Digital image capture and processing system employing a micro-computing platform with an event-driven multi-tier modular software architecture and supporting an image-processing based illumination metering program for automatically adjusting illumination during object illumination and imaging operations

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United States of America Patent

PATENT NO 7637433
SERIAL NO

11818155

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Abstract

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A digital image capture and processing system comprising an illumination measurement subsystem for measuring the level of illumination at a particular region of the field of view (FOV) of the system during object illumination and imaging operations, and producing and storing an illumination measure for achieving a desired spatial intensity in a digital image to be formed and detected by the image formation and detection subsystem. An illumination control subsystem uses the illumination measure to control a LED-based illumination array during object illumination and imaging operations. A programmed image processor supports an image-processing based illumination metering program, as well as processes digital images formed and detected by the image formation and detection subsystem so as to read or acquire information graphically represented in the digital images. A computing platform supports the implementation of one or more of the subsystems above, and includes memory for storing at least one code symbol reading application.

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Patent Owner(s)

  • METROLOGIC INSTRUMENTS, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Au, Ka Man Philadelphia, US 169 9851
Hou, Rui Suzhou, CN 138 3201
Kotlarsky, Anatoly Holland, US 143 9509
Liu, Liang Suzhou, CN 768 9740
Liu, Yong Suzhou, CN 1235 24302
Tao, Xi Suzhou, CN 79 5814
Yu, Hongpeng Tianjin, CN 51 2255
Zhang, Wenhua Suzhou, CN 76 2386
Zhu, Xiaoxun Marlton, US 309 26903

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