Analysis method, analysis device and production method therefor

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7815861
APP PUB NO 20060153738A1
SERIAL NO

10530725

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Abstract

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The present invention relates to a technique for analyzing the concentration of a specific component in a sample liquid, such as a method for analyzing a sample. The analyzing method includes a first detection step for irradiating light from a light source (50) onto a reaction system to detect a response from the reaction system (56) as a first detection result. The reaction system contains a sample liquid and a reagent. The method also includes a second detection step for irradiating light onto a reference board (54) to detect a response from the reference board as a second detection result. The response from the reference board under light irradiation is dependent on wavelength. The method further includes a calculation step for calculating the concentration of the specific component in the sample liquid based on the first and second detection results.

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Patent Owner(s)

Patent OwnerAddress
ARKRAY INCYOUSUIEN-NAI 59 GANSUIN-CHO KAMIGYO-KU KYOTO-SHI KYOTO 6020008 ?6020008

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Tanji, Hideki Kyoto, JP 5 10

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