Methods and systems for back end characterization using I/O sampling

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United States of America Patent

PATENT NO 7817562
SERIAL NO

11537202

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Abstract

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Disclosed methods and systems relate to characterizing a dynamic performance quality of service available from a storage element within a storage system. An exemplary method includes initiating a known I/O request to the storage element; measuring a time the storage element takes to respond to the known I/O request; and reporting a measure of the quality of service available from the storage element. One implementation of the method further includes using the time measurement and an estimation algorithm to calculate the quality of service and adjusting the load on the storage element based on the quality of service.

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Patent Owner(s)

Patent OwnerAddress
EMC IP HOLDING COMPANY LLC176 SOUTH STREET HOPKINTON MA 01748

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kemeny, John N Westford, US 2 79

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