Vertical channel transistor structure and manufacturing method thereof

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United States of America Patent

PATENT NO 7811890
APP PUB NO 20080087946A1
SERIAL NO

11545575

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Abstract

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A vertical channel transistor structure is provided. The structure includes a substrate, a channel, a cap layer, a charge trapping layer, a source and a drain. The channel is formed in a fin-shaped structure protruding from the substrate. The cap layer is deposited on the fin-shaped structure. The cap layer and the fin-shaped structure have substantially the same width. The charge trapping layer is deposited on the cap layer and on two vertical surfaces of the fin-shaped structure. The gate is deposited on the charge trapping layer and on two vertical surfaces of the fin-shaped structure. The source and the drain are respectively positioned on two sides of the fin-shaped structure and opposite the gate.

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Patent Owner(s)

Patent OwnerAddress
MACRONIX INTERNATIONAL CO LTDHSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hsu, Tzu-Hsuan Jhongpu Township, Chiayi County, TW 192 2074
Shih, Yen-Hao Bangiao, TW 101 2492
Wu, Chia-Wei Jhubei, TW 61 204

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