Probe station

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United States of America Patent

PATENT NO 7688062
APP PUB NO 20080042670A1
SERIAL NO

11975174

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A probe station for testing a wafer.

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Patent Owner(s)

Patent OwnerAddress
CASCADE MICROTECH INC2430 NW 206TH AVENUE BEAVERTON OR 97006

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dunklee, John Tigard, US 36 578
Nordgren, Greg Wilsonville, US 10 324

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