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United States of America Patent

PATENT NO 7644082
APP PUB NO 20080059462A1
SERIAL NO

11681673

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Abstract

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Abbreviated index of parameter patterns. An abbreviated index includes indicators that a parameter pattern may be in a set of parameter patterns. To create the abbreviated index, indicators for overlapping parameter patterns of a given parameter pattern are placed in the index. Different patterns may have the same indicator, so the abbreviated index does not necessarily give an absolute indication of the presence of a parameter pattern in the set of parameter patterns, but rather may give an indication of the possible inclusion of a parameter pattern. The use of indicators for overlapping patterns can be used to increase confidence as to the existence of a given parameter pattern in the set of parameter patterns. The absence of an indicator for a parameter pattern or an overlapping parameter pattern will indicate with certainty that the parameter pattern is not present in the set of parameter patterns.

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Patent Owner(s)

Patent OwnerAddress
PERFECT SEARCH CORPORATION400 W DYNIX DRIVE PROVO UT 84604

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Inouye, Dillon K Provo, US 5 49
Millett, Ronald P Orem, US 25 1050

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