Apparatus and method for determining an absolute pose of a manipulated object in a real three-dimensional environment with invariant features

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United States of America Patent

PATENT NO 7826641
SERIAL NO

12584402

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Abstract

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An apparatus and method for optically inferring an absolute pose of a manipulated object in a real three-dimensional environment from on-board the object with the aid of an on-board optical measuring arrangement. At least one invariant feature located in the environment is used by the arrangement for inferring the absolute pose. The inferred absolute pose is expressed with absolute pose data (.phi., .theta., .psi., x, y, z) that represents Euler rotated object coordinates expressed in world coordinates (X.sub.o, Y.sub.o, Z.sub.o) with respect to a reference location, such as, for example, the world origin. Other conventions for expressing absolute pose data in three-dimensional space and representing all six degrees of freedom (three translational degrees of freedom and three rotational degrees of freedom) are also supported. Irrespective of format, a processor prepares the absolute pose data and identifies a subset that may contain all or fewer than all absolute pose parameters. This subset is transmitted to an application via a communication link, where it is treated as input that allows a user of the manipulated object to interact with the application and its output.

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Patent Owner(s)

Patent OwnerAddress
ELECTRONIC SCRIPTING PRODUCTS INC555 BRYANT STREET #142 PALO ALTO CA 94301

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Alboszta, Marek San Francisco, US 28 2225
Gonzalez-Banos, Hector H Mountain View, US 62 3086
Mandella, Michael J Palo Alto, US 53 4160

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