Systems and methods for detecting inkjet defects
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United States of America Patent
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Nov 24, 2009
Grant Date -
May 11, 2006
app pub date -
Oct 28, 2004
filing date -
Oct 28, 2004
priority date (Note) -
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Abstract
A method for testing inkjets for defects in an inkjet device includes determining, based on the likelihood that one or more inkjets are defective, whether to perform an inkjet defect test, The method may also include, identifying, if it is determined to perform an inkjet defect test, which inkjets to test based on properties of the inkjets, the number of identified inkjets being less than a total number of inkjets in the inkjet device; and testing the identified inkjets for defects using an image sensor.
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