Memory elements having patterned electrodes and method of forming the same

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United States of America Patent

PATENT NO 7709289
APP PUB NO 20060240616A1
SERIAL NO

11111917

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Abstract

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A memory element having a resistance variable material and methods for forming the same are provided. The method includes forming a plurality of first electrodes over a substrate and forming a blanket material stack over the first electrodes. The stack includes a plurality of layers, at least one layer of the stack includes a resistance variable material. The method also includes forming a first conductive layer on the stack and etching the conductive layer and at least one of the layers of the stack to form a first pattern of material stacks. The etched first conductive layer forming a plurality of second electrodes with a portion of the resistance variable material located between each of the first and second electrodes.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Brooks, Joseph F Nampa, US 44 442
Daley, Jon Boise, US 32 365

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