Large signal scattering functions from orthogonal phase measurements
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United States of America Patent
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Mar 2, 2010
Grant Date -
Jul 23, 2009
app pub date -
Jan 17, 2008
filing date -
Jan 17, 2008
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Abstract
The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.
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