Measurement system and method for the noninvasive determination of properties of an object to be examined and contrast medium X-ray phase-contrast measurement

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United States of America Patent

PATENT NO 7653177
APP PUB NO 20090003526A1
SERIAL NO

12213945

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Abstract

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A method and a measurement system are disclosed for the noninvasive determination of properties of an object to be examined and to the use of a contrast medium for X-ray phase-contrast measurement. in at least one embodiment of the invention, a mixture (suspension) consisting of a base liquid and a multiplicity of particles contained therein is used, the refractive index of the base liquid being different to the refractive index of the particles.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS HEALTHCARE GMBHHENKESTR 127 ERLANGEN 91052

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Baumann, Joachim Munich, DE 24 1578
David, Christian Lauchringen, DE 17 1083
Engelhardt, Martin Munich, DE 16 691
Freudenberger, Jörg Kalchreuth, DE 16 235
Hempel, Eckhard Fürth, DE 35 1504
Hoheisel, Martin Erlangen, DE 68 1801
Honal, Matthias Munich, DE 11 15
Mertelmeier, Thomas Erlangen, DE 79 1996
Pfeiffer, Franz Brugg, CH 31 1193
Popescu, Stefan Erlangen, DE 144 2324
Schuster, Manfred Munich, DE 47 939

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