Dedicated process diagnostic device
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United States of America Patent
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Dec 8, 2009
Grant Date -
Jan 11, 2007
app pub date -
May 25, 2006
filing date -
Mar 28, 1996
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A field mountable dedicated process diagnostic device is used for diagnosing operation of an industrial control or monitoring system. An input is configured to receive at least one process signal related to operation of the industrial process. A memory contains diagnostic program instructions configured to implement a diagnostic algorithm using the process signal. The diagnostic algorithm is specific to the industrial process. A microprocessor performs the diagnostic program instructions and responsively diagnoses operation of the process based upon the process signal.
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