Sample analyzer

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United States of America Patent

PATENT NO 7760340
APP PUB NO 20070222973A1
SERIAL NO

11724934

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A sample analyzer includes (a) a measuring part for measuring optical information of a sample at first wavelength, second wavelength, and third wavelength, first light of the first wavelength and second light of the second wavelength being absorbed by a second substance but substantially not absorbed by a first substance, and third light of the third wavelength being absorbed by the first substance; and (b) an obtaining part for obtaining content of the first substance in the sample, and content of the second substance in the sample, influence by the second substance being excluded from the content of the first substance, based on the optical information at the first wavelength, second wavelength, and third wavelength measured by the measuring part.

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Patent Owner(s)

  • SYSMEX CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hoshiko, Susumu Kobe, JP 12 119
Kobayashi, Katsushi Kobe, JP 8 95
Matsuo, Naohiko Kobe, JP 15 190
Yamamoto, Norimasa Kobe, JP 37 356

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