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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address	Total Patents
CASCADE MICROTECH, INC.	BEAVERTON, OR	139

International Classification(s)

• G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Campbell, Richard	Portland , US	24	120

Cited Art Landscape

Patent Info	(Count)	# Cites	Year
Other [Check patent profile for assignment information] (36)
4284682 Heat sealable, flame and abrasion resistant coated fabric		126	1980
4383217 Collinear four-point probe head and mount for resistivity measurements		88	1981
4480223 Unitary probe assembly		136	1981
4641659 Medical diagnostic microwave scanning apparatus		113	1982
4563640 Fixed probe board		42	1982
4515133 Fuel economizing device		77	1984
4812754 Circuit board interfacing apparatus		118	1987
4711563 Portable collapsible darkroom		90	1987
4791363 Ceramic microstrip probe blade		137	1987
4988062 Apparatus, system and method for organizing and maintaining a plurality of medical catheters and the like		95	1988
4922912 MAP catheter		121	1988
* 5129006 Electronic audio signal amplifier and loudspeaker system		24	1989
5363050 Quantitative dielectric imaging system		115	1990
5414565 Tilting kinematic mount		85	1991
5187443 Microwave test fixtures for determining the dielectric properties of a material		80	1992
5584608 Anchored cable sling system		87	1994
5670322 Multi site molecule detection method		181	1995
5670888 Method for transporting and testing wafers		128	1995
5621400 Ice detection method and apparatus for an aircraft		42	1995
5744971 Device and apparatus for measuring dielectric properties of materials		97	1995
5831442 Handling device		96	1996
5675932 Plant growing system		93	1996
5949579 Flexible darkness adapting viewer		89	1997
6307363 Ultrahigh-frequency high-impedance passive voltage probe		52	1998
* RE37130 Signal conditioning apparatus		30	1998
6147851 Method for guarding electrical regions having potential gradients		92	1999
6327034 Apparatus for aligning two objects		93	1999
6548311 Device and method for detecting analytes		142	2000
2001/0002,794 Split resistor probe and method		79	2001
2002/0030,480 Apparatus for the automated testing, calibration and characterization of test adapters		12	2001
6587327 Integrated broadband ceramic capacitor array		117	2002
2003/0076,585 Optical system for enhancing the image from a microscope's high power objective lens		31	2002
2003/0139,662 Method and apparatus for detecting, identifying and performing operations on microstructures including, anthrax spores, brain cells, cancer cells, living tissue cells, and macro-objects including stereotactic neurosurgery instruments, weapons and explosives		85	2002
7015707 Micro probe		121	2003
2004/0193,382 Method and apparatus for calibrating a multiport test system for measurement of a DUT		100	2004
2006/0030,060 Apparatus and method for testing defects		39	2005
AUTOCYTE NORTH CAROLINA, L.L.C. (1)
5659421 Slide positioning and holding device		110	1995
GENERAL ELECTRIC MEDICAL SYSTEMS ISRAEL LTD., AN ISRAEL CORPORATION AFFILIATED WITH GENERAL ELECTRIC COMPANY (1)
4691163 Dual frequency surface probes		116	1985
Stiftesen Institutet for Microvagsteknik (1)
4476363 Method and device for heating by microwave energy		33	1983
DAINIPPON SCREEN MFG. CO., LTD. (2)
4531474 Rotary board treating apparatus		89	1984
4746857 Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer		96	1986
CONIFER CORPORATION (1)
5293175 Stacked dual dipole MMDS feed		146	1993
KDC TECHNOLOGY CORP. (1)
5227730 Microwave needle dielectric sensors		105	1992
Kraftwerk Union Aktiengesellschaft (1)
4642417 Concentric three-conductor cable		115	1985
BLUE LEAF I.P., INC. (2)
5316435 Three function control system		50	1992
5360312 Three function control mechanism		48	1992
SIERRA MONOLITHICS, INC. (1)
6639461 Ultra-wideband power amplifier module apparatus and method for optical and electronic communications		82	2001
HUGHES ELECTRONICS CORPORATION (7)
4727319 Apparatus for on-wafer testing of electrical circuits		75	1985
4772846 Wafer alignment and positioning apparatus for chip testing by voltage contrast electron microscopy		140	1986
4908570 Method of measuring FET noise parameters		43	1987
5313157 Probe for jesting an electrical circuit chip		93	1992
5583445 Opto-electronic membrane probe		103	1994
5611008 Substrate system for optoelectronic/microwave circuits		88	1996
5623214 Multiport membrane probe for full-wafer testing		109	1996
CROWN CORK & SEAL TECHNOLOGIES CORPORATION (1)
6130536 Preform test fixture and method of measuring a wall thickness		37	1998
ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG (1)
2004/0066,181 High-frequency probe tip		82	2003
NORTHROP GRUMMAN CORPORATION (2)
4581679 Multi-element circuit construction		102	1985
2005/0026,276 Remote detection and analysis of chemical and biological aerosols		80	2003
BROADCOM CORPORATION (1)
7088981 Apparatus for reducing flicker noise in a mixer circuit		112	2001
BRUKER NANO, INC. (2)
5376790 Scanning probe microscope		116	1992
5672816 Large stage system for scanning probe microscopes and other instruments		119	1995
PROFILE TECHNOLOGIES, INC. (1)
2001/0044,152 Dual beam, pulse propagation analyzer, medical profiler interferometer		73	2001
NORTHROP GRUMMAN SYSTEMS CORPORATION (2)
5479109 Testing device for integrated circuits on wafer		118	1994
6040739 Waveguide to microstrip backshort with external spring compression		75	1998
GARMIN CORPORATION (1)
5966645 Transmitter with low-level modulation and minimal harmonic emissions		42	1997
NIKON CORPORATION (2)
6628503 Gas cooled electrostatic pin chuck for vacuum applications		110	2001
2002/0176,160 Microscope system		44	2002
HEWLETT-PACKARD COMPANY (2)
4795962 Floating driver circuit and a device for measuring impedances of electrical components		95	1987
5133119 Shearing stress interconnection apparatus and method		66	1991
HITACHI CONSUMER ELECTRONICS CO., LTD. (1)
7012871 Information recording method and apparatus with suppressed mark edge jitters		76	2004
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. (4)
4839587 Test fixture for tab circuits and devices		154	1988
5198753 Integrated circuit test fixture and method		129	1990
5691503 Electro-magnetically shielded door hinge		41	1994
2004/0201,388 Support for an electronic probe and related methods		42	2003
BLACKBERRY LIMITED (1)
6794950 Waveguide to microstrip transition		87	2001
Hughes Aircraft Company (5)
4918373 R.F. phase noise test set using fiber optic delay line		52	1988
4835495 Diode device packaging arrangement		41	1988
5326412 Method for electrodepositing corrosion barrier on isolated circuitry		74	1992
5512835 Electrical probe and method for measuring gaps and other discontinuities in enclosures using electrical inductance for RF shielding assessment		75	1992
5412866 Method of making a cast elastomer/membrane test probe assembly		123	1993
SANTRONICS, INC. (1)
7030599 Hand held voltage detection probe		101	2004
ISC CO., LTD. (1)
7071722 Anisotropic, conductive sheet and impedance measuring probe		35	2003
TEXAS INSTRUMENTS INCORPORATED (13)
4888550 Intelligent multiprobe tip		92	1983
5128612 Disposable high performance test head		26	1990
5159752 Scanning electron microscope based parametric testing method and apparatus		119	1990
5225037 Method for fabrication of probe card for testing of semiconductor devices		216	1991
5317656 Fiber optic network for multi-point emissivity-compensated semiconductor wafer pyrometry		74	1993
5511010 Method and apparatus of eliminating interference in an undersettled electrical signal		93	1994
6292760 Method and apparatus to measure non-coherent signals		93	1998
6906539 High density, area array probe card apparatus		57	2001
6911834 Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probing		57	2002
* 6741129 Differential amplifier slew rate boosting scheme		34	2002
7026833 Multiple-chip probe and universal tester contact assemblage		101	2005
7327153 Analog built-in self-test module		31	2005
7323899 System and method for resumed probing of a wafer		19	2006
INTERMEC IP CORP. (1)
6236223 Method and apparatus for wireless radio frequency testing of RFID integrated circuits		204	1999
SENSOR DIAGNOSTICS, INC. (1)
4713347 Measurement of ligand/anti-ligand interactions using bulk conductance		215	1985
OMNIPROBE, INC. (1)
6420722 Method for sample separation and lift-out with one cut		127	2001
MICRON TECHNOLOGY, INC. (11)
4970386 Vertical FET high speed optical sensor		43	1989
5487999 Method for fabricating a penetration limited contact having a rough textured surface		171	1994
5686317 Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die		239	1995
5869974 Micromachined probe card having compliant contact members for testing semiconductor wafers		172	1996
6071009 Semiconductor wirebond machine leadframe thermal map system		45	1997
6181144 Semiconductor probe card having resistance measuring circuitry and method fabrication		177	1998
6194720 Preparation of transmission electron microscope samples		110	1998
6359456 Probe card and test system for semiconductor wafers		115	2001
6924653 Selectively configurable microelectronic probes		59	2002
7026835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad		93	2002
7009188 Lift-out probe having an extension tip, methods of making and using, and analytical instruments employing same		97	2004
HAMAMATSU PHOTONICS K.K. (1)
4922186 Voltage detector		82	1988
SANTEC CORPORATION (1)
7323680 Optical deflection probe and optical deflection probe device		21	2006
ANDO ELECTRIC CO., LTD. (1)
2001/0054,906 Probe card and a method of manufacturing the same		78	2001
TECHSEARCH, L.L.C. (2)
4600907 Coplanar microstrap waveguide interconnector and method of interconnection		55	1985
4626805 Surface mountable microwave IC package		61	1985
THOMAS JEFFERSON UNIVERSITY (1)
5478748 Protein assay using microwave energy		89	1994
GOOGLE INC. (2)
5793213 Method and apparatus for calibrating a network analyzer		94	1996
6078500 Pluggable chip scale package		106	1998
MDS INC. (5)
6376258 Resonant bio-assay device and test system for detecting molecular binding events		137	2000
6340568 Method for detecting and classifying nucleic acid hybridization		84	2001
6566079 Methods for analyzing protein binding events		104	2001
2003/0032,000 Method for analyzing cellular events		95	2001
2002/0168,659 System and method for characterizing the permittivity of molecular events		75	2002
CREDENCE SYSTEMS CORPORATION (1)
5883523 Coherent switching power for an analog circuit tester		105	1997
MITSUBISHI GAS CHEMICAL COMPANY, INC. (1)
6222031 Process for preparing water-soluble tricarboxypolysaccharide		83	1998
SHARP KABUSHIKI KAISHA (3)
4899126 Thick film resistor type printed circuit board		98	1989
5089774 Apparatus and a method for checking a semiconductor		129	1990
5374938 Waveguide to microstrip conversion means in a satellite broadcasting adaptor		95	1993
SHARP LABORATORIES OF AMERICA, INC. (1)
7057404 Shielded probe for testing a device under test		22	2003
MEDISPECTRA, INC. (1)
2004/0186,382 Spectral volume microprobe arrays		83	2003
CERPROBE CORPORATION (1)
6002426 Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits		114	1997
EADS DEUTSCHLAND GMBH (1)
6636182 Structural antenna for flight aggregates or aircraft		74	2001
LION APPAREL, INC. (1)
5157790 Firefighter garment with lumbar support		49	1991
RELIABILITY INCORPORATED (1)
2002/0070,745 Cooling system for burn-in unit		85	2000
AVAGO TECHNOLOGIES ECBU IP (SINGAPORE) PTE. LTD. (1)
5066357 Method for making flexible circuit card with laser-contoured vias and machined capacitors		108	1990
AGILENT TECHNOLOGIES, INC. (32)
4980637 Force delivery system for improved precision membrane probe		100	1988
4918383 Membrane probe with automatic contact scrub action		158	1988
4906920 Self-leveling membrane probe		206	1988
5172051 Wide bandwidth passive probe		111	1991
5298972 Method and apparatus for measuring polarization sensitivity of optical devices		111	1991
5274336 Capacitively-coupled test probe		140	1992
5308250 Pressure contact for connecting a coaxial shield to a microstrip ground plane		30	1992
5463324 Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like		48	1993
5507652 Wedge connector for integrated circuits		40	1995
5578932 Method and apparatus for providing and calibrating a multiport network analyzer		148	1995
5945836 Loaded-board, guided-probe test fixture		131	1996
5923180 Compliant wafer prober docking adapter		72	1997
5940965 Method of making multiple lead voltage probe		30	1997
5903143 Probe apparatus with RC circuit connected between ground and a guard		94	1997
6060888 Error correction method for reflection measurements of reciprocal devices in vector network analyzers		113	1998
6251595 Methods and devices for carrying out chemical reactions		124	1998
6175228 Electronic probe for measuring high impedance tri-state logic circuits		84	1998
6271673 Probe for measuring signals		105	1999
6407562 Probe tip terminating device providing an easily changeable feed-through termination		95	1999
2001/0024,116 Electronic probe for measuring high impedance tri-state logic circuits		79	2001
6643597 Calibrating a test system using unknown standards		119	2001
6717426 Blade-like connecting needle		79	2002
6768328 Single point probe structure and method		77	2002
6864694 Voltage probe		91	2002
2004/0140,819 Differential voltage probe		32	2003
2005/0030,047 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration		86	2003
7025628 Electronic probe extender		114	2003
2004/0162,689 Multiport network analyzer calibration employing reciprocity of a device		95	2004
6933713 High bandwidth oscilloscope probe with replaceable cable		58	2004
7005868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe		94	2004
7030328 Liquid metal switch employing micro-electromechanical system (MEMS) structures for actuation		13	2004
7026834 Multiple two axis floating probe block assembly using split probe block		93	2005
DERMON, JOHN A. (1)
4980638 Microcircuit probe and method for manufacturing same		26	1989
NORTH STAR INNOVATIONS INC. (1)
6127831 Method of testing a semiconductor device by automatically measuring probe tip parameters		106	1997
LEXMARK INTERNATIONAL, INC. (1)
6154238 Scanning print head		42	1997
KLA-TENCOR CORPORATION (2)
6633174 Stepper type test structures and methods for inspection of semiconductor integrated circuits		105	2000
6771806 Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices		148	2000
SV PROBE PTE LTD. (9)
5521518 Probe card apparatus		136	1991
5180977 Membrane probe contact bump compliancy system		145	1991
5422574 Large scale protrusion membrane for semiconductor devices under test with very high pin counts		183	1993
5720098 Method for making a probe preserving a uniform stress distribution under deflection		118	1995
5742174 Membrane for holding a probe tip in proper location		135	1995
5623213 Membrane probing of circuits		97	1996
6037785 Probe card apparatus		109	1996
5973504 Programmable high-density electronic device testing		101	1997
6908364 Method and apparatus for probe tip cleaning and shaping pad		58	2001
DEBIOTECH S.A. (1)
7005078 Micromachined fluidic device and method for making same		178	2001
MATTSON TECHNOLOGY, INC. (1)
6172337 System and method for thermal processing of a semiconductor substrate		105	1999
ADVANTEST AMERICA, INC (2)
6295729 Angled flying lead wire bonding process		127	1998
6708403 Angled flying lead wire bonding process		120	2003
WICO DISTRIBUTION CORP. (1)
4558609 Joystick controller with interchangeable handles		29	1983
HYNIX SEMICONDUCTOR INC. (1)
7002364 Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same		96	2003
CANON KABUSHIKI KAISHA (7)
4755747 Wafer prober and a probe card to be used therewith		109	1985
4864227 Wafer prober		132	1988
4929893 Wafer prober		160	1988
5145552 Process for preparing electrical connecting member		68	1990
5304924 Edge detector		99	1992
5731920 Converting adapter for interchangeable lens assembly		95	1995
5685232 Positioning stage device exposure apparatus and device manufacturing method utilizing the same		116	1996
VEECO INSTRUMENTS ACQUISITION CORP. (1)
4707657 Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine		150	1985
CHENG, DAVID (1)
5479108 Method and apparatus for handling wafers		158	1992
ENDEVCO CORPORATION (1)
5214243 High-temperature, low-noise coaxial cable assembly with high strength reinforcement braid		130	1991
LUCENT TECHNOLOGIES INC. (3)
5970429 Method and apparatus for measuring electrical noise in devices		132	1997
6121836 Differential amplifier		37	1998
6245692 Method to selectively heat semiconductor wafers		91	1999
VEECO METROLOGY INC. (1)
7001785 Capacitance probe for thin dielectric film characterization		100	2004
TELEDYNE LECROY, INC. (3)
6822463 Active differential test probe with a transmission line input structure		77	2002
6870359 Self-calibrating electrical test probe		40	2002
7019544 Transmission line input structure test probe		96	2004
NUCLEAR FILTER TECHNOLOGY, INC. (1)
6948391 Probe with integral vent, sampling port and filter element		65	2003
MURATA MANUFACTURING CO., LTD. (1)
6838885 Method of correcting measurement error and electronic component characteristic measurement apparatus		101	2003
MOTOROLA, INC. (4)
4453142 Microstrip to waveguide transition		113	1981
4646005 Signal probe		100	1984
5561378 Circuit probe for measuring a differential circuit		32	1994
5748506 Calibration technique for a network analyzer		96	1996
M/A-COM TECHNOLOGY SOLUTIONS HOLDINGS, INC. (1)
5142224 Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals		105	1991
M/A-COM, INC. (1)
4376920 Shielded radio frequency transmission cable		143	1981
MITSUBISHI DENKI KABUSHIKI KAISHA (6)
5408188 High frequency wafer probe including open end waveguide		77	1992
5493236 Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis		191	1994
6144212 Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card		112	1998
6242929 Probe needle for vertical needle type probe card and fabrication thereof		90	1998
6404213 Probe stylus		85	1999
7173433 Circuit property measurement method		19	2005
STMICROELECTRONICS S.A. (2)
6146908 Method of manufacturing a test circuit on a silicon wafer		32	1999
6480013 Method for the calibration of an RF integrated circuit probe		101	2000
Thomson Hybrides et Microondes (1)
4901012 Circuit for measuring the dynamic characteristics of a package for high-speed integrated circuits and a method for measuring said dynamic characteristics		39	1987
ST. CLAIR INTELLECTUAL PROPERTY CONSULTANTS, INC. (1)
4904933 Integrated circuit probe station		114	1986
SIGNATURE BIOSCIENCESM INC. (1)
6395480 Computer program and database structure for detecting molecular binding events		109	1999
WI-LAN INC. (2)
5565881 Balun apparatus including impedance transformer having transformation length		84	1994
5628057 Multi-port radio frequency signal transformation network		100	1996
TDK RF SOLUTIONS, INC. (1)
6657601 Metrology antenna system utilizing two-port, sleeve dipole and non-radiating balancing network		78	2001
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP (2)
6233613 High impedance probe for monitoring fast ethernet LAN links		97	1997
7002133 Detecting one or more photons from their interactions with probe photons in a matter system		93	2003
BENHOV GMBH, LLC (1)
6418009 Broadband multi-layer capacitor		88	2000
TDK CORPORATION (2)
5510792 Anechoic chamber and wave absorber		95	1994
7012425 Eddy-current probe		95	2005
THOMSON-CSF (1)
4742571 Coupling device between a metal wave guide, a dielectric wave guide and a semiconductor component and a mixer using this coupling device		88	1986
Iwasaki Correspond Industry Co., Ltd. (1)
6933737 Probe card		56	2003
Kaiser Optical Systems (1)
6907149 Compact optical measurement probe		65	2003
REMOLEAUX TECHNOLOGIES AG, LLC (1)
5686960 Image input device having optical deflection elements for capturing multiple sub-images		161	1994
KEITHLEY INSTRUMENTS, INC. (1)
6104206 Product wafer junction leakage measurement using corona and a kelvin probe		128	1997
ELK FINANCIAL, INC. (2)
6064217 Fine pitch contact device employing a compliant conductive polymer bump		134	1996
2002/0011,859 METHOD FOR FORMING CONDUCTIVE BUMPS FOR THE PURPOSE OF CONTRRUCTING A FINE PITCH TEST DEVICE		114	1998
TOKYO OHKA KOGYO CO., LTD. (1)
5571324 Rotary-cup coating apparatus		104	1994
Hypervision, Inc. (1)
5475316 Transportable image emission microscope		140	1993
MTU MOTOREN- UND TURBINEN-UNION MUENCHEN GMBH (1)
5232789 Structural component with a protective coating having a nickel or cobalt basis and method for making such a coating		92	1992
SMSC ANALOG TECHNOLOGY, INC. (1)
6753699 Integrated circuit and method of controlling output impedance		81	2002
SINGULUS TECHNOLOGIES GMBH (1)
5876082 Device for gripping and holding substrates		70	1997
ADVANTEST CORPORATION (8)
5172049 IC test equipment		133	1991
5644248 Test head cooling system		84	1995
5767690 Test head cooling system		92	1997
6191596 Method for detecting a contact position between an object to be measured and measuring pins		81	1998
6174744 Method of producing micro contact structure and contact probe using same		138	2000
2002/0011,863 IC chip tester with heating element for preventing condensation		89	2001
7020360 Wavelength dispersion probing system		94	2002
6937040 Probe module and a testing apparatus		61	2004
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. (4)
6927079 Method for probing a semiconductor wafer		105	2000
6605951 Interconnector and method of connecting probes to a die for functional analysis		108	2000
6617866 Apparatus and method of protecting a probe card during a sort sequence		36	2001
7023225 Wafer-mounted micro-probing platform		94	2003
MITEL SEMICONDUCTOR LIMITED (1)
5764070 Structure for testing bare integrated circuit devices		66	1996
Tokyo Shibaura Denki Kabushiki Kaisha (1)
4491783 Apparatus for measuring noise factor and available gain		30	1982
TECHNOPROBE S.R.L. (1)
2002/0070,743 Testing head having vertical probes		96	2001
MOLECULAR DEVICES, INC. (1)
5164319 Multiple chemically modulated capacitance determination		326	1989
Data Probe Corporation (1)
4588950 Test system for VLSI digital circuit and method of testing		97	1983
Honeywell Inc. (1)
5347204 Position dependent rate dampening in any active hand controller		58	1992
KAI TECHNOLOGIES, INC. (1)
6275738 Microwave devices for medical hyperthermia, thermotherapy and diagnosis		146	1999
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (4)
5594358 Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line		98	1994
5794133 Microwave mixing circuit		84	1996
6806836 Helical antenna apparatus provided with two helical antenna elements, and radio communication apparatus provided with same helical antenna apparatus		76	2003
7219416 Method of manufacturing a magnetic element		22	2004
WALES ABERYSTWYTH, UNIVERSITY OF (1)
5569591 Analytical or monitoring apparatus and method		158	1994
SONY CORPORATION (4)
5669316 Turntable for rotating a wafer carrier		101	1993
6362792 Antenna apparatus and portable radio set		79	2000
6366247 Antenna device and portable radio set		83	2000
8035987 Electronic device having a groove partitioning functional and mounting parts from each other		35	2007
Spectroscopy Imaging Systems Corporation (1)
4916398 Efficient remote transmission line probe tuning for NMR apparatus		95	1988
FormFactor, Inc. (156)
5476211 Method of manufacturing electrical contacts, using a sacrificial member		375	1993
5917707 Flexible contact structure with an electrically conductive shell		315	1994
6049976 Method of mounting free-standing resilient electrical contact structures to electronic components		124	1995
5772451 Sockets for electronic components and methods of connecting to electronic components		412	1995
5974662 Method of planarizing tips of probe elements of a probe card assembly		374	1995
5829128 Method of mounting resilient contact structures to semiconductor devices		236	1995
5852871 Method of making raised contacts on electronic components		144	1995
5601740 Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires		116	1995
5820014 Solder preforms		127	1996
5773780 Method of severing bond wires and forming balls at their ends		77	1996
5900738 Contact structure device for interconnections, interposer, semiconductor assembly and package using the same and method		149	1996
5926951 Method of stacking electronic components		178	1996
6184587 Resilient contact structures, electronic interconnection component, and method of mounting resilient contact structures to electronic components		124	1996
6242803 Semiconductor devices with integral contact structures		94	1996
6274823 Interconnection substrates with resilient contact structures on both sides		128	1996
6476333 Raised contact structures (solder columns)		73	1996
6064213 Wafer-level burn-in and test		265	1997
5806181 Contact carriers (tiles) for populating larger substrates with spring contacts		279	1997
5994152 Fabricating interconnects and tips using sacrificial substrates		243	1997
6442831 Method for shaping spring elements		74	1997
6482013 Microelectronic spring contact element and electronic component having a plurality of spring contact elements		158	1997
5832601 Method of making temporary connections between electronic components		201	1997
5864946 Method of making contact tip structures		173	1997
5878486 Method of burning-in semiconductor devices		110	1997
5884398 Mounting spring elements on semiconductor devices		106	1997
5983493 Method of temporarily, then permanently, connecting to a semiconductor device		120	1997
5998228 Method of testing semiconductor		130	1997
6032356 Wafer-level test and burn-in, and semiconductor process		164	1997
6184053 Method of making microelectronic spring contact elements		203	1997
5912046 Method and apparatus for applying a layer of flowable coating material to a surface of an electronic component		81	1997
5998864 Stacking semiconductor devices, particularly memory chips		209	1997
6050829 Making discrete power connections to a space transformer of a probe card assembly		161	1997
6307161 Partially-overcoated elongate contact structures		74	1997
6043563 Electronic components with terminals and spring contact elements extending from areas which are remote from the terminals		168	1997
6741085 Contact carriers (tiles) for populating larger substrates with spring contacts		95	1997
6520778 Microelectronic contact structures, and methods of making same		157	1998
6720501 PC board having clustered blind vias		71	1998
6042712 Apparatus for controlling plating over a face of a substrate		117	1998
6090261 Method and apparatus for controlling plating over a face of a substrate		84	1998
6110823 Method of modifying the thickness of a plating on a member by creating a temperature gradient on the member, applications for employing such a method, and structures resulting from such a method		189	1998
6023103 Chip-scale carrier for semiconductor devices including mounted spring contacts		160	1998
6033935 Sockets for "springed" semiconductor devices		110	1998
6669489 Interposer, socket and assembly for socketing an electronic component and method of making and using same		116	1998
6330164 Interconnect assemblies and methods including ancillary electronic component connected in immediate proximity of semiconductor device		127	1998
6029344 Composite interconnection element for microelectronic components, and method of making same		219	1998
6246247 Probe card assembly and kit, and methods of using same		127	1998
6441315 Contact structures with blades having a wiping motion		128	1998
6690185 Large contactor with multiple, aligned contactor units		140	1998
6255126 Lithographic contact elements		228	1998
6268015 Method of making and using lithographic contact springs		127	1998
6150186 Method of making a product with improved material properties by moderate heat-treatment of a metal incorporating a dilute additive		103	1998
6429029 Concurrent design and subsequent partitioning of product and test die		167	1998
6456099 Special contact points for accessing internal circuitry of an integrated circuit		121	1998
6215670 Method for manufacturing raised electrical contact pattern of controlled geometry		136	1999
6208225 Filter structures for integrated circuit interfaces		158	1999
6218910 High bandwidth passive integrated circuit tester probe card assembly		144	1999
6448865 Integrated circuit interconnect system		75	1999
6452411 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses		109	1999
6480978 Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons		86	1999
6499121 Distributed interface for parallel testing of multiple devices using a single tester channel		99	1999
6627483 Method for mounting an electronic component		101	1999
6644982 Method and apparatus for the transport and tracking of an electronic component		120	1999
6887723 Method for processing an integrated circuit including placing dice into a carrier and testing		76	1999
6468098 Electrical contactor especially wafer level contactor using fluid pressure		99	1999
6655023 Method and apparatus for burning-in semiconductor devices in wafer form		84	1999
6827584 Interconnect for microelectronic structures with enhanced spring characteristics		93	1999
6491968 Methods for making spring interconnect structures		102	1999
6672875 Spring interconnect structures		112	1999
6339338 Apparatus for reducing power supply noise in an integrated circuit		91	2000
6168974 Process of mounting spring contacts to semiconductor devices		115	2000
6459343 Integrated circuit interconnect system forming a multi-pole filter		71	2000
6232149 Sockets for "springed" semiconductor devices		79	2000
6509751 Planarizer for a semiconductor contactor		143	2000
6215196 Electronic component with terminals and spring contact elements extending from areas which are remote from the terminals		72	2000
6640432 Method of fabricating shaped springs		107	2000
6677744 System for measuring signal path resistance for an integrated circuit tester interconnect structure		71	2000
6476630 Method for testing signal paths between an integrated circuit wafer and a wafer tester		75	2000
6525555 Wafer-level burn-in and test		102	2000
6727579 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES		102	2000
6685817 Method and apparatus for controlling plating over a face of a substrate		65	2000
6622103 System for calibrating timing of an integrated circuit wafer tester		93	2000
6603323 Closed-grid bus architecture for wafer interconnect structure		90	2000
6727580 Microelectronic spring contact elements		79	2000
6539531 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes		119	2000
6835898 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES		85	2000
6778406 Resilient contact structures for interconnecting electronic devices		135	2000
6475822 Method of making microelectronic contact structures		91	2000
6597187 Special contact points for accessing internal circuitry of an integrated circuit		76	2000
6603324 Special contact points for accessing internal circuitry of an integrated circuit		72	2000
6606575 Cross-correlation timing calibration for wafer-level IC tester interconnect systems		85	2000
6621260 Special contact points for accessing internal circuitry of an integrated circuit		80	2000
6701612 Method and apparatus for shaping spring elements		90	2000
6713374 Interconnect assemblies and methods		104	2000
6836962 Method and apparatus for shaping spring elements		78	2000
6538538 High frequency printed circuit board via		91	2001
6791176 Lithographic contact elements		79	2001
6616966 Method of making lithographic contact springs		128	2001
6780001 Forming tool for forming a contoured microelectronic spring mold		75	2001
6501343 Integrated circuit tester with high bandwidth probe assembly		94	2001
6606014 Filter structures for integrated circuit interfaces		63	2001
6534856 Sockets for "springed" semiconductor devices		90	2001
6910268 Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via		144	2001
6856150 Probe card with coplanar daughter card		86	2001
6627980 Stacked semiconductor device assembly with microelectronic spring contacts		82	2001
6538214 Method for manufacturing raised electrical contact pattern of controlled geometry		78	2001
6882239 Electromagnetically coupled interconnect system		90	2001
6888362 Test head assembly for electronic components with plurality of contoured microelectronic spring contacts		97	2001
6729019 Method of manufacturing a probe card		111	2001
6678876 Process and apparatus for finding paths through a routing space		92	2001
6862727 Process and apparatus for adjusting traces		69	2001
6764869 Method of assembling and testing an electronics module		71	2001
6714828 Method and system for designing a probe card		74	2001
6882546 Multiple die interconnect system		75	2001
6664628 Electronic component overlapping dice of unsingulated semiconductor wafer		70	2001
6456103 Apparatus for reducing power supply noise in an integrated circuit		89	2001
6759311 Fan out of interconnect elements attached to semiconductor wafer		71	2001
6817052 Apparatuses and methods for cleaning test probes		94	2001
6816031 Adjustable delay transmission line		73	2001
6624648 Probe card assembly		120	2001
6777319 Microelectronic spring contact repair		81	2001
6479308 Semiconductor fuse covering		70	2001
6615485 Probe card assembly and kit, and methods of making same		96	2001
6891385 Probe card cooling assembly with direct cooling of active electronic components		94	2001
7002363 Method and system for compensating thermally induced motion of probe cards		122	2001
6741092 Method and system for detecting an arc condition		63	2001
6864105 Method of manufacturing a probe card		70	2002
6680659 Integrated circuit interconnect system		74	2002
6784674 Test signal distribution system for IC tester		76	2002
6798225 Tester channel to multiple IC terminals		80	2002
6825422 Interconnection element with contact blade		83	2002
6812691 Compensation for test signal degradation due to DUT fault		70	2002
6640415 Segmented contactor		111	2002
6657455 Predictive, adaptive power supply for an integrated circuit under test		83	2002
6807734 Microelectronic contact structures, and methods of making same		79	2002
6559671 Efficient parallel testing of semiconductor devices using a known good device to generate expected responses		75	2002
6646520 Integrated circuit interconnect system		76	2002
6839964 Method for manufacturing a multi-layer printed circuit board		68	2002
6686754 Integrated circuit tester with high bandwidth probe assembly		75	2002
6678850 Distributed interface for parallel testing of multiple devices using a single tester channel		74	2002
6818840 Method for manufacturing raised electrical contact pattern of controlled geometry		68	2002
6642625 Sockets for "springed" semiconductor devices		66	2002
6661316 High frequency printed circuit board via		71	2002
6825052 Test assembly including a test die for testing a semiconductor product die		86	2002
6788094 Wafer-level burn-in and test		78	2002
6845491 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes		73	2003
6784677 Closed-grid bus architecture for wafer interconnect structure		66	2003
7342402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features		25	2003
6911835 High performance probe system		87	2003
6838893 Probe card assembly		75	2003
6870381 Insulative covering of probe tips		64	2003
6911814 Apparatus and method for electromechanical testing and validation of probe cards		77	2003
6913468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods		92	2003
6949942 Predictive, adaptive power supply for an integrated circuit under test		46	2003
6822529 Integrated circuit interconnect system		73	2003
6917210 Integrated circuit tester with high bandwidth probe assembly		69	2003
7276922 Closed-grid bus architecture for wafer interconnect structure		23	2004
SONY ELECTRONICS INC. (1)
2007/0024,506 Systems and methods for high frequency parallel transmissions		79	2006
Semitest, Inc. (1)
4891584 Apparatus for making surface photovoltage measurements of a semiconductor		138	1988
WISCONSIN ALUMNI RESEARCH FOUNDATION (1)
2003/0088,180 Space-time microwave imaging for cancer detection		117	2002
NXP B.V. (1)
6275043 Test device for testing a module for a data carrier intended for contactless communication		41	1999
OLYMPUS CORPORATION (1)
4696544 Fiberscopic device for inspection of internal sections of construction, and method for using same		136	1985
SUMITOMO WIRING SYSTEMS, LTD. (1)
5627473 Connector inspection device		44	1995
DIT-MCO INTERNATIONAL CORPORATION (1)
4357575 Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies		116	1980
SEMILAB SEMICONDUCTOR PHYSICS LABORATORY, CO., LTD. (1)
6388455 Method and apparatus for simulating a surface photo-voltage in a substrate		42	2000
MCC GESELLSCHAFT FUR DIAGNOSESYSTEME IN MEDIZIN UND TECHNIK MBH & CO. KG (1)
2005/0168,722 Device and method for measuring constituents in blood		46	2003
OPTOMETRIX, INC. (1)
6181416 Schlieren method for imaging semiconductor device properties		84	1999
FRESH QUEST CORPORATION (1)
5589781 Die carrier apparatus		74	1993
SEMICONDUCTOR PHYSICS LABORATORY, INC. (1)
6052653 Spreading resistance profiling system		100	1997
MESO SCALE TECHNOLOGIES, LLC. (1)
2005/0142,033 Modular assay plates, reader systems and methods for test measurements		123	2004
TERADYNE, INC. (1)
6784679 Differential coaxial contact array for high-density, high-speed signals		93	2002
Microwave Imaging Systems Technologies, Inc. (2)
5841288 Two-dimensional microwave imaging apparatus and methods		125	1997
6448788 Fixed array microwave imaging apparatus and method		112	2000
SUMITOMO ELECTRIC INDUSTRIES, LTD. (1)
4818059 Optical connector and splicer		87	1987
AG Communication Systems Corporation (1)
4684884 Universal test circuit for integrated circuit packages		79	1985
OLYMPUS OPTICAL CO., LTD. (3)
5367165 Cantilever chip for scanning probe microscope		78	1993
6006002 Rigid sleeve device fitted over a flexible insertion section of an endoscope for inspecting industrial equipment		56	1995
6811406 Microelectronic spring with additional protruding member		196	2001
HYPRES, INC. (1)
4894612 Soft probe for providing high speed on-wafer connections to a circuit		158	1988
ELECTRIC POWER RESEARCH INSTITUTE, INC. (1)
4487996 Shielded electrical cable		106	1982
COMMSCOPE, INC. OF NORTH CAROLINA (1)
6407542 Implementation of a multi-port modal decomposition system		42	2000
SNAP-ON TECHNOLOGIES, INC. (1)
6940283 Detecting field from different ignition coils using adjustable probe		55	2003
MARTEK, INC. (3)
5656942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane		111	1995
6096567 Method and apparatus for direct probe sensing		146	1997
6320372 Apparatus and method for testing a substrate having a plurality of terminals		102	1999
XCERRA CORPORATION (1)
7015711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method		107	2004
L-3 COMMUNICATIONS ELECTRON TECHNOLOGIES, INC. (1)
5148131 Coaxial-to-waveguide transducer with improved matching		43	1991
TERAVIEW LIMITED (1)
7315175 Probe apparatus and method for examining a sample		21	2002
MATRA BAE DYNAMICS (UK) (1)
5266963 Integrated antenna/mixer for the microwave and millimetric wavebands		54	1991
NCR CORPORATION (1)
6816840 System and method of sending messages to a group of electronic price labels		37	1998
VEGA GRIESHABER KG (1)
7030827 Planar antenna and antenna system		75	2004
INTEST CORPORATION (2)
5900737 Method and apparatus for automated docking of a test head to a device handler		116	1996
6259260 Apparatus for coupling a test head and probe card in a wafer testing system		11	1998
PURDUE RESEARCH FOUNDATION (1)
2004/0147,034 Method and apparatus for measuring a substance in a biological sample		139	2003
INTEST IP CORPORATION (2)
4589815 Electronic test head positioner for test systems		50	1983
4705447 Electronic test head positioner for test systems		139	1985
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6528993 Magneto-optical microscope magnetometer		80	2000
GILLESPIE, ROBB S. (1)
6481939 Tool tip conductivity contact sensor and method		91	2001
LOGICVISION, INC. (1)
2005/0229,053 Circuit and method for low frequency testing of high frequency signal waveforms		31	2004
MARTIN MARIETTA CORPORATION (1)
5867073 Waveguide to transmission line transition		86	1994
PS4 LUXCO S.A.R.L. (1)
7319337 Method and apparatus for pad aligned multiprobe wafer testing		20	2007
SCHLUMBERGER TECHNOLOGY CORPORATION (1)
4766384 Well logging apparatus for determining dip, azimuth, and invaded zone conductivity		101	1986
The United States of America as represented by the Secretary of the Army (2)
6201453 H-plane hermetic sealed waveguide probe		17	1998
6731804 Thermal luminescence liquid monitoring system and method		81	2000
STORAGE TECHNOLOGY CORPORATION (1)
5469324 Integrated decoupling capacitive core for a printed circuit board and method of making same		122	1994
The United States of America as represented by the Secretary of the Air Force (4)
4754239 Waveguide to stripline transition assembly		91	1986
5631571 Infrared receiver wafer level probe testing		146	1996
6215295 Photonic field probe and calibration means thereof		115	1998
2003/0170,898 Method for intracellular modifications within living cells using pulsed electric fields		127	2002
Trio-Tech International (1)
6605955 Temperature controlled wafer chuck system with low thermal resistance		109	2000
HITACHI HIGH-TECH SCIENCE CORPORATION (1)
6621082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function		100	2002
TRUSTEES OF DARTMOUTH COLLEGE (1)
5833601 Methodology for determining oxygen in biological systems		85	1997
WINWAY TECHNOLOGY CO., LTD. (1)
6927586 Temperature compensated vertical pin probing device		62	2003
JEOL RESONANCE INC. (1)
6914430 NMR probe		59	2004
APPLIED MATERIALS, INC. (5)
5916689 Electrostatic chuck with an impregnated, porous layer that exhibits the Johnson-Rahbeck effect		129	1996
5874361 Method of processing a wafer within a reaction chamber		108	1996
6257564 Vacuum chuck having vacuum-nipples wafer support		108	1998
6232787 Microstructure defect detection		163	1999
7319335 Configurable prober for TFT LCD array testing		20	2004
GYRUS MEDICAL LIMITED (1)
6409724 Electrosurgical instrument		302	2000
TOKYO ELECTRON LIMITED (35)
4998062 Probe device having micro-strip line structure		91	1989
5084671 Electric probing-test machine having a cooling system		193	1990
5091692 Probing test device		116	1990
5198752 Electric probing-test machine having a cooling system		156	1991
5315237 Touch sensor unit of prober for testing electric circuit and electric circuit testing apparatus using the touch sensor unit		113	1991
5321352 Probe apparatus and method of alignment for the same		133	1992
5321453 Probe apparatus for probing an object held above the probe card		103	1992
5635846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer		193	1993
5404111 Probe apparatus with a swinging holder for an object of examination		114	1993
5517126 Probe apparatus		134	1993
5521522 Probe apparatus for testing multiple integrated circuit dies		144	1993
5539676 Method of identifying probe position and probing method in prober		94	1994
5811982 High density cantilevered probe for electronic devices		181	1996
5777485 Probe method and apparatus with improved probe contact		119	1996
5910727 Electrical inspecting apparatus with ventilation system		90	1996
5821763 Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof		227	1996
5804983 Probe apparatus with tilt correction mechanisms		152	1997
6334247 High density integrated circuit apparatus, test probe and methods of use thereof		149	1997
5914614 High density cantilevered probe for electronic devices		98	1997
5999268 Apparatus for aligning a semiconductor wafer with an inspection contactor		119	1997
6060892 Probe card attaching mechanism		99	1997
6300780 High density integrated circuit apparatus, test probe and methods of use thereof		126	1998
6124725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer		137	1998
6329827 High density cantilevered probe for electronic devices		76	1998
6414478 Transfer mechanism for use in exchange of probe card		80	2000
6722032 Method of forming a structure for electronic devices contact locations		64	2001
7005842 Probe cartridge assembly and multi-probe assembly		93	2001
6933736 Prober		58	2003
6927587 Probe apparatus		65	2003
6906542 Probing method and prober		61	2003
6794888 Probe device		76	2003
7026832 Probe mark reading device and probe mark reading method		96	2003
7009415 Probing method and probing apparatus		95	2004
7023226 Probe pins zero-point detecting method, and prober		93	2004
7332918 Prober and probe testing method for temperature-controlling object to be tested		29	2005
NGK INSULATORS, LTD. (2)
5280156 Wafer heating apparatus and with ceramic substrate and dielectric layer having electrostatic chucking means		221	1991
6001760 Aluminum nitride sintered body, metal embedded article, electronic functional material and electrostatic chuck		117	1997
PHILIPS ELECTRONICS NORTH AMERICA CORPORATION (1)
4593243 Coplanar and stripline probe card apparatus		115	1984
SYNERGETICS USA, INC. (1)
6572608 Directional laser probe		107	2000
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (2)
6909300 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips		56	2002
6902941 Probing of device elements		100	2003
J.A. WOOLLAM CO., INC. (1)
6937341 System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation		86	2002
Sirotech Ltd. (1)
5824494 Method for enumerating bacterial populations		99	1995
GATAN, INC. (1)
6914244 Ion beam milling system and method for electron microscopy specimen preparation		90	2004
GOOGLE TECHNOLOGY HOLDINGS LLC (2)
5751153 Method and apparatus for characterizing a multiport circuit		40	1996
5751252 Method and antenna for providing an omnidirectional pattern		97	1997
APPLE INC. (1)
5617035 Method for testing integrated devices		110	1995
FRAMATOME TECHNOLOGIES, INC. (1)
5756908 Probe positioner		42	1996
The United States of America as represented by the United States Department of Energy (2)
5523694 Integrated circuit failure analysis by low-energy charge-induced voltage alteration		122	1994
6307672 Microscope collision protection apparatus		82	1996
BOARD OF REGENTS OF THE UNIVERSITY OF WISCONSIN SYSTEM, THE, AN INSTITUTE OF WI (1)
5233306 Method and apparatus for measuring the permittivity of materials		130	1991
SMITHS GROUP PLC (1)
4706050 Microstrip devices		103	1985
KABUSHIKI KAISHA TOSHIBA (4)
5166893 Portable apparatus having a voltage converter unit removable from a base unit having a removable display unit		46	1992
5491425 Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same		10	1994
6605941 Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes		50	2001
7032307 Method for fabricating a probe pin for testing electrical characteristics of an apparatus		93	2004
WESTERNGECO L.L.C. (1)
6912468 Method and apparatus for contemporaneous utilization of a higher order probe in pre-stack and post-stack seismic domains		64	2003
RAYTHEON COMPANY (6)
4346355 Radio frequency energy launcher		95	1980
4502028 Programmable two-port microwave network		32	1982
5069628 Flexible electrical cable connector with double sided dots		72	1990
5395253 Membrane connector with stretch induced micro scrub		116	1993
5600256 Cast elastomer/membrane test probe assembly		78	1995
6211837 Dual-window high-power conical horn antenna		109	1999
TENCOR INSTRUMENTS (2)
4755746 Apparatus and methods for semiconductor wafer testing		156	1985
5852232 Acoustic sensor as proximity detector		144	1997
INTERNATIONAL BUSINESS MACHINES CORPORATION (28)
4520314 Probe head arrangement for conductor line testing with at least one probe head comprising a plurality of resilient contacts		39	1982
4744041 Method for testing DC motors		119	1985
4851767 Detachable high-speed opto-electronic sampling probe		31	1988
4831494 Multilayer capacitor		160	1988
4922128 Boost clock circuit for driving redundant wordlines and sample wordlines		80	1989
4987100 Flexible carrier for an electronic device		82	1989
5001423 Dry interface thermal chuck temperature control system for semiconductor wafer testing		135	1990
5007163 Non-destructure method of performing electrical burn-in testing of semiconductor chips		67	1990
5207585 Thin interface pellicle for dense arrays of electrical interconnects		180	1990
5061192 High density connector		152	1990
5334931 Molded test probe assembly		93	1991
5371654 Three dimensional high performance interconnection package		309	1992
5537372 High density data storage system with topographic contact sensor		115	1993
5531022 Method of forming a three dimensional high performance interconnection package		211	1994
5532608 Ceramic probe card and method for reducing leakage current		65	1995
5804982 Miniature probe positioning actuator		106	1995
5726211 Process for making a foamed elastometric polymer		103	1996
5756021 Electronic devices comprising dielectric foamed polymers		89	1996
5700844 Process for making a foamed polymer		147	1996
5723347 Semi-conductor chip test probe and process for manufacturing the probe		108	1996
5838160 Integral rigid chip test probe		83	1996
5926029 Ultra fine probe contacts		108	1997
6059982 Micro probe assembly and method of fabrication		151	1997
5804607 Process for making a foamed elastomeric polymer		121	1997
6104201 Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage		72	1998
6206273 Structures and processes to create a desired probetip contact geometry on a wafer test probe		122	1999
6943571 Reduction of positional errors in a four point probe resistance measurement		62	2003
7007380 TFI probe I/O wrap test method		93	2004
OSRAM OPTO SEMICONDUCTORS GMBH (1)
6946864 Method for measuring product parameters of components formed on a wafer and device for performing the method		20	2002
ADVANCED MICRO DEVICES, INC. (1)
6396296 Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station		103	2000
U.S. BANK NATIONAL ASSOCIATION (1)
4926172 Joystick controller		56	1988
ELM TECHNOLOGY CORPORATION (2)
5020219 Method of making a flexible tester surface for testing integrated circuits		182	1989
5453404 Method for making an interconnection structure for integrated circuits		134	1994
DRNC HOLDINGS, INC. (1)
6987483 Effectively balanced dipole microstrip antenna		81	2003
ROBERT BOSCH GMBH (2)
6066911 Ultrasonic driving element		125	1998
6948981 Compact coupler plug, particularly for a planar broadband lambda probe, in which single-conductor seals are prevented from being lost		55	2002
EVERETT CHARLES TECHNOLOGIES, INC. (1)
5214374 Dual level test fixture		105	1991
HARRIS CORPORATION (3)
5854608 Helical antenna having a solid dielectric core		168	1994
6181297 Antenna		104	1998
6424316 Helical antenna		90	2000
ADE CORPORATION (1)
5642298 Wafer testing and self-calibration system		116	1996
INTEGRAL TECHNOLOGIES, INC. (1)
7006046 Low cost electronic probe devices manufactured from conductive loaded resin-based materials		95	2004
TOTAL FINA ELF (1)
2002/0197,174 Electrical pump, and method for using plurality of submersible electrical pumps for well completion		0	2002
PROMOS TECHNOLOGIES INC. (1)
2003/0234,659 Electrical isolation between pins sharing the same tester channel		17	2002
FELTEN & GUILLEAUME ENERGIETECHNIK AG (1)
4972073 Light wave conductor-bending sensor with sliding rails for monitoring bridge structures or the like		46	1990
SEMICONDUCTOR DIAGNOSTICS, INC. (1)
6114865 Device for electrically contacting a floating semiconductor wafer having an insulating film		112	1999
HOUSTON ADVANCED RESEARCH CENTER, A CORP. OF TX (1)
5846708 Optical and electrical methods and apparatus for molecule detection		410	1992
LAM RESEARCH CORPORATION (1)
7015703 Radio frequency Langmuir probe		103	2004
BERTHOLD TECHNOLOGIES GMBH & CO. KG (1)
5369368 Device for determining material parameters by means of microwave measurements		81	1993
EDO CORPORATION, BARNES DIVISION (1)
4755874 Emission microscopy system		165	1987
TRIQUINT SEMICONDUCTOR, INC. (1)
4853627 Wafer probes		104	1988
STOVOKOR TECHNOLOGY LLC (2)
4991290 Flexible electrical interconnect and method of making		121	1989
5170930 Liquid metal paste for thermal and electrical connections		90	1991
SEMCO MACHINE CORPORATION (1)
5550481 Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making		42	1995
D-LINK CORPORATION (1)
6778140 Atch horn antenna of dual frequency		73	2003
RCA Corporation (1)
4651115 Waveguide-to-microstrip transition		82	1985
SHOSHOTECH CO., LTD. (1)
6351885 Method of making conductive bump on wiring board		64	1998
GENERAL ELECTRIC COMPANY (3)
6927598 Test probe for electrical devices having low or no wedge depression		58	2003
6911826 Pulsed eddy current sensor probes and inspection methods		64	2003
7015690 Omnidirectional eddy current probe and inspection system		100	2004
COMPAQ COMPUTER CORPORATION (1)
5500606 Completely wireless dual-access test fixture		114	1993
SEMATECH, INC. (2)
5159264 Pneumatic energy fluxmeter		80	1991
5159267 Pneumatic energy fluxmeter		82	1992
INTERSTITIAL, LLC (3)
5704355 Non-invasive system for breast cancer detection		147	1995
5829437 Microwave method and system to detect and locate cancers in heterogenous tissues		143	1996
6061589 Microwave antenna for cancer detection system		136	1997
RUDOLPH TECHNOLOGIES, INC. (1)
6710798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card		115	1999
MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH (1)
4551747 Leadless chip carrier apparatus providing for a transmission line environment and improved heat dissipation		126	1982
BROOKS AUTOMATION, INC. (1)
5539323 Sensor for articles such as wafers on end effector		126	1993
Yulim Hitech, Inc. (2)
6922069 Needle assembly of probe card		63	2003
7014499 Probe card for testing semiconductor device		96	2005
PICO TECHNOLOGY HOLDINGS, INC. (1)
6335625 Programmable active microwave ultrafine resonance spectrometer (PAMURS) method and systems		87	2000
HERSTEIN, DOV (1)
4810981 Assembly of microwave components		91	1987
GILBOE, DEREK (1)
7034553 Direct resistance measurement corrosion probe		96	2003
TEMPTRONIC CORPORATION (1)
6415858 Temperature control system for a workpiece chuck		98	1997
Carl-Zeiss-Stiftung (1)
4515439 Attachment of microscope objectives		82	1982
John H. Blanz Company, Inc. (3)
5097207 Temperature stable cryogenic probe station		107	1989
5160883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support		96	1990
5166606 High efficiency cryogenic test station		95	1990
FUJI PHOTO FILM CO., LTD. (1)
4727391 Sheet film package and device for loading sheet films		82	1987
SCIENCE & TECHNOLOGY CORPORATION @ UNM (1)
6549022 Apparatus and method for analyzing functional failures in integrated circuits		130	2000
BRUKER BIOSPIN CORPORATION (1)
6933725 NMR probe circuit for generating close frequency resonances		62	2004
XILINX, INC. (1)
6512482 Method and apparatus using a semiconductor die integrated antenna structure		93	2001
Sandia Corporation (1)
6078183 Thermally-induced voltage alteration for integrated circuit analysis		132	1998
BARKER REVOCABLE TRUST U/A/D (1)
5202558 Flexible fiber optic probe for high-pressure shock experiments		103	1992
OKI SEMICONDUCTOR CO., LTD. (1)
6927078 Method of measuring contact resistance of probe and method of testing semiconductor device		62	2003
ADVANTEST (SINGAPORE) PTE. LTD. (2)
6812718 Massively parallel interface for electronic circuits		112	2001
6917525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs		116	2002
EMIMAGING LTD (2)
5715819 Microwave tomographic spectroscopy system and method		159	1994
6490471 Electromagnetical imaging and therapeutic (EMIT) systems		95	2001
U.S. PHILIPS CORPORATION (2)
4568890 Microwave oscillator injection locked at its fundamental frequency for producing a harmonic frequency output		23	1983
4663840 Method of interconnecting conductors of different layers of a multilayer printed circuit board		74	1985
SILICONIX INCORPORATED (1)
6476442 Pseudo-Schottky diode		101	1998
SUN MICROSYSTEMS, INC. (1)
* 5629838 Apparatus for non-conductively interconnecting integrated circuits using half capacitors		192	1994
UNIVERSITY OF KANSAS (1)
6937020 Solid-state nuclear magnetic resonance probe		65	2004
TSK AMERICA, INC. (1)
2001/0043,073 PROBER INTERFACE PLATE		74	1999
INTERSIL CORPORATION (1)
4528504 Pulsed linear integrated circuit tester		98	1982
The United States of America as represented by the Secretary of the Navy (4)
5361049 Transition from double-ridge waveguide to suspended substrate		50	1986
5091732 Lightweight deployable antenna system		89	1990
5430813 Mode-matched, combination taper fiber optic probe		60	1993
6940264 Near field probe		60	2004
TEKTRONIX, INC. (12)
4739259 Telescoping pin probe		100	1986
4673839 Piezoelectric pressure sensing apparatus for integrated circuit testing stations		124	1986
4734641 Method for the thermal characterization of semiconductor packaging systems		60	1987
4749942 Wafer probe head		84	1987
4912399 Multiple lead probe for integrated circuits in wafer form		122	1987
4783625 Wideband high impedance card mountable probe		95	1988
4965514 Apparatus for probing a microwave circuit		18	1989
5059898 Wafer probe with transparent loading member		78	1990
5136237 Double insulated floating high voltage test probe		107	1991
5412330 Optical module for an optically based measurement system		95	1993
6447339 Adapter for a multi-channel signal probe		87	2001
6701265 Calibration for vector network analyzer		94	2002
AMPEX CORPORATION (1)
4375631 Joystick control		63	1981
XEROX CORPORATION (2)
4780670 Active probe card for high resolution/low noise wafer level testing		135	1985
6352454 Wear-resistant spring contacts		84	1999
SEIKO INSTRUMENTS INC. (1)
7015455 Near-field optical probe		93	2005
SILICON VALLEY BANK (4)
4893914 Test station		112	1988
5892539 Portable emission microscope workstation for failure analysis		127	1995
6744268 High resolution analytical probe station		124	2002
6917195 Wafer probe station		56	2004
YOKOWO CO., LTD. (7)
7019701 Antenna device mounted on vehicle		86	2004
6900647 Contact probe and probe device		105	2004
6903563 Contact probe and probe device		100	2004
6917211 Contact probe and probe device		57	2004
6919732 Contact probe and probe device		58	2004
6937042 Contact probe and probe device		58	2004
7015710 Contact probe and probe device		97	2004
DELAWARE CAPITAL FORMATION, INC. (5)
5408189 Test fixture alignment system for printed circuit boards		149	1992
5289117 Testing of integrated circuit devices on loaded printed circuit		54	1992
5389885 Expandable diaphragm test modules and connectors		97	1993
6181149 Grid array package test contactor		105	1996
6064218 Peripherally leaded package test contactor		105	1997
TRW INC. (2)
4468629 NPN Operational amplifier		80	1982
5126696 W-Band waveguide variable controlled oscillator		42	1991
AMP Incorporated (1)
4652082 Angled electro optic connector		56	1984
Olaer Industries (1)
4788851 Pressure vessel incorporating a sensor for detecting liquid in a gas chamber		44	1987
Riken Denshi Co., Ltd. (1)
4636772 Multiple function type D/A converter		50	1985
THE REGENTS OF THE UNIVERSITY OF MICHIGAN (1)
6906506 Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe		56	2002
3M INNOVATIVE PROPERTIES COMPANY (1)
6902416 High density probe device		75	2002
IBIDEN CO., LTD. (3)
2004/0021,475 Wafer prober		82	2003
2004/0134,899 Ceramic substrate for a semiconductor-production/inspection device		80	2003
2004/0207,072 Ceramic substrate for a semiconductor producing/examining device		85	2004
TELEFONAKTIEBOLAGET L M ERICSSON (PUBL) (1)
5996102 Assembly and method for testing integrated circuit devices		91	1997
ALERI INC. (1)
6924655 Probe card for use with microelectronic components, and methods for making same		57	2003
NEWPORT FAB, LLC (1)
6727716 Probe card and probe needle for high frequency testing		96	2002
GLUCOSET AS (1)
7003184 Fiber optic probes		109	2001
AT&T Technologies, Inc. (1)
4837507 High frequency in-circuit test fixture		76	1987
UNIVERSITY OF MASSACHUSETTS (1)
5233197 High speed digital imaging microscope		113	1991
RPX CLEARINGHOUSE LLC (1)
6753679 Test point monitor using embedded passive resistance		84	2002
The Boeing Company (3)
4727637 Computer aided connector assembly method and apparatus		114	1987
5202648 Hermetic waveguide-to-microstrip transition module		63	1991
6914427 Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method		63	2003
UNIVERSITY OF MARYLAND, BALTIMORE (1)
6809533 Quantitative imaging of dielectric permittivity and tunability		79	2002
Fujikura Rubber Works, Ltd. (1)
4425395 Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production		105	1982
FUJIKURA LTD. (1)
4626618 DC electric power cable		99	1985
FILOTEX (1)
5397855 Low noise cable		95	1993
The Aerospace Corporation (2)
6211663 Baseband time-domain waveform measurement method		118	1999
6396298 Active feedback pulsed measurement method		96	2000
ROSEMOUNT TANK RADAR AB (1)
6278411 Horn antenna		80	1999
Acome, Societies Anonyme (1)
4621169 Electric cable construction and uses therefor		95	1985
DESIGNTECH INTERNATIONAL, INC. (1)
5041782 Microstrip probe		96	1989
Gebr. Marzhauser Wetzlar oHG (1)
4552033 Drive system for a microscope stage or the like		110	1984
L&P PROPERTY MANAGEMENT COMPANY (1)
5505150 Method and apparatus for facilitating loop take time adjustment in multi-needle quilting machine		87	1994
GEC FERRANTI DEFENCE SYSTEMS LIMITED (1)
4714873 Microwave noise measuring apparatus		49	1986
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. (1)
6653903 Supply voltage decoupling device for HF amplifier circuits		73	2001
ECLIPSE SURGICAL TECHNOLOGIES, INC. (1)
5728091 Optical fiber for myocardial channel formation		57	1995
ELECTRO SCIENTIFIC INDUSTRIES, INC. (1)
6100815 Compound switching matrix for probing and interconnecting devices under test to measurement equipment		119	1997
TRANSAT CORPORATION (1)
5451884 Electronic component temperature test system with flat ring revolving carriage		102	1993
KOCH, LINDA (1)
4567436 Magnetic thickness gauge with adjustable probe		34	1982
Nebraska Electronics, Inc. (1)
5481196 Process and apparatus for microwave diagnostics and therapy		85	1994
ALPS ELECTRIC CO., LTD. (1)
4725793 Waveguide-microstrip line converter		88	1986
Yugen Kaisha Sozoan (1)
5481936 Rotary drive positioning system for an indexing table		115	1994
H+W Test Products, Inc. (1)
6054869 Bi-level test fixture for testing printed circuit boards		97	1998
DYNEX SEMICONDUCTOR LIMITED (1)
6265950 Transition from a waveguide to a strip transmission line		93	1999
INTEL CORPORATION (5)
5944093 Pickup chuck with an integral heat pipe		104	1997
7020363 Optical probe for wafer testing		99	2001
6856129 Current probe device having an integrated amplifier		92	2002
2006/0052,075 Testing integrated circuits using high bandwidth wireless technology		78	2004
2007/0145,989 Probe card with improved transient power delivery		27	2005
Probe-Rite, Inc. (1)
4636722 High density probe-head with isolated and shielded transmission lines		157	1984
QINETIQ LIMITED (1)
5803607 Method and apparatus for measurement of unsteady gas temperatures		44	1997
Nihon Denshizairyo Kabushiki Kaisha (1)
5134365 Probe card in which contact pressure and relative position of each probe end are correctly maintained		88	1991
GGB INDUSTRIES, INC. (4)
4871964 Integrated circuit probing apparatus		104	1988
5373231 Integrated circuit probing apparatus including a capacitor bypass structure		127	1993
6603322 Probe card for high speed testing		102	1996
6118287 Probe tip structure		104	1997
ARRAY BIOSCIENCE CORPORATION (1)
6707548 Systems and methods for filter based spectrographic analysis		113	2001
XANDEX, INC. (3)
5528158 Probe card changer system and method		105	1994
5506498 Probe card system and method		98	1995
6166553 Prober-tester electrical interface for semiconductor test		100	1998
VERIGY (SINGAPORE) PTE. LTD. (1)
2005/0068,054 Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies		30	2004
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (2)
6049216 Contact type prober automatic alignment		94	1997
7012441 High conducting thin-film nanoprobe card and its fabrication method		106	2003
MASSACHUSETTS INSTITUTE OF TECHNOLOGY (2)
5653939 Optical and electrical methods and apparatus for molecule detection		477	1995
5998768 Active thermal control of surfaces by steering heating beam in response to sensed thermal radiation		108	1998
NEC CORPORATION (5)
4669805 High frequency connector		59	1985
6114864 Probe card with plural probe tips on a unitary flexible tongue		109	1997
6310483 Longitudinal type high frequency probe for narrow pitched electrodes		103	1998
6281691 Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable		103	1999
6400168 Method for fabricating probe tip portion composed by coaxial cable		104	2001
CSI TECHNOLOGY, INC. (1)
6091236 System and method for measuring and analyzing electrical signals on the shaft of a machine		97	1997
NOTTERMAN, DANIEL A. (1)
2003/0072,549 Method and apparatus for dielectric spectroscopy of biological solutions		118	2002
SPAR AEROSPACE LIMITED (1)
5116180 Human-in-the-loop machine control loop		265	1990
NISSAN CHEMICAL INDUSTRIES, LTD. (1)
5021186 Chloroisocyanuric acid composition having storage stability		77	1989
NEC ELECTRONICS CORPORATION (1)
6320396 Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device		100	1997
PINNACLE PRODUCTS, INC. (1)
5807107 Dental infection control system		94	1996
NOVELLUS DEVELOPMENT COMPANY, LLC (1)
6946859 Probe structures using clamped substrates with compliant interconnectors		48	2003
THERMOCARBON, INC. (1)
5676360 Machine tool rotary table locking apparatus		117	1995
ANRITSU COMPANY (4)
5905421 Apparatus for measuring and/or injecting high frequency signals in integrated systems		80	1997
6169410 Wafer probe with built in RF frequency conversion module		85	1998
6529844 Vector network measurement system		117	1999
6943563 Probe tone S-parameter measurements		58	2002
MicroCraft (1)
7188037 Method and apparatus for testing circuit boards		89	2004
BECHTEL BWXT IDAHO, LLC (1)
6147502 Method and apparatus for measuring butterfat and protein content using microwave absorption techniques		80	1998
Finch International Limited (1)
5281364 Liquid metal electrical contact compositions		14	1992
Research Organization for Circuit Knowledge (1)
5584120 Method of manufacturing printed circuits		79	1994
Junkosha Co., Ltd. (1)
4567321 Flexible flat cable		102	1984
FLUKE CORPORATION (1)
6384614 Single tip Kelvin probe		103	2000
Trigon (1)
4340860 Integrated circuit carrier package test probe		67	1980
ATMEL CORPORATION (1)
4649339 Integrated circuit interface		116	1984
INTEGRATED TECHNOLOGY CORPORATION (1)
6118894 Integrated circuit probe card inspection system		120	1997
SOLID STATE MEASUREMENTS, INC. (2)
6900652 Flexible membrane probe and method of use thereof		106	2003
7023231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof		94	2004
Solid State Farms, Inc. (1)
5792668 Radio frequency spectral analysis for in-vitro or in-vivo environments		214	1996
New Wave Research (3)
5811751 Multi-wavelength laser system, probe station and laser cutter system using the same		141	1997
6573702 Method and apparatus for cleaning electronic test contacts		103	1997
5963364 Multi-wavelength variable attenuator and half wave plate		120	1997
WENTWORTH LABORATORIES, INC. (4)
4975638 Test probe assembly for testing integrated circuit devices		155	1989
5355079 Probe assembly for testing integrated circuit devices		108	1993
5959461 Probe station adapter for backside emission inspection		123	1997
6031383 Probe station for low current, low voltage parametric measurements using multiple probes		109	1998
SAMSUNG ELECTRONICS CO., LTD. (3)
6970001 Variable impedance test probe		74	2003
6900653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof		106	2003
6909297 Probe card		56	2004
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM (1)
2003/0119,057 Forming and modifying dielectrically-engineered microparticles		136	2001
Albany Instruments, Inc. (1)
6933717 Sensors and probes for mapping electromagnetic fields		61	2004
Formfactor, et al. (1)
6937037 Probe card assembly for contacting a device with raised contact elements		65	2002
RENESAS ELECTRONICS CORPORATION (4)
6028435 Semiconductor device evaluation system using optical fiber		108	1997
6160407 Inspection method and wiring current observation method for semiconductor device and apparatus of the same		98	1998
6900646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof		97	2002
6551884 Semiconductor device including gate insulation films having different thicknesses		71	2002
KABUSHIKI KAISHA NIHON MICRONICS (2)
5888075 Auxiliary apparatus for testing device		78	1997
6019612 Electrical connecting apparatus for electrically connecting a device to be tested		87	1998
GLOBALFOUNDRIES INC. (21)
5441690 Process of making pinless connector		76	1993
5810607 Interconnector with contact pads having enhanced durability		184	1995
5785538 High density test probe with rigid surface structure		112	1996
6268016 Manufacturing computer systems with fine line circuitized substrates		68	1996
6286208 Interconnector with contact pads having enhanced durability		87	1996
6054651 Foamed elastomers for wafer probing applications and interposer connectors		82	1996
6091255 System and method for tasking processing modules based upon temperature		138	1998
6062879 High density test probe with rigid surface structure		114	1998
6332270 Method of making high density integral test probe		140	1998
6608494 Single point high resolution time resolved photoemission microscopy system and method		111	1998
6452406 Probe structure having a plurality of discrete insulated probe tips		82	1999
6528984 Integrated compliant probe for wafer level test and burn-in		115	1999
6483327 Quadrant avalanche photodiode time-resolved detection		109	1999
6724928 Real-time photoemission detection system		97	2000
6488405 Flip chip defect analysis using liquid crystal		103	2000
6526655 Angled flying lead wire bonding process		115	2001
6617862 Laser intrusive technique for locating specific integrated circuit current paths		98	2002
6788093 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies		108	2002
7022976 Dynamically adjustable probe tips		98	2003
7011531 Membrane probe with anchored elements		93	2005
7005879 Device for probe card power bus noise reduction		93	2005
DH TECHNOLOGIES DEVELOPMENT PTE. LTD. (1)
6627461 Method and apparatus for detection of molecular events using temperature control of detection environment		99	2001
NXP USA, INC. (1)
5982166 Method for measuring a characteristic of a semiconductor wafer using cylindrical control		108	1997
CASCADE MICROTECH, INC. (38)
4697143 Wafer probe		201	1984
4764723 Wafer probe		91	1986
4827211 Wafer probe		127	1987
4858160 System for setting reference reactance for vector corrected measurements		99	1988
4849689 Microwave wafer probe having replaceable probe tip		128	1988
5012186 Electrical probe with contact force protection		41	1990
5045781 High-frequency active probe having replaceable contact needles		110	1991
5101453 Fiber optic wafer probe		102	1991
5266889 Wafer probe station with integrated environment control enclosure		135	1992
5457398 Wafer probe station having full guarding		123	1993
5506515 High-frequency probe tip assembly		160	1994
5610529 Probe station having conductive coating added to thermal chuck insulator		138	1995
5565788 Coaxial wafer probe with tip shielding		148	1995
5729150 Low-current probe card with reduced triboelectric current generating cables		137	1995
5914613 Membrane probing system with local contact scrub		121	1996
6232788 Wafer probe station for low-current measurements		88	1997
6232789 Probe holder for low current measurements		87	1997
6034533 Low-current pogo probe card		112	1997
6137302 Low-current probe card with reduced triboelectric current generating cables		112	1997
6256882 Membrane probing system		80	1998
6578264 Method for constructing a membrane probe using a depression		80	2000
6384615 Probe holder for low current measurements		42	2001
6549106 Waveguide with adjustable backshort		144	2001
7233160 Wafer probe		23	2001
6496024 Probe holder for testing of a test device		38	2002
6850082 Probe holder for testing of a test device		37	2002
6724205 Probe for combined signals		98	2002
6815963 Probe for testing a device under test		65	2003
6806724 Probe for combined signals		95	2003
7161363 Probe for testing a device under test		35	2004
6930498 Membrane probing system		58	2004
7009383 Wafer probe station having environment control enclosure		93	2004
7187188 Chuck with integrated wafer support		79	2004
2006/0184,041 System for testing semiconductors		34	2006
7332923 Test probe for high-frequency measurement		23	2006
7271603 Shielded probe for testing a device under test		35	2006
7403028 Test structure and probe for differential signals		24	2007
2008/0111,571 Membrane probing system		11	2008
NATIONAL SEMICONDUCTOR CORPORATION (4)
4757255 Environmental box for automated wafer probing		194	1986
5814847 General purpose assembly programmable multi-chip package substrate		97	1996
5883522 Apparatus and method for retaining a semiconductor wafer during testing		107	1996
7096133 Method of establishing benchmark for figure of merit indicative of amplifier flicker noise		73	2005
MERCK & CO., INC. (1)
7013221 Iterative probe design and detailed expression profiling with flexible in-situ synthesis arrays		96	2000
DELPHI TECHNOLOGIES, INC. (1)
7015709 Ultra-broadband differential voltage probes		102	2004
SARANTEL LIMITED (3)
6184845 Dielectric-loaded antenna		142	1997
6369776 Antenna		92	1999
6914580 Dielectrically-loaded antenna		83	2003
NORTEL NETWORKS LIMITED (1)
4853624 Tunable microwave wafer probe		93	1988
ABBOTT DIABETES CARE INC. (1)
2005/0165,316 Method for detecting artifacts in data		77	2004
GCB INDUSTRIES, INC. (1)
6229327 Broadband impedance matching probe		142	1997
GTE Valeron Corporation (1)
4401945 Apparatus for detecting the position of a probe relative to a workpiece		97	1981
OL SECURITY LIMITED LIABILITY COMPANY (1)
5688618 Millimeter wave device and method of making		42	1995
INTELLECTUAL VENTURES I LLC (1)
5633780 Electrostatic discharge protection device		134	1996
ELECTRONICS RESEARCH, INC. (1)
2004/0100,276 Method and apparatus for calibration of a vector network analyzer		101	2002
MENTOR GRAPHICS CORPORATION (1)
5383787 Integrated circuit package with direct access to internal signals		64	1993
CIRREX SYSTEMS, LLC (1)
6222970 Methods and apparatus for filtering an optical fiber		153	1999
GE CAPITAL EQUITY INVESTMENTS, INC. (1)
6628980 Apparatus, systems, and methods for in vivo magnetic resonance imaging		193	2001
INIZIATIVE MARITTIME 1991, S.R.L. (1)
5245292 Method and apparatus for sensing a fluid handling		75	1992
DEUTSCHE THOMSON-BRANDT GMBH (1)
4685150 Tuning of a resonant circuit in a communications receiver		53	1984
Aries Electronics, Inc. (1)
6937045 Shielded integrated circuit probe		66	2004
GTE Products Corporation (1)
4653174 Method of making packaged IC chip		28	1986
CIRCUIT COMPONENTS, INCORPORATED (1)
4793814 Electrical circuit board interconnect		311	1986
Aehr Test Systems (2)
6340895 Wafer-level burn-in and test cartridge		107	1999
6580283 Wafer level burn-in and test methods		88	1999
General Dielectric, Inc. (1)
2002/0050,828 Multi-feed microwave reflective resonant sensors		79	2001
EUROPAEISCHES LABORATORIUM FUER MOLEKULARBIOLOGIE (EMBL) (2)
6798226 Multiple local probe measuring device and method		93	2002
6943574 Multiple local probe measuring device and method		63	2004
ABB POWER T&D COMPANY INC. (1)
4998063 Fiber optic coupled magneto-optic sensor having a concave reflective focusing surface		39	1989
EAST GIANT LIMITED (1)
5879289 Hand-held portable endoscopic camera		175	1996
Dimension Polyant Sailcloth, Inc. (1)
6013586 Tent material product and method of making tent material product		91	1997
ALSTOM (1)
5813847 Device and method for injecting fuels into compressed gaseous media		77	1996
CARDIFF AND VALE NHS TRUST (1)
2004/0175,294 Apparatus and method for analysing a biological sample in response to microwave radiation		76	2004
DCG SYSTEMS, INC. (2)
5530372 Method of probing a net of an IC at an optimal probe-point		119	1994
5675499 Optimal probe point placement		111	1996
HITACHI, LTD. (1)
2005/0186,696 Gas flowmeter and manufacturing method thereof		0	2005
COM DEV LTD. (1)
5841342 Voltage controlled superconducting microwave switch and method of operation thereof		43	1995
SKYWORKS SOLUTIONS, INC. (2)
6582979 Structure and method for fabrication of a leadless chip carrier with embedded antenna		93	2001
6770955 Shielded antenna in a semiconductor package		104	2001
BELL TELEPHONE LABORATORIES, INCORPORATED (1)
4684883 Method of manufacturing high-quality semiconductor light-emitting devices		97	1985
THK CO., LTD. (1)
4899998 Rotational positioning device		107	1988
EATON CORPORATION (2)
4904935 Electrical circuit board text fixture having movable platens		114	1988
5471185 Electrical circuit protection devices comprising conductive liquid compositions		32	1994
GENETRONICS, INC. (1)
5869326 Electroporation employing user-configured pulsing scheme		121	1996
KEYSIGHT TECHNOLOGIES, INC. (4)
5493070 Measuring cable and measuring system		97	1994
6300775 Scattering parameter calibration system and method		130	1999
2004/0095,145 Method and apparatus for performing multiport through-reflect-line calibration and measurement		97	2002
2004/0199,350 System and method for determining measurement errors of a testing device		94	2003
SIEMENS AKTIENGESELLSCHAFT (2)
4805627 Method and apparatus for identifying the distribution of the dielectric constants in an object		109	1986
5095891 Connecting cable for use with a pulse generator and a shock wave generator		98	1987
TIOGA TECHNOLOGIES, INC. (1)
* 6459739 Method and apparatus for RF common-mode noise rejection in a DSL receiver		112	1999
MICROCONNECT LLC (3)
5621333 Contact device for making connection to an electronic circuit device		95	1995
6046599 Method and device for making connection		67	1997
6091256 Contact device for making connection to an electronic circuit device		65	1997
ROUND ROCK RESEARCH, LLC (1)
5126286 Method of manufacturing edge connected semiconductor die		164	1990
Vatell Corporation (1)
6278051 Differential thermopile heat flux transducer		100	2000
HP HOLDINGS THREE, INC. (1)
5995914 Method and apparatus for asynchronously measuring frequency shifted signals		103	1996
SARNOFF CORPORATION (1)
5993611 Capacitive denaturation of nucleic acid		145	1997
ASAHI KOGAKU KOGYO KABUSHIKI KAISHA (1)
5267088 Code plate mounting device		84	1990
W. L. GORE & ASSOCIATES, INC. (8)
4871883 Electro-magnetic shielding		121	1987
4859989 Security system and signal carrying member thereof		130	1987
5061823 Crush-resistant coaxial transmission line		136	1990
5107076 Easy strip composite dielectric coaxial signal cable		125	1991
5477011 Low noise signal transmission cable		112	1994
5896038 Method of wafer level burn-in		110	1996
6032714 Repeatably positionable nozzle assembly		79	1999
7015708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts		95	2003
Premtek International Inc. (1)
2005/0116,730 DOUBLE-FACED DETECTING DEVICES FOR AN ELECTRONIC SUBSTRATE		27	2003
Biotronic Systems Corporation (1)
5082627 Three dimensional binding site array for interfering with an electrical field		86	1987
NITTO DENKO CORPORATION (1)
5977783 Multilayer probe for measuring electrical characteristics		64	1997
CROWN PRODUCTS, INC. (1)
7019541 Electric conductivity water probe		97	2004
FREESCALE SEMICONDUCTOR, INC. (4)
5172050 Micromachined semiconductor probe card		277	1991
5177438 Low resistance probe for semiconductor		176	1991
5467024 Integrated circuit test with programmable source for both AC and DC modes of operation		86	1993
5666063 Method and apparatus for testing an integrated circuit		107	1996
CALIFORNIA INSTITUTE OF TECHNOLOGY (1)
5138289 Noncontacting waveguide backshort		42	1990
NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6759859 Resilient and rugged multi-layered probe		34	2001
FAIRCHILD SEMICONDUCTOR CORPORATION (1)
5357211 Pin driver amplifier		84	1993
JPK INSTRUMENTS AG (1)
7022985 Apparatus and method for a scanning probe microscope		99	2002
JPMORGAN CHASE BANK, NATIONAL ASSOCIATION (1)
5678210 Method and apparatus of coupling a transmitter to a waveguide in a remote ground terminal		44	1995
MEDICAL COLLEGE OF GEORGIA RESEARCH INSTITUTE, INC. (1)
5488954 Ultrasonic transducer and method for using same		145	1994
MAGMA DESIGN AUTOMATION, INC. (1)
5030907 CAD driven microprobe integrated circuit tester		113	1989
TESSERA, INC. (1)
5808874 Microelectronic connections with liquid conductive elements		91	1996
WINBOND ELECTRONICS CORP. (1)
6611417 Wafer chuck system		82	2001
iTerra Communications, LLC (1)
* 6794934 High gain wideband driver amplifier		100	2001
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QUALCOMM INCORPORATED (1)
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STAR TECHNOLOGIES INC. (2)
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THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY (6)
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PREMIER MICROWAVE OF CALIFORNIA, INC. (1)
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SAE MAGNETICS (H.K.) LTD. (1)
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ERICSSON INC. (1)
5949383 Compact antenna structures including baluns		118	1997
CHIPMOS TECHNOLOGIES INC. (1)
6946860 Modularized probe head		56	2003
LAURENCE J. MARHOEFER (1)
5097101 Method of forming a conductive contact bump on a flexible substrate and a flexible substrate		96	1991
RENISHAW PLC (2)
5270664 Probe for measuring surface roughness by sensing fringe field capacitance effects		126	1992
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EASTMAN KODAK COMPANY (1)
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UNISYS CORPORATION (1)
4553111 Printed circuit board maximizing areas for component utilization		32	1983
MEDICAL DEVICE INNOVATIONS LIMITED (1)
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* Cited By Examiner

Patent Citation Ranking

Forward Cite Landscape

Patent Info	(Count)	# Cites	Year
UNIVERSITY OF VIRGINIA (1)
9366697 Micromachined on-wafer probes and related method		0	2011
TERADYNE, INC. (2)
9435855 Interconnect for transmitting signals between a device and a tester		0	2013
9594114 Structure for transmitting signals in an application space between a device under test and test electronics		0	2014

* Cited By Examiner

Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
7.5 Year Payment	$3600.00	$1800.00	$900.00	May 17, 2017
11.5 Year Payment	$7400.00	$3700.00	$1850.00	May 17, 2021

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 7.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

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DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
November 17, 2009	US,7619419,B2   US7619419B2	GRANTED PATENT AS SECOND PUBLICATION
December 28, 2006	US,20060290357,A1   US20060290357A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7619419

Wideband active-passive differential signal probe

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