Manufacturing test and programming system
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United States of America Patent
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-
Apr 20, 2010
Grant Date -
May 1, 2008
app pub date -
Nov 7, 2005
filing date -
Nov 5, 2004
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A manufacturing test and programming system (100) is presented including providing a PCB tester (108), providing an in-system programmer (102) electrically attached to the PCB tester (108), mounting a device under test (114) having a programmable device (116) attached thereon and programming the programmable device (116) with the in-system programmer (102).
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