Systems and methods for comparative interferogram spectrometry

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United States of America Patent

PATENT NO 7869050
SERIAL NO

12540986

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Abstract

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A method for determining a background noise level includes receiving interferogram data; determining at least one measure of interferogram quality; accumulating said received interferogram data; and generating a background noise level based on said interferogram data and at least one measure of interferogram quality.

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Patent Owner(s)

Patent OwnerAddress
PARSONS CORPORATION5875 TRINITY PARKWAY SUITE 140 CENTREVILLE VA 20120

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Deterline, Diane E Fredericksburg, US 2 9
He, George G Fredericksburg, US 3 28

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