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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
SEIKO EPSON CORPORATION	1-6 SHINJUKU 4-CHOME SHINJUKU-KU TOKYO 160-8801

International Classification(s)

• G09G:ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Ishii, Tatsuya	Fujimi-cho, JP	168	2408
Mizugaki, Koichi	Suwa, JP	37	255
Yamaji, Shigefumi	Chitose, JP	2	11

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
November 23, 2010	US,7839372,B2   US7839372B2	GRANTED PATENT AS SECOND PUBLICATION
October 29, 2009	US,20090267873,A1   US20090267873A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7839372

Electrooptic apparatus substrate and examining method therefor and electrooptic apparatus and electronic equipment

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