Nonlinear measurement system error correction
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United States of America Patent
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Jun 15, 2010
Grant Date -
May 14, 2009
app pub date -
Nov 14, 2007
filing date -
Nov 14, 2007
priority date (Note) -
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Abstract
A method for eliminating the systematic measurement errors from a measurement system, for example a vector network analyzer, such that an accurate representation of the behavior of a nonlinear device can be measured or characterized. The cross-frequency phase and absolute amplitude of the measured voltage waves applied to and emanating from the nonlinear device are measured and error corrected. These waves may be used for nonlinear device characterization or modeling.
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