Memory device with fail search and redundancy
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United States of America Patent
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Jan 12, 2010
Grant Date -
Feb 28, 2008
app pub date -
Jul 20, 2007
filing date -
Jul 20, 2006
priority date (Note) -
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Abstract
An automatic redundancy system may exploit an existing microprocessor management system on chip for carrying out autonomously, without communicating with an external testing machine, the operations of: writing data in the memory array according to one or more pre-established test patterns, verifying data successively read from the memory array, and substituting failed elements of the memory array with equivalent redundancy structures. A logic structure may detect and store memory array failures upstream of the output data path. Thereby, data collection relating to failures may be accomplished more quickly and without any interaction with the testing machine apart from communicating the end of the execution of the redundancy process.
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