Apparatus and process for plasma-enhanced atomic layer deposition

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United States of America Patent

PATENT NO 7850779
APP PUB NO 20070128863A1
SERIAL NO

11556758

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Embodiments of the invention provide an apparatus configured to form a material during an atomic layer deposition (ALD) process, such as a plasma-enhanced ALD (PE-ALD) process. In one embodiment, a lid assembly for conducting a vapor deposition process within a process chamber is provided which includes an insulation cap and a plasma screen. In one example, the insulation cap has a centralized channel configured to flow a first process gas from an upper surface to an expanded channel and an outer channel configured to flow a second process gas from an upper surface to a groove which is encircling the expanded channel. In one example, the plasma screen has an upper surface containing an inner area with a plurality of holes and an outer area with a plurality of slots. The insulation cap may be positioned on top of the plasma screen to form a centralized gas region with the expanded channel and a circular gas region with the groove.

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Patent Owner(s)

Patent OwnerAddress
APPLIED MATERIALS INC3050 BOWERS AVENUE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chu, Schubert S San Francisco, US 100 6529
Ganguli, Seshadri Sunnyvale, US 131 12878
Ma, Paul Sunnyvale, US 56 3689
Marcadal, Christophe Santa Clara, US 50 5903
Shah, Kavita Sunnyvale, US 35 2513
Wu, Dien-Yeh San Jose, US 83 8828
Wu, Frederick C Cupertino, US 17 2628

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