Systems and methods for temperature measurement using n-factor coefficient correction
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United States of America Patent
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Jan 19, 2010
Grant Date -
Oct 23, 2008
app pub date -
Apr 23, 2007
filing date -
Apr 23, 2007
priority date (Note) -
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Abstract
Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems. Such temperature measurement systems include a variable current source and a diode connected transistor. The variable current source is capable of applying two or more distinct currents to the diode connected transistor. The currents result in a different base-emitter voltage on the diode connected transistor. The systems further include an n-factor coefficient register and an analog to digital converter. The analog to digital converter is operable to receive two of the base-emitter voltages created by applying the different currents, and to provide a digital output based at least in part on a value stored in the n-factor coefficient register and the two base-emitter voltages.
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