Stressor for engineered strain on channel

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United States of America Patent

PATENT NO 7759199
SERIAL NO

11858054

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Abstract

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A semiconductor substrate having recesses filled with heteroepitaxial silicon-containing material with different portions having different impurity concentrations. Strained layers can fill recessed source/drain regions in a graded, bottom-up fashion. Layers can also line recess sidewalls with one concentration of strain-inducing impurity and fill the remainder to the recess with a lower concentration of the impurity. In the latter case, the sidewall liner can be tapered.

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Patent Owner(s)

Patent OwnerAddress
ASM IP HOLDING B VALMERE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Thomas, Shawn Gilbert, US 44 2051
Tomasini, Pierre Tempe, US 25 2004

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