Micro free electron laser (FEL)

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7876793
APP PUB NO 20090290604A1
SERIAL NO

11411129

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A charged particle beam including charged particles (e.g., electrons) is generated from a charged particle source (e.g., a cathode or scanning electron beam). As the beam is projected, it passes between plural alternating electric fields. The attraction of the charged particles to their oppositely charged fields accelerates the charged particles, thereby increasing their velocities in the corresponding (positive or negative) direction. The charged particles therefore follow an oscillating trajectory. When the electric fields are selected to produce oscillating trajectories having the same (or nearly the same) frequency as the emitted radiation, the resulting photons can be made to constructively interfere with each other to produce a coherent radiation source.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
ADVANCED PLASMONICS INC3239 SW 47TH AVE GAINESVILLE FL 32608

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Davidson, Mark Florahome, US 89 3905
Gorrell, Jonathan Gainesville, US 69 1009
Maines, Michael E Gainesville, US 28 543

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation