Methods of reducing CD loss in a microelectromechanical device

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United States of America Patent

PATENT NO 7863079
APP PUB NO 20090195856A1
SERIAL NO

12026131

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Abstract

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Methods of fabricating an electromechanical systems device that minimize critical dimension (CD) loss in the device are described. The methods provide electromechanical systems devices with improved properties, including high reflectivity.

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Patent Owner(s)

  • SNAPTRACK, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chui, Clarence San Jose, US 259 8761
Gudlavalleti, Sauri San Jose, US 21 265
Kothari, Manish Cupertino, US 215 7372

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