Methods and devices for characterizing a surface
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United States of America Patent
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Aug 3, 2010
Grant Date -
Dec 3, 2009
app pub date -
Jun 3, 2008
filing date -
Jun 3, 2008
priority date (Note) -
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status (Latency Note)
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Abstract
A measuring device comprising a base, feet connected to the base, and an inclinometer mounted on the base is used to characterize a surface. The feet are placed in direct contact with the surface at a predetermined position. The inclinometer measures the angle of the surface relative to gravity at the predetermined position. In some embodiments, multiple measuring devices are connected to an arm, in order to measure different positions on the surface simultaneously. The arm may be moved by an actuator to the next predetermined position on the surface. In some embodiments, multiple measuring devices are connected to a frame that is substantially the same size as the surface to be characterized, such that the entire surface can be characterized without moving the frame.
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