High resolution three dimensional topography using a flatbed scanner
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United States of America Patent
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Oct 5, 2010
Grant Date -
N/A
app pub date -
Jun 10, 2008
filing date -
Jun 11, 2007
priority date (Note) -
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Abstract
An optical measuring apparatus for measuring 3D surface profiles of an object comprising, in combination: a linear detector array; an imaging system including a light source to image the object onto the detector array; and machine readable software for producing a 3D topology map from a 2D image, wherein the apparatus is calibrated by changing the optical focus distance between the detector array and the object for the purpose of 3D measurement calibration, and changing the relative lateral positions between the detector array and the object for the purpose of scanning the object's surface.
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