Method of concurrently patterning a substrate having a plurality of fields and a plurality of alignment marks

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United States of America Patent

PATENT NO 7780893
APP PUB NO 20070228610A1
SERIAL NO

11695850

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Abstract

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A method of patterning a substrate comprising first and second fields with a template, the template having a mold and a plurality of alignment forming areas and a plurality of template alignment marks, the method comprising: positioning a material on the first field of the substrate and a plurality of regions of the substrate, the plurality of regions laying outside of the first and second fields; positioning the mold and the substrate such that a desired spatial relationship between the mold and the first field of the substrate is obtained to define a pattern in the material on the first field of the substrate while concurrently defining a plurality of substrate alignment marks with the material in the plurality of regions of the substrate in superimposition with the plurality of alignment forming areas of the template; positioning a material on the second field of the substrate; and positioning the mold and the substrate to obtain a desired spatial relationship between the plurality of template alignment marks and the plurality of substrate alignment marks such that a desired spatial relationship between the mold and the second field of the substrate is obtained to define a pattern in the material on the second field of the substrate.

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Patent OwnerAddress
CITIBANK N A390 GREENWICH STREET NEW YORK NY 10013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Choi, Byung-Jin Austin, US 194 2163
McMackin, Ian M Austin, US 30 1029
Melliar-Smith, Christopher Mark Austin, US 4 85
Sreenivasan, Sidlgata V Austin, US 214 5594

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