Membrane probing method using improved contact
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United States of America Patent
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Jul 27, 2010
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app pub date -
Nov 10, 2003
filing date -
Jul 14, 1998
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Abstract
A method of probing an electrical device using a membrane probing system having an improved contact. A membrane probe forms a contact having a ridge with a pair of inclined surfaces defining an acute angle such that, when pressed into an electrical pad of a device to be tested, the ridge penetrates into the electrical pad, shearing away any oxide on the surface of the pad. The device may then be tested.
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