Embedded Test I/O Engine
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United States of America Patent
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May 18, 2010
Grant Date -
Mar 30, 2006
app pub date -
Sep 8, 2004
filing date -
Sep 8, 2004
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A system and method for testing input and output paths connected to an embedded processor. Specialized test software operating on the embedded processor creates one or more test workers or threads, each having a specific routine to perform, which are executed in parallel, stressing various communication paths. The results may be analyzed to help in many different ways during the life cycle of the device with the embedded controller.
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