Method of designing a projection system, lithographic apparatus and device manufacturing method

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United States of America Patent

PATENT NO 7714307
APP PUB NO 20070165296A1
SERIAL NO

11517578

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Abstract

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, that are new minima in the merit function. Each resulting configuration is output, e.g., as a table of parameters specifying the projection system or as a computer file for use in making an actual projection system.

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Patent Owner(s)

  • ASML NETHERLANDS B.V.;CARL ZEISS SMT AG;TECHNISCHE UNIVERSITEIT DELFT

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bociort, Florian Delft, NL 2 53
Marinescu, Oana Elena Delft, NL 1 0
van, Turnhout Maarten Rotterdam, NL 1 0

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