
2002/0197,174 Electrical pump, and method for using plurality of submersible electrical pumps for well completion 0 2002
 
PROMOS TECHNOLOGIES INC. (1)
2003/0234,659 Electrical isolation between pins sharing the same tester channel 17 2002
 
FELTEN & GUILLEAUME ENERGIETECHNIK AG (1)
4972073 Light wave conductor-bending sensor with sliding rails for monitoring bridge structures or the like 46 1990
 
Semiconductor Diagnostics, Inc. (1)
6114865 Device for electrically contacting a floating semiconductor wafer having an insulating film 112 1999
 
HOUSTON ADVANCED RESEARCH CENTER, A CORP. OF TX (1)
5846708 Optical and electrical methods and apparatus for molecule detection 427 1992
 
LAM RESEARCH CORPORATION (1)
7015703 Radio frequency Langmuir probe 103 2004
 
BERTHOLD TECHNOLOGIES GMBH & CO. KG (1)
5369368 Device for determining material parameters by means of microwave measurements 81 1993
 
EDO CORPORATION, BARNES DIVISION (1)
4755874 Emission microscopy system 165 1987
 
TRIQUINT SEMICONDUCTOR, INC. (1)
4853627 Wafer probes 105 1988
 
STOVOKOR TECHNOLOGY LLC (2)
4991290 Flexible electrical interconnect and method of making 123 1989
5170930 Liquid metal paste for thermal and electrical connections 91 1991
 
Semco Machine Corporation (1)
5550481 Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making 42 1995
 
D-LINK CORPORATION (1)
6778140 Atch horn antenna of dual frequency 73 2003
 
RCA Corporation (1)
4651115 Waveguide-to-microstrip transition 82 1985
 
SHOSHOTECH CO., LTD. (1)
6351885 Method of making conductive bump on wiring board 64 1998
 
GENERAL ELECTRIC COMPANY (3)
6927598 Test probe for electrical devices having low or no wedge depression 58 2003
6911826 Pulsed eddy current sensor probes and inspection methods 64 2003
7015690 Omnidirectional eddy current probe and inspection system 100 2004
 
COMPAQ COMPUTER CORPORATION (1)
5500606 Completely wireless dual-access test fixture 115 1993
 
SEMATECH, INC. (2)
5159264 Pneumatic energy fluxmeter 80 1991
5159267 Pneumatic energy fluxmeter 82 1992
 
Interstitial, LLC (3)
5704355 Non-invasive system for breast cancer detection 151 1995
5829437 Microwave method and system to detect and locate cancers in heterogenous tissues 146 1996
6061589 Microwave antenna for cancer detection system 141 1997
 
RUDOLPH TECHNOLOGIES, INC. (1)
6710798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card 118 1999
 
MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH (1)
4551747 Leadless chip carrier apparatus providing for a transmission line environment and improved heat dissipation 128 1982
 
BROOKS AUTOMATION, INC. (1)
5539323 Sensor for articles such as wafers on end effector 126 1993
 
Yulim Hitech, Inc. (2)
6922069 Needle assembly of probe card 64 2003
7014499 Probe card for testing semiconductor device 96 2005
 
PICO TECHNOLOGY HOLDINGS, INC. (1)
6335625 Programmable active microwave ultrafine resonance spectrometer (PAMURS) method and systems 88 2000
 
HERSTEIN, DOV (1)
4810981 Assembly of microwave components 91 1987
 
GILBOE, DEREK (1)
7034553 Direct resistance measurement corrosion probe 96 2003
 
Temptronic Corporation (1)
6415858 Temperature control system for a workpiece chuck 99 1997
 
Carl-Zeiss-Stiftung (1)
4515439 Attachment of microscope objectives 82 1982
 
John H. Blanz Company, Inc. (3)
5097207 Temperature stable cryogenic probe station 107 1989
5160883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support 96 1990
5166606 High efficiency cryogenic test station 95 1990
 
FUJI PHOTO FILM CO., LTD. (1)
4727391 Sheet film package and device for loading sheet films 82 1987
 
SCIENCE & TECHNOLOGY CORPORATION @ UNM (1)
6549022 Apparatus and method for analyzing functional failures in integrated circuits 132 2000
 
BRUKER BIOSPIN CORPORATION (1)
6933725 NMR probe circuit for generating close frequency resonances 62 2004
 
XILINX, INC. (1)
6512482 Method and apparatus using a semiconductor die integrated antenna structure 94 2001
 
BARKER REVOCABLE TRUST U/A/D (1)
5202558 Flexible fiber optic probe for high-pressure shock experiments 103 1992
 
OKI SEMICONDUCTOR CO., LTD. (1)
6927078 Method of measuring contact resistance of probe and method of testing semiconductor device 62 2003
 
ADVANTEST (SINGAPORE) PTE. LTD. (2)
6812718 Massively parallel interface for electronic circuits 113 2001
6917525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs 116 2002
 
U.S. PHILIPS CORPORATION (2)
4568890 Microwave oscillator injection locked at its fundamental frequency for producing a harmonic frequency output 23 1983
4663840 Method of interconnecting conductors of different layers of a multilayer printed circuit board 74 1985
 
Siliconix Incorporated (1)
6476442 Pseudo-Schottky diode 102 1998
 
SUN MICROSYSTEMS, INC. (1)
* 5629838 Apparatus for non-conductively interconnecting integrated circuits using half capacitors 196 1994
 
UNIVERSITY OF KANSAS (1)
6937020 Solid-state nuclear magnetic resonance probe 65 2004
 
TSK AMERICA (1)
2001/0043,073 PROBER INTERFACE PLATE 74 1999
 
INTERSIL CORPORATION (1)
4528504 Pulsed linear integrated circuit tester 98 1982
 
The United States of America as represented by the Secretary of the Navy (4)
5361049 Transition from double-ridge waveguide to suspended substrate 51 1986
5091732 Lightweight deployable antenna system 89 1990
5430813 Mode-matched, combination taper fiber optic probe 60 1993
6940264 Near field probe 60 2004
 
TEKTRONIX, INC. (12)
4739259 Telescoping pin probe 100 1986
4673839 Piezoelectric pressure sensing apparatus for integrated circuit testing stations 124 1986
4734641 Method for the thermal characterization of semiconductor packaging systems 60 1987
4749942 Wafer probe head 84 1987
4912399 Multiple lead probe for integrated circuits in wafer form 122 1987
4783625 Wideband high impedance card mountable probe 95 1988
4965514 Apparatus for probing a microwave circuit 18 1989
5059898 Wafer probe with transparent loading member 78 1990
5136237 Double insulated floating high voltage test probe 108 1991
5412330 Optical module for an optically based measurement system 95 1993
6447339 Adapter for a multi-channel signal probe 87 2001
6701265 Calibration for vector network analyzer 94 2002
 
Ampex Corporation (1)
4375631 Joystick control 63 1981
 
XEROX CORPORATION (2)
4780670 Active probe card for high resolution/low noise wafer level testing 135 1985
6352454 Wear-resistant spring contacts 85 1999
 
SEIKO INSTRUMENTS INC. (1)
7015455 Near-field optical probe 93 2005
 
SILICON VALLEY BANK (4)
4893914 Test station 113 1988
5892539 Portable emission microscope workstation for failure analysis 127 1995
6744268 High resolution analytical probe station 126 2002
6917195 Wafer probe station 57 2004
 
YOKOWO CO., LTD. (7)
7019701 Antenna device mounted on vehicle 88 2004
6900647 Contact probe and probe device 105 2004
6903563 Contact probe and probe device 100 2004
6917211 Contact probe and probe device 57 2004
6919732 Contact probe and probe device 58 2004
6937042 Contact probe and probe device 58 2004
7015710 Contact probe and probe device 97 2004
 
DELAWARE CAPITAL FORMATION, INC. (5)
5408189 Test fixture alignment system for printed circuit boards 149 1992
5289117 Testing of integrated circuit devices on loaded printed circuit 54 1992
5389885 Expandable diaphragm test modules and connectors 97 1993
6181149 Grid array package test contactor 107 1996
6064218 Peripherally leaded package test contactor 105 1997
 
TRW INC. (2)
4468629 NPN Operational amplifier 80 1982
5126696 W-Band waveguide variable controlled oscillator 42 1991
 
AMP Incorporated (1)
4652082 Angled electro optic connector 56 1984
 
Olaer Industries (1)
4788851 Pressure vessel incorporating a sensor for detecting liquid in a gas chamber 44 1987
 
Riken Denshi Co., Ltd. (1)
4636772 Multiple function type D/A converter 50 1985
 
THE REGENTS OF THE UNIVERSITY OF MICHIGAN (1)
6906506 Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe 56 2002
 
3M INNOVATIVE PROPERTIES COMPANY (1)
6902416 High density probe device 75 2002
 
IBIDEN CO., LTD. (3)
2004/0021,475 Wafer prober 82 2003
2004/0134,899 Ceramic substrate for a semiconductor-production/inspection device 80 2003
2004/0207,072 Ceramic substrate for a semiconductor producing/examining device 85 2004
 
TELEFONAKTIEBOLAGET L M ERICSSON (PUBL) (1)
5996102 Assembly and method for testing integrated circuit devices 92 1997
 
ALERI, INC. (1)
6924655 Probe card for use with microelectronic components, and methods for making same 57 2003
 
NEWPORT FAB, LLC DBA JAZZ SEMICONDUCTOR (1)
6727716 Probe card and probe needle for high frequency testing 96 2002
 
GLUCOSET AS (1)
7003184 Fiber optic probes 110 2001
 
AT & T TECHNOLOGIES, INC., (1)
4837507 High frequency in-circuit test fixture 76 1987
 
UNIVERSITY OF MASSACHUSETTS (1)
5233197 High speed digital imaging microscope 113 1991
 
RPX CLEARINGHOUSE LLC (1)
6753679 Test point monitor using embedded passive resistance 84 2002
 
THE BOEING COMPANY (3)
4727637 Computer aided connector assembly method and apparatus 114 1987
5202648 Hermetic waveguide-to-microstrip transition module 63 1991
6914427 Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method 65 2003
 
UNIVERSITY OF MARYLAND, BALTIMORE (1)
6809533 Quantitative imaging of dielectric permittivity and tunability 79 2002
 
Fujikura Rubber Works, Ltd. (1)
4425395 Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production 105 1982
 
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5397855 Low noise cable 95 1993
 
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6211663 Baseband time-domain waveform measurement method 119 1999
6396298 Active feedback pulsed measurement method 96 2000
 
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6278411 Horn antenna 80 1999
 
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4621169 Electric cable construction and uses therefor 97 1985
 
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5041782 Microstrip probe 96 1989
 
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5505150 Method and apparatus for facilitating loop take time adjustment in multi-needle quilting machine 87 1994
 
GEC FERRANTI DEFENCE SYSTEMS LIMITED (1)
4714873 Microwave noise measuring apparatus 49 1986
 
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6653903 Supply voltage decoupling device for HF amplifier circuits 73 2001
 
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5728091 Optical fiber for myocardial channel formation 59 1995
 
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6100815 Compound switching matrix for probing and interconnecting devices under test to measurement equipment 119 1997
 
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5451884 Electronic component temperature test system with flat ring revolving carriage 102 1993
 
KOCH, LINDA (1)
4567436 Magnetic thickness gauge with adjustable probe 34 1982
 
Nebraska Electronics, Inc. (1)
5481196 Process and apparatus for microwave diagnostics and therapy 85 1994
 
ALPS ELECTRIC CO., LTD. (1)
4725793 Waveguide-microstrip line converter 89 1986
 
Yugen Kaisha Sozoan (1)
5481936 Rotary drive positioning system for an indexing table 115 1994
 
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6054869 Bi-level test fixture for testing printed circuit boards 97 1998
 
DYNEX SEMICONDUCTOR LIMITED (1)
6265950 Transition from a waveguide to a strip transmission line 94 1999
 
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5944093 Pickup chuck with an integral heat pipe 104 1997
7020363 Optical probe for wafer testing 101 2001
6856129 Current probe device having an integrated amplifier 92 2002
2006/0052,075 Testing integrated circuits using high bandwidth wireless technology 78 2004
2007/0145,989 Probe card with improved transient power delivery 28 2005
 
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5803607 Method and apparatus for measurement of unsteady gas temperatures 44 1997
 
Probe-Rite, Inc. (1)
4636722 High density probe-head with isolated and shielded transmission lines 158 1984
 
Nihon Denshizairyo Kabushiki Kaisha (1)
5134365 Probe card in which contact pressure and relative position of each probe end are correctly maintained 88 1991
 
GGB INDUSTRIES, INC. (4)
4871964 Integrated circuit probing apparatus 104 1988
5373231 Integrated circuit probing apparatus including a capacitor bypass structure 127 1993
6603322 Probe card for high speed testing 104 1996
6118287 Probe tip structure 104 1997
 
ARRAY BIOSCIENCE CORPORATION (1)
6707548 Systems and methods for filter based spectrographic analysis 113 2001
 
XANDEX, INC. (3)
5528158 Probe card changer system and method 105 1994
5506498 Probe card system and method 98 1995
6166553 Prober-tester electrical interface for semiconductor test 100 1998
 
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2005/0068,054 Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies 30 2004
 
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (2)
6049216 Contact type prober automatic alignment 94 1997
7012441 High conducting thin-film nanoprobe card and its fabrication method 106 2003
 
MASSACHUSETTS INSTITUTE OF TECHNOLOGY (2)
5653939 Optical and electrical methods and apparatus for molecule detection 486 1995
5998768 Active thermal control of surfaces by steering heating beam in response to sensed thermal radiation 109 1998
 
NEC CORPORATION (5)
4669805 High frequency connector 59 1985
6114864 Probe card with plural probe tips on a unitary flexible tongue 110 1997
6310483 Longitudinal type high frequency probe for narrow pitched electrodes 103 1998
6281691 Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable 103 1999
6400168 Method for fabricating probe tip portion composed by coaxial cable 104 2001
 
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6091236 System and method for measuring and analyzing electrical signals on the shaft of a machine 97 1997
 
NOTTERMAN, DANIEL A. (1)
2003/0072,549 Method and apparatus for dielectric spectroscopy of biological solutions 121 2002
 
SPAR AEROSPACE LIMITED (1)
5116180 Human-in-the-loop machine control loop 271 1990
 
NISSAN CHEMICAL INDUSTRIES, LTD. (1)
5021186 Chloroisocyanuric acid composition having storage stability 77 1989
 
NEC ELECTRONICS CORPORATION (1)
6320396 Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device 100 1997
 
PINNACLE PRODUCTS, INC. (1)
5807107 Dental infection control system 94 1996
 
NOVELLUS DEVELOPMENT COMPANY, LLC (1)
6946859 Probe structures using clamped substrates with compliant interconnectors 48 2003
 
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5676360 Machine tool rotary table locking apparatus 117 1995
 
ANRITSU COMPANY (4)
5905421 Apparatus for measuring and/or injecting high frequency signals in integrated systems 80 1997
6169410 Wafer probe with built in RF frequency conversion module 85 1998
6529844 Vector network measurement system 118 1999
6943563 Probe tone S-parameter measurements 59 2002
 
MicroCraft (1)
7188037 Method and apparatus for testing circuit boards 90 2004
 
BECHTEL BWXT IDAHO, LLC (1)
6147502 Method and apparatus for measuring butterfat and protein content using microwave absorption techniques 81 1998
 
Finch International Limited (1)
5281364 Liquid metal electrical contact compositions 14 1992
 
Research Organization for Circuit Knowledge (1)
5584120 Method of manufacturing printed circuits 80 1994
 
Junkosha Co., Ltd. (1)
4567321 Flexible flat cable 103 1984
 
FLUKE CORPORATION (1)
6384614 Single tip Kelvin probe 103 2000
 
Trigon (1)
4340860 Integrated circuit carrier package test probe 67 1980
 
ATMEL CORPORATION (1)
4649339 Integrated circuit interface 116 1984
 
INTEGRATED TECHNOLOGY CORPORATION (1)
6118894 Integrated circuit probe card inspection system 120 1997
 
SOLID STATE MEASUREMENTS, INC. (2)
6900652 Flexible membrane probe and method of use thereof 106 2003
7023231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof 94 2004
 
Solid State Farms, Inc. (1)
5792668 Radio frequency spectral analysis for in-vitro or in-vivo environments 218 1996
 
New Wave Research (3)
5811751 Multi-wavelength laser system, probe station and laser cutter system using the same 141 1997
6573702 Method and apparatus for cleaning electronic test contacts 104 1997
5963364 Multi-wavelength variable attenuator and half wave plate 120 1997
 
WENTWORTH LABORATORIES, INC. (4)
4975638 Test probe assembly for testing integrated circuit devices 155 1989
5355079 Probe assembly for testing integrated circuit devices 109 1993
5959461 Probe station adapter for backside emission inspection 123 1997
6031383 Probe station for low current, low voltage parametric measurements using multiple probes 110 1998
 
SAMSUNG ELECTRONICS CO., LTD. (3)
6970001 Variable impedance test probe 74 2003
6900653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof 106 2003
6909297 Probe card 56 2004
 
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM (1)
2003/0119,057 Forming and modifying dielectrically-engineered microparticles 136 2001
 
Albany Instruments, Inc. (1)
6933717 Sensors and probes for mapping electromagnetic fields 62 2004
 
Formfactor, et al. (1)
6937037 Probe card assembly for contacting a device with raised contact elements 65 2002
 
RENESAS ELECTRONICS CORPORATION (4)
6028435 Semiconductor device evaluation system using optical fiber 108 1997
6160407 Inspection method and wiring current observation method for semiconductor device and apparatus of the same 98 1998
6900646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof 97 2002
6551884 Semiconductor device including gate insulation films having different thicknesses 71 2002
 
EMTENSOR GMBH (1)
6490471 Electromagnetical imaging and therapeutic (EMIT) systems 96 2001
 
KABUSHIKI KAISHA NIHON MICRONICS (2)
5888075 Auxiliary apparatus for testing device 78 1997
6019612 Electrical connecting apparatus for electrically connecting a device to be tested 87 1998
 
GLOBALFOUNDRIES INC. (21)
5441690 Process of making pinless connector 76 1993
5810607 Interconnector with contact pads having enhanced durability 186 1995
5785538 High density test probe with rigid surface structure 116 1996
6268016 Manufacturing computer systems with fine line circuitized substrates 68 1996
6286208 Interconnector with contact pads having enhanced durability 87 1996
6054651 Foamed elastomers for wafer probing applications and interposer connectors 82 1996
6091255 System and method for tasking processing modules based upon temperature 141 1998
6062879 High density test probe with rigid surface structure 118 1998
6332270 Method of making high density integral test probe 151 1998
6608494 Single point high resolution time resolved photoemission microscopy system and method 111 1998
6452406 Probe structure having a plurality of discrete insulated probe tips 82 1999
6528984 Integrated compliant probe for wafer level test and burn-in 115 1999
6483327 Quadrant avalanche photodiode time-resolved detection 109 1999
6724928 Real-time photoemission detection system 97 2000
6488405 Flip chip defect analysis using liquid crystal 103 2000
6526655 Angled flying lead wire bonding process 126 2001
6617862 Laser intrusive technique for locating specific integrated circuit current paths 98 2002
6788093 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies 108 2002
7022976 Dynamically adjustable probe tips 98 2003
7011531 Membrane probe with anchored elements 93 2005
7005879 Device for probe card power bus noise reduction 94 2005
 
DH TECHNOLOGIES DEVELOPMENT PTE. LTD. (1)
6627461 Method and apparatus for detection of molecular events using temperature control of detection environment 100 2001
 
NXP USA, INC. (1)
5982166 Method for measuring a characteristic of a semiconductor wafer using cylindrical control 108 1997
 
CASCADE MICROTECH, INC. (38)
4697143 Wafer probe 202 1984
4764723 Wafer probe 91 1986
4827211 Wafer probe 127 1987
4858160 System for setting reference reactance for vector corrected measurements 99 1988
4849689 Microwave wafer probe having replaceable probe tip 128 1988
5012186 Electrical probe with contact force protection 42 1990
5045781 High-frequency active probe having replaceable contact needles 110 1991
5101453 Fiber optic wafer probe 102 1991
5266889 Wafer probe station with integrated environment control enclosure 136 1992
5457398 Wafer probe station having full guarding 123 1993
5506515 High-frequency probe tip assembly 160 1994
5610529 Probe station having conductive coating added to thermal chuck insulator 139 1995
5565788 Coaxial wafer probe with tip shielding 148 1995
5729150 Low-current probe card with reduced triboelectric current generating cables 138 1995
5914613 Membrane probing system with local contact scrub 121 1996
6232788 Wafer probe station for low-current measurements 88 1997
6232789 Probe holder for low current measurements 87 1997
6034533 Low-current pogo probe card 113 1997
6137302 Low-current probe card with reduced triboelectric current generating cables 113 1997
6256882 Membrane probing system 80 1998
6578264 Method for constructing a membrane probe using a depression 80 2000
6384615 Probe holder for low current measurements 42 2001
6549106 Waveguide with adjustable backshort 178 2001
7233160 Wafer probe 23 2001
6496024 Probe holder for testing of a test device 38 2002
6850082 Probe holder for testing of a test device 37 2002
6724205 Probe for combined signals 98 2002
6815963 Probe for testing a device under test 65 2003
6806724 Probe for combined signals 95 2003
7161363 Probe for testing a device under test 35 2004
6930498 Membrane probing system 58 2004
7009383 Wafer probe station having environment control enclosure 94 2004
7187188 Chuck with integrated wafer support 80 2004
2006/0184,041 System for testing semiconductors 34 2006
7332923 Test probe for high-frequency measurement 23 2006
7271603 Shielded probe for testing a device under test 35 2006
7403028 Test structure and probe for differential signals 25 2007
2008/0111,571 Membrane probing system 11 2008
 
NATIONAL SEMICONDUCTOR CORPORATION (4)
4757255 Environmental box for automated wafer probing 194 1986
5814847 General purpose assembly programmable multi-chip package substrate 97 1996
5883522 Apparatus and method for retaining a semiconductor wafer during testing 107 1996
7096133 Method of establishing benchmark for figure of merit indicative of amplifier flicker noise 73 2005
 
MERCK & CO., INC. (1)
7013221 Iterative probe design and detailed expression profiling with flexible in-situ synthesis arrays 96 2000
 
DELPHI TECHNOLOGIES, INC. (1)
7015709 Ultra-broadband differential voltage probes 103 2004
 
SARANTEL LIMITED (3)
6184845 Dielectric-loaded antenna 142 1997
6369776 Antenna 92 1999
6914580 Dielectrically-loaded antenna 83 2003
 
NORTEL NETWORKS LIMITED (1)
4853624 Tunable microwave wafer probe 93 1988
 
ABBOTT DIABETES CARE INC. (1)
2005/0165,316 Method for detecting artifacts in data 78 2004
 
GCB INDUSTRIES, INC. (1)
6229327 Broadband impedance matching probe 176 1997
 
GTE Valeron Corporation (1)
4401945 Apparatus for detecting the position of a probe relative to a workpiece 97 1981
 
OL SECURITY LIMITED LIABILITY COMPANY (1)
5688618 Millimeter wave device and method of making 42 1995
 
INTELLECTUAL VENTURES I LLC (1)
5633780 Electrostatic discharge protection device 134 1996
 
ELECTRONICS RESEARCH, INC. (1)
2004/0100,276 Method and apparatus for calibration of a vector network analyzer 101 2002
 
MENTOR GRAPHICS CORPORATION (1)
5383787 Integrated circuit package with direct access to internal signals 65 1993
 
CIRREX SYSTEMS, LLC (1)
6222970 Methods and apparatus for filtering an optical fiber 156 1999
 
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6628980 Apparatus, systems, and methods for in vivo magnetic resonance imaging 198 2001
 
INIZIATIVE MARITTIME 1991, S.R.L. (1)
5245292 Method and apparatus for sensing a fluid handling 75 1992
 
DEUTSCHE THOMSON-BRANDT GMBH (1)
4685150 Tuning of a resonant circuit in a communications receiver 53 1984
 
Aries Electronics, Inc. (1)
6937045 Shielded integrated circuit probe 66 2004
 
GTE Products Corporation (1)
4653174 Method of making packaged IC chip 28 1986
 
CIRCUIT COMPONENTS, INCORPORATED (1)
4793814 Electrical circuit board interconnect 321 1986
 
AEHR Test Systems (2)
6340895 Wafer-level burn-in and test cartridge 107 1999
6580283 Wafer level burn-in and test methods 88 1999
 
General Dielectric, Inc. (1)
2002/0050,828 Multi-feed microwave reflective resonant sensors 79 2001
 
Europaisches Laboratorium fur Molekularbiologie (EMBL) (2)
6798226 Multiple local probe measuring device and method 94 2002
6943574 Multiple local probe measuring device and method 64 2004
 
ABB POWER T&D COMPANY INC. (1)
4998063 Fiber optic coupled magneto-optic sensor having a concave reflective focusing surface 39 1989
 
EAST GIANT LIMITED (1)
5879289 Hand-held portable endoscopic camera 180 1996
 
Dimension Polyant Sailcloth, Inc. (1)
6013586 Tent material product and method of making tent material product 91 1997
 
ALSTOM (1)
5813847 Device and method for injecting fuels into compressed gaseous media 80 1996
 
CARDIFF AND VALE NHS TRUST (1)
2004/0175,294 Apparatus and method for analysing a biological sample in response to microwave radiation 76 2004
 
DCG SYSTEMS, INC. (2)
5530372 Method of probing a net of an IC at an optimal probe-point 119 1994
5675499 Optimal probe point placement 111 1996
 
HITACHI, LTD. (1)
2005/0186,696 Gas flowmeter and manufacturing method thereof 0 2005
 
COM DEV LTD. (1)
5841342 Voltage controlled superconducting microwave switch and method of operation thereof 43 1995
 
SKYWORKS SOLUTIONS, INC. (2)
6582979 Structure and method for fabrication of a leadless chip carrier with embedded antenna 93 2001
6770955 Shielded antenna in a semiconductor package 106 2001
 
BELL TELEPHONE LABORATORIES, INCORPORATED (1)
4684883 Method of manufacturing high-quality semiconductor light-emitting devices 97 1985
 
THK CO., LTD. (1)
4899998 Rotational positioning device 107 1988
 
EATON CORPORATION (2)
4904935 Electrical circuit board text fixture having movable platens 114 1988
5471185 Electrical circuit protection devices comprising conductive liquid compositions 32 1994
 
Genetronics, Inc. (1)
5869326 Electroporation employing user-configured pulsing scheme 122 1996
 
KEYSIGHT TECHNOLOGIES, INC. (4)
5493070 Measuring cable and measuring system 99 1994
6300775 Scattering parameter calibration system and method 130 1999
2004/0095,145 Method and apparatus for performing multiport through-reflect-line calibration and measurement 97 2002
2004/0199,350 System and method for determining measurement errors of a testing device 94 2003
 
SIEMENS AKTIENGESELLSCHAFT (2)
4805627 Method and apparatus for identifying the distribution of the dielectric constants in an object 110 1986
5095891 Connecting cable for use with a pulse generator and a shock wave generator 98 1987
 
TIOGA TECHNOLOGIES, INC. (1)
* 6459739 Method and apparatus for RF common-mode noise rejection in a DSL receiver 113 1999
 
MICROCONNECT LLC (3)
5621333 Contact device for making connection to an electronic circuit device 95 1995
6046599 Method and device for making connection 67 1997
6091256 Contact device for making connection to an electronic circuit device 65 1997
 
ROUND ROCK RESEARCH, LLC (1)
5126286 Method of manufacturing edge connected semiconductor die 166 1990
 
Vatell Corporation (1)
6278051 Differential thermopile heat flux transducer 100 2000
 
HP HOLDINGS THREE, INC. (1)
5995914 Method and apparatus for asynchronously measuring frequency shifted signals 103 1996
 
SARNOFF CORPORATION (1)
5993611 Capacitive denaturation of nucleic acid 150 1997
 
ASAHI KOGAKU KOGYO KABUSHIKI KAISHA (1)
5267088 Code plate mounting device 84 1990
 
W. L. GORE & ASSOCIATES, INC. (8)
4871883 Electro-magnetic shielding 121 1987
4859989 Security system and signal carrying member thereof 130 1987
5061823 Crush-resistant coaxial transmission line 136 1990
5107076 Easy strip composite dielectric coaxial signal cable 126 1991
5477011 Low noise signal transmission cable 113 1994
5896038 Method of wafer level burn-in 110 1996
6032714 Repeatably positionable nozzle assembly 79 1999
7015708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts 95 2003
 
Premtek International Inc. (1)
2005/0116,730 DOUBLE-FACED DETECTING DEVICES FOR AN ELECTRONIC SUBSTRATE 27 2003
 
Biotronic Systems Corporation (1)
5082627 Three dimensional binding site array for interfering with an electrical field 87 1987
 
NITTO DENKO CORPORATION (1)
5977783 Multilayer probe for measuring electrical characteristics 65 1997
 
CROWN PRODUCTS, INC. (1)
7019541 Electric conductivity water probe 97 2004
 
FREESCALE SEMICONDUCTOR, INC. (4)
5172050 Micromachined semiconductor probe card 277 1991
5177438 Low resistance probe for semiconductor 176 1991
5467024 Integrated circuit test with programmable source for both AC and DC modes of operation 86 1993
5666063 Method and apparatus for testing an integrated circuit 108 1996
 
CALIFORNIA INSTITUTE OF TECHNOLOGY (1)
5138289 Noncontacting waveguide backshort 42 1990
 
NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6759859 Resilient and rugged multi-layered probe 34 2001
 
FAIRCHILD SEMICONDUCTOR CORPORATION (1)
5357211 Pin driver amplifier 84 1993
 
JPK Instruments AG (1)
7022985 Apparatus and method for a scanning probe microscope 99 2002
 
JPMORGAN CHASE BANK, N.A. (1)
5678210 Method and apparatus of coupling a transmitter to a waveguide in a remote ground terminal 44 1995
 
MEDICAL COLLEGE OF GEORGIA RESEARCH INSTITUTE, INC. (1)
5488954 Ultrasonic transducer and method for using same 146 1994
 
MAGMA DESIGN AUTOMATION, INC. (1)
5030907 CAD driven microprobe integrated circuit tester 113 1989
 
TESSERA, INC. (1)
5808874 Microelectronic connections with liquid conductive elements 92 1996
 
WINBOND ELECTRONICS CORP. (1)
6611417 Wafer chuck system 83 2001
 
iTerra Communications, LLC (1)
* 6794934 High gain wideband driver amplifier 103 2001
 
HITACHI SOFTWARE ENGINEERING CO., LTD. (1)
7035738 Probe designing apparatus and probe designing method 94 2002
 
SWCC SHOWA CABLE SYSTEMS CO., LTD. (1)
6944380 Optical fiber for transmitting ultraviolet ray, optical fiber probe, and method of manufacturing the optical fiber probe 67 2002
 
QUALCOMM INCORPORATED (1)
6737920 Variable gain amplifier 78 2002
 
STAR TECHNOLOGIES, INC. (2)
6906543 Probe card for electrical testing a chip in a wide temperature range 64 2003
7253646 Probe card with tunable stage and at least one replaceable probe 11 2005
 
HITACHI ULSI SYSTEMS CO., LTD. (1)
6734687 Apparatus for detecting defect in device and method of detecting defect 112 2001
 
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY (6)
4983910 Millimeter-wave active probe 73 1988
4916002 Microcasting of microminiature tips 138 1989
5003253 Millimeter-wave active probe system 79 1989
5847569 Electrical contact probe for sampling high frequency electrical signals 98 1996
5981268 Hybrid biosensors 160 1997
6051422 Hybrid biosensors 135 1998
 
PREMIER MICROWAVE OF CALIFORNIA, INC. (1)
4740764 Pressure sealed waveguide to coaxial line connection 45 1987
 
SAE MAGNETICS (H.K.) LTD. (1)
7015689 Connection method for probe pins for measurement of characteristics of thin-film magnetic head and characteristic measurement method for thin-film magnetic head 95 2003
 
ERICSSON INC. (1)
5949383 Compact antenna structures including baluns 119 1997
 
CHIPMOS TECHNOLOGIES INC. (1)
6946860 Modularized probe head 56 2003
 
LAURENCE J. MARHOEFER (1)
5097101 Method of forming a conductive contact bump on a flexible substrate and a flexible substrate 96 1991
 
RENISHAW PLC (2)
5270664 Probe for measuring surface roughness by sensing fringe field capacitance effects 127 1992
6909983 Calibration of an analogue probe 66 2002
 
EASTMAN KODAK COMPANY (1)
5848500 Light-tight enclosure and joint connectors for enclosure framework 114 1997
 
MEDICAL DEVICE INNOVATIONS LIMITED (1)
2006/0155,270 Tissue ablation apparatus and method of ablating tissue 168 2003
 
UNISYS CORPORATION (1)
4553111 Printed circuit board maximizing areas for component utilization 32 1983
* Cited By Examiner

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
UNIVERSITY OF VIRGINIA (1)
9366697 Micromachined on-wafer probes and related method 0 2011
 
TERADYNE, INC. (2)
9435855 Interconnect for transmitting signals between a device and a tester 0 2013
9594114 Structure for transmitting signals in an application space between a device under test and test electronics 0 2014
* Cited By Examiner

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