X-ray analysis apparatus

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7711091
APP PUB NO 20080056452A1
SERIAL NO

11880638

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An X-ray analysis apparatus has information about a relationship between selection of a measurement type and a replacement work of optical parts and shows, on a screen of a display, graphical information about optical parts which should be changed, to make it easy for an operator to perform a preliminary work before measurement. When the operator selects one desired measurement type among a plurality of measurement types in a selection window, there is displayed on the display, depending on the selected measurement type, graphical information about necessary optical parts which should be newly installed and/or installed optical parts which should be removed. The operator looks at the operating instructions and then performs the replacement work. The graphical information may be: graphical indication of the installation locations of the optical parts; different pictorial expressions about the installation and the removal works; and graphical indication of the identification marks of the optical parts.

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Patent Owner(s)

  • RIGAKU CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kato, Toshiyuki Akishima, JP 94 716
Kuribayashi, Aya Akishima, JP 2 14
Morikawa, Keiichi Fuchu, JP 9 140
Nishi, Kunio Hachioji, JP 6 47
Ohara, Takao Higashimurayama, JP 8 30
Sasaki, Akito Akishima, JP 41 80
Tsuji, Yuji Hamura, JP 26 262

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