Signal coupling system for scanning microwave microscope
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United States of America Patent
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Sep 7, 2010
Grant Date -
Mar 11, 2010
app pub date -
Sep 11, 2008
filing date -
Sep 11, 2008
priority date (Note) -
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Abstract
A signal coupling system interposed between a scanning probe and a measurement instrument provides signal communication between the scanning probe and the measurement instrument. The signal coupling system has a pre-stressed shape when the scanning probe is in a neutral position. The pre-stressed shape is designated to provide a characteristic impedance of the signal coupling system that varies linearly as a function of displacement of the scanning probe from the neutral position when the scanning probe is displaced, relative to the neutral position, over a designated range of displacements.
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