Test system and method for testing electronic devices using a pipelined testing architecture
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United States of America Patent
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Jun 22, 2010
Grant Date -
Aug 23, 2007
app pub date -
Feb 17, 2006
filing date -
Feb 17, 2006
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Abstract
A test system for performing tests on devices under test (DUTs) includes a storage device storing test data for performing the tests on the DUTs, a shared processor for generating the test data, storing the test data in the storage device and generating a test control signal including one or more test instructions for executing the tests, and, for each DUT, a dedicated processor configured to receive a test control signal from the shared processor, and in response to the test control signal, transfer the test data for one of the test instructions to the DUT to execute that test instruction and verify the completion of that test instruction.
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