Method and system to analyze aspect rules based on domain coverage of the aspect rules

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United States of America Patent

PATENT NO 7739226
APP PUB NO 20070198498A1
SERIAL NO

11703515

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Abstract

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Methods and systems to analyze aspect rules based on domain coverage of the aspect rules are provided. The system receives a first plurality of data items from a database, applies a first plurality of rules to the first plurality of data items to generate a second plurality of data items associated with a first domain, counts the second plurality of data items to determine a total quantity of data items, applies a second plurality of rules to the second plurality of data items to identify a third plurality of data items associated with a first aspect counts the third plurality of data items to determine a first quantity of data items, determines a percentage of coverage for the first aspect based on the first quantity of data items and the total quantity of data items, and provides the percentage of coverage as an interface element within an interface.

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Patent Owner(s)

Patent OwnerAddress
EBAY INC2025 HAMILTON AVENUE SAN JOSE CA 95125

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arora, Aditya Fremont, US 36 525
Foster, Benjamin David Campbell, US 28 960
Leon, Jean-Michel Santa Clara, US 37 581
Loftus, Josh San Jose, US 14 260
Monier, Louis Marcel Gino Menlo Park, US 25 396
Shah, Seema San Francisco, US 19 353
Sundaranatha, Venkat San Jose, US 18 394

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