System and method for metamodel-based gap analysis

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United States of America Patent

PATENT NO 7702643
SERIAL NO

11649430

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Abstract

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A system and methods for comparing differences and similarities of at least two models including generating corresponding metamodel maps, visual representation of the models, and conducting a series of phases of comparison of the models using a mapping index, wherein the mapping index includes the metamodel maps and the visual representation of the models to produce a comparison output.

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Patent Owner(s)

  • MICRO FOCUS (US), INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Oara, Ioan Mihai Cary, US 12 74

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