System and method of measurement for a distributed computer system

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United States of America Patent

PATENT NO 7844703
APP PUB NO 20080107218A1
SERIAL NO

11555830

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Abstract

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A system and method of parameter measurement for a distributed computer system, the method including selecting a master unit; selecting slave units operably connected to the master unit on a bus, the slave units having a slave clock; determining slave unit latencies between the master unit and the slave units; generating slave unit synchronizing signals for the slave units, the slave unit synchronizing signals being adjusted for the slave unit latencies; synchronizing the slave clocks in response to the slave unit synchronizing signals; and measuring an operating parameter at the slave units at a synchronously determined time.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bieswanger, Andreas Ehningen, DE 29 677
Geissler, Andrew Austin, US 20 412
McCreary, Hye-Young Liberty Hill, US 17 440
Ware, Malcolm S Austin, US 51 1782

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