Semiconductor device and method of manufacturing the same

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United States of America Patent

PATENT NO 7795734
APP PUB NO 20070085080A1
SERIAL NO

11636598

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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To provide a semiconductor device composed of a semiconductor element or a group of semiconductor elements, in which a crystalline semiconductor film having as few grain boundaries as possible in a channel formation region is formed on an insulating surface, which can operate at high speed, which have high current drive performance, and which are less fluctuated between elements. The method of the present invention includes: forming an insulating film with an opening on a substrate having an insulating surface; forming on the insulating film and over the opening an amorphous semiconductor film or a polycrystalline semiconductor film that has randomly-formed grain boundaries; forming a crystalline semiconductor film by melting the semiconductor film, pouring the melted semiconductor into the opening of the insulating film, and crystallizing or re-crystallizing the semiconductor film; and removing the crystalline semiconductor film except a portion of the crystalline semiconductor film that is in the opening to form a gate insulating film, which is in contact with the top face of the crystalline semiconductor film, and a gate electrode.

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Patent Owner(s)

Patent OwnerAddress
SEMICONDUCTOR ENERGY LABORATORY CO LTD398 HASE ATSUGI-SHI KANAGAWA 2430036 ?2430036

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arao, Tatsuya Atsugi, JP 131 3032
Isobe, Atsuo Atsugi, JP 213 5332
Kokubo, Chiho Tochigi, JP 52 1250
Miyairi, Hidekazu Atsugi, JP 310 9103
Shimomura, Akihisa Atsugi, JP 211 3295
Tanaka, Koichiro Atsugi, JP 530 12050
Yamazaki, Shunpei Setagaya, JP 7534 239327

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