Programmable heavy-ion sensing device for accelerated DRAM soft error detection
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United States of America Patent
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Mar 9, 2010
Grant Date -
Oct 30, 2008
app pub date -
Jun 6, 2008
filing date -
Mar 21, 2007
priority date (Note) -
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Abstract
Aspects of the invention relate to a programmable heavy-ion sensing device for accelerated DRAM soft error detection. Design of a DRAM-based alpha particle sensing apparatus is preferred to be used as an accelerated on-chip SER test vehicle. The sensing apparatus is provided with programmable sensing margin, refresh rate, and supply voltage to achieve various degree of SER sensitivity. In addition, a dual-mode DRAM array is proposed so that at least a portion of the array can be used to monitor high-energy particle activities during soft-error detection (SED) mode.
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