Test method for frequency converters with embedded local oscillators

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United States of America Patent

PATENT NO 7868607
SERIAL NO

11738051

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Abstract

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A method is presented where the phase trace is offset for each sweep such that the first point is always at zero degrees. The resulting traces are then averaged. The average reduces the noise in the phase trace and results in a less noisy group delay trace.

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Patent Owner(s)

  • KEYSIGHT TECHNOLOGIES, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Betts, Loren C Rohnert Park, US 11 54
Dunsmore, Joel P Sebastopol, US 33 355
Ericsson, Johan Windsor, US 4 27
Hubert, Sean Santa Rosa, US 2 15

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