Specific heat measuring method and instrument

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United States of America Patent

PATENT NO 7637654
APP PUB NO 20080025365A1
SERIAL NO

11597059

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In order to measure specific heat, the measurement time is very long and the instrument is very expensive. The specific heat may be calculated based on the thermal time constant obtained from the change of the sample temperature when the predetermined amount of sample with known density at the first temperature is introduced in the environment at the second temperature. This measuring method can use the oscillatory densitometer. The predetermined amount corresponds to the volume of the sample to be introduced in the oscillatory densitometer, the density is a measurement result of the oscillatory densitometer, and the thermal time constant corresponds to the time constant of the oscillation period of the oscillatory densitometer.

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Patent Owner(s)

Patent OwnerAddress
KYOTO ELECTRONICS MANUFACTURING CO LTDKYOTO-SHI KYOTO 601-8317

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kawaguchi, Kenji Kyoto, JP 71 939
Kurauchi, Nami Kyoto, JP 2 5
Obayashi, Masanobu Kyoto, JP 1 0

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