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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
HELLMA MATERIALS GMBH & CO KG	07745 JENA

International Classification(s)

• G01J:MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTE....

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• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Engel, Axel	Ingelheim, DE	15	66
Keutel, Dietmar	Mainz, DE	1	1
Natura, Ute	Jena, DE	10	52
Parthier, Lutz	Kleinmachnow, DE	32	112

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
March 30, 2010	US,7688444,B2   US7688444B2	GRANTED PATENT AS SECOND PUBLICATION
February 21, 2008	US,20080043221,A1   US20080043221A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7688444

Method of determining laser stabilities of optical materials, crystals selected according to said method, and uses of said selected crystals

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