Test apparatus and calibration method
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United States of America Patent
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-
Sep 21, 2010
Grant Date -
Jun 11, 2009
app pub date -
Dec 6, 2007
filing date -
Dec 6, 2007
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A test apparatus that tests a device under test is provided, including a driver section that supplies a test signal to a corresponding pin of the device under test, a judgment section that makes a judgment concerning pass/fail of the device under test based on the response signal output by the device under test in response to the test signal, a voltage measuring section that detects a DC voltage of the signal output by the driver section, and an output side adjusting section that adjusts a duty ratio of the signal output by the driver section according to the DC voltage detected by the voltage measuring section.
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