Anti-fuse latch self-test circuit and method
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United States of America Patent
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Dec 28, 2010
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app pub date -
Mar 21, 2007
filing date -
Mar 31, 2006
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Abstract
A programmable latch circuit (200) can include a volatile latch (206) that may regenerate a value determined by programmable section (202). In a test operation, a variable current source (216') can generate a current (IBASE) that can be mirrored in test sections (252-0 and 252-1) and compared to a current drawn by either programmable element (210-0) or (210-1) by a latching operation of volatile latch (206). Variable current source (216') can enable characterization of programmable elements (210-0 or 210-1) as well as adjustable test threshold limits. A program voltage (Vprog) applied to programmable elements (210-0 or 210-1) can be also be variable to allow for characterization of programmable elements (210-0 and 210-1) over a range of voltages.
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