Alignment features in a probing device
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United States of America Patent
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-
Nov 16, 2010
Grant Date -
Mar 18, 2010
app pub date -
Jul 14, 2009
filing date -
Apr 10, 2003
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An image of an array of probes is searched for alignment features. The alignment features are then used to bring contact targets and the probes into contact with one another. The alignment features may be a feature of one or more of the tips of the probes. For example, such a feature may be a corner of one of the tips. An array of probes may be formed to have such alignment features.
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