US Patent No: 7,876,114

Number of patents in Portfolio can not be more than 2000

Differential waveguide probe

Stats

ALSO PUBLISHED AS: 20090189623
ATTORNEY / AGENT: (SPONSORED)
 

Importance

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Abstract

A wafer probe comprises a contact conductively interconnected with the wall of a waveguide channel and supported by a substrate that projects from an end of a waveguide channel.

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First Claim

Related Publications

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Patent Owner(s)

Patent OwnerAddressTotal Patents
CASCADE MICROTECH, INC.BEAVERTON, OR255

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Andrews, Michael Hillsboro, OR 39 266
Campbell, Richard L Portland, OR 16 192

Cited Art

Patent Info (Count) # Cites Year
 
FORMFACTOR, INC. (156)
5,476,211 Method of manufacturing electrical contacts, using a sacrificial member 354 1993
5,917,707 Flexible contact structure with an electrically conductive shell 289 1994
6,049,976 Method of mounting free-standing resilient electrical contact structures to electronic components 120 1995
5,772,451 Sockets for electronic components and methods of connecting to electronic components 343 1995
5,974,662 Method of planarizing tips of probe elements of a probe card assembly 341 1995
5,829,128 Method of mounting resilient contact structures to semiconductor devices 214 1995
5,852,871 Method of making raised contacts on electronic components 127 1995
5,601,740 Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires 112 1995
5,820,014 Solder preforms 114 1996
5,773,780 Method of severing bond wires and forming balls at their ends 76 1996
5,900,738 Contact structure device for interconnections, interposer, semiconductor assembly and package using the same and method 146 1996
5,926,951 Method of stacking electronic components 155 1996
6,184,587 Resilient contact structures, electronic interconnection component, and method of mounting resilient contact structures to electronic components 112 1996
6,242,803 Semiconductor devices with integral contact structures 88 1996
6,274,823 Interconnection substrates with resilient contact structures on both sides 112 1996
6,476,333 Raised contact structures (solder columns) 71 1996
6,064,213 Wafer-level burn-in and test 252 1997
5,806,181 Contact carriers (tiles) for populating larger substrates with spring contacts 254 1997
5,994,152 Fabricating interconnects and tips using sacrificial substrates 173 1997
6,442,831 Method for shaping spring elements 73 1997
6,482,013 Microelectronic spring contact element and electronic component having a plurality of spring contact elements 138 1997
5,832,601 Method of making temporary connections between electronic components 188 1997
5,864,946 Method of making contact tip structures 158 1997
5,878,486 Method of burning-in semiconductor devices 108 1997
5,884,398 Mounting spring elements on semiconductor devices 104 1997
5,983,493 Method of temporarily, then permanently, connecting to a semiconductor device 118 1997
5,998,228 Method of testing semiconductor 127 1997
6,032,356 Wafer-level test and burn-in, and semiconductor process 159 1997
6,184,053 Method of making microelectronic spring contact elements 193 1997
5,912,046 Method and apparatus for applying a layer of flowable coating material to a surface of an electronic component 77 1997
5,998,864 Stacking semiconductor devices, particularly memory chips 177 1997
6,050,829 Making discrete power connections to a space transformer of a probe card assembly 155 1997
6,307,161 Partially-overcoated elongate contact structures 70 1997
6,043,563 Electronic components with terminals and spring contact elements extending from areas which are remote from the terminals 158 1997
6,741,085 Contact carriers (tiles) for populating larger substrates with spring contacts 89 1997
6,520,778 Microelectronic contact structures, and methods of making same 145 1998
6,720,501 PC board having clustered blind vias 69 1998
6,042,712 Apparatus for controlling plating over a face of a substrate 111 1998
6,090,261 Method and apparatus for controlling plating over a face of a substrate 82 1998
6,110,823 Method of modifying the thickness of a plating on a member by creating a temperature gradient on the member, applications for employing such a method, and structures resulting from such a method 173 1998
6,023,103 Chip-scale carrier for semiconductor devices including mounted spring contacts 149 1998
6,033,935 Sockets for "springed" semiconductor devices 109 1998
6,669,489 Interposer, socket and assembly for socketing an electronic component and method of making and using same 107 1998
6,330,164 Interconnect assemblies and methods including ancillary electronic component connected in immediate proximity of semiconductor device 121 1998
6,029,344 Composite interconnection element for microelectronic components, and method of making same 203 1998
6,246,247 Probe card assembly and kit, and methods of using same 113 1998
6,441,315 Contact structures with blades having a wiping motion 105 1998
6,690,185 Large contactor with multiple, aligned contactor units 114 1998
6,255,126 Lithographic contact elements 174 1998
6,268,015 Method of making and using lithographic contact springs 116 1998
6,150,186 Method of making a product with improved material properties by moderate heat-treatment of a metal incorporating a dilute additive 95 1998
6,429,029 Concurrent design and subsequent partitioning of product and test die 129 1998
6,456,099 Special contact points for accessing internal circuitry of an integrated circuit 104 1998
6,215,670 Method for manufacturing raised electrical contact pattern of controlled geometry 86 1999
6,208,225 Filter structures for integrated circuit interfaces 136 1999
6,218,910 High bandwidth passive integrated circuit tester probe card assembly 132 1999
6,448,865 Integrated circuit interconnect system 73 1999
6,452,411 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses 102 1999
6,480,978 Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons 80 1999
6,499,121 Distributed interface for parallel testing of multiple devices using a single tester channel 93 1999
6,627,483 Method for mounting an electronic component 81 1999
6,644,982 Method and apparatus for the transport and tracking of an electronic component 102 1999
6,887,723 Method for processing an integrated circuit including placing dice into a carrier and testing 73 1999
6,468,098 Electrical contactor especially wafer level contactor using fluid pressure 91 1999
6,655,023 Method and apparatus for burning-in semiconductor devices in wafer form 82 1999
6,827,584 Interconnect for microelectronic structures with enhanced spring characteristics 91 1999
6,491,968 Methods for making spring interconnect structures 96 1999
6,672,875 Spring interconnect structures 97 1999
6,339,338 Apparatus for reducing power supply noise in an integrated circuit 89 2000
6,168,974 Process of mounting spring contacts to semiconductor devices 106 2000
6,459,343 Integrated circuit interconnect system forming a multi-pole filter 69 2000
6,232,149 Sockets for "springed" semiconductor devices 78 2000
6,509,751 Planarizer for a semiconductor contactor 124 2000
6,215,196 Electronic component with terminals and spring contact elements extending from areas which are remote from the terminals 71 2000
6,640,432 Method of fabricating shaped springs 101 2000
6,677,744 System for measuring signal path resistance for an integrated circuit tester interconnect structure 70 2000
6,476,630 Method for testing signal paths between an integrated circuit wafer and a wafer tester 74 2000
6,525,555 Wafer-level burn-in and test 97 2000
6,727,579 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES 91 2000
6,685,817 Method and apparatus for controlling plating over a face of a substrate 63 2000
6,622,103 System for calibrating timing of an integrated circuit wafer tester 91 2000
6,603,323 Closed-grid bus architecture for wafer interconnect structure 87 2000
6,727,580 Microelectronic spring contact elements 76 2000
6,539,531 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes 107 2000
6,835,898 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES 76 2000
6,778,406 Resilient contact structures for interconnecting electronic devices 98 2000
6,475,822 Method of making microelectronic contact structures 88 2000
6,597,187 Special contact points for accessing internal circuitry of an integrated circuit 74 2000
6,603,324 Special contact points for accessing internal circuitry of an integrated circuit 71 2000
6,606,575 Cross-correlation timing calibration for wafer-level IC tester interconnect systems 82 2000
6,621,260 Special contact points for accessing internal circuitry of an integrated circuit 77 2000
6,701,612 Method and apparatus for shaping spring elements 85 2000
6,713,374 Interconnect assemblies and methods 95 2000
6,836,962 Method and apparatus for shaping spring elements 71 2000
6,538,538 High frequency printed circuit board via 81 2001
6,791,176 Lithographic contact elements 78 2001
6,616,966 Method of making lithographic contact springs 122 2001
6,780,001 Forming tool for forming a contoured microelectronic spring mold 71 2001
6,501,343 Integrated circuit tester with high bandwidth probe assembly 89 2001
6,606,014 Filter structures for integrated circuit interfaces 62 2001
6,534,856 Sockets for "springed" semiconductor devices 87 2001
6,910,268 Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via 105 2001
6,856,150 Probe card with coplanar daughter card 83 2001
6,627,980 Stacked semiconductor device assembly with microelectronic spring contacts 77 2001
6,538,214 Method for manufacturing raised electrical contact pattern of controlled geometry 75 2001
6,882,239 Electromagnetically coupled interconnect system 79 2001
6,888,362 Test head assembly for electronic components with plurality of contoured microelectronic spring contacts 87 2001
6,729,019 Method of manufacturing a probe card 95 2001
6,678,876 Process and apparatus for finding paths through a routing space 90 2001
6,862,727 Process and apparatus for adjusting traces 65 2001
6,764,869 Method of assembling and testing an electronics module 70 2001
6,714,828 Method and system for designing a probe card 73 2001
6,882,546 Multiple die interconnect system 72 2001
6,664,628 Electronic component overlapping dice of unsingulated semiconductor wafer 69 2001
6,456,103 Apparatus for reducing power supply noise in an integrated circuit 84 2001
6,759,311 Fan out of interconnect elements attached to semiconductor wafer 69 2001
6,817,052 Apparatuses and methods for cleaning test probes 77 2001
6,816,031 Adjustable delay transmission line 69 2001
6,624,648 Probe card assembly 101 2001
6,777,319 Microelectronic spring contact repair 74 2001
6,479,308 Semiconductor fuse covering 69 2001
6,615,485 Probe card assembly and kit, and methods of making same 84 2001
6,891,385 Probe card cooling assembly with direct cooling of active electronic components 78 2001
7,002,363 Method and system for compensating thermally induced motion of probe cards 117 2001
6,741,092 Method and system for detecting an arc condition 62 2001
6,864,105 Method of manufacturing a probe card 67 2002
6,680,659 Integrated circuit interconnect system 68 2002
6,784,674 Test signal distribution system for IC tester 75 2002
6,798,225 Tester channel to multiple IC terminals 77 2002
6,825,422 Interconnection element with contact blade 72 2002
6,812,691 Compensation for test signal degradation due to DUT fault 69 2002
6,640,415 Segmented contactor 101 2002
6,657,455 Predictive, adaptive power supply for an integrated circuit under test 79 2002
6,807,734 Microelectronic contact structures, and methods of making same 77 2002
6,559,671 Efficient parallel testing of semiconductor devices using a known good device to generate expected responses 73 2002
6,646,520 Integrated circuit interconnect system 70 2002
6,839,964 Method for manufacturing a multi-layer printed circuit board 65 2002
6,686,754 Integrated circuit tester with high bandwidth probe assembly 71 2002
6,678,850 Distributed interface for parallel testing of multiple devices using a single tester channel 73 2002
6,818,840 Method for manufacturing raised electrical contact pattern of controlled geometry 66 2002
6,642,625 Sockets for "springed" semiconductor devices 65 2002
6,661,316 High frequency printed circuit board via 68 2002
6,825,052 Test assembly including a test die for testing a semiconductor product die 80 2002
6,788,094 Wafer-level burn-in and test 75 2002
6,845,491 Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes 70 2003
6,784,677 Closed-grid bus architecture for wafer interconnect structure 65 2003
7,342,402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features 25 2003
6,911,835 High performance probe system 80 2003
6,838,893 Probe card assembly 66 2003
6,870,381 Insulative covering of probe tips 63 2003
6,911,814 Apparatus and method for electromechanical testing and validation of probe cards 70 2003
6,913,468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods 82 2003
6,949,942 Predictive, adaptive power supply for an integrated circuit under test 44 2003
6,822,529 Integrated circuit interconnect system 67 2003
6,917,210 Integrated circuit tester with high bandwidth probe assembly 66 2003
7,276,922 Closed-grid bus architecture for wafer interconnect structure 23 2004
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (40)
4,520,314 Probe head arrangement for conductor line testing with at least one probe head comprising a plurality of resilient contacts 38 1982
4,744,041 Method for testing DC motors 116 1985
4,831,494 Multilayer capacitor 153 1988
4,922,128 Boost clock circuit for driving redundant wordlines and sample wordlines 79 1989
4,987,100 Flexible carrier for an electronic device 81 1989
5,001,423 Dry interface thermal chuck temperature control system for semiconductor wafer testing 131 1990
5,207,585 Thin interface pellicle for dense arrays of electrical interconnects 161 1990
5,061,192 High density connector 141 1990
5,334,931 Molded test probe assembly 92 1991
5,371,654 Three dimensional high performance interconnection package 215 1992
5,441,690 Process of making pinless connector 73 1993
5,537,372 High density data storage system with topographic contact sensor 111 1993
5,531,022 Method of forming a three dimensional high performance interconnection package 147 1994
5,532,608 Ceramic probe card and method for reducing leakage current 61 1995
5,804,982 Miniature probe positioning actuator 104 1995
5,810,607 Interconnector with contact pads having enhanced durability 158 1995
5,726,211 Process for making a foamed elastometric polymer 102 1996
5,756,021 Electronic devices comprising dielectric foamed polymers 88 1996
5,700,844 Process for making a foamed polymer 130 1996
5,785,538 High density test probe with rigid surface structure 86 1996
6,268,016 Manufacturing computer systems with fine line circuitized substrates 64 1996
5,723,347 Semi-conductor chip test probe and process for manufacturing the probe 106 1996
6,286,208 Interconnector with contact pads having enhanced durability 79 1996
5,838,160 Integral rigid chip test probe 82 1996
6,054,651 Foamed elastomers for wafer probing applications and interposer connectors 79 1996
5,926,029 Ultra fine probe contacts 105 1997
6,059,982 Micro probe assembly and method of fabrication 147 1997
5,804,607 Process for making a foamed elastomeric polymer 117 1997
6,062,879 High density test probe with rigid surface structure 79 1998
6,104,201 Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage 70 1998
6,332,270 Method of making high density integral test probe 79 1998
6,206,273 Structures and processes to create a desired probetip contact geometry on a wafer test probe 71 1999
6,452,406 Probe structure having a plurality of discrete insulated probe tips 77 1999
6,528,984 Integrated compliant probe for wafer level test and burn-in 103 1999
6,526,655 Angled flying lead wire bonding process 64 2001
6,788,093 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies 102 2002
6,943,571 Reduction of positional errors in a four point probe resistance measurement 60 2003
7,007,380 TFI probe I/O wrap test method 92 2004
7,011,531 Membrane probe with anchored elements 92 2005
7,005,879 Device for probe card power bus noise reduction 92 2005
 
CASCADE MICROTECH, INC. (38)
4,280,112 Electrical coupler 98 1979
4,697,143 Wafer probe 196 1984
4,764,723 Wafer probe 90 1986
4,827,211 Wafer probe 125 1987
4,858,160 System for setting reference reactance for vector corrected measurements 99 1988
4,849,689 Microwave wafer probe having replaceable probe tip 125 1988
5,012,186 Electrical probe with contact force protection 40 1990
5,045,781 High-frequency active probe having replaceable contact needles 109 1991
5,101,453 Fiber optic wafer probe 97 1991
5,266,889 Wafer probe station with integrated environment control enclosure 133 1992
5,457,398 Wafer probe station having full guarding 122 1993
5,506,515 High-frequency probe tip assembly 149 1994
5,610,529 Probe station having conductive coating added to thermal chuck insulator 135 1995
5,565,788 Coaxial wafer probe with tip shielding 144 1995
5,729,150 Low-current probe card with reduced triboelectric current generating cables 135 1995
5,914,613 Membrane probing system with local contact scrub 105 1996
6,232,788 Wafer probe station for low-current measurements 87 1997
6,232,789 Probe holder for low current measurements 87 1997
6,034,533 Low-current pogo probe card 106 1997
6,137,302 Low-current probe card with reduced triboelectric current generating cables 107 1997
6,256,882 Membrane probing system 67 1998
6,578,264 Method for constructing a membrane probe using a depression 77 2000
6,384,615 Probe holder for low current measurements 41 2001
6,549,106 Waveguide with adjustable backshort 109 2001
7,233,160 Wafer probe 20 2001
6,496,024 Probe holder for testing of a test device 38 2002
6,850,082 Probe holder for testing of a test device 37 2002
6,724,205 Probe for combined signals 97 2002
6,815,963 Probe for testing a device under test 64 2003
6,806,724 Probe for combined signals 94 2003
7,161,363 Probe for testing a device under test 33 2004
6,930,498 Membrane probing system 55 2004
7,009,383 Wafer probe station having environment control enclosure 92 2004
7,187,188 Chuck with integrated wafer support 75 2004
2006/0184,041 System for testing semiconductors 32 2006
7,332,923 Test probe for high-frequency measurement 21 2006
7,271,603 Shielded probe for testing a device under test 32 2006
7,403,028 Test structure and probe for differential signals 19 2007
 
AGILENT TECHNOLOGIES, INC. (34)
4,980,637 Force delivery system for improved precision membrane probe 95 1988
4,918,383 Membrane probe with automatic contact scrub action 152 1988
4,906,920 Self-leveling membrane probe 202 1988
5,172,051 Wide bandwidth passive probe 105 1991
5,298,972 Method and apparatus for measuring polarization sensitivity of optical devices 107 1991
5,274,336 Capacitively-coupled test probe 131 1992
5,463,324 Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like 48 1993
5,493,070 Measuring cable and measuring system 91 1994
5,507,652 Wedge connector for integrated circuits 39 1995
5,578,932 Method and apparatus for providing and calibrating a multiport network analyzer 142 1995
5,945,836 Loaded-board, guided-probe test fixture 119 1996
5,923,180 Compliant wafer prober docking adapter 70 1997
5,940,965 Method of making multiple lead voltage probe 30 1997
5,903,143 Probe apparatus with RC circuit connected between ground and a guard 93 1997
6,060,888 Error correction method for reflection measurements of reciprocal devices in vector network analyzers 112 1998
6,251,595 Methods and devices for carrying out chemical reactions 91 1998
6,175,228 Electronic probe for measuring high impedance tri-state logic circuits 83 1998
6,300,775 Scattering parameter calibration system and method 128 1999
6,271,673 Probe for measuring signals 102 1999
6,407,562 Probe tip terminating device providing an easily changeable feed-through termination 86 1999
2001/0024,116 Electronic probe for measuring high impedance tri-state logic circuits 78 2001
6,643,597 Calibrating a test system using unknown standards 115 2001
6,717,426 Blade-like connecting needle 78 2002
6,768,328 Single point probe structure and method 74 2002
6,864,694 Voltage probe 90 2002
2004/0095,145 Method and apparatus for performing multiport through-reflect-line calibration and measurement 95 2002
2004/0140,819 Differential voltage probe 28 2003
2004/0199,350 System and method for determining measurement errors of a testing device 93 2003
2005/0030,047 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration 82 2003
7,025,628 Electronic probe extender 96 2003
2004/0162,689 Multiport network analyzer calibration employing reciprocity of a device 92 2004
6,933,713 High bandwidth oscilloscope probe with replaceable cable 55 2004
7,005,868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe 92 2004
7,026,834 Multiple two axis floating probe block assembly using split probe block 92 2005
 
TOKYO ELECTRON LIMITED (34)
4,998,062 Probe device having micro-strip line structure 89 1989
5,084,671 Electric probing-test machine having a cooling system 173 1990
5,091,692 Probing test device 113 1990
5,198,752 Electric probing-test machine having a cooling system 152 1991
5,315,237 Touch sensor unit of prober for testing electric circuit and electric circuit testing apparatus using the touch sensor unit 107 1991
5,321,352 Probe apparatus and method of alignment for the same 131 1992
5,321,453 Probe apparatus for probing an object held above the probe card 101 1992
5,635,846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer 130 1993
5,404,111 Probe apparatus with a swinging holder for an object of examination 112 1993
5,517,126 Probe apparatus 128 1993
5,521,522 Probe apparatus for testing multiple integrated circuit dies 142 1993
5,539,676 Method of identifying probe position and probing method in prober 93 1994
5,811,982 High density cantilevered probe for electronic devices 113 1996
5,777,485 Probe method and apparatus with improved probe contact 118 1996
5,910,727 Electrical inspecting apparatus with ventilation system 89 1996
5,821,763 Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof 163 1996
5,804,983 Probe apparatus with tilt correction mechanisms 148 1997
6,334,247 High density integrated circuit apparatus, test probe and methods of use thereof 84 1997
5,914,614 High density cantilevered probe for electronic devices 95 1997
5,999,268 Apparatus for aligning a semiconductor wafer with an inspection contactor 106 1997
6,060,892 Probe card attaching mechanism 93 1997
6,300,780 High density integrated circuit apparatus, test probe and methods of use thereof 75 1998
6,124,725 Apparatus and method for testing semiconductor devices formed on a semiconductor wafer 129 1998
6,329,827 High density cantilevered probe for electronic devices 73 1998
6,414,478 Transfer mechanism for use in exchange of probe card 79 2000
6,722,032 Method of forming a structure for electronic devices contact locations 62 2001
7,005,842 Probe cartridge assembly and multi-probe assembly 92 2001
6,927,587 Probe apparatus 63 2003
6,906,542 Probing method and prober 60 2003
6,794,888 Probe device 75 2003
7,026,832 Probe mark reading device and probe mark reading method 93 2003
7,009,415 Probing method and probing apparatus 94 2004
7,023,226 Probe pins zero-point detecting method, and prober 92 2004
7,332,918 Prober and probe testing method for temperature-controlling object to be tested 22 2005
 
MICRON TECHNOLOGY, INC. (12)
4,312,117 Integrated test and assembly device 152 1979
4,970,386 Vertical FET high speed optical sensor 43 1989
5,487,999 Method for fabricating a penetration limited contact having a rough textured surface 161 1994
5,686,317 Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die 236 1995
5,869,974 Micromachined probe card having compliant contact members for testing semiconductor wafers 169 1996
6,071,009 Semiconductor wirebond machine leadframe thermal map system 41 1997
6,181,144 Semiconductor probe card having resistance measuring circuitry and method fabrication 131 1998
6,194,720 Preparation of transmission electron microscope samples 107 1998
6,359,456 Probe card and test system for semiconductor wafers 113 2001
6,924,653 Selectively configurable microelectronic probes 58 2002
7,026,835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad 92 2002
7,009,188 Lift-out probe having an extension tip, methods of making and using, and analytical instruments employing same 96 2004
 
TEKTRONIX, INC. (12)
4,755,742 Dual channel time domain reflectometer 29 1986
4,739,259 Telescoping pin probe 99 1986
4,673,839 Piezoelectric pressure sensing apparatus for integrated circuit testing stations 122 1986
4,734,641 Method for the thermal characterization of semiconductor packaging systems 59 1987
4,749,942 Wafer probe head 82 1987
4,912,399 Multiple lead probe for integrated circuits in wafer form 113 1987
4,783,625 Wideband high impedance card mountable probe 95 1988
5,059,898 Wafer probe with transparent loading member 77 1990
5,136,237 Double insulated floating high voltage test probe 103 1991
5,412,330 Optical module for an optically based measurement system 94 1993
6,447,339 Adapter for a multi-channel signal probe 84 2001
6,701,265 Calibration for vector network analyzer 91 2002
 
TEXAS INSTRUMENTS INCORPORATED (12)
4,888,550 Intelligent multiprobe tip 91 1983
5,159,752 Scanning electron microscope based parametric testing method and apparatus 118 1990
5,225,037 Method for fabrication of probe card for testing of semiconductor devices 213 1991
5,317,656 Fiber optic network for multi-point emissivity-compensated semiconductor wafer pyrometry 71 1993
5,511,010 Method and apparatus of eliminating interference in an undersettled electrical signal 89 1994
6,292,760 Method and apparatus to measure non-coherent signals 92 1998
6,906,539 High density, area array probe card apparatus 55 2001
6,911,834 Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probing 55 2002
6,741,129 Differential amplifier slew rate boosting scheme 34 2002
7,026,833 Multiple-chip probe and universal tester contact assemblage 94 2005
7,327,153 Analog built-in self-test module 25 2005
7,323,899 System and method for resumed probing of a wafer 19 2006
 
SV PROBE PTE LTD. (9)
5,521,518 Probe card apparatus 131 1991
5,180,977 Membrane probe contact bump compliancy system 140 1991
5,422,574 Large scale protrusion membrane for semiconductor devices under test with very high pin counts 165 1993
5,720,098 Method for making a probe preserving a uniform stress distribution under deflection 108 1995
5,742,174 Membrane for holding a probe tip in proper location 125 1995
5,623,213 Membrane probing of circuits 93 1996
6,037,785 Probe card apparatus 107 1996
5,973,504 Programmable high-density electronic device testing 98 1997
6,908,364 Method and apparatus for probe tip cleaning and shaping pad 56 2001
 
ADVANTEST CORPORATION (8)
5,172,049 IC test equipment 127 1991
5,644,248 Test head cooling system 83 1995
5,767,690 Test head cooling system 88 1997
6,191,596 Method for detecting a contact position between an object to be measured and measuring pins 80 1998
6,174,744 Method of producing micro contact structure and contact probe using same 136 2000
2002/0011,863 IC chip tester with heating element for preventing condensation 86 2001
7,020,360 Wavelength dispersion probing system 92 2002
6,937,040 Probe module and a testing apparatus 58 2004
 
CANON KABUSHIKI KAISHA (8)
4,755,747 Wafer prober and a probe card to be used therewith 106 1985
4,864,227 Wafer prober 126 1988
4,929,893 Wafer prober 159 1988
5,145,552 Process for preparing electrical connecting member 67 1990
5,304,924 Edge detector 98 1992
5,731,920 Converting adapter for interchangeable lens assembly 92 1995
5,685,232 Positioning stage device exposure apparatus and device manufacturing method utilizing the same 113 1996
6,891,151 Probe with hollow waveguide and method for producing the same 1 2001
 
W. L. GORE & ASSOCIATES, INC. (8)
4,871,883 Electro-magnetic shielding 115 1987
4,859,989 Security system and signal carrying member thereof 128 1987
5,061,823 Crush-resistant coaxial transmission line 122 1990
5,107,076 Easy strip composite dielectric coaxial signal cable 119 1991
5,477,011 Low noise signal transmission cable 103 1994
5,896,038 Method of wafer level burn-in 106 1996
6,032,714 Repeatably positionable nozzle assembly 78 1999
7,015,708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts 94 2003
 
FREESCALE SEMICONDUCTOR, INC. (7)
5,172,050 Micromachined semiconductor probe card 270 1991
5,177,438 Low resistance probe for semiconductor 165 1991
5,467,024 Integrated circuit test with programmable source for both AC and DC modes of operation 85 1993
5,617,035 Method for testing integrated devices 109 1995
5,666,063 Method and apparatus for testing an integrated circuit 106 1996
5,982,166 Method for measuring a characteristic of a semiconductor wafer using cylindrical control 107 1997
6,127,831 Method of testing a semiconductor device by automatically measuring probe tip parameters 101 1997
 
GLOBALFOUNDRIES INC. (7)
6,091,255 System and method for tasking processing modules based upon temperature 125 1998
6,608,494 Single point high resolution time resolved photoemission microscopy system and method 108 1998
6,483,327 Quadrant avalanche photodiode time-resolved detection 104 1999
6,724,928 Real-time photoemission detection system 96 2000
6,488,405 Flip chip defect analysis using liquid crystal 98 2000
6,617,862 Laser intrusive technique for locating specific integrated circuit current paths 97 2002
7,022,976 Dynamically adjustable probe tips 94 2003
 
HUGHES ELECTRONICS CORPORATION (7)
4,727,319 Apparatus for on-wafer testing of electrical circuits 74 1985
4,772,846 Wafer alignment and positioning apparatus for chip testing by voltage contrast electron microscopy 130 1986
4,908,570 Method of measuring FET noise parameters 43 1987
5,313,157 Probe for jesting an electrical circuit chip 92 1992
5,583,445 Opto-electronic membrane probe 100 1994
5,611,008 Substrate system for optoelectronic/microwave circuits 80 1996
5,623,214 Multiport membrane probe for full-wafer testing 106 1996
 
YOKOWO CO., LTD. (7)
7,019,701 Antenna device mounted on vehicle 75 2004
6,900,647 Contact probe and probe device 103 2004
6,903,563 Contact probe and probe device 97 2004
6,917,211 Contact probe and probe device 55 2004
6,919,732 Contact probe and probe device 56 2004
6,937,042 Contact probe and probe device 56 2004
7,015,710 Contact probe and probe device 94 2004
 
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. (6)
4,839,587 Test fixture for tab circuits and devices 125 1988
5,198,753 Integrated circuit test fixture and method 124 1990
5,691,503 Electro-magnetically shielded door hinge 41 1994
6,233,613 High impedance probe for monitoring fast ethernet LAN links 92 1997
2004/0201,388 Support for an electronic probe and related methods 39 2003
7,002,133 Detecting one or more photons from their interactions with probe photons in a matter system 92 2003
 
MITSUBISHI DENKI KABUSHIKI KAISHA (6)
5,408,188 High frequency wafer probe including open end waveguide 75 1992
5,493,236 Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis 183 1994
6,144,212 Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card 105 1998
6,242,929 Probe needle for vertical needle type probe card and fabrication thereof 87 1998
6,404,213 Probe stylus 84 1999
7,173,433 Circuit property measurement method 19 2005
 
SARANTEL LIMITED (6)
5,854,608 Helical antenna having a solid dielectric core 113 1994
6,184,845 Dielectric-loaded antenna 122 1997
6,181,297 Antenna 90 1998
6,369,776 Antenna 87 1999
6,424,316 Helical antenna 85 2000
6,914,580 Dielectrically-loaded antenna 81 2003
 
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY (6)
4,983,910 Millimeter-wave active probe 69 1988
4,916,002 Microcasting of microminiature tips 134 1989
5,003,253 Millimeter-wave active probe system 76 1989
5,847,569 Electrical contact probe for sampling high frequency electrical signals 95 1996
5,981,268 Hybrid biosensors 142 1997
6,051,422 Hybrid biosensors 120 1998
 
APPLIED MATERIALS, INC. (5)
5,916,689 Electrostatic chuck with an impregnated, porous layer that exhibits the Johnson-Rahbeck effect 106 1996
5,874,361 Method of processing a wafer within a reaction chamber 105 1996
6,257,564 Vacuum chuck having vacuum-nipples wafer support 100 1998
6,232,787 Microstructure defect detection 152 1999
7,319,335 Configurable prober for TFT LCD array testing 20 2004
 
DELAWARE CAPITAL FORMATION, INC. (5)
5,408,189 Test fixture alignment system for printed circuit boards 142 1992
5,289,117 Testing of integrated circuit devices on loaded printed circuit 54 1992
5,389,885 Expandable diaphragm test modules and connectors 95 1993
6,181,149 Grid array package test contactor 96 1996
6,064,218 Peripherally leaded package test contactor 103 1997
 
HUGHES AIRCRAFT COMPANY (5)
4,918,373 R.F. phase noise test set using fiber optic delay line 50 1988
4,835,495 Diode device packaging arrangement 40 1988
5,326,412 Method for electrodepositing corrosion barrier on isolated circuitry 72 1992
5,512,835 Electrical probe and method for measuring gaps and other discontinuities in enclosures using electrical inductance for RF shielding assessment 73 1992
5,412,866 Method of making a cast elastomer/membrane test probe assembly 120 1993
 
MDS INC. (5)
6,376,258 Resonant bio-assay device and test system for detecting molecular binding events 133 2000
6,340,568 Method for detecting and classifying nucleic acid hybridization 80 2001
6,566,079 Methods for analyzing protein binding events 94 2001
2003/0032,000 Method for analyzing cellular events 88 2001
2002/0168,659 System and method for characterizing the permittivity of molecular events 74 2002
 
MOTOROLA, INC. (5)
4,232,398 Radio receiver alignment indicator 47 1978
4,453,142 Microstrip to waveguide transition 105 1981
4,646,005 Signal probe 98 1984
5,561,378 Circuit probe for measuring a differential circuit 30 1994
5,748,506 Calibration technique for a network analyzer 94 1996
 
NEC CORPORATION (5)
4,669,805 High frequency connector 57 1985
6,114,864 Probe card with plural probe tips on a unitary flexible tongue 107 1997
6,310,483 Longitudinal type high frequency probe for narrow pitched electrodes 100 1998
6,281,691 Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable 101 1999
6,400,168 Method for fabricating probe tip portion composed by coaxial cable 101 2001
 
RAYTHEON COMPANY (5)
4,346,355 Radio frequency energy launcher 95 1980
5,069,628 Flexible electrical cable connector with double sided dots 71 1990
5,395,253 Membrane connector with stretch induced micro scrub 115 1993
5,600,256 Cast elastomer/membrane test probe assembly 76 1995
6,211,837 Dual-window high-power conical horn antenna 76 1999
 
WENTWORTH LABORATORIES, INC. (5)
4,975,638 Test probe assembly for testing integrated circuit devices 144 1989
5,355,079 Probe assembly for testing integrated circuit devices 95 1993
5,959,461 Probe station adapter for backside emission inspection 118 1997
6,031,383 Probe station for low current, low voltage parametric measurements using multiple probes 104 1998
6,927,586 Temperature compensated vertical pin probing device 58 2003
 
ANRITSU COMPANY (4)
5,905,421 Apparatus for measuring and/or injecting high frequency signals in integrated systems 78 1997
6,169,410 Wafer probe with built in RF frequency conversion module 84 1998
6,529,844 Vector network measurement system 105 1999
6,943,563 Probe tone S-parameter measurements 57 2002
 
GGB INDUSTRIES, INC. (4)
4,871,964 Integrated circuit probing apparatus 91 1988
5,373,231 Integrated circuit probing apparatus including a capacitor bypass structure 119 1993
6,603,322 Probe card for high speed testing 99 1996
6,118,287 Probe tip structure 96 1997
 
INTEL CORPORATION (4)
5,944,093 Pickup chuck with an integral heat pipe 100 1997
7,020,363 Optical probe for wafer testing 93 2001
6,856,129 Current probe device having an integrated amplifier 90 2002
2006/0052,075 Testing integrated circuits using high bandwidth wireless technology 72 2004
 
LSI LOGIC CORPORATION (4)
6,927,079 Method for probing a semiconductor wafer 102 2000
6,605,951 Interconnector and method of connecting probes to a die for functional analysis 102 2000
6,617,866 Apparatus and method of protecting a probe card during a sort sequence 36 2001
7,023,225 Wafer-mounted micro-probing platform 93 2003
 
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (4)
5,594,358 Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line 96 1994
5,794,133 Microwave mixing circuit 82 1996
6,806,836 Helical antenna apparatus provided with two helical antenna elements, and radio communication apparatus provided with same helical antenna apparatus 74 2003
7,219,416 Method of manufacturing a magnetic element 20 2004
 
NATIONAL SEMICONDUCTOR CORPORATION (4)
4,757,255 Environmental box for automated wafer probing 181 1986
5,814,847 General purpose assembly programmable multi-chip package substrate 89 1996
5,883,522 Apparatus and method for retaining a semiconductor wafer during testing 106 1996
7,096,133 Method of establishing benchmark for figure of merit indicative of amplifier flicker noise 72 2005
 
RENESAS ELECTRONICS CORPORATION (4)
6,028,435 Semiconductor device evaluation system using optical fiber 106 1997
6,160,407 Inspection method and wiring current observation method for semiconductor device and apparatus of the same 97 1998
6,900,646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof 96 2002
6,551,884 Semiconductor device including gate insulation films having different thicknesses 70 2002
 
SILICON VALLEY BANK (4)
4,893,914 Test station 111 1988
5,892,539 Portable emission microscope workstation for failure analysis 116 1995
6,744,268 High resolution analytical probe station 118 2002
6,917,195 Wafer probe station 55 2004
 
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE (4)
4,754,239 Waveguide to stripline transition assembly 90 1986
5,631,571 Infrared receiver wafer level probe testing 133 1996
6,215,295 Photonic field probe and calibration means thereof 112 1998
2003/0170,898 Method for intracellular modifications within living cells using pulsed electric fields 103 2002
 
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY (4)
5,361,049 Transition from double-ridge waveguide to suspended substrate 46 1986
5,091,732 Lightweight deployable antenna system 87 1990
5,430,813 Mode-matched, combination taper fiber optic probe 60 1993
6,940,264 Near field probe 58 2004
 
ELECTROGLAS, INC. (3)
5,656,942 Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane 107 1995
6,096,567 Method and apparatus for direct probe sensing 140 1997
6,320,372 Apparatus and method for testing a substrate having a plurality of terminals 100 1999
 
ENERGY, UNITED STATES DEPARTMENT OF (3)
4,287,473 Nondestructive method for detecting defects in photodetector and solar cell devices 108 1979
5,523,694 Integrated circuit failure analysis by low-energy charge-induced voltage alteration 119 1994
6,307,672 Microscope collision protection apparatus 80 1996
 
GENERAL ELECTRIC COMPANY (3)
6,927,598 Test probe for electrical devices having low or no wedge depression 56 2003
6,911,826 Pulsed eddy current sensor probes and inspection methods 62 2003
7,015,690 Omnidirectional eddy current probe and inspection system 97 2004
 
IBIDEN CO., LTD. (3)
2004/0021,475 Wafer prober 80 2003
2004/0134,899 Ceramic substrate for a semiconductor-production/inspection device 79 2003
2004/0207,072 Ceramic substrate for a semiconductor producing/examining device 83 2004
 
INTERSTITIAL, LLC (3)
5,704,355 Non-invasive system for breast cancer detection 114 1995
5,829,437 Microwave method and system to detect and locate cancers in heterogenous tissues 118 1996
6,061,589 Microwave antenna for cancer detection system 114 1997
 
JOHN H. BLANZ COMPANY, INC. (3)
5,097,207 Temperature stable cryogenic probe station 106 1989
5,160,883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving support 95 1990
5,166,606 High efficiency cryogenic test station 94 1990
 
KABUSHIKI KAISHA TOSHIBA (3)
5,166,893 Portable apparatus having a voltage converter unit removable from a base unit having a removable display unit 46 1992
6,605,941 Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes 49 2001
7,032,307 Method for fabricating a probe pin for testing electrical characteristics of an apparatus 92 2004
 
LUCENT TECHNOLOGIES INC. (3)
5,970,429 Method and apparatus for measuring electrical noise in devices 116 1997
6,121,836 Differential amplifier 37 1998
6,245,692 Method to selectively heat semiconductor wafers 90 1999
 
MICROCONNECT LLC (3)
5,621,333 Contact device for making connection to an electronic circuit device 90 1995
6,046,599 Method and device for making connection 65 1997
6,091,256 Contact device for making connection to an electronic circuit device 62 1997
 
MOTOROLA MOBILITY LLC (3)
5,751,153 Method and apparatus for characterizing a multiport circuit 39 1996
5,793,213 Method and apparatus for calibrating a network analyzer 93 1996
5,751,252 Method and antenna for providing an omnidirectional pattern 86 1997
 
NEW WAVE RESEARCH (3)
5,811,751 Multi-wavelength laser system, probe station and laser cutter system using the same 135 1997
6,573,702 Method and apparatus for cleaning electronic test contacts 100 1997
5,963,364 Multi-wavelength variable attenuator and half wave plate 116 1997
 
NORTHROP GRUMMAN CORPORATION (3)
4,216,467 Hand controller 187 1977
4,581,679 Multi-element circuit construction 100 1985
2005/0026,276 Remote detection and analysis of chemical and biological aerosols 78 2003
 
OLYMPUS OPTICAL CO., LTD. (3)
5,367,165 Cantilever chip for scanning probe microscope 74 1993
6,006,002 Rigid sleeve device fitted over a flexible insertion section of an endoscope for inspecting industrial equipment 50 1995
6,811,406 Microelectronic spring with additional protruding member 146 2001
 
SAMSUNG ELECTRONICS CO., LTD. (3)
6,970,001 Variable impedance test probe 73 2003
6,900,653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof 105 2003
6,909,297 Probe card 55 2004
 
SHARP KABUSHIKI KAISHA (3)
4,899,126 Thick film resistor type printed circuit board 71 1989
5,089,774 Apparatus and a method for checking a semiconductor 127 1990
5,374,938 Waveguide to microstrip conversion means in a satellite broadcasting adaptor 94 1993
 
SIEMENS AKTIENGESELLSCHAFT (3)
4,275,446 Method and apparatus for measurement of attenuation and distortion by a test object 101 1979
4,805,627 Method and apparatus for identifying the distribution of the dielectric constants in an object 98 1986
5,095,891 Connecting cable for use with a pulse generator and a shock wave generator 97 1987
 
SONY CORPORATION (3)
6,362,792 Antenna apparatus and portable radio set 77 2000
6,366,247 Antenna device and portable radio set 82 2000
8,035,987 Electronic device having a groove partitioning functional and mounting parts from each other 34 2007
 
TELEDYNE LECROY, INC. (3)
6,822,463 Active differential test probe with a transmission line input structure 75 2002
6,870,359 Self-calibrating electrical test probe 28 2002
7,019,544 Transmission line input structure test probe 94 2004
 
THE BOEING COMPANY (3)
4,727,637 Computer aided connector assembly method and apparatus 110 1987
5,202,648 Hermetic waveguide-to-microstrip transition module 53 1991
6,914,427 Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method 59 2003
 
XANDEX, INC. (3)
5,528,158 Probe card changer system and method 104 1994
5,506,498 Probe card system and method 96 1995
6,166,553 Prober-tester electrical interface for semiconductor test 96 1998
 
ADVANTEST (SINGAPORE) PTE LTD (2)
6,812,718 Massively parallel interface for electronic circuits 102 2001
6,917,525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs 95 2002
 
ADVANTEST AMERICA, INC (2)
6,295,729 Angled flying lead wire bonding process 74 1998
6,708,403 Angled flying lead wire bonding process 66 2003
 
AEHR TEST SYSTEMS (2)
6,340,895 Wafer-level burn-in and test cartridge 100 1999
6,580,283 Wafer level burn-in and test methods 86 1999
 
AEROSPACE CORPORATION, THE (2)
6,211,663 Baseband time-domain waveform measurement method 113 1999
6,396,298 Active feedback pulsed measurement method 87 2000
 
BELL TELEPHONE LABORATORIES, INCORPORATED (2)
4,225,819 Circuit board contact contamination probe 56 1978
4,684,883 Method of manufacturing high-quality semiconductor light-emitting devices 94 1985
 
BRUKER NANO, INC. (2)
5,376,790 Scanning probe microscope 112 1992
5,672,816 Large stage system for scanning probe microscopes and other instruments 115 1995
 
CNH AMERICA LLC (2)
5,316,435 Three function control system 49 1992
5,360,312 Three function control mechanism 48 1992
 
DAINIPPON SCREEN MFG. CO., LTD. (2)
4,531,474 Rotary board treating apparatus 88 1984
4,746,857 Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer 95 1986
 
DCG SYSTEMS, INC. (2)
5,530,372 Method of probing a net of an IC at an optimal probe-point 116 1994
5,675,499 Optimal probe point placement 107 1996
 
ELK FINANCIAL, INC. (2)
6,064,217 Fine pitch contact device employing a compliant conductive polymer bump 130 1996
2002/0011,859 METHOD FOR FORMING CONDUCTIVE BUMPS FOR THE PURPOSE OF CONTRRUCTING A FINE PITCH TEST DEVICE 105 1998
 
ELM TECHNOLOGY CORPORATION (2)
5,020,219 Method of making a flexible tester surface for testing integrated circuits 161 1989
5,453,404 Method for making an interconnection structure for integrated circuits 125 1994
 
EMIMAGING LTD (2)
5,715,819 Microwave tomographic spectroscopy system and method 102 1994
6,490,471 Electromagnetical imaging and therapeutic (EMIT) systems 86 2001
 
EUROPAISCHES LABORATORIUM FUR MOLEKULARBIOLOGIE (EMBL) (2)
6,798,226 Multiple local probe measuring device and method 89 2002
6,943,574 Multiple local probe measuring device and method 60 2004
 
HEWLETT-PACKARD COMPANY (2)
4,795,962 Floating driver circuit and a device for measuring impedances of electrical components 94 1987
5,133,119 Shearing stress interconnection apparatus and method 65 1991
 
HITACHI, LTD. (2)
7,012,871 Information recording method and apparatus with suppressed mark edge jitters 76 2004
2005/0186,696 Gas flowmeter and manufacturing method thereof 2005
 
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (2)
6,049,216 Contact type prober automatic alignment 92 1997
7,012,441 High conducting thin-film nanoprobe card and its fabrication method 103 2003
 
INTEST IP CORPORATION (2)
4,589,815 Electronic test head positioner for test systems 49 1983
4,705,447 Electronic test head positioner for test systems 129 1985
 
KABUSHIKI KAISHA NIHON MICRONICS (2)
5,888,075 Auxiliary apparatus for testing device 77 1997
6,019,612 Electrical connecting apparatus for electrically connecting a device to be tested 84 1998
 
KLA-TENCOR CORPORATION (2)
6,633,174 Stepper type test structures and methods for inspection of semiconductor integrated circuits 99 2000
6,771,806 Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices 126 2000
 
MASSACHUSETTS INSTITUTE OF TECHNOLOGY (2)
5,653,939 Optical and electrical methods and apparatus for molecule detection 405 1995
5,998,768 Active thermal control of surfaces by steering heating beam in response to sensed thermal radiation 100 1998
 
MICROWAVE IMAGING SYSTEMS TECHNOLOGIES, INC. (2)
5,841,288 Two-dimensional microwave imaging apparatus and methods 113 1997
6,448,788 Fixed array microwave imaging apparatus and method 99 2000
 
NGK INSULATORS, LTD. (2)
5,280,156 Wafer heating apparatus and with ceramic substrate and dielectric layer having electrostatic chucking means 202 1991
6,001,760 Aluminum nitride sintered body, metal embedded article, electronic functional material and electrostatic chuck 114 1997
 
NIKON CORPORATION (2)
6,628,503 Gas cooled electrostatic pin chuck for vacuum applications 96 2001
2002/0176,160 Microscope system 36 2002
 
NORTHROP GRUMMAN SYSTEMS CORPORATION (2)
5,479,109 Testing device for integrated circuits on wafer 117 1994
6,040,739 Waveguide to microstrip backshort with external spring compression 67 1998
 
RCA CORPORATION (2)
4,284,033 Means to orbit and rotate target wafers supported on planet member 113 1979
4,651,115 Waveguide-to-microstrip transition 80 1985
 
RENISHAW PLC (2)
5,270,664 Probe for measuring surface roughness by sensing fringe field capacitance effects 123 1992
6,909,983 Calibration of an analogue probe 64 2002
 
ROBERT BOSCH GMBH (2)
6,066,911 Ultrasonic driving element 118 1998
6,948,981 Compact coupler plug, particularly for a planar broadband lambda probe, in which single-conductor seals are prevented from being lost 54 2002
 
SEMATECH, INC. (2)
5,159,264 Pneumatic energy fluxmeter 79 1991
5,159,267 Pneumatic energy fluxmeter 81 1992
 
SKYWORKS SOLUTIONS, INC. (2)
6,582,979 Structure and method for fabrication of a leadless chip carrier with embedded antenna 87 2001
6,770,955 Shielded antenna in a semiconductor package 86 2001
 
SOLID STATE MEASUREMENTS, INC. (2)
6,900,652 Flexible membrane probe and method of use thereof 105 2003
7,023,231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof 93 2004
 
SONY ELECTRONICS INC. (2)
5,669,316 Turntable for rotating a wafer carrier 99 1993
2007/0024,506 Systems and methods for high frequency parallel transmissions 78 2006
 
STMICROELECTRONICS S.A. (2)
6,146,908 Method of manufacturing a test circuit on a silicon wafer 31 1999
6,480,013 Method for the calibration of an RF integrated circuit probe 100 2000
 
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (2)
6,909,300 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips 55 2002
6,902,941 Probing of device elements 99 2003
 
TDK CORPORATION (2)
5,510,792 Anechoic chamber and wave absorber 93 1994
7,012,425 Eddy-current probe 94 2005
 
TECHSEARCH, LLC (2)
4,600,907 Coplanar microstrap waveguide interconnector and method of interconnection 52 1985
4,626,805 Surface mountable microwave IC package 55 1985
 
TENCOR INSTRUMENTS (2)
4,755,746 Apparatus and methods for semiconductor wafer testing 155 1985
5,852,232 Acoustic sensor as proximity detector 117 1997
 
TRW INC. (2)
4,468,629 NPN Operational amplifier 77 1982
5,126,696 W-Band waveguide variable controlled oscillator 41 1991
 
U.S. PHILIPS CORPORATION (2)
4,568,890 Microwave oscillator injection locked at its fundamental frequency for producing a harmonic frequency output 22 1983
4,663,840 Method of interconnecting conductors of different layers of a multilayer printed circuit board 73 1985
 
WI-LAN INC. (2)
5,565,881 Balun apparatus including impedance transformer having transformation length 79 1994
5,628,057 Multi-port radio frequency signal transformation network 97 1996
 
XEROX CORPORATION (2)
4,780,670 Active probe card for high resolution/low noise wafer level testing 133 1985
6,352,454 Wear-resistant spring contacts 82 1999
 
YULIM HITECH, INC. (2)
6,922,069 Needle assembly of probe card 61 2003
7,014,499 Probe card for testing semiconductor device 92 2005
 
3M INNOVATIVE PROPERTIES COMPANY (1)
6,902,416 High density probe device 74 2002
 
ABB POWER T&D COMPANY, INC., A DE CORP. (1)
4,998,063 Fiber optic coupled magneto-optic sensor having a concave reflective focusing surface 39 1989
 
ABBOTT LABORATORIES (1)
2005/0165,316 Method for detecting artifacts in data 75 2004
 
Acome, Societies Anonyme (1)
4,621,169 Electric cable construction and uses therefor 93 1985
 
ADE CORPORATION (1)
5,642,298 Wafer testing and self-calibration system 106 1996
 
ADVANCED MICRO DEVICES, INC. (1)
6,396,296 Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station 96 2000
 
AG COMMUNICATION SYSTEMS CORPORATION, 2500 W. UTOPIA RD., PHOENIX, AZ 85027, A DE CORP. (1)
4,684,884 Universal test circuit for integrated circuit packages 74 1985
 
ALBANY INSTRUMENTS, INC. (1)
6,933,717 Sensors and probes for mapping electromagnetic fields 58 2004
 
ALERI INC. (1)
6,924,655 Probe card for use with microelectronic components, and methods for making same 56 2003
 
ALPS ELECTRIC CO., LTD. (1)
4,725,793 Waveguide-microstrip line converter 85 1986
 
ALSTOM (1)
5,813,847 Device and method for injecting fuels into compressed gaseous media 76 1996
 
AMP INCORPORATED (1)
4,652,082 Angled electro optic connector 56 1984
 
AMPEX CORPORATION (1)
4,375,631 Joystick control 61 1981
 
ANDO ELECTRIC CO., LTD. (1)
2001/0054,906 Probe card and a method of manufacturing the same 77 2001
 
ARIES ELECTRONICS, INC. (1)
6,937,045 Shielded integrated circuit probe 62 2004
 
ARRAY BIOSCIENCE CORPORATION (1)
6,707,548 Systems and methods for filter based spectrographic analysis 96 2001
 
ASAHI KOGAKU KOGYO KABUSHIKI KAISHA (1)
5,267,088 Code plate mounting device 83 1990
 
AT & T TECHNOLOGIES, INC., (1)
4,837,507 High frequency in-circuit test fixture 74 1987
 
ATG TEST SYSTEMS GMBH & CO. KG (1)
7,015,711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method 104 2004
 
ATMEL CORPORATION (1)
4,649,339 Integrated circuit interface 114 1984
 
AUTOCYTE NORTH CAROLINA, L.L.C. (1)
5,659,421 Slide positioning and holding device 103 1995
 
AVAGO TECHNOLOGIES ECBU IP (SINGAPORE) PTE. LTD. (1)
5,066,357 Method for making flexible circuit card with laser-contoured vias and machined capacitors 107 1990
 
BARKER REVOCABLE TRUST U/A/D (1)
5,202,558 Flexible fiber optic probe for high-pressure shock experiments 102 1992
 
BECHTEL BWXT IDAHO, LLC (1)
6,147,502 Method and apparatus for measuring butterfat and protein content using microwave absorption techniques 78 1998
 
BERTHOLD TECHNOLOGIES GMBH & CO. KG (1)
5,369,368 Device for determining material parameters by means of microwave measurements 79 1993
 
BILL, ELVIN STUART, 3 MARK ST., DUNDAS VALLEY, 2117 (1)
4,223,658 Elastic band projecting toy gun 50 1978
 
BIOTRONIC SYSTEMS CORPORATION (1)
5,082,627 Three dimensional binding site array for interfering with an electrical field 84 1987
 
BOARD OF REGENTS OF THE UNIVERSITY OF WISCONSIN SYSTEM, THE, AN INSTITUTE OF WI (1)
5,233,306 Method and apparatus for measuring the permittivity of materials 102 1991
 
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM (1)
2003/0119,057 Forming and modifying dielectrically-engineered microparticles 96 2001
 
BOURNS, INC. (1)
6,827,582 Connector block having an isolation circuit 21 2002
 
BROADCOM CORPORATION (1)
7,088,981 Apparatus for reducing flicker noise in a mixer circuit 94 2001
 
BROOKS AUTOMATION, INC. (1)
5,539,323 Sensor for articles such as wafers on end effector 116 1993
 
BRUKER BIOSPIN CORPORATION (1)
6,933,725 NMR probe circuit for generating close frequency resonances 60 2004
 
CALIFORNIA INSTITUTE OF TECHNOLOGY (1)
5,138,289 Noncontacting waveguide backshort 40 1990
 
CARDIFF AND VALE NHS TRUST (1)
2004/0175,294 Apparatus and method for analysing a biological sample in response to microwave radiation 74 2004
 
CARL-ZEISS-STIFTUNG (1)
4,515,439 Attachment of microscope objectives 78 1982
 
CBC CORPORATION (1)
4,306,235 Multiple frequency microwave antenna 40 1978
 
CERPROBE CORPORATION (1)
6,002,426 Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits 109 1997
 
CHENG, DAVID (1)
5,479,108 Method and apparatus for handling wafers 156 1992
 
CHIPMOS TECHNOLOGIES INC. (1)
6,946,860 Modularized probe head 55 2003
 
CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,759,859 Resilient and rugged multi-layered probe 32 2001
 
CIRCUIT COMPONENTS, INCORPORATED (1)
4,793,814 Electrical circuit board interconnect 255 1986
 
CIRREX SYSTEMS LLC (1)
6,222,970 Methods and apparatus for filtering an optical fiber 129 1999
 
COM DEV LTD. (1)
5,841,342 Voltage controlled superconducting microwave switch and method of operation thereof 40 1995
 
COMMSCOPE, INC. OF NORTH CAROLINA (1)
6,407,542 Implementation of a multi-port modal decomposition system 42 2000
 
COMPAQ COMPUTER CORPORATION (1)
5,500,606 Completely wireless dual-access test fixture 113 1993
 
CONIFER CORPORATION (1)
5,293,175 Stacked dual dipole MMDS feed 134 1993
 
CONTEL FEDERAL SYSTEMS, INC., A DE CORP. (1)
4,184,729 Flexible connector cable 105 1977
 
CREDENCE SYSTEMS CORPORATION (1)
5,883,523 Coherent switching power for an analog circuit tester 103 1997
 
CROWN CORK & SEAL TECHNOLOGIES CORPORATION (1)
6,130,536 Preform test fixture and method of measuring a wall thickness 37 1998
 
CROWN PRODUCTS, INC. (1)
7,019,541 Electric conductivity water probe 95 2004
 
CSI TECHNOLOGY, INC. (1)
6,091,236 System and method for measuring and analyzing electrical signals on the shaft of a machine 94 1997
 
D-LINK CORPORATION (1)
6,778,140 Atch horn antenna of dual frequency 72 2003
 
DATA PROBE CORPORATION (1)
4,588,950 Test system for VLSI digital circuit and method of testing 92 1983
 
DEBIOTECH S.A. (1)
7,005,078 Micromachined fluidic device and method for making same 120 2001
 
DELPHI TECHNOLOGIES, INC. (1)
7,015,709 Ultra-broadband differential voltage probes 99 2004
 
DERMON, JOHN A. (1)
4,980,638 Microcircuit probe and method for manufacturing same 25 1989
 
DESIGNTECH INTERNATIONAL, INC. (1)
5,041,782 Microstrip probe 95 1989
 
DEUTSCHE THOMSON-BRANDT GMBH (1)
4,685,150 Tuning of a resonant circuit in a communications receiver 53 1984
 
DH TECHNOLOGIES DEVELOPMENT PTE. LTD. (1)
6,627,461 Method and apparatus for detection of molecular events using temperature control of detection environment 90 2001
 
DIMENSION POLYANT SAILCLOTH, INC. (1)
6,013,586 Tent material product and method of making tent material product 89 1997
 
DIT-MCO INTERNATIONAL CORPORATION (1)
4,357,575 Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies 115 1980
 
DYNEX SEMICONDUCTOR LIMITED (1)
6,265,950 Transition from a waveguide to a strip transmission line 85 1999
 
EADS DEUTSCHLAND GMBH (1)
6,636,182 Structural antenna for flight aggregates or aircraft 73 2001
 
EAST GIANT LIMITED (1)
5,879,289 Hand-held portable endoscopic camera 142 1996
 
EASTMAN KODAK COMPANY (1)
5,848,500 Light-tight enclosure and joint connectors for enclosure framework 103 1997
 
EATON CORPORATION (1)
4,904,935 Electrical circuit board text fixture having movable platens 112 1988
 
ECLIPSE SURGICAL TECHNOLOGIES, INC. (1)
5,728,091 Optical fiber for myocardial channel formation 55 1995
 
EDO CORPORATION, BARNES DIVISION (1)
4,755,874 Emission microscopy system 155 1987
 
ELECTRIC POWER RESEARCH INSTITUTE, INC. (1)
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5,214,374 Dual level test fixture 100 1991
 
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5,357,211 Pin driver amplifier 82 1993
 
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FILOTEX (1)
5,397,855 Low noise cable 93 1993
 
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6,384,614 Single tip Kelvin probe 101 2000
 
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4,626,618 DC electric power cable 98 1985
 
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GENERAL MOTORS CORPORATION (1)
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6,481,939 Tool tip conductivity contact sensor and method 87 2001
 
GOOGLE INC. (1)
6,078,500 Pluggable chip scale package 104 1998
 
GTE PRODUCTS CORPORATION (1)
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6,054,869 Bi-level test fixture for testing printed circuit boards 94 1998
 
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4,810,981 Assembly of microwave components 88 1987
 
HITACHI SOFTWARE ENGINEERING CO., LTD. (1)
7,035,738 Probe designing apparatus and probe designing method 93 2002
 
HITACHI ULSI SYSTEMS CO., LTD. (1)
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HOUSTON ADVANCED RESEARCH CENTER, A CORP. OF TX (1)
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7,002,364 Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same 95 2003
 
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HYPRES, INC. (1)
4,894,612 Soft probe for providing high speed on-wafer connections to a circuit 154 1988
 
INIZIATIVE MARITTIME 1991 S.R.L. (1)
5,245,292 Method and apparatus for sensing a fluid handling 74 1992
 
INTEGRAL TECHNOLOGIES, INC. (1)
7,006,046 Low cost electronic probe devices manufactured from conductive loaded resin-based materials 94 2004
 
INTEGRATED TECHNOLOGY CORPORATION (1)
6,118,894 Integrated circuit probe card inspection system 114 1997
 
INTERMEC IP CORP. (1)
6,236,223 Method and apparatus for wireless radio frequency testing of RFID integrated circuits 149 1999
 
INTERSIL CORPORATION (1)
4,528,504 Pulsed linear integrated circuit tester 96 1982
 
INTEST CORPORATION (1)
5,900,737 Method and apparatus for automated docking of a test head to a device handler 113 1996
 
iTerra Communications, LLC (1)
6,794,934 High gain wideband driver amplifier 77 2001
 
IWASAKI CORRESPOND INDUSTRY CO., LTD. (1)
6,933,737 Probe card 55 2003
 
J.A. WOOLLAM CO., INC. (1)
6,937,341 System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation 80 2002
 
JEOL RESONANCE INC. (1)
6,914,430 NMR probe 57 2004
 
JPK INSTRUMENTS AG (1)
7,022,985 Apparatus and method for a scanning probe microscope 98 2002
 
JPMORGAN CHASE BANK, N.A. (1)
5,678,210 Method and apparatus of coupling a transmitter to a waveguide in a remote ground terminal 41 1995
 
JSR CORPORATION (1)
7,071,722 Anisotropic, conductive sheet and impedance measuring probe 34 2003
 
JUNKOSHA CO., LTD. (1)
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6,275,738 Microwave devices for medical hyperthermia, thermotherapy and diagnosis 115 1999
 
KAISER OPTICAL SYSTEMS (1)
6,907,149 Compact optical measurement probe 62 2003
 
KDC TECHNOLOGY CORP. (1)
5,227,730 Microwave needle dielectric sensors 94 1992
 
KEITHLEY INSTRUMENTS, INC. (1)
6,104,206 Product wafer junction leakage measurement using corona and a kelvin probe 111 1997
 
KOCH, LINDA (1)
4,567,436 Magnetic thickness gauge with adjustable probe 33 1982
 
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY (1)
6,528,993 Magneto-optical microscope magnetometer 79 2000
 
KRAFTWERK UNION AKTIENGESELLSCHAFT (1)
4,642,417 Concentric three-conductor cable 113 1985
 
KYOCERA CORPORATION (1)
6,987,483 Effectively balanced dipole microstrip antenna 79 2003
 
L&P PROPERTY MANAGEMENT COMPANY (1)
5,505,150 Method and apparatus for facilitating loop take time adjustment in multi-needle quilting machine 85 1994
 
L-3 COMMUNICATIONS ELECTRON TECHNOLOGIES, INC. (1)
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7,015,703 Radio frequency Langmuir probe 94 2004
 
LAURENCE J. MARHOEFER (1)
5,097,101 Method of forming a conductive contact bump on a flexible substrate and a flexible substrate 93 1991
 
LEXINGTON, MA. 02173 A CORP OF DE. (1)
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5,157,790 Firefighter garment with lumbar support 46 1991
 
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M/A-COM, INC. (1)
4,376,920 Shielded radio frequency transmission cable 140 1981
 
MAGMA DESIGN AUTOMATION, INC. (1)
5,030,907 CAD driven microprobe integrated circuit tester 111 1989
 
MARTIN MARIETTA CORPORATION (1)
5,867,073 Waveguide to transmission line transition 83 1994
 
MATRA BAE DYNAMICS (UK) LIMITED (1)
5,266,963 Integrated antenna/mixer for the microwave and millimetric wavebands 51 1991
 
MATTSON TECHNOLOGY, INC. (1)
6,172,337 System and method for thermal processing of a semiconductor substrate 100 1999
 
MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH (1)
4,551,747 Leadless chip carrier apparatus providing for a transmission line environment and improved heat dissipation 108 1982
 
MCC GESELLSCHAFT FUR DIAGNOSESYSTEME IN MEDIZIN UND TECHNIK MBH & CO. KG (1)
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MEDICAL COLLEGE OF GEORGIA RESEARCH INSTITUTE, INC. (1)
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MEDICAL DEVICE INNOVATIONS LIMITED (1)
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MEDISPECTRA, INC. (1)
2004/0186,382 Spectral volume microprobe arrays 75 2003
 
MEDXENSE AS (1)
7,003,184 Fiber optic probes 102 2001
 
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5,383,787 Integrated circuit package with direct access to internal signals 58 1993
 
MERCK & CO., INC. (1)
7,013,221 Iterative probe design and detailed expression profiling with flexible in-situ synthesis arrays 93 2000
 
MESO SCALE TECHNOLOGIES, LLC (1)
2005/0142,033 Modular assay plates, reader systems and methods for test measurements 55 2004
 
MICROCRAFT (1)
7,188,037 Method and apparatus for testing circuit boards 77 2004
 
MITEL SEMICONDUCTOR LIMITED (1)
5,764,070 Structure for testing bare integrated circuit devices 57 1996
 
MITSUBISHI GAS CHEMICAL COMPANY, INC. (1)
6,222,031 Process for preparing water-soluble tricarboxypolysaccharide 81 1998
 
MOLECULAR DEVICES, INC. (1)
5,164,319 Multiple chemically modulated capacitance determination 249 1989
 
MTU MOTOREN- UND TURBINEN-UNION MUENCHEN GMBH (1)
5,232,789 Structural component with a protective coating having a nickel or cobalt basis and method for making such a coating 90 1992
 
MURATA MANUFACTURING CO., LTD. (1)
6,838,885 Method of correcting measurement error and electronic component characteristic measurement apparatus 98 2003
 
NCR CORPORATION (1)
6,816,840 System and method of sending messages to a group of electronic price labels 37 1998
 
Nebraska Electronics, Inc. (1)
5,481,196 Process and apparatus for microwave diagnostics and therapy 83 1994
 
NEC ELECTRONICS CORPORATION (1)
6,320,396 Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device 98 1997
 
NEWPORT FAB, LLC (1)
6,727,716 Probe card and probe needle for high frequency testing 94 2002
 
NIHON DENSHIZAIRYO KABUSHIKI KAISHA (1)
5,134,365 Probe card in which contact pressure and relative position of each probe end are correctly maintained 86 1991
 
NISSAN CHEMICAL INDUSTRIES, LTD. (1)
5,021,186 Chloroisocyanuric acid composition having storage stability 75 1989
 
NITTO DENKO CORPORATION (1)
5,977,783 Multilayer probe for measuring electrical characteristics 61 1997
 
NKK CORPORATION (1)
6,176,091 Method and apparatus for preventing snow from melting and for packing snow in artificial ski facility 36 1998
 
NORTEL NETWORKS LIMITED (1)
4,853,624 Tunable microwave wafer probe 92 1988
 
NOVELLUS DEVELOPMENT COMPANY, LLC (1)
6,946,859 Probe structures using clamped substrates with compliant interconnectors 46 2003
 
NUCLEAR FILTER TECHNOLOGY, INC. (1)
6,948,391 Probe with integral vent, sampling port and filter element 58 2003
 
NXP B.V. (1)
6,275,043 Test device for testing a module for a data carrier intended for contactless communication 41 1999
 
OKI SEMICONDUCTOR CO., LTD. (1)
6,927,078 Method of measuring contact resistance of probe and method of testing semiconductor device 59 2003
 
OL SECURITY LIMITED LIABILITY COMPANY (1)
5,688,618 Millimeter wave device and method of making 41 1995
 
OLAER INDUSTRIES (1)
4,788,851 Pressure vessel incorporating a sensor for detecting liquid in a gas chamber 42 1987
 
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PACIFIC WESTERN SYSTEMS, INC. (1)
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PHILIPS ELECTRONICS NORTH AMERICA CORPORATION (1)
4,593,243 Coplanar and stripline probe card apparatus 113 1984
 
PICO TECHNOLOGY HOLDINGS, INC. (1)
6,335,625 Programmable active microwave ultrafine resonance spectrometer (PAMURS) method and systems 85 2000
 
PINNACLE PRODUCTS, INC. (1)
5,807,107 Dental infection control system 91 1996
 
POPKIN FAMILY ASSETS, L.L.C. (1)
6,418,009 Broadband multi-layer capacitor 86 2000
 
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4,740,764 Pressure sealed waveguide to coaxial line connection 45 1987
 
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2005/0116,730 DOUBLE-FACED DETECTING DEVICES FOR AN ELECTRONIC SUBSTRATE 27 2003
 
PROBE-RITE, INC. (1)
4,636,722 High density probe-head with isolated and shielded transmission lines 153 1984
 
PRODONT, INC. (1)
7,034,553 Direct resistance measurement corrosion probe 95 2003
 
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2001/0044,152 Dual beam, pulse propagation analyzer, medical profiler interferometer 72 2001
 
PURDUE RESEARCH FOUNDATION (1)
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QINETIQ LIMITED (1)
5,803,607 Method and apparatus for measurement of unsteady gas temperatures 41 1997
 
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6,737,920 Variable gain amplifier 76 2002
 
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REMOLEAUX TECHNOLOGIES AG, LLC (1)
5,686,960 Image input device having optical deflection elements for capturing multiple sub-images 125 1994
 
RESEARCH IN MOTION LIMITED (1)
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6,794,950 Waveguide to microstrip transition 83 2001
 
RESEARCH ORGANIZATION FOR CIRCUIT KNOWLEDGE (1)
5,584,120 Method of manufacturing printed circuits 76 1994
 
Riken Denshi Co., Ltd. (1)
4,636,772 Multiple function type D/A converter 47 1985
 
ROCKSTAR BIDCO, LP (1)
6,753,679 Test point monitor using embedded passive resistance 82 2002
 
ROCKWELL INTERNATIONAL CORPORATION (1)
4,184,133 Assembly of microwave integrated circuits having a structurally continuous ground plane 51 1977
 
ROSEMOUNT TANK RADAR AB (1)
6,278,411 Horn antenna 77 1999
 
ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG (1)
2004/0066,181 High-frequency probe tip 80 2003
 
ROUND ROCK RESEARCH, LLC (1)
5,126,286 Method of manufacturing edge connected semiconductor die 144 1990
 
RUDOLPH TECHNOLOGIES, INC. (1)
6,710,798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card 106 1999
 
SAE MAGNETICS (H.K.) LTD. (1)
7,015,689 Connection method for probe pins for measurement of characteristics of thin-film magnetic head and characteristic measurement method for thin-film magnetic head 94 2003
 
SANDIA CORPORATION (1)
6,078,183 Thermally-induced voltage alteration for integrated circuit analysis 128 1998
 
SANTEC CORPORATION (1)
7,323,680 Optical deflection probe and optical deflection probe device 19 2006
 
SANTRONICS, INC. (1)
7,030,599 Hand held voltage detection probe 96 2004
 
SARNOFF CORPORATION (1)
5,993,611 Capacitive denaturation of nucleic acid 101 1997
 
SCHLUMBERGER TECHNOLOGY CORPORATION (1)
4,766,384 Well logging apparatus for determining dip, azimuth, and invaded zone conductivity 99 1986
 
SCIENCE & TECHNOLOGY CORPORATION @ UNM (1)
6,549,022 Apparatus and method for analyzing functional failures in integrated circuits 122 2000
 
SEIKO INSTRUMENTS INC. (1)
7,015,455 Near-field optical probe 92 2005
 
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5,550,481 Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making 40 1995
 
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6,114,865 Device for electrically contacting a floating semiconductor wafer having an insulating film 110 1999
 
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SENSHIN CAPITAL, LLC (1)
5,633,780 Electrostatic discharge protection device 114 1996
 
SENSOR DIAGNOSTICS, INC. (1)
4,713,347 Measurement of ligand/anti-ligand interactions using bulk conductance 191 1985
 
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7,057,404 Shielded probe for testing a device under test 20 2003
 
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6,639,461 Ultra-wideband power amplifier module apparatus and method for optical and electronic communications 80 2001
 
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6,621,082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function 98 2002
 
SILICONIX INCORPORATED (1)
6,476,442 Pseudo-Schottky diode 87 1998
 
SINGULUS TECHNOLOGIES GMBH (1)
5,876,082 Device for gripping and holding substrates 69 1997
 
SIROTECH LTD. (1)
5,824,494 Method for enumerating bacterial populations 90 1995
 
SLOAN TECHNOLOGY CORPORATION, A CORP. OF CA (1)
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SMITHS GROUP PLC (1)
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SMSC ANALOG TECHNOLOGY, INC. (1)
6,753,699 Integrated circuit and method of controlling output impedance 76 2002
 
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6,940,283 Detecting field from different ignition coils using adjustable probe 53 2003
 
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5,792,668 Radio frequency spectral analysis for in-vitro or in-vivo environments 147 1996
 
SPAR AEROSPACE LIMITED (1)
5,116,180 Human-in-the-loop machine control loop 240 1990
 
SPECTROSCOPY IMAGING SYSTEMS CORPORATION (1)
4,916,398 Efficient remote transmission line probe tuning for NMR apparatus 94 1988
 
ST. CLAIR INTELLECTUAL PROPERTY CONSULTANTS, INC. (1)
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STAR TECHNOLOGIES INC. (1)
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4,476,363 Method and device for heating by microwave energy 32 1983
 
STORAGE TECHNOLOGY CORPORATION (1)
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STOVOKOR TECHNOLOGY LLC (1)
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SUMITOMO ELECTRIC INDUSTRIES, LTD. (1)
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6,784,679 Differential coaxial contact array for high-density, high-speed signals 92 2002
 
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6,906,506 Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe 55 2002
 
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5,478,748 Protein assay using microwave energy 88 1994
 
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TIOGA TECHNOLOGIES, INC. (1)
6,459,739 Method and apparatus for RF common-mode noise rejection in a DSL receiver 102 1999
 
TOKYO OHKA KOGYO CO., LTD. (1)
5,571,324 Rotary-cup coating apparatus 103 1994
 
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5,451,884 Electronic component temperature test system with flat ring revolving carriage 100 1993
 
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4,340,860 Integrated circuit carrier package test probe 67 1980
 
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6,605,955 Temperature controlled wafer chuck system with low thermal resistance 95 2000
 
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UNISYS CORPORATION (1)
4,553,111 Printed circuit board maximizing areas for component utilization 30 1983
 
UNIVERSITY COLLEGE OF WALES, ABERYSTWYTH, THE (1)
5,569,591 Analytical or monitoring apparatus and method 126 1994
 
UNIVERSITY OF KANSAS (1)
6,937,020 Solid-state nuclear magnetic resonance probe 61 2004
 
UNIVERSITY OF MARYLAND, BALTIMORE (1)
6,809,533 Quantitative imaging of dielectric permittivity and tunability 73 2002
 
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VATELL CORPORATION (1)
6,278,051 Differential thermopile heat flux transducer 91 2000
 
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WESTERNGECO L.L.C. (1)
6,912,468 Method and apparatus for contemporaneous utilization of a higher order probe in pre-stack and post-stack seismic domains 53 2003
 
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WICO DISTRIBUTION CORP., A DE CORP. (1)
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6,611,417 Wafer chuck system 80 2001
 
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2003/0088,180 Space-time microwave imaging for cancer detection 96 2002
 
XILINX, INC. (1)
6,512,482 Method and apparatus using a semiconductor die integrated antenna structure 86 2001
 
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Other [Check patent profile for assignment information] (35)
4,330,783 Coaxially fed dipole antenna 75 1979
4,284,682 Heat sealable, flame and abrasion resistant coated fabric 123 1980
4,383,217 Collinear four-point probe head and mount for resistivity measurements 85 1981
4,480,223 Unitary probe assembly 133 1981
4,641,659 Medical diagnostic microwave scanning apparatus 106 1982
4,563,640 Fixed probe board 41 1982
4,515,133 Fuel economizing device 76 1984
4,812,754 Circuit board interfacing apparatus 116 1987
4,711,563 Portable collapsible darkroom 89 1987
4,791,363 Ceramic microstrip probe blade 136 1987
4,988,062 Apparatus, system and method for organizing and maintaining a plurality of medical catheters and the like 91 1988
4,922,912 MAP catheter 107 1988
5,363,050 Quantitative dielectric imaging system 103 1990
5,414,565 Tilting kinematic mount 84 1991
5,187,443 Microwave test fixtures for determining the dielectric properties of a material 78 1992
5,584,608 Anchored cable sling system 83 1994
5,670,322 Multi site molecule detection method 164 1995
5,670,888 Method for transporting and testing wafers 125 1995
5,621,400 Ice detection method and apparatus for an aircraft 41 1995
5,744,971 Device and apparatus for measuring dielectric properties of materials 87 1995
5,831,442 Handling device 95 1996
5,675,932 Plant growing system 90 1996
5,949,579 Flexible darkness adapting viewer 88 1997
6,307,363 Ultrahigh-frequency high-impedance passive voltage probe 47 1998
RE37130 Signal conditioning apparatus 30 1998
6,147,851 Method for guarding electrical regions having potential gradients 90 1999
6,327,034 Apparatus for aligning two objects 90 1999
6,548,311 Device and method for detecting analytes 99 2000
2001/0002,794 Split resistor probe and method 78 2001
6,587,327 Integrated broadband ceramic capacitor array 105 2002
2003/0076,585 Optical system for enhancing the image from a microscope's high power objective lens 30 2002
2003/0139,662 Method and apparatus for detecting, identifying and performing operations on microstructures including, anthrax spores, brain cells, cancer cells, living tissue cells, and macro-objects including stereotactic neurosurgery instruments, weapons and explosives 81 2002
7,015,707 Micro probe 108 2003
2004/0193,382 Method and apparatus for calibrating a multiport test system for measurement of a DUT 95 2004
2006/0030,060 Apparatus and method for testing defects 36 2005

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